Implementation of SPC Techniques in Automotive Industry: A Case Study

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International Journal of Emerging Technology and Advanced Engineering

Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)

Implementation of SPC Techniques in Automotive


Industry: A Case Study
Dr. D. R. Prajapati
Assistant Professor in the Department of Mechanical Engineering, PEC University of Technology (formerly Punjab
Engineering College), Chandigarh-160012 (India).
[email protected]
With its emphasis on early detection and prevention of
problems, SPC has a distinct advantage over other quality
methods. In mass-manufacturing, the quality of the finished
article was traditionally achieved through postmanufacturing inspection of the product; accepting or
rejecting each article (or samples from a production lot)
based on how well it met its design specifications. In
contrast, Statistical Process Control uses statistical tools to
observe the performance of the production process in order
to predict significant deviations that may later result in
rejected product.
Two kinds of variation occur in all manufacturing
processes: both these types of process variation cause
subsequent variation in the final product. The first is known
as natural or common cause of variation and consists of the
variation inherent in the process as it is designed. Common
cause of variation may include variations in temperature,
properties of raw materials, strength of an electrical current
etc. The second kind of variation is known as special cause
of variation, or assignable cause of variation, and happens
less frequently than the first. With sufficient investigation,
a specific cause, such as abnormal raw material or incorrect
set-up parameters can be found for special cause variations.
By observing at the right time what happened in the
process that led to a change, the quality engineer or any
member of the team responsible for the production line can
troubleshoot the root cause of the variation that has crept in
to the process and correct the problem. SPC indicates when
an action should be taken in a process, but it also indicates
when NO action should be taken. An example is a person
who would like to maintain a constant body weight and
takes weight measurements weekly. A person who does not
understand SPC concepts might start dieting every time his
or her weight increased, or eat more every time his or her
weight decreased. This type of action could be harmful and
possibly generate even more variation in body weight. SPC
would account for normal weight variation and better
indicate when the person is in fact gaining or losing weight.

Abstract: In this paper, an attempt has been made to

implement the some statistical process control (SPC)


techniques in the industry that is offering its customers
the widest and latest range of sealing solutions for
various applications in the automotive industry. The
power of SPC lies in the ability to examine a process
and the sources of variation in that process, using tools
that give weightage to objective analysis over subjective
opinions and that allow the strength of each source to
be determined numerically. Only two main techniques
i.e. cause and effect diagram and control charts are
implemented in this industry out of seven SPC
techniques. The present work deals with the study of
defects in shocker seals of an automotive industry. It is
found that after implementing the SPC tools to remove
the root causes, the percentage rejection is reduced
from 9.1% to 5% and process capability of 0.953 is
achieved.
Keywords Cause and effect diagram, control charts,

process capability index, casting defects and percentage


rejection.

I. INTRODUCTION
Statistical process control (SPC) is the application of
statistical methods to the monitoring and control of a
process to ensure that it operates at its full potential to
produce conforming product. Under SPC, a process
behaves predictably to produce as much conforming
product as possible with the least possible waste. While
SPC has been applied most frequently to controlling
manufacturing lines, it applies equally well to any process
with a measurable output. Key tools in SPC are control
charts and cause & effect diagrams, focused on continuous
improvement. Variations in the process that may affect the
quality of the end product or service can be detected and
corrected, thus reducing waste as well as the likelihood that
problems will be passed on to the customer.
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The preparatory phases of SPC involve several steps,
using a number of different tools. Seven quality tools are
available to help organizations to better understand and
improve their processes. The essential tools for the
discovery process are: Check Sheet, Cause-and-Effect
Sheet, Flow Charting, Pareto Chart, Scatter Diagram,
Histogram or probability plot and Control Charts.
Check sheets are simply charts for gathering data.
When check sheets are designed clearly and cleanly, they
assist in gathering accurate and pertinent data, and allow
the data to be easily read and used. Cause-and-Effect or
Fishbone diagram are also called Ishikawa diagrams
because Kaoru Ishikawa developed them to search the root
causes of problem. The fishbone chart organizes and
displays the relationships between different causes for the
effect that is being examined. This chart helps organize the
brainstorming process. The major categories of causes are
put on major branches connecting to the backbone and
various sub-causes are attached to the branches.
Flowcharting breaks the process down into its many subprocesses. Analyzing each of these separately minimizes
the number of factors that contribute to the variation in the
process. The Pareto chart can be used to display categories
of problems graphically so they can be properly prioritized.
The Pareto chart is named for a 19th century Italian
economist who postulated that a small minority (20%) of
the people owned a great proportion (80%) of the wealth in
the land. The Scatter plot is another problem analysis tool.
Scatter plots are also called correlation charts. A Scatter
plot is used to uncover possible cause-and-effect
relationships. It is constructed by plotting two variables
against one another on a pair of axes. A Scatter plot cannot
prove that one variable causes another, but it does show
how a pair of variables is related and the strength of that
relationship.
The probability plot is a graph of the cumulative
relative frequencies of the data, plotted on a normal
probability scale. The purpose of this plot is to show
whether the data approximates a normal distribution. A
histogram is a snapshot of the variation of a product or the
results of a process. It often forms the bell shaped curve
which is characteristic of a normal process. Control charts
are an essential tool of continuous quality control. Control
charts monitor processes to show how the process is
performing and how the process and capabilities are
affected by changes to the process. This information is then
used to make quality improvements. Control charts are also
used to determine the capability of the process. They can
help to identify special or assignable cause for factors that
impede peak performance.

