Abstract: A radiation-hardness-by-design (RHBD) method for flip-flop single-event upsets (SEUs) mitigation is studied in this paper.

Abstract— A radiation-hardness-by-design (RHBD) method for flip-flop single-event upsets (SEUs) mitigation is studied in this paper.

A radiation-hardness-by-design (RHBD) method for flip-flop single-event upsets (SEUs) mitigation is studied and was implemented for an asynchronous ...

This method applies a certain radiation hardened structure, e.g., the dual-interlocked storage cell (DICE), to implement one stage latch of a flip-flop while ...

Bibliographic details on Flip-Flop SEUs Mitigation through Partial Hardening of Internal Latch and Adjustment of Clock Duty Cycle.

This paper presents a new single event upset tolerant flip-flop design by applying the hardening technique on DICE at the layout level, an alternative to ...

Flip-Flop SEUs Mitigation through Partial Hardening of Internal Latch and Adjustment of Clock Duty Cycle ... Reconfigurable Hardened Latch and Flip-Flop for FPGAs.

Flip-flop SEUs mitigation through partial hardening of internal latch and adjustment of clock duty cycle. Proceedings - 21st IEEE International Symposium on ...

The paper presents a strategy for mitigation of SETs on data paths using three-clock input TMR (Triple Modular Redundancy) flip-flop cells (φTMR approach) as an ...