- Agnese, R;
- Aralis, T;
- Aramaki, T;
- Arnquist, IJ;
- Azadbakht, E;
- Baker, W;
- Banik, S;
- Barker, D;
- Bauer, DA;
- Binder, T;
- Bowles, MA;
- Brink, PL;
- Bunker, R;
- Cabrera, B;
- Calkins, R;
- Cartaro, C;
- Cerdeño, DG;
- Chang, Y-Y;
- Cooley, J;
- Cornell, B;
- Cushman, P;
- Di Stefano, PCF;
- Doughty, T;
- Fascione, E;
- Figueroa-Feliciano, E;
- Fink, C;
- Fritts, M;
- Gerbier, G;
- Germond, R;
- Ghaith, M;
- Golwala, SR;
- Harris, HR;
- Hong, Z;
- Hoppe, EW;
- Hsu, L;
- Huber, ME;
- Iyer, V;
- Jardin, D;
- Jena, C;
- Kelsey, MH;
- Kennedy, A;
- Kubik, A;
- Kurinsky, NA;
- Lawrence, RE;
- Leyva, JV;
- Loer, B;
- Asamar, E Lopez;
- Lukens, P;
- MacDonell, D;
- Mahapatra, R;
- Mandic, V;
- Mast, N;
- Miller, EH;
- Mirabolfathi, N;
- Mohanty, B;
- Mendoza, JD Morales;
- Nelson, J;
- Orrell, JL;
- Oser, SM;
- Page, WA;
- Partridge, R;
- Pepin, M;
- Phipps, A;
- Ponce, F;
- Poudel, S;
- Pyle, M;
- Qiu, H;
- Rau, W;
- Reisetter, A;
- Reynolds, T;
- Roberts, A;
- Robinson, AE;
- Rogers, HE;
- Romani, RK;
- Saab, T;
- Sadoulet, B;
- Sander, J;
- Scarff, A;
- Schnee, RW;
- Scorza, S;
- Senapati, K;
- Serfass, B;
- So, J;
- Speller, D;
- Stanford, C;
- Stein, M;
- Street, J;
- Tanaka, HA;
- Toback, D;
- Underwood, R;
- Villano, AN;
- von Krosigk, B;
- Watkins, SL;
- Wilson, JS;
- Wilson, MJ;
- Winchell, J;
- Wright, DH;
- Yellin, S;
- Young, BA;
- Zhang, X;
- Zhao, X
We present the first limits on inelastic electron-scattering dark matter and dark photon absorption using a prototype SuperCDMS detector having a charge resolution of 0.1 electron-hole pairs (CDMS HVeV, a 0.93 g CDMS high-voltage device). These electron-recoil limits significantly improve experimental constraints on dark matter particles with masses as low as 1 MeV/c^{2}. We demonstrate a sensitivity to dark photons competitive with other leading approaches but using substantially less exposure (0.49 g d). These results demonstrate the scientific potential of phonon-mediated semiconductor detectors that are sensitive to single electronic excitations.
