Apr 2, 2005 · Electromigration due to excessive current density stress in the interconnect can cause the premature failure of an electronic circuit.

Apr 2, 2005 · In this tutorial, we give an introduction to the electromigration problem and its relationship to current density. We then present various ...

This tutorial gives an introduction to the electromigration problem and its relationship to current density, and presents various physical design constraints ...

Apr 2, 2005 · Electromigration due to excessive current density stress in the interconnect can cause the premature failure of an electronic circuit.

Electromigration due to excessive current density stress in the interconnect can cause the premature failure of an electronic circuit.

Apr 2, 2005 · We will first explain the physical causes of electromigration, and then introduce ways of influencing current density during the physical design ...

ABSTRACT: Electromigration is a main challenge in the pursuit of power electronics, because physical limit to increase current density in power electronics is ...

Electromigration due to excessive current density stress in the interconnect can cause the premature failure of an electronic circuit. The ongoing reduction of ...

Apr 17, 2019 · ABSTRACT. Electromigration (EM) is seen as a growing problem in recent and upcoming technology nodes, and affects a wider variety of wires.

Sciweavers · Interconnect and current density stress: an introduction to electromigration-aware design.