The dynamic removal of faults before the end of the test pattern is reached, called fault dropping (FD), is considered. The conventional technique, called ...

Abstract-In many fault simulation applications it is not re- quired to simulate each fault up to the end of the test pattern. For example, a fault can be ...

Total fault simulation throughout the experiments is unnec- essary in most of the fault simulation applications. When simula-.

Nov 1, 2006 · The dynamic removal of faults before the end of the test pattern is reached, called fault dropping (FD), is considered.

The Fault Dropping Problem in Concurrent Event Driven Simulation ; Journal. IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS.

The dynamic removal of faults before the end of the test pattern is reached, called fault dropping (FD), is considered. The conventional technique, called ...

1993. ABSTRACT Logic and fault simulations with gate delay information are not common in today's simulators due to their lack of parallelism.

One of the oldest methods for sequential circuit fault simulation is concurrent fault simulation. In this technique, a fault-free circuit and all the faulty ...

Fault dropping causes simulation of C(fn) to stop after vector 35. Serial Fault Simulation. If fault dropping is not employed, the effort of simulating n faults ...

The fault dropping problem in concurrent event driven simulation · S. GaiP. Montessoro. Computer Science. Proceedings., 1990 IEEE International Conference… 1990.