Abstract. In this paper, we focus on how the IDDQ current value varies depending on the test vectors and the resistance of bridging faults.
In this paper, we focus on how IDDQ current value varies depending on the test vectors and the resistance of bridging faults. Detection of a large IDDQ is ...
Designers must target realistic faults if they desire high-quality test and diagnosis of CMOS circuits. The authors propose a strategy for generating ...
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How are the IDDQ test vectors different from stuck at test vectors?
To show how a quiescent current supply test, Iddq, contributes to IC defect isolation. To understand the challenges of the Iddq measurement.
Many delay faults are detected with few test vectors. However, there is a defect subset that causes a delay fault, but does not elevate current, by increasing ...
Scan Chain Diagnosis Using IDDQ Current Measurement pp. 153. IDDQ Current Dependency on Test Vectors and Bridging Resistance pp. 158. A Parallel Generation ...
IDDQ testing is a powerful strategy for detecting de- fects that do not alter the logic behavior of CMOS ICs. Such a technique is very effective especially ...
The maximum detectable bridging resistance by di erent test vectors via outputs Q1 and Q2 are given in Table 1, where X indicates that no functional fault is ...
I/sub DDQ/ current dependency on test vectors and bridging resistance · A. KeshkK. KinoshitaY. Miura. Computer Science, Engineering. Asian Test Symposium. 1999.
In this paper, a current monitoring technique that overcomes the current variations problem in I DDQ testing is proposed.