TIL111M, TIL117M, MOC8100M General Purpose 6-Pin Phototransistor Optocouplers
TIL111M, TIL117M, MOC8100M General Purpose 6-Pin Phototransistor Optocouplers
TIL111M, TIL117M, MOC8100M General Purpose 6-Pin Phototransistor Optocouplers
I
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2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2
September 2009
TIL111M, TIL117M, MOC8100M
General Purpose 6-Pin Phototransistor Optocouplers
Features
UL recognized (File # E90700)
VDE recognized (File #102497 for white package)
Add option V (e.g., TIL111VM)
Applications
Power supply regulators
Digital logic inputs
Microprocessor inputs
Appliance sensor systems
Industrial controls
General Description
The MOC8100M, TIL111M and TIL117M optocouplers
consist of a gallium arsenide infrared emitting diode
driving a silicon phototransistor in a 6-pin dual in-line
package.
Schematic Package Outlines
CATHODE 2
NC 3
ANODE 1
5 COLLECTOR
6 BASE
4 EMITTER
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 2
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol Parameter Device Value Units
TOTAL DEVICE
T
STG
Storage Temperature All -40 to +150 C
T
OPR
Operating Temperature All -40 to +100 C
T
SOL
Lead Solder Temperature All 260 for 10 sec C
P
D
Total Device Power Dissipation @ T
A
= 25C
Derate above 25C
All 250 mW
2.94 mW/C
EMITTER
I
F
DC/Average Forward Input Current All 60 mA
V
R
Reverse Input Voltage TIL111M 3 V
MOC8100M, TIL117M 6
I
F
(pk) Forward Current Peak (300s, 2% Duty Cycle) All 3 A
P
D
LED Power Dissipation @ T
A
= 25 C
Derate above 25C
All 120 mW
1.41 mW/C
DETECTOR
V
CEO
Collector-Emitter Voltage All 30 V
V
CBO
Collector-Base Voltage All 70 V
V
ECO
Emitter-Collector Voltage TIL111M, TIL117M 7 V
V
EBO
Emitter-Base Voltage All 7
P
D
Detector Power Dissipation @ T
A
= 25 C
Derate above 25C
All 150 mW
1.76 mW/C
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 3
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Electrical Characteristics
(T
A
= 25C unless otherwise specified.)
Individual Component Characteristics
*All Typical values at T
A
= 25C
Symbol Parameter Test Conditions Device Min. Typ.* Max. Unit
EMITTER
V
F
Input Forward Voltage I
F
= 16mA T
A
= 25C TIL111M 1.2 1.4 V
I
F
= 10mA for
MOC8100M,
I
F
= 16mA; for
TIL117M
T
A
= 0C70C MOC8100M,
TIL117M
1.2 1.4
T
A
= -55C 1.32
T
A
= +100C 1.10
I
R
Reverse Leakage Current V
R
= 3.0V TIL111M, TIL117M 0.001 10 A
V
R
= 6.0V MOC8100M 0.001 10 A
DETECTOR
BV
CEO
Collector-Emitter
Breakdown Voltage
I
C
= 1.0mA, I
F
= 0 All 30 100 V
BV
CBO
Collector-Base
Breakdown Voltage
I
C
= 10A, I
F
= 0 All 70 120 V
BV
EBO
Emitter-Base Breakdown
Voltage
I
E
= 10A, I
F
= 0 All 7 10 V
BV
ECO
Emitter-Collector
Breakdown Voltage
I
F
= 100A, I
F
= 0 TIL111M, TIL117M 7 10 V
I
CEO
Collector-Emitter Dark
Current
V
CE
= 10V, I
F
= 0 TIL111M, TIL117M 1 50 nA
V
CE
= 5V, T
A
= 25C MOC8100M 0.5 25 nA
V
CE
= 30V, I
F
= 0, T
A
= 70C TIL117M,
MOC8100M
0.2 50 A
I
CBO
Collector-Base Dark
Current
V
CB
= 10V TIL111M, TIL117M 20 nA
I
CBO
V
CB
= 5V MOC8100M 10 nA
C
CE
Capacitance V
CE
= 0V, f = 1MHz All 8 pF
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 4
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Electrical Characteristics
(Continued) (T
A
= 25C unless otherwise specified.)
