Quick - Guide Mitutoyo PDF

Mitutoyo Europe GmbH
QUICK GUIDE TO MEASUREMENT
ENGLISH EDITION
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41469 Neuss
T +49 (0) 2137 -102-0
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[email protected]
www.mitutoyo.eu Precision instruments in dimensional metrology
Contents
PG
Meaning of symbols 02 01
Conformance to CE marking 03
Quality control 04
Micrometers 06
Micrometer heads 12
Bore micrometers 16
Calipers 18
Height gauges 22
Gauge blocks 26
Dial gauges and digital indicators 28
Linear gauges 32
Laser scan micrometers 34
Linear scales 36
Profile projectors 38
Microscopes 40
Vision measuring machines 42
Surface measurement 46
Contour measurement 52
Roundform measurement 54
Hardness testing 58
Coordinate measuring machines 60
Quick Guide to Measurement

Meaning of symbols
The ABSOLUTE linear encoder
This is an electronic measuring scale that provides a direct readout of absolute linear position when switched on, without needing to be zeroed or
reset. Mitutoyo measuring instruments incorporating these scales provide the significant benefit of being always ready for measurement without
the need of preliminary setting after switching on. Electrostatic, electromagnetic and a combination of electrostatic and optical methods are used in
PG implementing this capability but the key enabling feature is Mitutoyo’s patented technology of building absolute positional information into the scale
02 so it can be read at start up. These linear encoders are widely used in Mitutoyo's measuring instruments as the in-built length standard and their use
greatly contributes to the generation of highly reliable measurement data in industry, especially in harsh environments where contamination by cutting
fluids, coolants and dust must not affect performance.
Advantages
1. No count error occurs even if you move the slider or spindle extremely rapidly.
2. You do not have to reset the system to zero when turning on the system after turning it off*1.
3. As this type of encoder can drive with less power than the incremental encoder, the battery life is prolonged
to about 3.5 years (continuous operation of 20,000 hours)*2 under normal use.
*1: Unless the battery is removed. *2: In the case of the ABSOLUTE Digimatic caliper (electrostatic capacitance model).
IP codes
These are codes that indicate the degree of protection provided (by an enclosure) for the electrical function
of a product against the ingress of foreign bodies, dust and water as defined in IEC 60529: 2001 and JIS C
0920: 2003.
IP X X
1st characteristic Degree of protection against solid foreign objects 2nd characteristic Degree of protection against water
numeral Brief description Definition numeral Brief description Definition
0 Unprotected — 0 Unprotected —
Protected against Vertically falling water drops shall have no
Protected against solid 1
A Sø50 mm object probe shall not fully vertical water drops harmful effects.
1 foreign objects of
penetrate enclosure*. Protected against Vertically falling water drops shall have no
Sø50 mm and greater
vertical water drops harmful effects when the enclosure is tilted
2
Protected against solid within a tilt angle at any angle up to 15° on either side of
foreign objects of A Sø12.5 mm object probe shall not fully of 15º the vertical.
2
Sø12.5 mm penetrate enclosure*. Protected against Water splashed against the enclosure from
and greater 3
spraying water any direction shall have no harmful effects.
Protected against solid Protected against Water splashed against the enclosure from
A Sø2.5 mm object probe shall not fully 4
3 foreign objects of splashing water any direction shall have no harmful effects.
penetrate enclosure*.
Sø2.5 mm and greater Water projected in jets against the enclosure
Protected against
5 from any direction shall have no harmful
water jets
effects.
Protected against solid
A Sø1.0 mm object probe shall not fully Water projected in powerful jets against the
4 foreign objects of Protected against
penetrate enclosure*. 6 enclosure from any direction shall have no
Sø1.0 mm and greater powerful water jets
harmful effects.
Ingress of dust is not totally prevented, but Ingress of water in quantities causing harmful
dust that does penetrate must not interfere effects shall not be possible when the
5 Protected against dust Protection against
with satisfactory operation of the apparatus 7 enclosure is temporarily immersed in water
or impair safety. water penetration
under standardized conditions of pressure
6 Dustproof No ingress of dust allowed and time.
* For details of the test conditions used in evaluating each degree of protection, please refer to the Ingress of water in quantities causing
original standard. harmful effects shall not be possible when
Protected against the
the enclosure is continuously immersed in
8 effects of continuous
water under conditions which shall be agreed
immersion in water
between manufacturer and user but which
are more severe than for IPX7.
Independent confirmation of compliance

IP65, IP66 and IP67 protection level ratings for applicable Mitutoyo products have been independently confirmed by the German accreditation
organization, TÜV Rheinland.
Dust tight and water jet protected IP65 Dust tight and water protected IP66 Dust tight and watertight IP67
Conformance to CE marking
PG
03
Mitutoyo's manufacturing plants throughout the world have programs to comply with the Machinery Directives,
the EMC Directives, and the Low Voltage Directives. CE marking on a product indicates compliance with the
essential requirements of the relevant European health, safety and environmental protection legislation.
> Testing for EMC compatibilty.

Quality control
Quality control (QC) Histogram
A system for economically producing products or services of a quality A diagram that divides the range between the maximum and the
that meets customer requirements. minimum measured values into several divisions and shows the number
of values (appearance frequency) in each division in the form of a bar
PG Process quality control graph. This makes it easier to understand the rough average or the
04 Activities to reduce variation in product output by a process and keep approximate extent of dispersion. A bell-shaped symmetrical distribution
this variation low. Process improvement and standardization as well as is called the normal distribution and is much used in theoretical
technology accumulation are promoted through these activities. examples on account of its easily calculable parameters. However,
caution should be observed because many real processes do not
Statistical process control (SPC) conform to the normal distribution, and error will result if it is assumed
Process quality control through statistical methods. that they do.
Population Process capability

A group of all items that have measurable characteristics to be considered Process-specific performance demonstrated when the process is
for improving and controlling processes and quality of product. sufficiently standardized, any causes of malfunctions are eliminated,
and the process is in a state of statistical control. The process capability is
Lot represented by ±3σ about the mean (or 6σ total width) when the target
Collection of product produced under the same conditions. characteristic output from the process shows a normal distribution.
Sample
An item of product (or items) taken out of the population to investigate Process capability index (PCI or Cp)
its characteristics. A measure of how well the process can operate within the tolerance
limits set for the target characteristic. It should always be significantly
Sample size greater than one. The index value is calculated by dividing the tolerance
Number of product items in the sample. of the target characteristic by the process capability (6σ). The value
calculated by dividing the difference between the mean ( ) and the
Bias standard value by 3σ may be used to represent this index in cases of
Value calculated by subtracting the target process mean value from the a unilateral tolerance. The process capability index assumes that a
mean of the measured values. characteristic follows the normal distribution.
Dispersion Note: If a characteristic follows the normal distribution, 99.74% of the

