Reduction of SOC test data volume, scan power and testing time using alternating run-length codes
A Chandra, K Chakrabarty - Proceedings of the 39th annual design …, 2002 - dl.acm.org
A Chandra, K Chakrabarty
Proceedings of the 39th annual design automation conference, 2002•dl.acm.orgWe present a test resource partitioning (TRP) technique that simultaneously reduces test
data volume, test application time and scan power. The proposed approach is based on the
use of alternating run-length codes for test data compression. Experimental results for the
larger ISCAS-89 benchmarks and an IBM production circuit show that reduced test data
volume, test application time and low power scan testing can indeed be achieved in all
cases.
data volume, test application time and scan power. The proposed approach is based on the
use of alternating run-length codes for test data compression. Experimental results for the
larger ISCAS-89 benchmarks and an IBM production circuit show that reduced test data
volume, test application time and low power scan testing can indeed be achieved in all
cases.
We present a test resource partitioning (TRP) technique that simultaneously reduces test data volume, test application time and scan power. The proposed approach is based on the use of alternating run-length codes for test data compression. Experimental results for the larger ISCAS-89 benchmarks and an IBM production circuit show that reduced test data volume, test application time and low power scan testing can indeed be achieved in all cases.
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