Improved afm scanning methodology with adaptation to the target shape
Proceedings of the 2005 IEEE International Conference on Robotics …, 2005•ieeexplore.ieee.org
This paper presents a manipulation and measurement aid for tasks carried out in micro-
nano environments operating with scanning AFM. In teleoperated manipulation or
measurement over a given point of the target, where a slow and precise movement is
necessary, the developed system increases the accuracy in this point producing a space
deformation. In automatic scanning, the adjusted selection of the target, through assisted
image segmentation, enables to reduce the working time.
nano environments operating with scanning AFM. In teleoperated manipulation or
measurement over a given point of the target, where a slow and precise movement is
necessary, the developed system increases the accuracy in this point producing a space
deformation. In automatic scanning, the adjusted selection of the target, through assisted
image segmentation, enables to reduce the working time.
This paper presents a manipulation and measurement aid for tasks carried out in micro-nano environments operating with scanning AFM. In teleoperated manipulation or measurement over a given point of the target, where a slow and precise movement is necessary, the developed system increases the accuracy in this point producing a space deformation. In automatic scanning, the adjusted selection of the target, through assisted image segmentation, enables to reduce the working time.
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