Variation in the values of a target characteristic in relation to the measured values will fall within the range ±3σ about the mean.
mean value. Standard deviation (σ) is usually used as the measure of
dispersion around the mean. Bilateral tolerance
USL-LSL USL: Upper specification limit
Cp = LSL: Lower specification limit
6σ
Upper specification limit (USL)
Target process mean
Lower specification limit (LSL)
X
Frequency
Unilateral tolerance ... if only the upper limit is stipulated

USL-X
Cp =
3σ
σ σ
Unilateral tolerance ... if only the lower limit is stipulated
X-LSL
Noncompliance Cp =
3σ
Measured values Specific examples of Cp values for bilateral tolerancing:

Dispersion (±σ)
LSL USL
Bias In this case the process
Tolerance (USL - LSL) capability is barely achieved
Cp = 1 as the 6-sigma process
limits are coincident with
the tolerance limits.
6
LSL USL
6
8
LSL USL
LSL USL
LSL USL
LSL
6
USL Chance causes and special causes
LSL USL Here the process capability All variation in a process has a cause, and in principle these individual
is the minimum value that causes can be tracked down and eliminated, but there is a point beyond
Cp = 1.33 can be generally accepted which this is technologically or economically impractical. Causes of
as it is no closer than 1 variation that must inevitably remain are known as chance causes and PG
6
sigma to the tolerance their sum effect defines the limiting capability of a process. In contrast, 05
68 limits. those causes that can readily be eliminated are known as special causes.
8
LSL USL
LSL USL Rules and the control chart
This shows the case where Examples of typical undesirable trends in measurement seen on control
the process capability charts are shown below, and are taken to mean that a special cause is
Cp = 1.67 is sufficient as it is no probably affecting the process output. The process operator is required
closer than 2 sigma to the to identify such trends by applying appropriate decision rules and to
6
tolerance limits. remedy the situation by eliminating the special cause. These trends
6
10
10 only provide a guideline and the process-specific variation should be
taken into consideration when formulating the rules to apply. Assuming
Note that Cp only represents the relationship between the tolerance typical upper and lower control limits of 3σ, divide the control chart into
limits and the process dispersion and does not consider the position of six zones at intervals of 1σ and apply the rules given, which apply to
the process mean. the X control chart and the control chart. Note that these rules were
formulated assuming a normal distribution, but can be formulated to
A process capability index that takes the difference between the actual suit any other distribution.
process mean and the target process mean into consideration is generally
Rule 1 Rule 2
called Cpk, which is defined as the upper tolerance (USL minus the
UCL X + 3σ UCL X + 3σ
mean) divided by 3σ (half of process capability) or the lower tolerance X + 2σ X + 2σ
(the mean minus LSL) divided by 3σ, whichever is smaller. X + 1σ X + 1σ
X X
X - 1σ X - 1σ
Control chart LCL
X - 2σ
X - 3σ LCL
X - 2σ
X - 3σ
Used to control the process by separating the process variation into
There is a point beyond either of Nine consecutive points are to one
that due to chance causes and that due to a malfunction. The control the control limits. side of the centreline.
chart consists of one centre line (CL) and the control limit lines rationally
Rule 3 Rule 4
determined above and below it (UCL and LCL). It can be said that the
process is in a state of statistical control if all points are within the X + 2σ X + 2σ
upper and lower control limit lines without notable trends when the X + 1σ X + 1σ
X X
characteristic values that represent the process output are plotted. X - 1σ X - 1σ
X - 2σ X - 2σ
The control chart is a useful tool for controlling process output, and LCL X - 3σ LCL X - 3σ
therefore quality.
Six points consecutively increase 14 points alternately increase and
or decrease. decrease.
Upper control limit (UCL)
Rule 5 Rule 6
X + 2σ X + 2σ
Centre line (CL) X + 1σ X + 1σ
X X
Lower control limit (LCL) X - 1σ X - 1σ
X - 2σ X - 2σ
LCL X - 3σ LCL X - 3σ
1 2 3 4 5 6 7
Subgroup number Two of three consecutive points are Four of five consecutive points are
further than 2σ from the centreline further than 1σ from the centreline
on either side. on either side.
-R control chart
Rule 7 Rule 8
A control chart used for process control that provides the most
information on the process. The -R control chart consists of the X + 2σ X + 2σ
control chart that uses the mean of each subgroup for control to X + 1σ X + 1σ
X X
monitor abnormal bias of the process mean and the R control chart X - 1σ X - 1σ
that uses the range for control to monitor abnormal variation. Usually, X - 2σ X - 2σ
LCL X - 3σ LCL X - 3σ
both charts are used together.
There are 15 consecutive points There are eight consecutive points
within 1σ of the centreline. further than 1σ from the centreline.
Note: This part has been written by Mitutoyo based on its own interpretation of the JIS Quality Control Handbook published by the Japanese Standards
Association. References: JIS Quality Control Handbook (Japanese Standards Association) Z8101: 1981, Z8101-1: 1999, Z8101-2: 1999, Z9020: 1999,
Z9021: 1998.

Micrometers
Nomenclature
Standard analogue outside micrometer
PG
06
Measuring faces Spindle Sleeve Index line Adjusting nut

Anvil
Frame
Thimble scale Thimble

Ratchet
Sleeve scale
Spindle clamp
Heat shield
Digital outside micrometer
Measuring faces Sleeve Thimble

Anvil Spindle Spindle lock
Sleeve scale
Frame
Thimble scale
Index line Ratchet
Digimatic output connector

(not present in plain digital model)
Display reading HOLD button
Heat shield ZERO (Incremental mode) / ABS (Absolute mode) setting button
Origin button
Special purpose micrometer applications
Blade micrometer Inside micrometer, caliper type Spline micrometer
PG
07
> For diameter inside narrow groove > For small internal diameter, and groove width > For splined shaft diameter measurement.
measurement. measurement.
Tube micrometer Point micrometer Screw thread micrometer
> For pipe thickness measurement. > For root diameter measurement. > For effective thread diameter measurement.
Disc type outside micrometer Gear tooth micrometer V-anvil micrometer
> For root tangent measurement on spur gears > Measurement of gear over-pin diameter. > For measurement of 3- or 5-flute cutting tools.
and helical gears.

