TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology
D Trémouilles, G Bertrand, M Bafleur… - Microelectronics …, 2003 - Elsevier
The number of circuit design iterations due to electrostatic discharge (ESD) failures
increases with the complexity of VLSI technologies and their shrinking. In this paper, we
show how TCAD and ESD SPICE modeling can be used to solve ESD protection issues in
an analog CMOS technology.
increases with the complexity of VLSI technologies and their shrinking. In this paper, we
show how TCAD and ESD SPICE modeling can be used to solve ESD protection issues in
an analog CMOS technology.
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