IV. Metal-Oxide Field-Effect Transistors (MOSFET) : ECE65 Lecture Notes (F. Najmabadi), Winter 2012
IV. Metal-Oxide Field-Effect Transistors (MOSFET) : ECE65 Lecture Notes (F. Najmabadi), Winter 2012
+
−
tached to the metal plate, electric charges, Q = Cv1 , appear on both
+ + + +
terminals of this device. Because the metal plate is positively charged Depletion
region
− − − −
and the electric field is strongest in the vicinity of the insulator/p- − − − −
− − − −
material interface, mobile holes in this regions are repelled, forming a
“depletion” region.
v1
If v1 is increased above a threshold value, Vt , electric field becomes
+
−
strong enough to pull electrons (minority carriers) to the insulator/p- + + + +
material interface. As the holes had been repelled from this region, an Inversion − − − −
layer
“inversion layer” is formed which contains electrons in the conduction Depletion
region
− − − −
− − − −
band. This layer or “channel” is a “virtual” n-type material.
cated on a p-type substrate (or Body). Two heavily doped SiO2 Metal
n-type regions (Source and Drain) are created in the sub- 111111111111
000000000000
n+ Channel region n+
strate. A thin (fraction of micron) layer of SiO2 , which is L
an excellent electrical insulator, is deposited on the p-type
material in between the source and drain regions. Metal is p−type substrate
vDS
vdrif t = µn |E| = µn
L p−type substrate
vDS as in that case, vGD = vGS − vDS ≈ vGS and the in-
vDS
duced channel is fairly uniform (i.e., has the same width v GS < Vt
|Q|
= 0.5[Cox W VOV + Cox W (VOV − vDS )] = 0.5Cox W (2VOV − vDS )
L
|Q| vDS W 2
iD = µn = µn Cox (2VOV vDS − vDS )
L L L
Note that for small vDS , the above equation for iD reduces to the one for a straight channel.
W 2 W 2
iD = 0.5µn Cox (2VOV VOV − VOV )VOV = 0.5µn Cox VOV
L L
If vDS is increased further, the channel pinched-off point remains very close to the drain and
iD remains approximately constant, given by the expression above. This case of vDS ≥ Vt is
called the “Saturation” mode.
Note that iD = f (vDS , vGS ) is a surface in the 3D-space of (iD , vGS , vDS ) as is shown below
(left). Projection of this surface on the iD -vDS plane (with vGS pointing into the paper) is
shown on the right. The three modes of operation of a MOS are identified on this figure:
1) Cut-off mode in which no channel exists (VOV < 0 for NMOS) and iD = 0 for any vDS .
2) Triode mode in which the channel is formed but not pinched off (VOV ≥ 0 and vDS ≤ VOV ).
3) Saturation mode in which the channel is formed and pinched off (VOV ≥ 0 and vDS ≥ VOV ).
the convention is that the drain current is flowing out of the drain and
subscripts for voltages are reversed (as is shown). S
A MOS is very similar to a BJT in that the applied voltage vGS controls iD flowing through
the drain-source circuit. As such, we can solve a MOS circuit utilizing a method similar to
that used for BJTs: Write down GS-KVL and DS-KVL, assume the MOS is in a particular
state, solve the circuit with the corresponding MOS equation and validate the assumption.
There are some differences, however:
1) A MOS is controlled with vGS and iG = 0. As such, typically no resistor is necessary in
the gate circuit (as opposed to an RB which was necessary for a BJT).
2) When MOS is in cut-off, iD = 0. However, iD = 0, does not mean that MOS is in
cut-off. This is a very important property that is utilized in the design of CMOS logic gates
(discussed in the next section).
To see this, assume that a MOS is in triode. Condition of iD = 0 gives:
W 2
iD = 0.5µn Cox [2VOV vDS − vDS ]=0 → vDS = 0
L
Since Vt > 0, MOS is ON. Assume the NMOS is in saturation (with λ = 0):
W 2
iD = 0.5µn Cox VOV = 0.5 × 0.5 × 10−3 × (4)2 = 4.0 mA
L
DS-KVL: VDD = RD iD + vDS
12 = 103 × 4 × 10−3 + vDS → vo = vDS = 8 V
Part C: vi = 12 V.