Micrometers
How to read the scales Measuring force limiting device
Audible in One-handed
Micrometer with standard scale (graduation: 0.01 mm)
 Type
operation operation
Remarks
Ratchet stop
PG (1) (1) Sleeve scale reading 7.00 mm
Yes Unsuitable
Audible clicking operation
08 45 (2) Thimble scale reading 0.37 mm causes micro-shocks
0 5
40
(2) Micrometer reading 7.37 mm
35 Friction thimble (F type)
30 Note: 0.37 mm (2) is read from the Smooth operation without
thimble scale where it No Suitable
shock or sound
intersects the index line.
The thimble scale can be read directly to 0.01 mm, as shown above, but Ratchet thimble (T type)
Audible operation provides
may also be estimated to 0.001 mm when the lines are nearly coincident Yes Suitable confirmation of constant
because the line thickness is 1/5 of the spacing between them. measuring force
Ratchet thimble
Approx. +1 µm Approx. +2 µm Audible operation provides
Yes Suitable confirmation of constant
measuring force
Index line Thimble line Index line Thimble line
Micrometer with vernier scale (graduation: 0.001 mm)

 Measuring face detail
30’ 30’
30
spindle ø6.35
0
(1) Sleeve scale reading 6.000 mm
spindle ø8
8
6
ø7.95
(3) 25 (2) Thimble scale reading 0.210 mm
ø6.3
4
2
20 (2) (3) Vernier scale reading 0.003 mm
0 5 15
Micrometer reading 6.213 mm
(1)
10 Carbide tip Carbide tip
Note: 0.21 mm (2) is read at the position where the index line is between These drawings above are for illustration only and are not to scale.
two graduations (21 and 22 in this case). 0.003 mm (3) is read at the
position where one of the vernier graduations aligns with one of the
Micrometer expansion due to holding frame
thimble graduations.
with the bare hand
Micrometer with mechanical-digit display (digital step:


0.001 mm) 14
13
12 300
Third decimal place on vernier scale (2) Vernier reading 0.004 mm 11
(0.001 mm units) 10
9
Expansion (µm)
5 200
6
4
8
2 7
0
6
(1) 5 100
0
45
4
3
0 2 9 9 50
Index line 2
mm 1
0
2 4 6 8 10 15 20 30
Third decimal place 0.004 mm (02) Time (minutes)
Second decimal place 0.090 mm
First decimal place 0.900 mm
Millimetres 2.000 mm
(01) The above graph shows micrometer frame expansion due to heat
Tens of mm 0.000 mm transfer from hand to frame when the frame is held in the bare hand
Micrometer reading 2.994 mm
which, as can be seen, may result in a significant measurement error
due to temperature-induced expansion. If the micrometer must be held
Note: 0.004 mm (2) is read at the position where a vernier graduation line by hand during measurement then try to minimize contact time. A heat
corresponds with one of the thimble graduation lines. insulator will reduce this effect considerably if fitted, or gloves may be
worn. (Note that the above graph shows typical effects, and is not
guaranteed.)
Length standard expansion with change Effect of changing support method and
of temperature (for 200 mm bar initially at 20ºC) orientation
Changing the support method and/or orientation of a micrometer after
zero setting affects subsequent measuring results. The tables below
Thermal expansion (µm)
20
31°C highlight the measurement errors to be expected in three other cases PG
15 after micrometers are zero set in the 'Supported at the bottom and 09
10 centre' case. These actual results show that it is best to set and measure
27°C
5 using the same orientation and support method.
21°C
0
0 1 2 3 4 5 6 7 8 9 10
Lapse of time (minutes)
Measurement error (µm)
The above experimental graph shows how a particular micrometer

Maximum
standard expanded with time as people whose hand temperatures were measuring
different (as shown) held the end of it at a room temperature of 20°C. length
(mm)
This graph shows that it is important not to set a micrometer while
directly holding the micrometer standard but to make adjustments Supported at the bottom and centre Supported only at the centre
only while wearing gloves or lightly supporting the length standard by 325 0 -5.5
its heat insulators. When performing a measurement, note also that 425 0 -2.5
it takes time until the expanded micrometer standard returns to the 525 0 -5.5
original length. (Note that the graph values shown are illustrative and 625 0 -11.0
are not guaranteed.) 725 0 -9.5
825 0 -18.0
Difference in thermal expansion between 925 0 -22.5
micrometer and length standard 1025 0 -26.0
Measurement error (µm)

Difference in expansion (µm)
+3
0°C
+2 Maximum
+1 measuring
20°C length
+0
-1 (mm)
-2 Supported at the centre in a lateral
Supported by hand downward
-3 10°C orientation
325 +1.5 -4.5
425 +2.0 -10.5
125 225 325 425 525
525 -4.5 -10.0
Nominal length (mm)
625 0 -5.5
725 -9.5 -19.0
In the above experiment, after the micrometer and its standard were
825 -5.0 -35.0
left at a room temperature of 20ºC for about 24 hours for temperature
925 -14.0 -27.0
stabilization, the start point was adjusted using the micrometer
1025 -5.0 -40.0
standard. Then, the micrometer with its standard were left at the
temperatures of 0ºC and 10ºC for about the same period of time, and
the start point was tested for shift. The above graph shows the results Abbe’s principle
for each of the sizes from 125 through 525 mm at each temperature.
This graph shows that both the micrometer and its standard must be
left at the same location for at least several hours before adjusting the
start point. (Note that the graph values are not guaranteed values but
experimental values.)
Hooke’s law
Hooke’s law states that strain in an elastic material is proportional to the
stress causing that strain, providing the strain remains within the elastic
limit for that material. Abbe’s principle states that 'maximum accuracy is obtained when the
scale and the measurement axes are common'. This is because any
variation in the relative angle (θ) of the moving measuring jaw on an
instrument, such as a caliper jaw micrometer, causes displacement that
is not measured on the instrument’s scale and this is an Abbe error
(ε = l - L in the diagram). Spindle straightness error, play in the spindle
guide or variation of measuring force can all cause (θ) to vary and the
error increases with R.