Capability index value and comparing the calculated


capability index to the desired index value, making a
decision concerning process changes, and recommending
any suggestions to reach the desired goal. The popularity of
capability measures continues to increase because of the
mentioned benefits. Terminology associated with this
subject must be relatively easy and provide a common
language for discussing quality on the shop floor with
suppliers as well as with customers.
The Control charts may be classified: (i) control charts
for variables and (ii) control charts for attribute. The
control charts based on variable data that can be measured
on a continuous scale i.e. weight, volume, temperature etc.
are known as control charts for variables. The control
charts based on discrete data i.e. counted as present or
not are called control charts for attributes. When
constructing attribute control charts, a subgroup is the
group of units that are inspected to obtain the number of
defects or the number of defective items.
Theory of X Charts
In X chart, means of small samples (3-5) are taken at
regular intervals, plotted on a chart, and compared against
two limits. The limits are known as upper control limit
(UCL) and lower control limit (LCL). These limits are
defined as under:
LCL =

- A2 R

and

UCL =

+ A2R

Where,
X is the target mean and factor A2 depends on
sample size. The process is assumed to be out of control
when the sample average falls beyond these limits.

Theory of Range (R) charts


In these charts, the sample ranges are plotted in order to
control the variability of a variable. The centreline of the R
chart is known as average range. The range of a sample is
simply the difference between the largest and smallest
observation.
If R1, R2, ..., Rk, be the range of k samples, then the average
range (R bar) is given by:-

228

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adjustments can be avoided. He described that due to lack
of control charts, the technicians have a tendency to
continuously adjust the process to keep it on target value.
Chang and Gan [2] proposed the Shewhart charts for
monitoring the variance component of the process. They
provided the simple procedures for designing Shewhart
charts for monitoring variance components.
Rahardja [12] compared the effectiveness of the
X-Chart alone to that of the individuals and Moving Range
Chart Combination (X/MR Charts), in terms of Average
Run Length (ARL) after designing for a common all OK
(in control) ARL. Comparison has been made under five
different non-standard conditions, including both iid and
non-iid circumstances. He conclude that adding the Moving
Range chart to an X-chart, while generally not helpful for
detecting iid departures from standard conditions, can be
beneficial in detecting some non-iid conditions. Lillrank
and Kujala [8] examined on the applicability of SPC in
non-repetitive processes and open systems, non-routine
processes and project-based business activities. They also
proposed guidelines for adjusting the logic of common and
specific causes for project-based businesses are proposed.
Prajapati and Mahapatra [10] proposed a joint X
and R chart to monitor the process mean and variance
simultaneously. They have suggested a very simple and
effective design of proposed joint X and R chart to monitor
the process mean and standard deviation. Sultana et al. [13]
intended to combine the Hourly Data System (HDS) and
Statistical Process Control (SPC) practices to improve
manufacturing performances in manufacturing companies.
The focus of their work is to find out the frequencies and
time duration of machine breakdowns as well as the major
causes of breakdowns affecting productivity. In this
research SPC is used to increase total output identifying
major loss times from various machine breakdowns using
HDS. The obtained result shows that any breakdown can
cause a huge cost and the best approach to address any
breakdown is the preventive measure.
Wu and Yu [14] proposed a neural network-based
identification model for both mean and variance shifts in
correlated processes. The proposed model used a selective
network ensemble approach named Discrete Particle
Swarm Optimization (DPSOEN) to obtain the improved
generalization performance, which outperforms those of
single neural network. The model was capable of on-line
monitoring mean and variance shifts, and classifying the
types of shifts without considering the occurrence of both
mean and variance shifts in one time. Result is significant it
provided additional information a process changes, which
could greatly aid identification of assignable causes.

