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SPIE Profile of Valery Axelrad, Sequoia Design Systems Inc. SPIE Profiles is a networking platform for optics and photonics professionals.
Publication Topics. Accuracy Of Model,Array Architecture,Buck Converter,Cathode Region,Cell Structure,Circuit Design,Circuit Elements,Circuit Power,Circuit ...
Valery Axelrad. SEQUOIA Design Systems. Inc. Presentations. Engineering Track Poster. Integrated Calculation of Capacitances for Image Sensor Arrays and other ...
Abstract: Robustness of modern ICs during system assembly and normal operation requires that protection circuits are built-in to prevent damage to internal ...
[PDF] Simulation of the Breakdown Walkout Effect in MOS Devices
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Valery Axelrad. SEQUOIA Design Systems, Inc. www.sequoiadesignsystems.com. Simulation of the Breakdown Walkout Effect in MOS Devices. Valery Axelrad. Page 2 ...
The presented results indicate that the unique features of AFFCCA allow for significant improvements in the accuracy of critical area computations.
Controlling Mesh Effects in Integrated Process and Device Simulation, with Valery Axelrad, presented at International Workshop on Statistical Metrology, June 98 ...