Transfer Characteristics
Isolation Characteristics
*All Typical values at T
A
= 25C
Symbol Parameter Test Conditions Device Min Typ* Max Unit
DC CHARACTERISTICS
CTR
CE
Current Transfer Ratio,
Collector to Emitter
I
F
= 10mA, V
CE
= 10V TIL117M 50 %
I
F
= 1mA, V
CE
= 5V MOC8100M 50 %
I
F
= 1mA, V
CE
= 5V,
T
A
= 0C to +70C
30
I
C(ON)
On-State Collector Current
(Phototransistor Operation)
I
F
= 16mA, V
CE
= 0.4V TIL111M 2 mA
On-State Collector Current
(Photodiode Operation)
I
F
= 16mA, V
CB
= 0.4V 7 A
V
CE (SAT)
Collector-Emitter Saturation
Voltage
I
C
= 500A, I
F
= 10mA TIL117M 0.4 V
I
C
= 2mA, I
F
= 16mA TIL111M 0.4
I
C
= 100A, I
F
= 1mA MOC8100M 0.5
AC CHARACTERISTICS
T
ON
Turn-On Time I
C
= 2mA, V
CC
= 10V,
R
L
= 100
(Fig. 11)
MOC8100M 20 s
TIL117M 10
T
OFF
Turn-Off Time MOC8100M 20 s
TIL117M 10
t
r
Rise Time MOC8100M
TIL117M
2 s
t
f
Fall Time 2
t
r
Rise Time
(Phototransistor Operation)
I
C(ON)
= 2mA, V
CC
= 10V,
R
L
= 100
(Fig. 11)
TIL111M 10 s
t
f
Fall Time
(Phototransistor Operation)
Symbol Characteristic Test Conditions Min. Typ.* Max. Units
V
ISO
Input-Output Isolation Voltage
f = 60Hz, t = 1 sec. 7500 V
AC(rms)
R
ISO
Isolation Resistance V
I-O
= 500 VDC 10
11
C
ISO
Isolation Capacitance
V
I-O
= 0,
f = 1MHz 0.2 pF
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 5
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Safety and Insulation Ratings
As per IEC 60747-5-2, this optocoupler is suitable for safe electrical insulation only within the safety limit data.
Compliance with the safety ratings shall be ensured by means of protective circuits.
Symbol Parameter Min. Typ. Max. Unit
Installation Classications per DIN VDE 0110/1.89
Table 1
For Rated Main Voltage < 150Vrms I-IV
For Rated Main voltage < 300Vrms I-IV
Climatic Classication 55/100/21
Pollution Degree (DIN VDE 0110/1.89) 2
CTI Comparative Tracking Index 175
V
PR
Input to Output Test Voltage, Method b,
V
IORM
x 1.875 = V
PR
, 100% Production Test
with tm = 1 sec, Partial Discharge < 5pC
1594 V
peak
Input to Output Test Voltage, Method a,
V
IORM
x 1.5 = V
PR
, Type and Sample Test
with tm = 60 sec, Partial Discharge < 5pC
1275 V
peak
V
IORM
Max. Working Insulation Voltage 850 V
peak
V
IOTM
Highest Allowable Over Voltage 6000 V
peak
External Creepage 7 mm
External Clearance 7 mm
Insulation Thickness 0.5 mm
RIO Insulation Resistance at Ts, V
IO
= 500V 10
9
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 6
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Typical Performance Characteristics
Fig. 2 Normalized CTR vs. Forward Current
I
F
FORWARD CURRENT (mA)
0 2 4 6 8 10 12 14 16 18 20
N
O
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A
L
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D
C
T
R
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
V
CE
= 5.0V
T
A
= 25C
Normalized to
I
F
= 10mA
Fig. 3 Normalized CTR vs. Ambient Temperature
T
A
AMBIENT TEMPERATURE (C)
-60 -40 -20 0 20 40 60 80 100
N
O
R
M
A
L
I
Z
E
D
C
T
R
0.2
0.4
0.6
0.8
1.0
1.2
1.4
I
F
= 5mA
I
F
= 10mA
I
F
= 20mA
Normalized to:
I
F
= 10mA
T
A
= 25C
Fig. 4 CTR vs. RBE (Unsaturated)
R
BE
BASE RESISTANCE (k)
N
O
R
M
A
L
I
Z
E
D
C
T
R
(
C
T
R
R
B
E
/
C
T
R
R
B
E
(
O
P
E
N
)
)
10 100 1000
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
V
CE
= 5.0V
I
F
= 20mA
I
F
= 10mA
I
F
= 5mA
Fig. 5 CTR vs. RBE (Saturated)
R
BE
BASE RESISTANCE (k)
N
O
R
M
A
L
I
Z
E
D
C
T
R
(
C
T
R
R
B
E
/
C
T
R
R
B
E
(
O
P
E
N
)
)
10 100 1000
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
I
F
= 20mA
I
F
= 10mA
I
F
= 5mA
V
CE
= 0.3V
I
F
LED FORWARD CURRENT (mA)
V
F
F
O
R
W
A
R
D
V
O
L
T
A
G
E
(
V
)
Fig. 1 LED Forward Voltage vs. Forward Current
1 10 100
1.0
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
T
A
= 25C
T
A
= -55C
T
A
= 100C
0.01 0.1 1 10
0.001
0.01
0.1
1
10
100
I
F
= 5mA
I
F
= 20mA
I
F
= 10mA
Fig. 6 Collector-Emitter Saturation Voltage vs Collector Current
I
C
- COLLECTOR CURRENT (mA)
V
C
E
(
S
A
T
)
C
O
L
L
E
C
T
O
R
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M
I
T
T
E
R
S
A
T
U
R
A
T
I
O
N
V
O
L
T
A
G
E
(
V
)
I
F
= 2.5mA
T
A
= 25C
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 7
