Multiple input bridging fault detection in CMOS sequential circuits
Proceedings 1992 IEEE International Conference on Computer Design: VLSI …, 1992•computer.org
… In this paper we consider theproblem of test generation for input bridging faults in
CMOSsequential circuits, either with or without scan-path design.Experimental results are
given to show the efficacy of ourmethods.1. IntroductionCMOS is currently the dominant
VLSI technology.… In thissection we describe a very efficient test pattern
generationalgorithm for detecting 2-tuple IBFs in combinationalcircuits (or sequential
circuits with scan) and giveexperimental results obtained by applying the algorithm …
CMOSsequential circuits, either with or without scan-path design.Experimental results are
given to show the efficacy of ourmethods.1. IntroductionCMOS is currently the dominant
VLSI technology.… In thissection we describe a very efficient test pattern
generationalgorithm for detecting 2-tuple IBFs in combinationalcircuits (or sequential
circuits with scan) and giveexperimental results obtained by applying the algorithm …
Abstract
Bridging fault testing algorithms for CMOS sequential circuits, assuming current supply monitoring, are discussed. Sequential circuits implemented both with and without scan design are considered. Experimental results are given to show the efficacy of the methods.
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