On the use of an oscillation-based test methodology for CMOS micro ...
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Abstract: This paper introduces the use of the oscillation test technique for MEMS testing. This well-known test technique is here adapted to MEMS.
The Device Under Test. The Device Under Test (DUT) is a U-shaped cantilever beam carrying a known current (figure 1). In presence of a magnetic field, ...
This paper introduces the use of the oscillation test technique for MEMS testing. This well-known test technique is here adapted to MEMS.
This paper introduces the use of the oscillation test technique for MEMS testing and its efficiency is evaluated based on a case study: A CMOS ...
On the Use of an Oscillation-Based Test Methodology for CMOS Micro-Electro-Mechanical Systems · Contents. DATE '02: Proceedings of the conference on Design, ...
On the use of an oscillation-based test methodology for CMOS micro-electro-mechanical systems. Authors. Beroulle, V.; Bertrand, Y.; Latorre, L.; Nouet, P ...
The BIST method using an oscillation-based test circuit has been shown to have the potential of overcoming common problems associated with conventional test.
The aim of the presentation is to discuss a practical way of carrying out an effective implementation of the oscillation test technique as well as ...
Dec 31, 2020 · 1. Oscillation-Based Test. It is computationally easier and faster to use an oscillating signal to measure these electrical parameters that are ...
The OBT is a technique derived from the microelectronic device testing field, which builds an oscillator as transducer for the electrical impedance associated ...