Analysing error of fit functions for ellipses
PL Rosin - Pattern Recognition Letters, 1996 - Elsevier
Pattern Recognition Letters, 1996•Elsevier
We describe several established error of fit (EOF) functions for use in the least square fitting
of ellipses, and introduce a further four new EOFs. Four measures are used for assessing
the suitability of such EOFs, quantifying their linearity, curvature bias, asymmetry, and overall
goodness. These measures enable a better understanding to be gained of the individual
merits of the EOF functions.
of ellipses, and introduce a further four new EOFs. Four measures are used for assessing
the suitability of such EOFs, quantifying their linearity, curvature bias, asymmetry, and overall
goodness. These measures enable a better understanding to be gained of the individual
merits of the EOF functions.
We describe several established error of fit (EOF) functions for use in the least square fitting of ellipses, and introduce a further four new EOFs. Four measures are used for assessing the suitability of such EOFs, quantifying their linearity, curvature bias, asymmetry, and overall goodness. These measures enable a better understanding to be gained of the individual merits of the EOF functions.
Elsevier
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