Micrometers
Hertz’s formulae Screw pitch diameter measurement
Hertz’s formulae give the apparent reduction in diameter of spheres and Three-wire method
cylinders due to elastic compression when measured between plane The screw pitch diameter can be measured with the three-wire method
surfaces. These formulae are useful for determining the deformation as shown in the figure. Calculate the pitch diameter (E) using the
PG of a workpiece caused by the measuring force in point and line contact appropriate formula (1) or (2) as shown below.
10 situations.
(1) Metric thread or unified screw (60°): E = M - 3d + 0.866025P
Assuming that the material is steel (2) Whitworth thread (55°): E = M - 3.16568d + 0.960491P
and units are as follows:
P P
Spindle d (x3)
Modulus of elasticity: E = 205 GPa d = Wire diameter
L Amount of deformation: δ (µm) E = Screw pitch diameter (or P
Diameter of sphere or = Effective Diameter)
SøD øD cylinder: D (mm) M = Micrometer reading over the
Screw E M
Length of cylinder: L (mm) M = three wires
Measuring force: P (N) P = Screw pitch
a) Apparent reduction in diameter

of sphere: Anvil
(a) (b)
3
Sphere between Cylinder between δ = 0.82 P /D 2
two planes two planes Thread type Optimum wire size

b) Apparent reduction in diameter
of cylinder: Metric thread or unified screw (60°) 0.577P
3 Whitworth thread (55°) 0.564P
δ = 0.094 P/L 1/D
Major measurement errors of the screw Major measurement errors of the three-wire
micrometer method
Error that Error that
might not be might not be
Maximum Error cause Precautions for eliminating errors Possible error
Error cause Precautions for eliminating errors eliminated eliminated even
possible error
even with with precautions
precautions
1. Correct the pitch error (δp = δE) ±18 µm
Micrometer Pitch error 2. Measure several points and adopt assuming that
3 µm 1. Correct the micrometer before use. ±1 µm ±3 µm
feed error (workpiece) their average. the pitch error
1. Measure the angle error and correct 3. Reduce single pitch errors. is 0.02 mm.
±5 µm assuming
the micrometer reading.
Anvil angle the half-angle Error of half
2. Adjust the micrometer using the ±3 µm 1. Use wires of the optimum size.
error error is 15 angle ±0.3 µm ±0.3 µm
same thread gauge as the 2. No correction is needed.
minutes (workpiece)
workpiece.
Misaligned 1. Use wires of the optimum size.
+10 µm +3 µm Anvil 2. Use the wire which has a diameter
contact points ±8 µm +1 µm
misalignment close to the average at the one
1. Use a micrometer with a low wire side.
Influence of measuring force if possible.
measuring ±10 µm 2. Always use the ratchet stop. +3 µm 1 Use the predetermined measuring
force 3. Adjust the micrometer using a Wire force appropriate for the pitch.
thread gauge with the same pitch. diameter 2. Use the calibrated section of the -3 µm -1 µm
error wires.
1. Perform correction calculation 3. Use a stable measuring force.
(angle).
Angle error of 2. Correct the error. In the worst When measured
±10 µm +3 µm Cumulative case carefully
thread gauge 3. Adjust the micrometer using the
same thread gauge as the error +20 µm +3 µm
workpiece. -35 µm -5 µm
1. Perform correction calculation.

Length error
2. Adjust the micrometer using the One-wire method
of thread ±1 µm
same thread gauge as the
gauge The pitch diameter of an odd-fluted tap can be measured using a V-anvil
workpiece.
1. Minimize the angle error as much micrometer with a single wire as shown. Obtain the measured value
±8 µm
JIS 2 grade half- as possible. (M1) and calculate M with equation (3) or (4).
Workpiece assuming the
angle error of 2. Measure the angle error and
thread angle half-angle
±23 minutes perform correction calculation.
error error is ±23 (3) Tap with three flutes : M = 3M1 - 2D
-91 µm + 71 µm 3. Use the three-wire method in the
minutes
case of a large angle error. (4) Tap with five flutes : M = 2.2360M1 - 1.23606D
Cumulative +26 µm M1 = Micrometer reading over the
(±117 + 40) µm
error -12 µm Anvil
= single wire (at cutting edge)
D = Diameter of tap (at cutting
= edge) Spindle
Then, assign the calculated M to

the appropriate formula (1) or (2) Odd-fluted tap Wire
as shown above and calculate the
pitch diameter (E).
Testing parallelism of micrometer measuring Testing flatness of micrometer measuring faces
faces Flatness can be estimated using an optical flat (or parallel) held against a
face. Count the number of red interference fringes seen on the measuring
Optical parallel reading face in white light. Each fringe represents a half wavelength difference in
direction on the spindle height (0.32 µm for red). PG
11
Interference fringe
reading direction
Optical parallel Fringes seen on the spindle
Parallelism can be estimated using an optical parallel held between the

faces. Firstly, wring the parallel to the anvil measuring face. Then close
the spindle on the parallel using normal measuring force and count
Optical flat Optical flat
the number of red interference fringes seen on the measuring face of
the spindle in white light. Each fringe represents a half wavelength Anvil Anvil
difference in height (0.32 µm for red fringes). In the above figure a
Measuring face is curved by Measuring face is concave (or
parallelism of approximately 1 µm is obtained from 0.32 µm x 3 = 0.96 µm. approximately 1.3 µm. convex) approximately 0.6 µm deep.
(0.32 µm x 4 paired red fringes.) (0.32 µm x 2 continuous fringes.)
General notes on using the micrometer

1. Carefully check the type, measuring range, accuracy, and other 5. Wipe away any dust, swarf and other debris from the circumference
specifications to select the appropriate model for your application. and measuring face of the spindle as part of daily maintenance. In
2. Leave the micrometer and workpiece at room temperature long enough addition, wipe off any stains or fingerprints on each part with a dry
for their temperatures to equalize before making a measurement. cloth.
3. Look directly at the index line when taking a reading against the 6. Use the constant-force device correctly so that measurements are
thimble graduations. If the graduations are viewed from an angle, the performed with the correct measuring force.
reading will be incorrect due to parallax error. 7. When mounting the micrometer onto a micrometer stand, the stand
should clamp the centre of the micrometer frame. Do not clamp it too
tightly.
(b)
(a)
(c)
Sleeve
Thimble
8. Be careful not to drop or bump the micrometer on anything. Do

not rotate the micrometer thimble using excessive force. If you believe
a micrometer may have been damaged due to accidental mishandling,
ensure that it is inspected for accuracy before further use.
(a) From above the (b) Looking directly at (c) From below the 9. After a long storage period or when there is no protective oil film visible,
index line the index line index line lightly apply anti-corrosion oil to the micrometer by wiping with a cloth
soaked in it.
4. Wipe off the measuring faces of both the anvil and spindle with lint- 10. Notes on storage:
free paper and set the start (zero) point before measuring.  Avoid storing the micrometer in direct sunlight.
 Store the micrometer in a ventilated place with low humidity.
 Store the micrometer in a place with little dust.
 Store the micrometer in a case or other container, which should not be
kept on the floor.
 Do not store the micrometer in a clamped state, always leave a small
gap (0.1 to 1 mm) between the measuring faces.

