The nonuniform substrate thermal profile and process variations are two major concerns in
the present-day ultra-deep submicrometer designs. To correctly predict performance/ leakage/…

The Latin hypercube sampling (LHS) has been used as a variance-reduction estimation tool
for an efficient sampling-based variability analysis of analog circuits. For a certain …

Power dissipation during test is a major challenge in testing integrated circuits. Dynamic
power has been the dominant part of power dissipation in CMOS circuits, however, in future …

The Monte-Carlo (MC) technique is a well-known solution for statistical analysis. In contrast
to probabilistic (non-Monte Carlo) statistical static timing analysis (SSTA) techniques, which …

In this paper, an adaptive sampling method is proposed for the statistical SRAM cell analysis.
The method is composed of two components. One part is the adaptive sampler that …

Recently, devices optimized for subthreshold operation have been introduced as potential
construction blocks for digital subthreshold logic circuits. However, for these devices, a strong …

As CMOS technology is scaled down toward the nanoscale regime, drastically growing
leakage currents and variations in device characteristics are becoming two important design …

Process variability is the pivotal factor impacting the design of high yield integrated circuits
and systems in deep sub-micron CMOS technologies. The electrical and physical properties …

A thermal-aware placement is proposed for FPGAs to reduce the peak temperature and
maximum on-chip gradient temperature. A new thermal cost is defined for the simulation …

A new low power multiplication algorithm for reducing the switching activity through
operand decomposition for Radix-8 Booth multiplier is proposed. The proposed algorithm …