Since Vt > 0, the NMOS is ON. Assume the NMOS is in saturation (with λ = 0):
W 2
iD = 0.5µn Cox V = 0.5 × 0.5 × 10−3 × (10)2 = 25.0 mA
L OV
DS-KVL: VDD = RD iD + vDS
2 = 103 × 24 × 10−3 + vDS → vo = vDS = −13 V
Since vDS = −13 < VOV = 10 V, our assumption of saturation mode is NOT justified.
Assume the NMOS is in triode:
W 2 2
iD = 0.5µn Cox [2VOV vSD − vSD ] = 0.5 × 0.5 × 10−3 × (20vSD − vSD )
L
DS-KVL: 12 = 103 iD + vDS
The above two equations in two unknown can be solved by substituting for iD into DS-KVL:
The first root vDS = 21.8 > VOV = 10 V is not acceptable for a MOS in triode. The second
root is the correct one as vDS = 2.2 < VOV = 10 V.
Thus vo = vDS = 2.2 V.
We will find the transfer function of a MOS by examining the circuit below.
VDD
GS-KVL: vGS = vi RD
vi
While it may appear the a large RD is require to get “good” transfer function for a logic
gate, large RD reduces gate switching times considerably. NMOS digital gates are not used
today because of the CMOS technology offers a far superior circuit.
Complementary MOS technology employs pairs of NMOS and PMOS. CMOS devices are
more difficult to fabricate than NMOS ones. However, most of MOS circuits are based on
CMOS technology today because of the excellent properties of CMOS circuits (both analog
and digital).
The basic idea is to replace RD in the NMOS inverter circuit above with a PMOS. Recall
that in the NMOS inverter circuit, the transfer function would resembles an ideal inverter
for large RD (low vo in triode mode, rapid transistor from high to low state). The PMOS is
configured such that when vi is high (vo is low), it would act as an effectively infinite resistor.
Furthermore, When vi is low (vo is high), the PMOS acts as a small resistor thus allowing a
high switching speed.
• A Low state of 0 and a High state of VDD , thereby allowing for a maximum voltage
swing. These states are independent of MOS device parameters. As a result, the gate
has a wide noise margin.
• Zero static power consumption. i.e., iD = 0 when the gate is in one the two states. iD
is non-zero only during transition from state to another.
CMOS Inverter
We consider the response of the inverter to vi = 0 (low) and vi = VDD (high). Note that
vo = vDS1 = VDD − vDS2
VDD
Case 1: vi = 0
Since vGS1 = vi = 0 < Vtn , NMOS will be in cut-off. Therefore, iD1 = 0. Since vSG2 =
VDD − vi = VDD > |Vtp |, PMOS will be ON.
By KCL, iD2 = 0 implies iD1 = 0. Now, NMOS (Q1) is ON and iD1 = 0. Thus, NMOS
should be in triode with vDS1 = 0.
Then vo = vDS1 = 0.
The above analysis is valid as long as vi > VDD − |Vtp | (Q1 ON & Q2 OFF) vo remains at
vo = 0.
In sum, when vi = 0, vo = VDD and when vi = VDD , vo = 0. Therefore, this is an inverter (or
a NOT gate). Note that 1) the low and high states were NOT set by transistor parameters,
and 2) iD1 = iD2 = 0 and the gate has zero power consumption when in either state.
The transfer function of a CMOS inverter is shown below. From our analysis, when vi < Vtn ,
NMOS is OFF and PMOS is in triode. When vi becomes larger than Vtn , NMOS moves
from cut-off to saturation (PMOS still in triode). Increasing vi further leads to both MOS
to be in saturation. The, NMOS transistor moves to triode. Finally, when vi > VDD − |Vtp |
NMOS is in triode and PMOS is in cut-off.
When Vtn < vi < VDD − |Vtp | both MOS are ON (and one is in saturation), a current iD
would flow during the transition between high and low states (as shown below).