Micrometer heads
Key factors in selection Spindle thread pitch
Key factors in selecting a micrometer head are the measuring range, types  The standard Metric micrometer head has 0.5 mm pitch.
of spindle face, stem diameter, graduations, thimble diameter, etc.  The 1mm-pitch type is quicker to set than the standard type and
avoids the possibility of a 0.5 mm reading error. Excellent load-bearing
PG Stem characteristics due to larger screw thread.
12  The 0.25 mm or 0.1 mm-pitch type is the best for fine-feed or fine-
> Plain stem > Stem locknut type positioning applications.
Constant-force device
 A micrometer head fitted with a constant-force device (ratchet or
friction thimble) is recommended for measurement applications.
 If using a micrometer head as a stop, or where saving space is a priority,
a head without a ratchet is probably the best choice.
 The stem used to mount a micrometer head is classified as a plain type
or locknut type as illustrated above. The stem diameter is manufactured
to a nominal Metric or Imperial size with an h6 tolerance.
 The locknut stem allows fast and secure clamping of the micrometer
head. The plain stem has the advantage of wider application and slight
positional adjustment in the axial direction on final installation,
although it does requires a split-fixture clamping arrangement or
adhesive fixing. > Micrometer head with constant- > Micrometer head without
 General-purpose mounting fixtures are available as optional force device constant-force device (no ratchet)
accessories.
Spindle lock
Spindle face If a micrometer head is used as a stop it is desirable to use a head fitted
with a spindle lock so that the setting will not change even under repeated
shock loading.
> Flat face > Spherical face > Anti-rotation device

 A flat measuring face is often specified where a micrometer head is
used in measurement applications.
 When a micrometer head is used as a feed device, a spherical face can
minimize errors due to misalignment (Figure A). Alternatively, a flat Measuring range (stroke)
face on the spindle can bear against a sphere, such as a carbide ball  When choosing a measuring range for a micrometer head, allow an
(Figure B). adequate margin in consideration of the expected measurement
 A non-rotating spindle type micrometer head, or one fitted with an stroke. Six stroke ranges, 5 to 50 mm, are available for standard
anti-rotation device on the spindle (Figure C), can be used if a twisting micrometer heads.
action on the workpiece must be avoided.  Even if an expected stroke is small, such as 2 to 3 mm, it will be cost
 If a micrometer head is used as a stop then a flat face both on the effective to choose a 25 mm-stroke model as long as there is enough
spindle and the face it contacts provides durability. space for installation.
 If a long stroke of over 50 mm is required, the concurrent use of a
> Figure A > Figure C gauge block can extend the effective measuring range (Figure D).
Gauge block
> Figure B > Figure D
Head’s stroke
Extended stroke
Non-rotating spindle
A non-rotating spindle type head does not exert a twisting action on a
workpiece, which may be an important factor in some applications.
Ultra-fine feed applications Graduation styles
Dedicated micrometer heads are available for manipulator applications,
20 80
etc., which require ultra-fine feed or adjustment of spindle. 5 45

10 90
0 5 25 20
0 5
0 0 0 0
Thimble diameter
25 20
PG
45 5
90 10
The diameter of a thimble greatly affects its usability and the fineness of
Normal graduation Reverse graduation
80 20
13
positioning. A small-diameter thimble allows quick positioning whereas style style Bidirectional
a large-diameter thimble allows fine positioning and easy reading of the graduation style
graduations. Some models combine the advantages of both by mounting
a coarse-feed thimble (speeder) on the large-diameter thimble.  In the normal graduation style, as used on a standard non-digital
micrometer, the reading increases as the spindle advances out of the
micrometer frame..
 In the reverse graduation style the reading increases as the spindle
retracts into the micrometer frame.
 The bidirectional graduation style is intended to facilitate measurement
in either direction by using black numerals for normal, and red
numerals for reverse, operation.
 Micrometer heads with a mechanical or electronic digital display,
which allow direct reading of a measurement value, are also available.
These types are generally free from misreading errors. A further
advantage is that the electronic digital display type can enable
computer-based storage and statistical processing of measurement
data.
Guidelines for self-made fixtures

A micrometer head should be mounted by the stem in an accurately machined hole using a clamping method that does not exert excessive compression
on the stem. There are three common mounting methods as shown below. Method 3 is not recommended for the reason given above. Adopt methods
(1) or (2) wherever possible.
Mounting method
(1) Locknut (2) Split-body clamp (3) Setscrew clamp
Face A
Stem diameter ø9.5 ø10 ø12 ø18 ø9.5 ø10 ø12 ø18 ø9.5 ø10 ø12 ø18
Mounting hole G7 G7 H5
Fitting tolerance +0.005 to +0.020 +0.006 to +0.024 +0.005 to +0.020 +0.006 to +0.024 0 to +0.006 0 to +0.008
M3 x 0.5 or M4 x 0.7 is an appropriate size for the
Care should be taken to make Face A square to the Remove burrs generated on the wall of the mounting
Precautions setscrew. Use a brass plug under setscrew (if thickness
mounting hole. hole by the slitting operation.
of fixture allows) to avoid damaging stem.

