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Abstract: In this paper we introduce a quality model that reflects fabrication process quality, design delay margin, and test timing accuracy.
Abstract - In this paper we introduce a quality model that reflects fabrication process quality, design delay margin, and test timing accuracy.
The model provides a measure that can predict the level of chip defects that cause delay failure, including marginal delay. We can therefore use the model to ...
A quality model that reflects fabrication process quality, design delay margin, and test timing accuracy is introduced that provides a measure that can ...
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Oct 22, 2024 · The model provides a measure that can predict the level of chip defects that cause delay failure, including marginal delay. We can therefore use ...
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SUMMARY. In this paper we introduce a statistical quality model for delay testing that reflects fabrication process quality, design delay margin,.
As a method to evaluate delay test quality of test patterns, SDQM (Statistical Delay Quality Model) has been proposed for transition faults.
We propose a new metric, statistical SDF Coverage (S-SDFC), for differentiating SDFs and GDFs and evaluating the test quality of SDFs under the statistical ...