The upper and lower control limits of R chart are:


Upper control limit:

Lower control limit:

Where,
Factors, D3 and D4 depend only on sample size (n)

II. LITERATURE REVIEW


From the past literature survey, it is evident that some
research on Statistical process Control is carried by
previous researchers but still a lot of applied research in
this field is required so as to explore the utilization of SPC
technique in the area of production, manufacturing and
design.
The control chart, introduced in 1924, allows
management to look at processes rather than just at
products. Shewhart discussed the concept of statistical
control. He carefully stated that a control chart is not a test
of statistical significance. In his first book on quality
control, Shewhart [11] described to select the criterion (the
three sigma limits). A control chart predicts that, in the
absence of assignable causes, the process will operate as a
random system and produce the present level of quality in
the future. If that level of quality is not satisfactory, a
fundamental change in the process is required.
Ishikawa [5] added the cause-and-effect chart as an aid
to brainstorming, but all the rest of the methods were the
same as those recommended by Juran [6]. The popularity
of these problem-solving tools and the ease of their use
caused many to adopt them.
Kane [7] carried out a
study on capability indices and examined the uses of
capability indices along with their estimation procedure.
When properly applied, statistical tools are an effective
way for improving process quality. Costa [4] also studied
the performance of X chart with variable sample size and
variable sampling intervals. He compared the performance
of his charts with Shewhart X charts and noticed that the
charts proposed by him outperforms Shewharts X chart
with a large margin.
Chen and Ding [3] reviewed Cp, Cpk, Cpm and
Cpmk, and their generalizations, and then proposed a new
index Spmk for any underlying distribution, which takes
into account the process variability, departure of the
process mean from the target value, and proportion of nonconformity. Nelson [9] described the situation when one
should not adjust the process so that over or frequent
229

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Abdolshah et al. [1] stated that process capability
indices (PCIs) are appropriate tools to measure the inherent
capability of a process, but most of them do not consider
the losses of a process, while in today's competitive
business environment, it is becoming more and more
important for companies to evaluate and minimise their
losses. They presented a review of loss-based PCIs such as
Cpm, Cpmk, PCI, Cpc, Le and Le. They also discussed
characteristics of loss-based PCIs such as reject based,
asymmetric, bounded, loss based and target based. Finally,
they made some recommendations for developing a new
loss-based process capability index with more excellent
specifications.

Moulding

Inspection

Post Curing

Spring
Loading

Greasing

Metal Part
Assembly

Waxing

Figure 1 Flow process chart for production of shocker seals

3.2 CASE STUDY


The emphasis is given on the production of shocker seals
because rejection level before implementing SPC tools for
this product is 9.1%
The following main root causes are found in
higher rejection of shocker seals of this industry.

III. INTRODUCTION OF INDUSTRY AND


PRODUCTS
This firm is the collaboration of three industries to mark its
presence as one of the largest firm of the automotive rubber
parts industry, situated in northern India. It is recognized as
the largest manufacturing company in the field of
Automobile Rubber Parts in India, with its wide range of
parts. It has also achieved TS-16949:2002, QS-9000 and
ISO-9002 standards of quality assurance. Being the
unchallenged market leader in the sealing technology, this
group of companies together offers its customers the widest
and latest range of sealing solutions for various
applications in the automotive and other related fields. Its
product range offers following class products:

(i) Moulding
Moulding is the first process of manufacturing of shocker
seals. It is found that various moulding defects are
responsible for the rejection. Following defects are
observed in this process, causing for rejection.

Oil Seals
Radial Shaft Seals
Shock Absorbers/Rod Seals
Hydraulic Seals
Shaft Seals
Valve Stem Seals

3.1 BRIEF DESCRIPTION OF THE CASE STUDY

Air trap
Tear
Knitting
Foreign matter
Curing
Excess material
Less material
Dirty cavity

Probable causes of each defect are listed below:


Air trap
Insufficient Vacuum
Improper Environmental temperature
Tear
Higher temperature
Improper manual loading
Material (excess/less)
Improper setting of grub screw volume

Shocker seals are the main components in this industry


which needed more attention because of their higher
rejection. These shocker seals have percentage rejection
more than 9.1%, thats why; SPC techniques are required to
implement on these products to reduce the percentage
rejection. Manufacturing process for shocker seals is shown
in Figure 1.

