| Introduction to microelectronic fabrication RC Jaeger Addison-Wesley Longman Publishing Co., Inc., 1987 | 1521* | 1987 |
| Microelectronic circuit design RC Jaeger, TN Blalock McGraw-Hill, 1997 | 785 | 1997 |
| Heat sink optimization with application to microchannels RW Knight, DJ Hall, JS Goodling, RC Jaeger IEEE Transactions on Components, Hybrids, and Manufacturing Technology 15 (5 …, 1992 | 567 | 1992 |
| Silicon piezoresistive stress sensors and their application in electronic packaging JC Suhling, RC Jaeger IEEE sensors journal 1 (1), 14-30, 2001 | 390 | 2001 |
| A high-speed clamped bit-line current-mode sense amplifier TN Blalock, RC Jaeger IEEE Journal of Solid-State Circuits 26 (4), 542-548, 1991 | 319 | 1991 |
| A 12-Bit Vernier Ring Time-to-Digital Converter in 0.13CMOS Technology J Yu, FF Dai, RC Jaeger IEEE journal of solid-state circuits 45 (4), 830-842, 2010 | 294 | 2010 |
| Piezoresistive stress sensors for structural analysis of electronic packages DA Bittle, JC Suhling, RE Beaty, RC Jaeger, RW Johnson | 273 | 1991 |
| CMOS stress sensors on [100] silicon RC Jaeger, JC Suhling, R Ramani, AT Bradley, J Xu IEEE journal of solid-state circuits 35 (1), 85-95, 2000 | 211 | 2000 |
| Piezoresistive characteristics of short-channel MOSFETs on (100) silicon AT Bradley, RC Jaeger, JC Suhling, KJ O'Connor IEEE Transactions on electron devices 48 (9), 2009-2015, 2001 | 195 | 2001 |
| Evaluation of piezoresistive coefficient variation in silicon stress sensors using a four-point bending test fixture RE Beaty, RC Jaeger, JC Suhling, RW Johnson, RD Butler IEEE Transactions on Components Hybrids and Manufacturing Technology 15 (5 …, 1992 | 169 | 1992 |
| A high-speed sensing scheme for 1T dynamic RAMs utilizing the clamped bit-line sense amplifier TN Blalock, RC Jaeger IEEE Journal of Solid-State Circuits 27 (4), 618-625, 1992 | 161 | 1992 |
| Temperature dependent threshold behavior of depletion mode MOSFETs: characterization and simulation FH Gaensslen, RC Jaeger Solid-State Electronics 22 (4), 423-430, 1979 | 149* | 1979 |
| Errors associated with the design, calibration and application of piezoresistive stress sensors in (100) silicon RC Jaeger, JC Suhling, R Ramani IEEE Transactions on Components, Packaging, and Manufacturing Technology …, 1994 | 148 | 1994 |
| Comments on" An optimized output stage for MOS integrated circuits"[with reply] RC Jaeger, LW Linholm IEEE Journal of Solid-State Circuits 10 (3), 185-186, 1975 | 133 | 1975 |
| Characterization of the Temperature Dependence of the Piezoresistive Coefficients of Silicon From C to C CH Cho, RC Jaeger, JC Suhling IEEE Sensors Journal 8 (8), 1455-1468, 2008 | 106 | 2008 |
| The van der Pauw stress sensor A Mian, JC Suhling, RC Jaeger IEEE Sensors Journal 6 (2), 340-356, 2006 | 105 | 2006 |
| Effect of nucleation site spacing on the pool boiling characteristics of a structured surface ND Nimkar, SH Bhavnani, RC Jaeger International journal of heat and mass transfer 49 (17-18), 2829-2839, 2006 | 101 | 2006 |
| Ionizing radiation tolerance of high-performance SiGe HBT's grown by UHV/CVD JA Babcock, JD Cressler, LS Vempati, SD Clark, RC Jaeger, DL Harame IEEE transactions on Nuclear Science 42 (6), 1558-1566, 1995 | 101 | 1995 |
| Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors LS Vempati, JD Cressler, JA Babcock, RC Jaeger, DL Harame IEEE journal of solid-state circuits 31 (10), 1458-1467, 1996 | 100 | 1996 |
| Simulation of impurity freezeout through numerical solution of Poisson's equation with application to MOS device behavior RC Jaeger, FH Gaensslen IEEE Transactions on Electron Devices 27 (5), 914-920, 1980 | 98 | 1980 |