NMOS OFF
vo PMOS Triode
NMOS Saturation
PMOS Triode
NMOS Saturation
PMOS Saturation
NMOS Triode
PMOS Saturation
NMOS Triode
PMOS OFF
VDD − |Vtp | vi
Vtn
While vDS1 can be mathematically negative and still satisfy DS-KVL above, NMOS operation
requires vDS ≥ 0. Thus, Q2 should be OFF (however, this is not used in analysis below).
By KCL iD2 = iD1 = 0 and iD3 + iD4 = iD1 = 0. Since iD ≥ 0 for both PMOS and NMOS,
the last equation can be only satisfied if iD3 = iD4 = 0. We add values of iD to the table
above and look for transistors that are ON and have iD = 0. These transistors (Q3 and Q4)
have to be in triode mode with vSD3 = vSD4 = 0.
In this case, the state of Q2 is unknown. By KCL iD2 = iD1 = 0. Also, iD3 + iD4 = iD1 = 0
leading to iD3 = 0. We add values of iD to the table above and look for transistors that are
ON and have iD = 0. This transistor (Q3) have to be in triode mode with vSD3 = 0.
Finally, we find vo = VDD − vSD3 = VDD . So, when v1 is LOW and v2 is HIGH, the output
is HIGH.
We can go back and find the state of Q2. We will find Q2 to be OFF (left as an exercise).
v1 = VDD , v2 = 0
We used vDS1 ≥ 0 to find the state of Q2. By KCL iD1 = iD2 = 0. Also, iD3 + iD4 = iD2 = 0
leading to iD4 = 0. We add values of iD to the table above and look for transistors that
are ON and have iD = 0. These transistors (Q1 and Q4) have to be in triode mode with
vDS1 = vSD4 = 0.
By KCL iD2 = iD1 = iD3 + iD4 = 0. We add values of iD to the table above and look for
transistors that are ON and have iD = 0. As can be seen in equations below, Q1 is ON and
iD1 = 0. Thus, vDS1 = 0. We use this value to find that Q2 should also be ON.
Finally, vo = vDS1 + vDS1 = 0. So, when v1 is HIGH and v2 is HIGH, the output is LOW.
From the “truth table,” the output of this gate is LOW only if both input states are HIGH.
Therefore, this is a NAND gate.
i D1 i D2
Q1 Q2
Problems 1 to 4. Find iD (µn Cox (W/L)n = µp Cox (W/L)p = 0.4 mA/V2 , λ = 0, Vtn = 3 V
and Vtp = −3 V).
+ − + +
5V 5V
+ −
10V 1V
+ + + +
4V 1V 6V 4V
− − − − − −
Problem 5. Find VS (µn Cox (W/L)n = 0.5 mA/V2 , λ = 0, and Vtn = 0.8 V).
Problem 6. Consider this PMOS with µp Cox (W/L)p = 0.6 mA/V2 , λ = 0, and Vtp = −1 V.
A) For what values of VG , PMOS will be ON?, B) Find the range of VD for which PMOS is
in triode (answer in terms of VG ). C) Find the range of VD for which PMOS is in saturation
(answer in terms of VG ). D) If PMOS is in saturation with iD = 75 µA, find VOV , VG and
the corresponding range of VD .
Problem 7. Find iD and vDS (µCox (W/L) = 0.4 mA/V2 , λ = 0, and Vt = 3 V).
Problem 8. Find vSG , iD , and vSD (µp Cox (W/L)p = 0.4 mA/V2 , λ = 0, and Vtp = −3 V).
20V
1M 1k
7V 10V
7V
VS 5V
VG 1M 1k
1k
10 µ A
− VSS VD
15V 2.5V
1k 12V 1.8V RD
vi VD
R
vo
1M 2k
1k RS
− 15V − 2.5V
Problem 13. Find VD (µn Cox (W/L) = 0.5 mA/V2 , λ = 0, and Vt = 0.8 V).
Problem 14. Find V1 and V2 (µn Cox (W/L) = 5 mA/V2 , λ = 0, and Vt = 1 V).