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Typical Performance Characteristics (Continued)
10 100 1000 10000 100000
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
1.2
1.3
1.4
V
CC =
10V
I
C
= 2mA
R
L
= 100
N
O
R
M
A
L
I
Z
E
D
t
o
f
f
(
t
o
f
f
(
R
B
E
)
/
t
o
f
f
(
o
p
e
n
)
)
R
BE
BASE RESISTANCE (k)
Fig. 9 Normalized t
off
vs. R
BE
Figure 11. Switching Time Test Circuit and Waveforms
Fig. 10 Dark Current vs. Ambient Temperature
S
W
I
T
C
H
I
N
G
S
P
E
E
D
(
s
)
Fig. 7 Switching Speed vs. Load Resistor
R LOAD RESISTOR (k)
0.1 1 10 100
0.1
1
10
100
1000
T
off
T
on
T
f
I
F
= 10mA
V
CC
= 10V
T
A
= 25C
T
r
R
BE
BASE RESISTANCE (k)
N
O
R
M
A
L
I
Z
E
D
t
o
n
(
t
o
n
(
R
B
E
)
/
t
o
n
(
o
p
e
n
)
)
Fig. 8 Normalized t
on
vs. R
BE
10 100 1000 10000 100000
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
V
CC =
10V
I
C
= 2mA
R
L
= 100
T
A
AMBIENT TEMPERATURE (C)
0 20 40 60 80 100
I
C
E
O
C
O
L
L
E
C
T
O
R
-
E
M
I
T
T
E
R
D
A
R
K
C
U
R
R
E
N
T
(
n
A
)
0.001
0.01
0.1
1
10
100
1000
V
CE
= 10V
T
A
= 25C
OUTPUT PULSE
INPUT PULSE
TEST CIRCUIT WAVEFORMS
tr tf
INPUT
IF RL
RBE
VCC = 10V
OUTPUT
ton
10%
90%
toff
IC
Adjust IF to produce IC = 2mA
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 8
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Package Dimensions
8.138.89
6.106.60
Pin 1
6 4
1 3
0.250.36
5.08 (Max.)
3.283.53
0.38 (Min.) 2.543.81
2.54 (Bsc) (0.86)
0.410.51
1.021.78
0.761.14
8.138.89
6.106.60
Pin 1
6 4
1 3
0.250.36
5.08 (Max.)
3.283.53
0.38 (Min.) 2.543.81
2.54 (Bsc) (0.86)
0.410.51
1.021.78
0.761.14
7.62 (Typ.)
15 (Typ.)
0.200.30
0.200.30
10.1610.80
Through Hole 0.4" Lead Spacing
Surface Mount
Rcommended Pad Layout
(1.78)
(2.54)
(1.52)
(7.49)
(10.54)
(0.76)
8.138.89
Note:
All dimensions in mm.
6.106.60
8.439.90
Pin 1
6 4
1 3
0.250.36
2.54 (Bsc)
(0.86)
0.410.51
1.021.78
0.761.14
0.38 (Min.)
3.283.53
5.08
(Max.)
0.200.30
0.160.88
(8.13)
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 9
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Ordering Information
Marking Information
Option
Order Entry Identier
(Example) Description
No option TIL111M Standard Through Hole Device
S TIL111SM Surface Mount Lead Bend
SR2 TIL111SR2M Surface Mount; Tape and Reel
T TIL111TM 0.4" Lead Spacing
V TIL111VM VDE 0884
TV TIL111TVM VDE 0884, 0.4" Lead Spacing
SV TIL111SVM VDE 0884, Surface Mount
SR2V TIL111SR2VM VDE 0884, Surface Mount, Tape and Reel
TIL111
1
2
6
4 3 5
*Note Parts that do not have the V option (see definition 3 above) that are
marked with date code 325 or earlier are marked in portrait format.
Denitions
1 Fairchild logo
2 Device number
3
VDE mark (Note: Only appears on parts ordered with VDE
option See order entry table)
4 One digit year code, e.g., 7
5 Two digit work week ranging from 01 to 53
6 Assembly package code
V X YY Q
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 10
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Carrier Tape Specification
Reflow Profile
4.0 0.1
1.5 MIN
User Direction of Feed
2.0 0.05
1.75 0.10
11.5 1.0
24.0 0.3
12.0 0.1
0.30 0.05
21.0 0.1
4.5 0.20
0.1 MAX 10.1 0.20
9.1 0.20
1.5 0.1/-0
300
280
260
240
220
200
180
160
140
120
100
80
60
40
20
0
C
Time (s)
0 60 180 120 270
260C
>245C = 42 Sec
Time above
183C = 90 Sec
360
1.822C/Sec Ramp up rate
33 Sec
2005 Fairchild Semiconductor Corporation www.fairchildsemi.com
TIL111M, TIL117M, MOC8100M Rev. 1.0.2 11
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QFET
QS
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STEALTH
SuperFET
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SyncFET
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*
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XS
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FAIRCHILDSEMICONDUCTORRESERVESTHERIGHTTOMAKECHANGESWITHOUTFURTHERNOTICETOANYPRODUCTSHEREINTOIMPROVE
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Datasheet contains the design specifications for product development. Specifications may change in
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The datasheet is for reference information only.
Rev. I40
First Production
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