Micrometer heads
Custom-built products (product example introductions)
Micrometer heads have applications in many fields of science and industry and Mitutoyo offers a wide range of standard models to meet customers’ needs.
However, in those cases where the standard product is not suitable, Mitutoyo can custom build a head incorporating features better suited to your special
application. Please feel free to contact Mitutoyo about the possibilities - even if only one custom-manufactured piece is required.
PG
14 1. Spindle-end types 4. Logo engraving
A specific logo can be engraved as required.
> Standard > Spherical > Pointed > Spline
5. Motor coupling
Couplings for providing motor drive to a head can be designed.
> Tapped > Flanged > Blade (for non-rotating spindle
types only)
Long spindle types are also available. Please consult Mitutoyo.
2. Stem types 6. Thimble mounting

A custom stem can be manufactured to suit the mounting fixture. Thimble mounting methods including ratchet, setscrew, and hex-socket
head screw types are available.
> Plain > Locknut
> Ratchet > Setscrew > Hex-socket head screw
> Threaded > Flanged
7. Spindle-thread pitch
Pitches of 1 mm for fast-feed applications or 0.25 mm for fine-feed can
be supplied as alternatives to the standard 0.5 mm. Inch pitches are also
3. Scale graduation schemes supported. Please consult Mitutoyo for details.
Various barrel and thimble scale graduation schemes, such as reverse
and vertical, are available. Please consult Mitutoyo for ordering a custom 8. Lubricant for spindle threads
scheme not shown here. Lubrication arrangements can be specified by the customer.
> Standard > Reverse 9. All-stainless construction

All components of a head can be manufactured in stainless steel.
0 5 10 15 5 25 20 15 10 45
0 0 10. Simple packaging

45 5 Large-quantity orders of micrometer heads can be delivered in simple
packaging for OEM purposes.
> Vertical > Reverse vertical
45
10
15
25
20
15
10
5
0
0
45
> Offset zero > Graduations only

10 5 0 5 5
45
Maximum loading capacity on micrometer heads
The maximum loading capacity of a micrometer head depends mainly on the method of mounting and whether the loading is static or dynamic (used as a
stop, for example). Therefore the maximum loading capacity of each model cannot be definitively specified. The loading limits recommended by Mitutoyo
(at less than 100,000 revolutions if used for measuring within the guaranteed accuracy range) and the results of static load tests using a small micrometer
head are given below. PG
15
1. Recommended maximum loading limit
Type Maximum loading limit

Standard Spindle pitch: 0.5 mm Up to approx. 4 kgf *
Spindle pitch: 0.1 mm / 0.25 mm Up to approx. 2 kgf
Spindle pitch: 0.5 mm Up to approx. 4 kgf
High-functionality Spindle pitch: 1.0 mm Up to approx. 6 kgf
Non-rotating spindle
Up to approx. 2 kgf
MHF micro-fine feed type (with a differential mechanism)
* Up to approx. 2 kgf only for MHT
2. Static load test for micrometer heads (using MHS for this test)
Micrometer heads were set up as shown and the force at which the head was damaged or pushed out of the fixture when a static load was applied, in
direction P, was measured. (In the tests no account was taken of the guaranteed accuracy range.)
(1) Locknut (2) Split-body clamp (3) Setscrew clamp
P
P
Locknut
Setscrew
P
Split-body
clamp
Mounting method Damaging / dislodging load*

(1) Locknut Damage to the head occurred at 8.63 to 9.8 kN (880 to 1000 kgf)
(2) Split-body clamp The head was pushed out of the fixture at 0.69 to 0.98 kN (70 to 100 kgf)
(3) Setscrew clamp Damage to the setscrew occurred at 0.69 to 1.08 kN (70 to 110 kgf)
* These load values should only be viewed as an approximate guide.

Bore micrometers
Nomenclature
Contact point
PG
16 Cone Spindle
Sleeve Thimble
Ratchet stop
Custom-ordered products (Holtest / Borematic)

Mitutoyo can custom-build a bore micrometer best suited to your special application. Please feel free to contact Mitutoyo about the possibilities – even
if only one custom-manufactured piece is required. Please note that, depending on circumstances, such a micrometer will usually need to be used with a
master setting ring for accuracy assurance. (A custom-ordered micrometer can be made compatible with a master ring supplied by the customer. Please
consult Mitutoyo.)
Type of
Workpiece profile (example) Contact point tip profile (example) Remarks
feature
r Tip radius R sized to measure
the minimum diameter W = 1 or more
(different for each size)
Square
ød
øD
groove
Allows measurement of the diameter of variously


H1 H2
shaped inside grooves and splines.
r Tip radius R sized to measure W = 1 or more Radius = 0.5 or more
the minimum diameter Minimum measurable groove diameter is approximately

(different for each size) 16 mm (differs depending on the workpiece profile.)
Round
 Dimension l should be as follows:
ød
øD
groove
For W = less than 2 mm: l = less than 2 mm
For W = 2 mm or more: l = 2 mm as the standard value
H which can be modified according to circumstances.
H W = 0.5 or more Tip radius R sized to measure  The number of splines or serrations is limited to a
r the minimum diameter
(different for each size)
multiple of 3.
Spline ød  Details of the workpiece profile should be provided at

øD
the time of placing a custom-order.
 If your application needs a measuring range different

from that of the standard bore micrometer an
a 45º or more R = 0.3 or more additional initial cost for the master ring gauge will be
required.
r
øD
Serration
ød
Allows measurement of the effective diameter of an


internal thread.
Threaded Measurable internal threads are restricted according to

øD
hole the type, nominal dimension, and pitch of the thread.

Please contact Mitutoyo with the specification of the
thread to be measured for advice.
How to read the scale Measurement error due to temperature
variation of micrometer
Graduation: 0.005 mm Heat transfer from the operator to the micrometer should be minimized
(2) to avoid any significant measuring error due to temperature difference
(1) Sleeve scale reading 35.000 mm between the workpiece and micrometer. If the micrometer is held directly PG
45
10
0
5
(2) Thimble scale reading 0.015 mm
(1) 35 6
by hand when measuring, use gloves or hold the heat-insulator (if fitted). 17
Micrometer reading 35.015 mm 40 9
8
7
Airy and bessel points

When a length standard bar or internal micrometer lies horizontally,
supported as simply as possible at two points, it bends under its own
Changes in measured values at different weight into a shape that depends on the spacing of those points. There are
45
5
measuring points two distances between the points that control this deformation in useful
4
45
1DIV. 0.005mm
When Holtest is used, the ways, as shown below.