Problem 15. Find iD and vDS for A) ignoring channel-width modulation (λ = 0) and B)
including channel-width modulation (λ = 0.05 V−1 ). NMOS has µn Cox (W/L) = 1 mA/V2
and Vt = 0.4 V.
Problem 16. Show that this circuit is a NOR gate with a LOW state of 0.2 V and a HIGH
state of 12 V (µn Cox (W/L)n = 0.5 mA/V2 , Vt = 1 V).
2.5V
Q2
12V
V1
5V 1.8V
10k
Q1
1k 5k
i1
VD V2 vo
v2 v1
1V
1k
Q2 Q1
− 2.5V
v1
Q6
Q6 Q5 Q4
v2
Q5 vo
v3 v3
Q4 Q3
vo
v2
Q2
Q1 Q2 Q3
v1
Q1
Problem 17 Problem 18
Problem 1. Find iD (µn Cox (W/L)n = µp Cox (W/L)p = 0.4 mA/V2 , λ = 0, Vtn = 3 V and
Vtp = −3 V).
+
This is a NMOS transistor with vGS = 4 V and vDS = 10 V.
10V
+
VOV = VGS − Vtn = 1 V VOV > 0 → MOS is ON 4V
− −
Problem 2. Find iD (µn Cox (W/L)n = µp Cox (W/L)p = 0.4 mA/V2 , λ = 0, Vtn = 3 V and
Vtp = −3 V).
−
This is a PMOS transistor with vSG = −1 V and vGD = 5 V. 5V
+
+
VOV = VSG − |Vtp | = −4 V 1V
−
Problem 3. Find iD (µn Cox (W/L)n = µp Cox (W/L)p = 0.4 mA/V2 , λ = 0, Vtn = 3 V and
Vtp = −3 V).
+
This is a PMOS transistor with vSG = 5 V and vGD = 6 V. 5V
−
+
VOV = VSG − |Vtp | = 2 V VOV > 0 → MOS is ON 6V
−
Since vDS = 1 = VOV = 1 V, NMOS is at the boundary of saturation and triode modes
(“edge of saturation”). We can use either formulas for iD . Saturation is simpler:
2
iD = 0.5µn Cox (W/L)n VOV = 0.5 × 0.4 × 10−3 (1)2 = 0.2 mA
Problem 5. Find VS (µn Cox (W/L)n = 0.5 mA/V2 , λ = 0, and Vtn = 0.8 V).
7V
Since iD = 10 µA, NMOS should be ON. Assume NMOS in saturation:
2
iD = 0.5µn Cox (W/L)n VOV VS
2
10 × 10−6 = 0.5 × 0.5 × 10−3 VOV → VOV = 0.2 V 10 µ A
− VSS
vGS = VOV + Vtn = 1 V
vGS = VG − VS = 0 − VS → VS = −1 V
vDS = VD − VS = 7 − (−1) = 8 V
Since vDS = 8 > VOV = 0.2 V, assume of MOS in saturation is correct and VS = −1 V.
Problem 6. Consider this PMOS with µp Cox (W/L)p = 0.6 mA/V2 , λ = 0, and Vtp = −1 V.
A) For what values of VG , PMOS will be ON?, B) Find the range of VD for which PMOS is
in triode (answer in terms of VG ). C) Find the range of VD for which PMOS is in saturation
(answer in terms of VG ). D) If PMOS is in saturation with iD = 75 µA, find VOV , VG and
the corresponding range of VD .
5V
Note: vSG = 5 − VG , vSD = 5 − VD , and VOV = vSG − |Vtp | = 4 − VG :
VG
VOV ≥ 0 → 4 − VG ≥ 0 → VG ≤ 4 V
vSD ≤ VOV
5 − VD ≤ 4 − VG → VD ≥ VG + 1
vSD ≥ VOV
5 − VD ≥ 4 − VG → VD ≤ VG + 1
Part D:
2 2
75 × 10−6 = iD = 0.5µp Cox (W/L)p VOV = 0.5 × 0.6 × 10−3 VOV → VOV = 0.5 V
vSG = VOV + |Vtp | = 1.5 V
vSG = 5 − VG = 1.5 V → VG = 3.5 V
Problem 7. Find iD and vDS (µCox (W/L) = 0.4 mA/V2 , λ = 0, and Vt = 3 V).
