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In this paper we focus on distributed environment and parallelization of the computationally intensive genetic algorithm based test generation for sequential ...
In this paper we focus on distributed environment and parallelization of the computationally intensive genetic algorithm based test generation for sequential ...
Collaborative Distributed Computing in the Field of Digital Electronics ... Distributed Approach for Genetic Test Generation in the Field of Digital Electronics.
Test generation is a highly complex and time-consuming task. In this work, we present a distributed method for combinational test generation.
Abstract: Test generation is a highly complex and time-consuming task. In this work, we present a distributed method for combinational test generation.
Missing: Digital | Show results with:Digital
The approach is based on continuous mutation of a given input sequence and on analyzing the mutated vectors for selecting the test set. The hierarchical ...
In this chapter, we will discuss how evolutionary methods can be used for test generation of digital circuits. In present time it is strongly investigated ...
This book represents the peer-reviewed proceedings of the Second International Symposium on Intelligent Distributed Computing -- IDC 2008 held in Catania, ...
The objective of this paper is to propose a novel approach for DS optimization, using Genetic Algorithms (GA) to map which areas are more sensitive to equipment ...
Missing: Electronics. | Show results with:Electronics.
The results showed that genetic algorithms have been successfully applied to simple test data generation, but are rarely used to generate complex test data such ...