measured value differs between
45
4
l
measurement across the anvil and
45
1DIV. 0.005mm
measurement using only the tips Airy points (a ≅ 0.577l)

of the anvils due to the product a
mechanism. Set the start point
under the same conditions as the The ends of a bar (or micrometer) can be made exactly horizontal by
measurement. spacing the two supports symmetrically as shown above. These points
are known as the airy points and are commonly used to ensure that the
ends of a length bar are parallel to one another, so that the length is well
Workpiece Setting the
start point
defined.
l
Misalignment errors
Bessel points (a ≅ 0.559l)
> Figure 1 X
> Figure 2
X a
The change in length of a bar (or micrometer) due to bending can be

minimized by spacing the two supports symmetrically as shown above.
These points are known as the bessel points and may be useful when using
L
a long inside micrometer.
Bore gauges
l : Inside diameter to be measured l : Inside diameter to be measured
L : Length measured with radial offset X
Mitutoyo bore gauges for small holes feature contact surfaces with a large
L : Length measured with axial offset X
X : Offset in axial direction X : Offset in radial direction curvature so they can be easily positioned for measuring the true diameter
Δl : EError in measurement Δl : EError in measurement
(in the direction a-a’) of a hole. The true diameter is the minimum value
Δl : L - l = l 2 + X2 - l Δl : L - l = l 2 - X2 - l
seen on the dial while rocking the bore gauge as indicated by the arrow.
a
If an inside micrometer is misaligned in the axial or radial direction by
an offset distance X when a measurement is taken, as in Figures 1 and
2, then that measurement will be in error as shown in the graph below
(constructed from the formulae given above). The error is positive for axial
misalignment and negative for radial misalignment.
a'
The spring-loaded guide plate on Workpiece Anvil

Error (positive for axial, and negative
a Mitutoyo two-point bore gauge

0.10 l = 200 mm
automatically ensures radial
for radial, misalignment) (mm)
0.09
0.08 l = 500 mm alignment so that only an axial
0.07 rocking movement is needed to
0.06
0.05
find the minimum reading (true
0.04 diameter).
0.03 l = 1000 mm
0.02
0.01
Guide plate Contact point
1 2 3 4 5 6 7 8 9 10
Misalignment (offset) of one end of micrometer (mm)

Calipers
Nomenclature
Vernier caliper
PG
18 Inside jaws Locking screw
Screw, gib setting Gib, slider
Screw, gib setting Depth bar
Beam Slider stop
Thumbwheel Reference surface Main scale
Vernier scale
Slider
Outside jaws
Absolute digimatic caliper
Inside jaws Slider

Locking screw
Output connector Beam Depth bar
Main scale Reference surface

Thumb-roller
ZERO set / Absolute button
Inch / metric button

Outside jaws
How to read the scale
Vernier calipers Dial calipers

Graduation : 0.05 mm Graduation : 0.01 mm
(1) (1) Main scale reading 4.00 mm (1) Main scale reading 16.00 mm
(2) Vernier scale reading 0.75 mm (2) Dial face reading 0.13 mm
(1)
Caliper reading 4.75 mm (2) Caliper reading 16.13 mm
Note: 0.75 mm (2) is read at the

(2)
position where a main scale
graduation corresponds with
a vernier graduation.
Measurement examples
Outside measurement Inside measurement
Measuring faces PG
19
Measuring faces
Step measurement Depth measurement
Measuring faces
Measuring faces
Special purpose caliper applications
Point jaw type Offset jaw type Depth type
> For uneven surface measurement. > For stepped feature measurement. > For depth measurement.
Blade jaw type Neck type Tube thickness type
> For diameter of narrow groove measurement. > For outside diameter measurement such as > For tube or pipe thickness measurement.
thickness of recess.

Calipers
Types of vernier scale Small hole measurement with an M-type caliper
The Vernier scale is attached to the caliper’s slider and each division on Due to the thickness and separation of caliper knife-edge jaws, the line
this scale is made 0.05 mm shorter than one main scale division of 1 mm. between the jaw contact points is offset relative to the scale axis when
This means that, as the caliper jaws open, each successive movement of measuring a hole diameter, which means that a small Abbe correction
PG 0.05 mm brings the succeeding vernier scale line into coincidence with needs to be added to the indicated measurement value to ensure the most
20 a main scale line and so indicates the number of 0.05 mm units to be accurate result obtainable from this method. The table below shows typical
counted (although for convenience the scale is numbered in fractions of correction values against offset (H).
a mm). Alternatively, one vernier division may be made 0.05 mm shorter
than two divisions of the main scale to make a long vernier scale. This øD = True internal diameter Correction to be added for øD = 5 mm
ød = Indicated internal diameter H 0.3 0.5 0.7
makes the scale easier to read but the principle, and graduation, is still Δd = Measurement error (øD – ød) Δd 0.009 0.026 0.047
the same.
> Standard vernier scale > Long vernier scale

(graduation 0.05 mm) (graduation 0.05 mm)
00 1010 2020 3030 4040 3030 4040 5050 6060 7070
H
0.05mm
0.05mm
0 0 2 2 4 4 6 6 8 8 1010 0 0 1 1 2 2 3 3 4 4 5 5 6 6 7 7 8 8 9 9 1010
ød
1919 3939
øD
Reading 1.45 mm Reading 30.35 mm
About long calipers Inside measurement with a CM-type caliper

Steel rules are commonly used to roughly measure large workpieces but Because the inside measuring faces of a CM-type caliper are at the tips of
if a little more accuracy is needed then a long caliper is suitable for the the jaws the measuring face parallelism is heavily affected by measuring
job. A long caliper is very convenient for its user friendliness but does force, and this becomes a large factor in the measurement accuracy
require some care in use. In the first place it is important to realize there attainable. In contrast to an M-type caliper, a CM-type caliper cannot
is no relationship between resolution and accuracy. For details, refer to measure a very small hole diameter because it is limited to the size of the
the values in our catalogue. Resolution is constant whereas the accuracy stepped jaws, although normally this is no inconvenience as it would be
obtainable varies dramatically according to how the caliper is used. The unusual to have to measure a very small hole with this type of caliper. Of
measuring method with this instrument is a concern since distortion of the course, the radius of curvature on the inside measuring faces is always
main beam causes a large amount of the measurement error, so accuracy small enough to allow correct hole diameter measurements right down
will vary greatly depending on the method used for supporting the caliper to the lowest limit (jaw closure). Mitutoyo CM-type calipers are provided
at the time. Also, be careful to use only the minimum measuring force with an extra scale on the slider for inside measurements so they can
necessary when using the outside measuring faces as they are furthest be read directly without the need for calculation, just as for an outside
away from the main beam, so errors will be at a maximum here. This measurement. This useful feature eliminates the possibility of error that
precaution is also necessary when using the tips of the outside measuring occurs when having to add the inside-jaw-thickness correction on a single-
faces of a long-jaw caliper. scale caliper.
For inside only
For outside only
General notes on use of calipers