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Following recommendations
eliminate various root causes.

Cold bit
Improper cleaning of nozzle hole
Dirty Top portion of mould
Trimming
Offset trimming problem
Spiral Lining problem
Step Trimming problem

for shocker seals in Figure 2.

Top mould
being dirty

Poor
Inspection

Machine
Nozzle hole not
clean properly

Material
Not purchased
from std. source

Grub scre
Moulding

Vacuum
problem

given

to

3.2.1 Recommendations to remove the moulding defects:


In-process inspection is must for each
manufacturing operation.
Adequate Vacuum must be created.
Proper Environmental temperature should be
maintained
Maintain temperature of the casting between
19000C to 21000C.

Manual loading should be replaced by


mechanised loading.
Grubbed screw volume should be maintained at
the required level.
Clean the nozzle hole properly.
Clean top portion of mould properly.
Trimming should be done very carefully.

Ishikawa (cause & Effect) diagram is shown

Man

are

High temp

Material non
conference

Improper
loading

Non
conference
to drawing

Material
Method

w volume setting
Figure 2 Cause and effect diagram for shocker seals

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3.3 IMPLEMENTATION OF X

AND RANGE (R)

Lower control limit =

CHARTS TO DIAMETERS OF SHOCKER SEALS

= 62.002 - 0.7380.075=
The sample size (n) of 4 is considered and 400 observations
of outer diameter of shocker seals for are taken in random
manner. These observations are taken after removing the
root causes as suggested in section 3.2.1. The observations
before the case study are not included because of the
limitation of length of the paper. The concept of subgrouping is followed when observations are taken. These
observations are shown in Table 1A (Appendix A).

61.94 mm
A2 = 0.738, D4 = 2.28, D3= 0 (values of these factor,
corresponding to sample size, are available in all the books
of Quality control)
3.3.2 Range (R) Chart

Target outer diameter of shocker seals = 62 mm 0.10 mm


(tolerance)
So, upper and lower specification limits can be calculated
as:
Upper specification Limit (USL) = 62.10 mm and
= 30.02/400 = 0.075,

Lower specification Limit (USL) = 59.90 mm


3.3.1 Mean ( X ) Chart

where, k is the number of


subgroups = 400
Upper control limit on R
chart

Mean or Average of one sample can be calculated as:

Lower control limit on R


chart

X = (X1 + X2+ X3+ X4) 4


Where, n is the sample size = 4 (for this case)

2.28* 0.075 = 0.171


0*0.075 = 0

Similarly, Mean or Average of 400 samples can be


calculated as

3.3.3 Calculation of Process capability (Cp)


Population standard deviation () =
2.059 (for sample size of 4)

/d2

where, d2 =

= 0.075/2.059 = 0.036
Where, k is the number of subgroups = 400 (for this case)
= 24800.70/400 = 62.002 mm and Average range can
be calculated as:

So Process capability (Cp) = 6 = 60.036= 0.21


To be process under control,
(USL LSL) 6

= 30.02/400 = 0.075

(61.10-59.90) = 60.036= 0.21


0.20 0.21

Upper control limit =

So, process is almost under the control and rejection level


has been reduced after removing the root causes of
rejection.

= 62.002+0.7380.075=
62.06 mm
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The Process Capability ratio can also be calculated as:


Process Capability ratio = (USL-LSL)/ 6
= [(61.10-59.90)/ 60.036]

= 0.953

3.3.4 Calculation of Process capability Index (Cpk)


Process capability Index (Cpk) can be calculated as:
Cpk = Minimum [( X - LCL)/3, (UCL X )/ 3]
= Min.[ (62.002 61.94 )/ 3* 0.036 , (62.06
62.002)/ 3* 0.036]
Cpk = Min. [0.58, 0.54] = 0.54
So, Process capability Index (Cpk) of the process is 0.54
Although 400 observations of the shocker seals
are taken, only plots of 100 observations for X and are R
charts are shown in Figures 3 and 4 respectively. These
observations are taken after removing the root causes of
rejection. It is clear from the Figures 3 and 4 that all the
observations are falling within the control limits on both
X and R charts.

