In BiCMOS, transistor stuck-OPEN faults ex- hibit delay faults in addition to sequential behav- ior. Stuck-ON faults cause enhanced 100~. The.

In BiCMOS, transistor stuck-OPEN faults exhibit delay faults in addition to sequential behavior. Stuck-ON faults cause enhanced I/sub DDQ/.

An input pattern classification scheme is presented for different faults. These classes of patterns are then used to obtain test sets.

Mar 3, 1994 · Input PatternClassi cation for Transistor Level Testing of iC. Circuits elowwe give a series of lemmas that summarize the impact on the sets.

Input pattern classification for transistor level testing of BiCMOS circuits. Profile image of Yashwant Malaiya Yashwant Malaiya. 1994, Proceedings of IEEE ...

PDF | Combining the advantages of bipolar and CMOS, BiCMOS is emerging as a major technology for high speed, high performance, digital and mixed signal.

This paper presents effects of bridging faults affecting p-and n-parts. It is shown that bridging faults can be detected by IDDQ monitoring in BiCMOS devices.

Input pattern classification for transistor level testing of bridging faults in BiCMOS circuits. by Yashwant Malaiya. 2002. See Full PDF Download PDF. Free ...

Input pattern classification for transistor level testing of BiCMOS circuits · Computer Science, Engineering. Proceedings of IEEE VLSI Test Symposium · 1994.

Malaiya, "Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits," Proc. Great Lakes Symposium on VLSI, March 1996 ...