CRAN - Package Spatstat
CRAN - Package Spatstat
CRAN - Package Spatstat
Comprehensive open-source toolbox for analysing Spatial Point Patterns. Focused mainly on two-dimensional
point patterns, including multitype/marked points, in any spatial region. Also supports three-dimensional point
patterns, space-time point patterns in any number of dimensions, point patterns on a linear network, and patterns
of other geometrical objects. Supports spatial covariate data such as pixel images. Contains over 2000 functions
for plotting spatial data, exploratory data analysis, model-fitting, simulation, spatial sampling, model
diagnostics, and formal inference. Data types include point patterns, line segment patterns, spatial windows,
pixel images, tessellations, and linear networks. Exploratory methods include quadrat counts, K-functions and
their simulation envelopes, nearest neighbour distance and empty space statistics, Fry plots, pair correlation
function, kernel smoothed intensity, relative risk estimation with cross-validated bandwidth selection, mark
correlation functions, segregation indices, mark dependence diagnostics, and kernel estimates of covariate
effects. Formal hypothesis tests of random pattern (chi-squared, Kolmogorov-Smirnov, Monte Carlo, Diggle-
Cressie-Loosmore-Ford, Dao-Genton, two-stage Monte Carlo) and tests for covariate effects (Cox-Berman-
Waller-Lawson, Kolmogorov-Smirnov, ANOVA) are also supported. Parametric models can be fitted to point
pattern data using the functions ppm(), kppm(), slrm(), dppm() similar to glm(). Types of models include
Poisson, Gibbs and Cox point processes, Neyman-Scott cluster processes, and determinantal point processes.
Models may involve dependence on covariates, inter-point interaction, cluster formation and dependence on
marks. Models are fitted by maximum likelihood, logistic regression, minimum contrast, and composite
likelihood methods. A model can be fitted to a list of point patterns (replicated point pattern data) using the
function mppm(). The model can include random effects and fixed effects depending on the experimental
design, in addition to all the features listed above. Fitted point process models can be simulated, automatically.
Formal hypothesis tests of a fitted model are supported (likelihood ratio test, analysis of deviance, Monte Carlo
tests) along with basic tools for model selection (stepwise(), AIC()). Tools for validating the fitted model include
simulation envelopes, residuals, residual plots and Q-Q plots, leverage and influence diagnostics, partial
residuals, and added variable plots.
Version: 1.55-1
Depends: R (≥ 3.3.0), spatstat.data (≥ 1.2-0), stats, graphics, grDevices, utils, methods, nlme, rpart
Imports: spatstat.utils (≥ 1.8-0), mgcv, Matrix, deldir (≥ 0.0-21), abind, tensor, polyclip (≥ 1.5-0),
goftest
Suggests: sm, maptools, gsl, locfit, spatial, rpanel, tkrplot, RandomFields (≥ 3.1.24.1),
RandomFieldsUtils (≥ 0.3.3.1), fftwtools (≥ 0.9-8)
Published: 2018-04-05
Author: Adrian Baddeley, Rolf Turner and Ege Rubak, with substantial contributions of code by
Kasper Klitgaard Berthelsen; Ottmar Cronie; Yongtao Guan; Ute Hahn; Abdollah Jalilian;
Marie-Colette van Lieshout; Greg McSwiggan; Tuomas Rajala; Suman Rakshit; Dominic
Schuhmacher; Rasmus Waagepetersen; and Hangsheng Wang. Additional contributions by
M. Adepeju; C. Anderson; Q.W. Ang; J. Astrom; M. Austenfeld; S. Azaele; M. Baddeley;
C. Beale; M. Bell; R. Bernhardt; T. Bendtsen; A. Bevan; B. Biggerstaff; A. Bilgrau; L.
Bischof; C. Biscio; R. Bivand; J.M. Blanco Moreno; F. Bonneu; J. Burgos; S. Byers; Y.M.
Chang; J.B. Chen; I. Chernayavsky; Y.C. Chin; B. Christensen; J.-F. Coeurjolly; K.
Colyvas; R. Constantine; R. Corria Ainslie; R. Cotton; M. de la Cruz; P. Dalgaard; M.
D'Antuono; S. Das; T. Davies; P.J. Diggle; P. Donnelly; I. Dryden; S. Eglen; A. El-Gabbas;
B. Fandohan; O. Flores; E.D. Ford; P. Forbes; S. Frank; J. Franklin; N. Funwi-Gabga; O.
Garcia; A. Gault; J. Geldmann; M. Genton; S. Ghalandarayeshi; J. Gilbey; J. Goldstick; P.
Grabarnik; C. Graf; U. Hahn; A. Hardegen; M.B. Hansen; M. Hazelton; J. Heikkinen; M.
Hering; M. Herrmann; P. Hewson; K. Hingee; K. Hornik; P. Hunziker; J. Hywood; R.
Ihaka; C. Icos; A. Jammalamadaka; R. John-Chandran; D. Johnson; M. Khanmohammadi;
R. Klaver; P. Kovesi; L. Kozmian-Ledward; M. Kuhn; J. Laake; F. Lavancier; T. Lawrence;
R.A. Lamb; J. Lee; G.P. Leser; A. Li; H.T. Li; G. Limitsios; A. Lister; B. Madin; M.
Maechler; J. Marcus; K. Marchikanti; R. Mark; J. Mateu; P. McCullagh; U. Mehlig; F.
https://cran.r-project.org/web/packages/spatstat/ 1/3
4/11/2018 CRAN - Package spatstat
Downloads:
Reverse dependencies:
Reverse depends: adaptsmoFMRI, aoristic, dbmss, Digiroo2, dixon, DSpat, ecespa, GriegSmith, idar,
latticeDensity, ppmlasso, rase, sclero, selectspm, SGCS, siar, siplab, sparr, SpatEntropy,
spatialsegregation, SpatialVx, spatstat.local
Reverse imports: ads, alphahull, BAT, Biolinv, colordistance, ConR, dpcR, ecospat, ETAS, gridsample, hht,
highriskzone, intamapInteractive, lgcp, lqr, MetaLandSim, mopa, NLMR, osmplotr, palm,
qlcVisualize, radiomics, replicatedpp2w, RImageJROI, rLiDAR, rust, smacpod, spatialEco,
spatialkernel, spatsurv, sppmix, SPUTNIK, stpp, surveillance, swfscMisc, trip, tweet2r,
windfarmGA
Reverse suggests: archdata, autoimage, bamlss, expp, GSIF, inlabru, ipdw, maptools, McSpatial, mobsim,
plotKML, polyCub, qle, sf, soil.spec, spatstat.data, spatstat.utils
Reverse enhances: imager
Linking:
https://cran.r-project.org/web/packages/spatstat/ 2/3
4/11/2018 CRAN - Package spatstat
https://cran.r-project.org/web/packages/spatstat/ 3/3