Electronic Devices: EEE F214
Electronic Devices: EEE F214
Electronic Devices: EEE F214
EEE F214
Lecture 7-9
Dr. Navneet Gupta
Nc Nv e
E g / 2 kT
Lecture-7
Example:2
A Si sample is doped with 1017 As atoms/cm3. What is the
equilibrium hole concentration po at 300K? Where is EF relative
to Ei?
Ionization of Impurities
Example-4
Consider a phosphorus-doped Si sample at 300K with ND =
1017 cm-3. What fraction of the donors are not ionized?
Answer: Suppose all of the donor atoms are ionized.
Nc
EF Ec kT ln
146meV
no
1
Probability of non-ionization
1 ( ED EF )/ kT
1 e
2
1
0.039 3.9%
1 (146 meV 45 meV )/26 meV
1 e
2
Dr. Navneet Gupta
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Lecture-8
Compensated Semiconductor
A compensated semiconductor is one that contains both donor
and acceptor impurity atoms in the same region.
Can be formed, e.g, by diffusing acceptor impurities into an ntype material, or by diffusing donor impurities into a p-type
material.
N-type compensated sc: Nd>Na
P-type compensated sc: Na>Nd
If Na = Nd, compensated sc has characteristics of an intrinsic
material
p0 N d n0 N a
Nd Na
Nd Na
2
n0
ni
2
2
n0 N d N a
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Example:5
Determine the thermal equilibrium electron and hole
concentration in a compensated p-type semiconductor.
Consider Si at 300K doped in which doping concentrations
are Na = 2 x 1016 cm-3 and Nd = 5 x 1015 cm-3 .
Comment: This example illustrates the fact that if we
assume complete ionization and if Na - Nd >> ni, then
majority-carrier hole conc. is, to a very good approx., just
the difference between the acceptor and donor impurity
conc.
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Semiconductor
Net
movement
DRIFT
Random thermal motion
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*
m
With every collision, the electron loses momentum =
n vd
mn*vd = (-q)Etmn
m n (cm2/Vs)
m p (cm2/Vs)
Si
1350
Ge
3900
GaAs
8500
InAs
30000
480
1900
400
500
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Current density:
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Example:4
At 300K a Si specimen of length 2 cm and cross section 2
mm2 is doped with 1017 atoms of As and 9 x 10 16 atoms of B.
Take n = 510 cm2/V-sec and p = 187 cm2/V-sec. Find the
resistance and the conductivity of the sample.
Answer= R = 122.55 ohms and = 0.816 per ohm cm
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Lecture-9
m L T 3/2
1 1 1
......
m m1 m 2
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Effect of doping
on mobility
At 300K:
n (intrinsic Si) = 1350 cm2/V-sec
Figure
Mobilities in Si and GaAs at 300
K as a function of impurity
concentration.
Dr. Navneet Gupta
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Example:7
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Example:8
A sample of Si is doped with 1017 phosphorous atoms/cm3.
What would you expect to measure for its resistivity? What
Hall voltage you expect in a sample 100m thick if Ix = 1 mA
and Bz=1kG
Answer: -62.5 V
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Material
2
N1(E)
N2(E)
At thermal equilibrium: no current
f1(E)
and therefore
no f2(E)
net charge
transport and no net transfer of
energy
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END OF
CHAPTER-3
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