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In this paper, we present a DFT method which modifies the circuit in such a way that, during the test operation, several more easily testable configurations are ...
The majority of Design For Testability (DFT) methods for sequential circuits are based on scan designs (complete or partial).
This paper presents a DFT method which modifies the circuit in such a way that, during the test operation, several more easily testable configurations are ...
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Test configurations to enhance the testability of sequential circuits. ATS '95: Proceedings of the 4th Asian Test Symposium. The majority of design for ...
In this paper, we propose the use of logic implications to enhance online error detection capabilities and to improve the testing efficiency of an ...
Missing: configurations | Show results with:configurations
Duration: 1:34:44
Posted: Sep 10, 2023
Posted: Sep 10, 2023
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Oct 22, 2024 · New techniques are presented in this paper to improve the efficiency of a test generation procedure for synchronous sequential circuits.
The change from normal system operation to test mode can be controlled by a level test-mode signal or by a separate test clock signal.
The testability of a sequential circuit can be im- proved by controlling the clocks of individual storage elements during testing. W e propose several clock ...
Missing: configurations enhance
This paper presents a technique to enhance the testability of sequential circuits by repositioning flip-flops. A novel retiming for testability technique is ...
Missing: configurations | Show results with:configurations