International Symposium on Design and Diagnostics of Electronic Circuits and Systems
2019 IEEE International Test Conference (ITC), 2019•ieeexplore.ieee.org
The paper is a contribution to the 50th anniversary celebration of the International Test
Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of
the test community and highlights the global reach of ITC during the past 50 years. It covers
the past, present, and future of the International Symposium on Design and Diagnostics of
Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test
technology related events initiated and supported by the ITC.
Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of
the test community and highlights the global reach of ITC during the past 50 years. It covers
the past, present, and future of the International Symposium on Design and Diagnostics of
Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test
technology related events initiated and supported by the ITC.
The paper is a contribution to the 50th anniversary celebration of the International Test Conference (ITC) and its Global Test Forum (GTF), which honors the geographic breadth of the test community and highlights the global reach of ITC during the past 50 years. It covers the past, present, and future of the International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), a symposium which belongs to prominent test technology related events initiated and supported by the ITC.
ieeexplore.ieee.org
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