Figure 3 Graphical representation of X chart

IV. CONCLUSIONS
0.25
0.2
0.15

UCL r
LCL r

0.1

RANGE

0.05
0
1

9 17 25 33 41 49 57 65 73 81 89 97
Figure 4 Graphical representation of R chart

233

The present work deals with the study of shocker seals. The
basic requirements of the manufacturing processes are
studied then the statistical process control of the specific
process is found out. SPC analysis may easily help in
improving the efficiency of the manufacturing process thus
decreasing the number of defective products, thus saving a
lot of re-work cost and valuable time. For each specific
product the suggested preventions can considerably
decrease the loss to the industry in terms of both money
and time. Although, improvement in rejection level of all
the other products of the industry is noticed, shocker seals
were the main concern because the rejection level of this
product was more than 9.1%. After implementing the
required suggestions/recommendations for shocker seals, it
is found that process capability is improved and it is greater
than required. Out of 400 observations of outer diameter of
Shocker seals, no any observation is falling outside of
control limits on both X and R charts.

International Journal of Emerging Technology and Advanced Engineering


Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
[11] Shewhart, W. A. 1931. Economic control of quality of
manufacturing product, Van Nostrand, New York.
[12] Rahardja, D. 2005.
X-Charts versus X / MR Chart
Combinations: IID Cases and Non-IID Cases, Quality
Engineering, Volume 17, Issue 2, pp. 189 196.
[13] Sultana F., Razive, N. and Azeem, A. 2009. Implementation of
statistical process control (spc), Journal of Mechanical
Engineering,
IEI
(Bangladesh),Vol. 40 (1) .
(www.banglajol.info/index.php/JME/rt/captureCite/3466/2908.
[14] Wu, B. and Yu, Jian-bo. 2010. A Neural Network-Based Online Monitoring Model of Process Mean and Variance Shift,
International Conference on E-Business and E-Government,
pp. 2615-2618.

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[2]

[3]

[4]

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Abdolshah, M., Yusuff, R. M., Hong, T. S. and Ismail, M. Y.


B. 2011. Loss-based process capability indices: a review,
International Journal of Productivity and Quality Management,
Vol. 7, No.1, pp. 1 - 21.
Chang, T. C. and Gan, F. F. 2004. Shewhart Chart for
Monitoring the Variance Components, Journal of Quality
Technology, Vol. 36, No. 3, pp. 293 308.
Chen, J.P. and Ding, C.G. 2001. A new process capability
index for non-normal distributions. International Journal of
Quality & Reliability Management, Vol. 18, Issue 7, pp. 762
770.
Costa, A. F. B. 1997. X charts with variable sample size and
sampling intervals, Journal of Quality Technology, Vol. 29,
No. 2, pp. 197 204.
Ishikawa, Kaoru, 1985. What is Total Quality Control?, D. J.
Lu (trans.), New Jersey: Prentice Hall, ISBN 0139524339.
Juran, J. M. 1990. Quality Handbook, 5th Edition, McGrawHill.
Kane, V.E. 1986. Process Capability Indices, Journal of
Quality Technology, Vol. 18,
pp. 41-52.

[8]

Lillrank, P. and Kujala, J. 2006. Managing common and


specific causes of quality problems in project-based
organizations, International Journal of Productivity and
Quality Management, Vol. 1, No-1/2, pp. 56-68.
[9] Nelson, C. S. 1984. The Shewhart Control Charts- Test for
special causes, Journal of Quality Technology, 16, pp. 237239.
[10] Prajapati, D. R. and Mahapatra, P. B. 2007. An Effective Joint
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International Journal of Productivity and Quality Management,
Vol. 2, No. 2, pp. 459-474.

