Jun 6, 2013 · This paper presents an evaluation of 14-nm SOI FinFET CMOS SRAM codesign techniques in the presence of statistical variability and ...
This paper investigates the impact of long-range process variation and local statistical variability on various 6T-SRAM metrics including static noise ...
Oct 22, 2024 · This paper presents an evaluation of 14-nm SOI FinFET CMOS SRAM codesign techniques in the presence of statistical variability and ...
This paper presents an evaluation of 14-nm SOI FinFET CMOS SRAM codesign techniques in the presence of statistical variability and reliability impact. As ...
This paper presents an evaluation of 14-nm SOI FinFET CMOS SRAM codesign techniques in the presence of statistical variability and reliability impact.
This paper presents a comprehensive statistical variability study of 14-nm technology node SOI FinFET which is optimized based on extensive exploration of ...
This paper presents a comprehensive statistical variability study of 14-nm technology node SOI FinFET which is optimized based on extensive exploration of ...
Sep 2, 2022 · This paper presents a comprehensive statistical variability study of 14-nm technology node SOI FinFET which is optimized based on extensive ...
This paper presents a comprehensive statistical variability study of 14-nm technology node SOI FinFET which is optimized based on extensive exploration of ...
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Variability is a critical concern for the stability and yield of SRAM with minimized size. We present a study of a 14 nm node SOI FinFET SRAM cell under the ...