In this paper, the impact of double-sided connectivity and buried power rails (BPR) on electrostatic discharge (ESD) diodes is reported.
Abstract. In this paper, the impact of double-sided connectivity and buried power rails (BPR) on electrostatic discharge (ESD) diodes is reported.
Request PDF | On Jun 11, 2023, W.-C. Chen and others published Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs | Find, ...
... Upcoming Challenges of ESD Reliability in DTCO with BS - PDN Routing via BPRs*** Optimization of SCR for High - Speed Digi- tal and RF Applications in 45 ...
2023 45th Annual EOS/ESD Symposium (EOS/ESD), 1-6, 2023. 2023. Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs. WC Chen, SH Chen, A ...
Feb 8, 2024 · The authors propose alternative ESD protection devices that exploit the wafer's active functional backside to enhance ESD performance.
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs. 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and ...
Jun 16, 2023 · Next, imec discusses upcoming challenges of ESD reliability in DTCO with BSPDN routing via Buried Power Rails (BPR). Finally, imec evaluates ...
Kateryna Serbulova's research works | imec and other places
www.researchgate.net › Kateryna-Serbul...
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs ... Enabling Active Backside Technology for ESD and LU Reliability in DTCO/STCO.
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs, W.-C. ... using BS-PDN. Effects on the dimension of μTSVs, materials applied in ...