234

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APPENDIX: A
Table 1A Observation of outer diameter of shocker seal for after the case study

S.
NO.
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50

X1
62.05
62.04
61.99
62.04
62.05
62.08
61.92
61.93
61.9
62.02
62.01
62.07
62.04
61.96
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
62.03

X2
62.05
61.96
61.98
62.02
62.04
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06

X3
62.04
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.07
61.98
61.95
62.05
62.04
61.99
62.04
62.05
62.08
61.92
61.93
61.9
62.02
62.01
61.94
62.04
61.98
62.02

X4
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
62.02
62.05
61.96

X
62.0475
62.0025
62
62.0325
62.045
62.0075
61.9625
61.98
61.985
62.0225
62.0275
62.04
61.9775
61.9725
61.985
62.005
61.9925
62.02
61.99
61.9975
61.985
62.0025
61.9825
62.0225
62.0275
61.9975
62
62.0025
62.02
62.0025
61.99
61.9975
61.9825
61.9825
61.985
62.0125
62.0025
62.0025
62.045
62.0075
62.0125
61.96
61.9575
61.9825
62.0375
62
61.9725
62.0325
62.0025
62.0175

235

R
0.01
0.08
0.06
0.03
0.01
0.12
0.07
0.14
0.14
0.11
0.04
0.1
0.12
0.09
0.15
0.11
0.09
0.1
0.07
0.08
0.09
0.08
0.05
0.13
0.08
0.1
0.1
0.15
0.08
0.09
0.03
0.09
0.15
0.01
0.11
0.15
0.07
0.03
0.05
0.13
0.11
0.07
0.06
0.14
0.1
0.07
0.08
0.03
0.08
0.1

International Journal of Emerging Technology and Advanced Engineering


Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
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61.97

62.05

62.07

61.98

62.0175

0.1

52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
71
72
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91
92
93
94
95
96
97
98
99
100
101
102
103
104
105
106
107
108
109
110

61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
62.05
61.92

62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.93
62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96
61.97
61.94
61.98
62.02
61.98
62.02
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04

62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
62.05
61.98
61.95
61.97
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
62.05
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96

61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.99
62.04
62.02
62.05
62.01
62.04
62.06
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95

62.01
62.01
62.04
62.03
61.9825
61.98
61.985
62.0375
61.995
62.005
61.9925
62.0225
62
62.01
62.0275
61.975
61.9875
62.0175
61.9925
62.015
61.9875
62.025
61.9775
61.995
62.0225
62.0375
62.0075
61.9925
62
61.9925
61.995
61.9875
62.0175
61.9975
61.9725
61.9975
62.015
62.01
62.0125
62.04
61.98
62.005
62.025
62.0025
62
62.005
61.98
62.0075
62.0325
61.9725
61.97
61.9975
62.0075
62.0175
61.9925
61.98
62.0375
62.035
61.9675

0.07
0.08
0.04
0.03
0.14
0.07
0.08
0.08
0.12
0.08
0.12
0.1
0.12
0.15
0.08
0.1
0.15
0.08
0.09
0.13
0.08
0.15
0.14
0.11
0.04
0.1
0.1
0.09
0.07
0.11
0.08
0.07
0.09
0.09
0.12
0.17
0.06
0.09
0.11
0.07
0.14
0.08
0.06
0.12
0.09
0.09
0.07
0.07
0.11
0.02
0.08
0.05
0.08
0.11
0.1
0.07
0.06
0.09
0.12

236

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Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
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61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
62.03
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.07
61.98
61.95
62.05
62.04
61.99
62.04
62.05
62.08
61.92
61.93
61.9
62.02
62.01
61.94
62.04
61.98
62.02
62.07
62.04

61.98
62.02
62.05
61.96
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
61.94
61.97
61.99
62.04
62.05
61.98
62.02
62.05
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.97
61.94
61.98
62.02
62.02
62.05
62.01
62.06
62.02
61.94

62.01
62.03
61.92
61.98
62.02
62.05
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07

61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92

61.9825
61.9975
61.9775
61.97
62.025
62.0025
62.0025
62.0175
61.99
62.0275
61.9925
61.975
61.9975
62.0025
62.015
61.9875
62.015
62.005
62.02
62.0275
61.99
61.9975
62.0025
61.98
61.99
62.0025
61.985
61.99
62
62.0325
61.995
61.99
61.9525
62
62.01
62.005
61.985
62
62.04
62.02
62.0125
62
62.0175
62.035
62.0475
62.025
62.02
61.985
61.99
61.96
61.9775
61.9825
62
62.02
62.0025
62.015
61.9625
62.0275
62.0325
61.9925

237

0.04
0.07
0.13
0.14
0.1
0.08
0.12
0.06
0.06
0.09
0.1
0.05
0.09
0.08
0.06
0.1
0.13
0.09
0.13
0.07
0.12
0.13
0.07
0.1
0.04
0.07
0.15
0.14
0.1
0.07
0.11
0.15
0.08
0.05
0.11
0.15
0.04
0.09
0.07
0.07
0.14
0.16
0.1
0.04
0.03
0.06
0.08
0.09
0.14
0.06
0.09
0.15
0.1
0.11
0.13
0.12
0.11
0.05
0.06
0.15