10V
3 3 3
GS-KVL: 7 = vGS + 10 iD = VOV + Vt + 10 iD → 4 = VOV + 10 iD 7V
2
0.2VOV + VOV − 4 = 0 → VOV = −7.62 V and VOV = 2.62 V
Negative root is unphysical (we need VOV > 0). Thus, VOV = 2.62 V (vGS = 5.62 V) and
Since vDS = 8.62 > VOV = 2.62 V, our assumption of NMOS in saturation is justified.
2
0.2VOV + VOV − 7 = 0 → VOV = −8.92 V and VOV = 3.92 V
Negative root is unphysical (we need VOV > 0). Thus, VOV = 3.92 V (vSG = 6.92 V) and
Sine vSD = 13.8 > VOV = 3.92 V, our assumption of PMOS in saturation is justified.
Problem 9. Find vGS , iD , and vDS (µn Cox (W/L)n = 0.4 mA/V2 , λ = 0, and Vtn = 3 V).
15V
2
0.2VOV + VOV − 12 = 0 → VOV = −10.64 V and VOV = 5.64 V
Sine vDS = 17.28 > VOV = 5.64, our assumption of NMOS in saturation is justified.
Problem 10. Find vo for vi = 12 V (µp Cox (W/L)p = 0.5 mA/V2 , λ = 0, and Vtp = −2 V).
12V
vSG = 12 − 0 = 12 V vi
2k
Since VOV > 0, assume PMOS in saturation:
2
iD = 0.5µp Cox (W/L)p VOV = 0.5 × 0.5 × 10−3 × (10)2 = 25 mA
DS-KVL: 12 = vSD + 2 × 103 iD → vSD = −38 V
Since vSD = −38 < VOV , PMOS is NOT in saturation. Assume PMOS in triode:
2
iD = 0.5µp Cox (W/L)p (2vSD VOV − vSD )
DS-KVL: 12 = vSD + 2 × 103 iD = vSD + 2 × 103 × 0.5 × 0.5 × 10−3 × (20vSD − vSD
2
)
2
→ 0.5vSD − 11vSD + 12 = 0 → vSD = 20.8 V and vSD = 1.15 V
Problem 11. Find R such that PMOS is in saturation with VOV = 0.6 V (µp Cox =
0.1 mA/V2 , (W/L) = 10/0.18, λ = 0, and Vtp = −0.4 V).
1.8V
2
iD = 0.5µp Cox (W/L)VOV = 0.5 × 10−3 × (10/0.18) × (0.6)2 = 10 mA
R
vGS = VG − VS = 0 − VS → VS = −1.5 V
− 2.5V
vDS = VD − VS = 0 − (−1.5) = 1.5 V
Problem 13. Find VD (µn Cox (W/L) = 0.5 mA/V2 , λ = 0, and Vt = 0.8 V).
5V
Since the gate is connected to the drain, vDS = vGS . This leads to vDS =
vGS > vGS − Vt = VOV . Thus, this transistor is always in saturation. This 1k
2
iD = 0.5µn Cox (W/L)VOV
DS-KVL 5 = 103 iD + vDS = 103 × 0.5 × 0.5 × 10−3 VOV
2
+ VOV + 0.8
2
0.25VOV + VOV − 4.2 = 0 → VOV = −6.56 V and VOV = 2.56 V
Negative root is unphysical (we need VOV > 0). Thus, VOV = 2.56 V and VD = vDS = vGS =
VOV + Vt = 3.36 V.
V1
2
iD = iD1 = 0.5µn Cox (W/L)VOV 1 Q1
3
GS1-KVL: 0 = VGS1 + 10 iD − 2.5 V2
2 − 2.5V
2.5VOV 1 + VOV 1 − 1.5 = 0
Negative root is unphysical (we need VOV > 0). Thus, VOV 1 = 0.6 V (vGS1 = 1.6 V).
