In this paper, we proposed a test data compression scheme targeted for minimizing the amount of test data. The proposed scheme can reduce the test ...
The proposed scheme can reduce the test application time and minimize the amount of compressed test data, which reduces the size of data memory in ATE and ...
In this paper, we proposed a test data compression scheme targeted for minimizing the amount of test data. The proposed scheme can reduce the test ...
In this paper, we proposed a test data compression scheme targeted for minimizing the amount of test data. The proposed scheme can reduce the test ...
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Abstract. We present an analysis of test application time for test data compression techniques that are used for reducing test data volume and testing time ...
Abstract. In this paper we propose a new compression algorithm geared to reduce the time needed to test scan-based designs. Our scheme compresses the test ...
Abstract: Increasing test costs has been one of the disadvantageous consequences of technology scaling especially in deep sub-micron designs.
A new scheme of test data compression based on run-length, namely equal-run-length coding (ERLC) is presented. It is based on both types of runs of 0's and 1's.
This paper presents a new test data compression/decompression method for SoC testing,called hybrid run length codes.The method makes a full analysis of the ...
By selecting an input sequence of the minimum path metric (at the final time index), we can compress a test cube to meet some of the important test requirements ...