International Journal of Emerging Technology and Advanced Engineering


Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
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61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
62.05
61.98
61.95
61.97
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
62.02
62.05
61.96
61.98
61.97
62.02
62.05
62.01
62.06

62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
62.05
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.97
61.94
61.98
62.02
62.05
61.95

62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96
61.97
61.94
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.93

61.98
62.02
62.01
61.96
61.97
61.94
61.98
62.02
61.97
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.97
61.99
62.02
62.05
62.01
62.02
61.97
62.03
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.99
61.95
62.01
62.07

61.9975
62.015
62.035
61.955
61.99
61.96
62.0175
62
61.9825
61.9775
61.9675
62
62.02
62.0225
61.97
62.0025
62.01
61.995
62.005
62.0175
61.995
61.9975
62.005
61.99
62.0125
61.99
61.9875
62.01
61.9975
61.9975
61.9825
62.025
62.0325
62.01
61.9925
61.995
61.9775
61.9875
62.0075
62.0075
61.9825
62.025
62.04
62.0125
62.0275
62.03
62.0225
62.025
62.055
62.0375
61.98
61.9975
61.9925
61.985
61.9875
62.01
62.0175
62
62
62.0025

238

0.08
0.07
0.07
0.06
0.15
0.12
0.07
0.13
0.15
0.05
0.07
0.07
0.14
0.1
0.07
0.08
0.12
0.07
0.12
0.08
0.07
0.12
0.11
0.13
0.07
0.11
0.15
0.08
0.09
0.13
0.14
0.1
0.04
0.11
0.05
0.07
0.13
0.1
0.06
0.1
0.04
0.08
0.03
0.07
0.09
0.07
0.1
0.03
0.03
0.03
0.1
0.08
0.08
0.06
0.08
0.14
0.1
0.1
0.12
0.14

International Journal of Emerging Technology and Advanced Engineering


Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
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62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.99
62.04
62.02
62.05
62.01
62.04
62.06
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01

61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93

62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96
61.97
61.94
61.98
62.02
61.98
62.02
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
62.02
62.05
61.96
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02

62.04
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
62.03
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.02
61.94

62.0125
62
62.03
61.9925
62.0325
62.02
62.01
61.9775
61.97
62.04
61.97
62
61.99
62.0125
62
61.9975
62.015
61.9825
61.9875
61.97
61.9925
62.005
62.01
61.98
62.0125
62.0075
61.96
61.985
62.005
61.975
61.9525
61.985
61.9725
62.0075
62.015
61.99
61.9975
62.015
62.0025
61.9975
62.01
61.975
62.025
62.0375
62.005
62.0025
62.035
62.025
61.9825
61.99
62.01
62.025
62.01
61.9775
61.9975
62.015
61.9925
62.0075
62
61.975

239

0.07
0.13
0.1
0.06
0.04
0.12
0.16
0.09
0.12
0.03
0.09
0.15
0.06
0.12
0.07
0.1
0.13
0.1
0.1
0.07
0.05
0.13
0.14
0.06
0.08
0.08
0.07
0.09
0.08
0.08
0.12
0.15
0.1
0.1
0.11
0.05
0.08
0.11
0.11
0.09
0.07
0.06
0.03
0.1
0.06
0.11
0.03
0.08
0.1
0.1
0.07
0.11
0.08
0.06
0.09
0.06
0.12
0.18
0.04
0.09

International Journal of Emerging Technology and Advanced Engineering


Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
291
292
293
294
295
296
297
298
299
300
301
302
303
304
305
306
307
308
309
310
311
312
313
314
315
316
317
318
319
320
321
322
323
324
325
326
327
328
329
330
331
332
333
334
335
336
337
338
339
340
341
342
343
344
345
346
347
348
349
350

62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96
61.97
61.94

61.9
62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.9
62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96

61.96
62.08
61.98
62.02
62.05
61.92
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
61.94
61.97
61.99
62.04
62.05
61.98
62.02
62.05
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.97
61.94
61.98
62.02
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96
62.08
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.96