Since iD1 = iD2 , transistors have the same µn Cox (W/L), and are both in saturation, VOV 2 =
VOV 1 = 0.6 V and vGS2 = vGS1 = 1.6 V
Since VOV 1 = VOV 2 = 0.6 > 0 and VDS1 = 2.5 > VOV 1 = 0.6 as well as VDS2 = 1.6 > VOV 2 =
0.6, our assumption of both MOS in saturation is justified,.
Problem 15. Find iD and vDS for A) ignoring channel-width modulation (λ = 0) and B)
including channel-width modulation (λ = 0.05 V−1 ). NMOS has µn Cox (W/L) = 1 mA/V2
and Vt = 0.4 V.
1.8V
Part A: λ = 0
5k
2 2
iD = 0.5µn Cox (W/L)n VOV 1 = 0.5 × 10 (0.6) = 0.180 mA
−3
1V
Since vDS = 0.9 > VOV = 0.6 V, assumption of NMOS in saturation is justified.
2
iD = 0.5µn Cox (W/L)n VOV 1 (1 + λvDS ) = 0.180 × 10 (1 + 0.05vDS )
−3
Note that by ignoring channel width modulation, the relative error in iD and vDS is ≈ λvDS
(for this problem, λvDS = 0.05 × 0.90 = 4.5%).
Problem 16. Show that this circuit is a NOR gate with a LOW state of 0.2 V and a HIGH
state of 12 V (µn Cox (W/L)n = 0.5 mA/V2 , Vt = 1 V).
12V
Case 1: v1 = v2 = 0.2. Since vGS1 = 0.2 < Vt = 1 and vGS2 = 0.2 < Vt = 1, both transistors
are in cut-off: iD1 = iD2 = 0. Then, i1 = iD1 + iD2 = 0 and from DS-KVL, vo = 12 V.
So, When v1 = 0.2 (LOW) and v2 = 0.2 (LOW), Q1 and Q2 are OFF and vo = 12 V (HIGH).
Case 2: v1 = 0.2, v2 = 12 V. Since vGS1 = 0.2 < Vt = 1, Q1 is in cut-off and iD1 = 0. Since
vGS2 = 12 > Vt = 1, Q2 is not in cut-off. Assume Q2 is in saturation (VOV 2 = vGS2 − Vt =
11 V). Then:
2 2
iD2 = 0.5µn Cox (W/L)n VOV 2 = 0.5 × 0.5 × 10 (11) = 30 mA
−3
2 2
iD2 = 0.5µn Cox (W/L)n (2vDS2 VOV 2 − vDS2 ) = 0.25 × 10−3 (22vDS2 − vDS2 )
12 = 104 iD2 + vDS2 → 2
12 = 2.5[22vDS2 − vDS2 ] + vDS2
2
−2.5vDS2 + 56vDS2 − 12 = 0 → VDS2 = 22.2 V and VDS2 = 0.22 V
So, when v1 = 0.2 (LOW) and v2 = 12 V (HIGH), Q1 is OFF, Q2 is in triode and vo = 0.2 V
(LOW).
2 2
iD1 = iD2 = 0.5µn Cox (W/L)n [2vDS2 VOV 2 − vDS2 ] = 0.25 × 10−3 [22vDS2 − vDS2 ]
12 = 104 (2iD2 ) + vDS2 → 2
12 = 5[22vDS2 − vDS2 ] + vDS2
2
−5vDS2 + 121vDS2 − 12 = 0 → VDS2 = 22.1 V and VDS2 = 0.11 V
First root is not physical (vDS2 = 22.1 > VOV 2 = 11). vDS2 = 0.11 V is correct as vDS2 =
0.11 < vGS2 − Vt = 12 − 1 = 11 (our assumption of Q2 in triode is justified). By KVL:
vo = vDS1 = vDS2 = 0.11 V.
So, When v1 = 12 V (HIGH) and v2 = 12 V (HIGH), Q1 and Q2 are in triode and vo = 0.1 V
(LOW).
Since the output is HIGH only when both inputs are LOW, this is NOR gate.