Abstract: Over the past years special chips for external tests have been successfully used for random pattern testing. The authors present a technique for ...

To achieve this goal two tasks are solved. Firstly, an algorithm is developed for pseudo-exhaustive test pattern generation, which ensures a feasible test ...

To achieve this goal two tasks are solved. Firstly, an algorithm is developed for pseudo-exhaustive test pattern generation, which ensures a feasible test ...

An algorithm is developed for pseudoexhaustive test pattern generation, which ensures a feasible test length and a chip design for applying these test ...

To achieve this goal twO taSks an: solved. Firstly, an algorithm is developed for pseudo-tlxhaustive test pallern generation, which ensures a feasible test ...

To achieve this goal two tasks are solved. Firstly, an algorithm is developed for pseudo-exhaustive test pattern generation, which ensures a feasible test ...

To achieve this goal twO taSks an: solved. Firstly, an algorithm is developed for pseudo-tlxhaustive test pallern generation, which ensures a feasible test ...

First, an algorithm is developed for pseudoexhaustive test pattern generation, which ensures a feasible test length. Second, a chip design for applying these ...

Title, Generating Pseudo-exhaustive Vectors for External Testing. Authors, Sybille Hellebrand, Hans-Joachim Wunderlich, Oliver F. Haberl.

Hellebrand S, Wunderlich H-J, F. Haberl O. Generating Pseudo-Exhaustive Vectors for External Testing. In: IEEE International Test Conference (ITC'90).