62.04
61.98
62.02
61.98
61.95
61.97
62.01
62.04
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
61.98
62.02
62.05
61.92
61.97
61.96
62.01
62.04
62.08
61.98
61.95
62.02
61.97
62.03
61.97
61.99
62.02
62.05
62.04
61.99
61.95
62.01
62.07
62.04
61.98
61.97
62.02
62.05
62.01
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.05
61.97
61.99

61.9925
62.0225
61.9925
62.01
61.9875
61.98
61.9975
61.99
61.9925
62.0025
62.0275
62.0475
62.0375
62.01
61.995
61.99
61.9725
61.975
62.005
62.0275
61.9925
62.0025
62.0475
62.0225
61.98
61.985
62
62.0075
62.0075
62.0275
62.005
62.045
62.005
62.0075
61.9875
61.96
61.9775
61.985
62.0375
62.0075
62.0075
62
62.0075
62.0025
61.97
62.01
61.9925
62.0225
61.9975
62.04
62.0125
62.0075
62.0125
61.97
61.975
61.97
62.005
62.0175
62.0075
61.9625

240

0.17
0.1
0.06
0.1
0.11
0.13
0.16
0.07
0.13
0.15
0.03
0.07
0.09
0.09
0.08
0.08
0.1
0.03
0.07
0.08
0.1
0.07
0.05
0.16
0.05
0.11
0.16
0.13
0.18
0.09
0.1
0.05
0.12
0.08
0.15
0.09
0.09
0.15
0.05
0.03
0.12
0.04
0.13
0.07
0.08
0.08
0.07
0.08
0.12
0.11
0.11
0.08
0.09
0.11
0.11
0.1
0.04
0.09
0.11
0.05

International Journal of Emerging Technology and Advanced Engineering


Website: www.ijetae.com (ISSN 2250-2459, Volume 2, Issue 3, March 2012)
351
352
353
354
355
356
357
358
359
360
361
362
363
364
365
366
367
368
369
370
371
372
373
374
375
376
377
378
379
380
381
382
383
384
385
386
387
388
389
390
391
392
393
394
395
396
397
398
399
400

61.98
62.02
61.97
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96
61.97
61.94
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98

62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.9
62.02
62.01
62.07
61.95
62.01
62.07
62.04
61.98
62.02
62.05
61.96
61.98
61.97
62.02
62.05
62.01
62.06
62.02
61.94
62.04
61.98
62.02
61.96

61.97
61.97
61.99
62.04
62.05
61.98
62.02
61.93
61.93
62.02
62.01
62.07
62.01
62.05
62.08
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
62.02
62.05
61.95
61.97
62.07
62.04
61.96
62.01
62.03
61.92
61.98
62.02
62.01
61.96
61.97
61.94
61.98
62.02
61.98
62.02
62.02
62.05
62.04
61.99

62.02
62.05
62.04
61.99
61.95
62.01
61.98
61.95
62.02
61.97
61.94
61.98
62.02
62.05
61.98
61.95
61.97
61.98
61.93
61.9
62.02
62.01
62.07
62.01
61.96
61.97
61.94
61.98
61.98
61.97
62.02
62.05
62.01
62.06
62.05
62.04
62.04
62.05
62.04
61.96
61.97
61.97
61.99
62.04
62.05
62.08
61.98
61.93
61.9
62.02

Total

61.995
62.0275
62.0025
62.0125
62.005
61.9875
61.9875
61.9575
61.98
61.9925
62.0225
62.025
61.9875
62.02
62.0075
61.9575
61.975
61.9875
61.9775
61.96
62.0325
62
61.9725
62.0025
61.985
61.985
61.9675
62.0025
61.9775
61.9875
62.005
62.02
62.0025
62.0325
62.0275
61.9975
62.0325
62.02
62.0175
61.9825
62.0025
62
61.985
62.0225
62.005
62.0075
62.02
62.0025
62.01
61.9875

0.05
0.1
0.07
0.08
0.14
0.03
0.09
0.15
0.09
0.05
0.13
0.09
0.06
0.08
0.14
0.06
0.09
0.15
0.09
0.11
0.1
0.1
0.17
0.05
0.09
0.15
0.12
0.09
0.06
0.13
0.12
0.07
0.11
0.05
0.07
0.12
0.08
0.09
0.06
0.08
0.08
0.11
0.05
0.09
0.08
0.14
0.06
0.12
0.18
0.06

24800.7

36.82

-----------------------------------

241

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