1. Potential causes of error
A variety of factors can cause errors when measuring with a caliper.
Major factors include parallax effects when reading the scales, excessive
measuring force combined with a failure to measure as close as possible
to the beam (a caliper does not conform to Abbe's Principle), differential
thermal expansion due to a temperature difference between the caliper
and workpiece, and the effect of the thickness of the knife-edge jaws and
the clearance between these jaws during measurement of the diameter of
a small hole. Although there are also other error factors such as graduation
accuracy, reference edge straightness, main scale flatness on the beam, and
squareness of the jaws, these factors are included within the instrumental 6. Moving jaw tilt error
error tolerances. Therefore, these factors do not cause problems as long as If the moving jaw becomes tilted out of parallel with the fixed jaw, either
the caliper satisfies the instrumental error tolerances. through excessive force being used on the slider or lack of straightness in
the reference edge of the beam, a measurement error will occur as shown PG
in the figure. This error may be substantial due to the fact that a caliper 21
L
does not conform to Abbe’s Principle.
a
L < øD
øD
h
h
f
Example: Assume that the error slope of the jaws due to tilt of the slider is
0.01 mm in 50 mm and the outside measuring jaws are 40 mm
deep, then the error (at the jaw tip) is calculated as (40/50) x
0.01 mm = 0.008 mm. If the guide face is worn then an error may
be present even using the correct measuring force.
7. Handling
 Caliper jaws are sharp, and therefore the instrument must be handled
2. Inside measurement with care to avoid personal injury.
 Insert the inside jaw as deeply as possible before measurement.  Avoid damaging the scale of a digital caliper and do not engrave an
 Read the maximum indicated value during inside measurement. identification number or other information on it with an electric marker
 Read the minimum indicated value during groove width measurement. pen.
 Avoid damaging a caliper by subjecting it to impact with hard objects
3. Depth measurement or by dropping it on a bench or the floor.
Read the minimum indicated value during depth measurement.
8. Maintenance of beam sliding surfaces and measuring faces
4. Parallax error when reading the scales Wipe away dust and dirt from the sliding surfaces and measuring faces
Look straight at the vernier graduation line when checking the alignment with a dry soft cloth before using the caliper.
of vernier graduation lines to the main scale graduation lines. If you look
at a vernier graduation line from an oblique direction (A), the apparent 9. Checking and setting theORIGINoriginbutton
beforesetsuse
alignment position is distorted by ΔX (as shown in the figure below) due Clean the measuring surfaces by display to zero
gripping a sheet of clean paper between
to a parallax effect caused by the step height (H) between the planes of the the outside jaws and then slowly
vernier graduations and the main scale graduations, resulting in a reading pulling it out. Close the jaws ORIGIN
error of the measured value. To help avoid this error some vernier calipers and ensure that the vernier scale
H
are made with H as small as possible, ideally less than 0.3 mm. (or display) reads zero before
using the caliper. When using a
A
digimaticClose
caliper,
jawsreset the origin Battery
(ORIGIN completely
button) after replacing
H
the battery.
10. Handling after use

A ΔX  After using the caliper, completely wipe off any water and oil. Then,
lightly apply anti-corrosion oil and let it dry before storage.
 Wipe off water from a waterproof caliper as well because it may also
5. Relationship between measurement and temperature rust.
The main scale of a caliper is engraved (or mounted on) ΔX stainless steel,
and although the linear thermal expansion coefficient is equal to that of 11. Notes on storage
the most common workpiece material, steel, i.e. (10.2 ±1) x10-6/K, note  Avoid direct sunlight, high temperatures, low temperatures, and high
that other workpiece materials, the room temperature and the workpiece humidity during storage.
temperature may affect measurement accuracy.  If a digital caliper will not be used for more than three months, remove
the battery before storage.
 Do not leave the jaws of a caliper completely closed during storage.

Height gauges
Nomenclature
Digimatic height gauges
PG
22
Main pole
Column
Sub pole
Strut
Clamping lever
Feed handwheel Power ON/OFF button

Slider
Zero set button / ABS
Touch probe connector (Absolute) button
Hold / data button
Scriber arm
Scriber clamp Preset mode, ball diameter

compensation mode button
Scriber stylus Number up/down button,

presetting
Battery cap Direction switch / digit shift
button, presetting
Base
Measuring face, scriber
Reference surface, base

PG
23
> Digimatic data socket. > Slider clamping lever. > Slider handwheel.
Vernier height gauges Mechanical digit height gauges
Fine adjuster for

main scale
Column
Main pole
Beam Column
Strut Sub pole
Main scale
Feed handwheel
Slider Clamping lever
Fine adjustment
Slider
Reset button
Vernier scale Clamp
Counter, upward
Scriber arm
Scriber clamp Reset button
Scriber clamp Scriber clamp
Counter,
Scriber arm downward
Scriber
Scriber stylus Hand-pointer
Dial face
Base
Measuring face,
scriber Base
Measuring face,
scriber
Reference surface,
beam
Reference surface, base Reference surface, base

Height gauges
How to read the scale
Vernier height gauge Mechanical digit height gauge

> Measuring upwards from a reference surface.
PG
24 (2)
(2) (1)
(1) Counter reading 122.00 mm
(2) Dial face reading 0.11 mm
122.11
Height gauge reading 122.11 mm
(1)
> Measuring downwards from a reference surface.

(2)
Graduation : 0.02 mm
(1) Main scale reading 79.00 mm

(2) Vernier scale reading 0.36 mm (1) Counter reading 125.00 mm
125.11
Height gauge reading 79.36 mm (2) Dial face reading 0.11 mm
(1)
Height gauge reading 125.11 mm
General notes on use of height gauges
1. Potential causes of error

Like the caliper, the error factors involved include parallax effects, error caused by excessive measuring force (mainly because a height gauge does not
conform to Abbe's Principle), and differential thermal expansion due to a temperature difference between the height gauge and workpiece. There are also
other error factors caused by the structure of the height gauge. In particular, the error factors related to a warped reference edge and scriber installation
described below should be studied before use.
2. Reference edge (column) warping and scriber installation

Like the caliper, and as shown in the Figure 1, measurement errors result when using the height gauge if the reference column, which guides the slider,
becomes warped. This error can be represented by the same calculation formula for errors caused by nonconformance to Abbe's Principle. Installing the
scriber (or a lever-type dial indicator as shown in Figure 2) requires careful consideration because it affects the size of any error due to a warped reference
column by increasing dimension h in Figure 1. In other words, if an optional long scriber or lever-type dial indicator is used, the measurement error becomes
larger.
> Figure 1 > Figure 2

l
l
h
h
h Example: Effect of measuring point position.

When h is 150 mm, the error is 1.5
times larger than when h is 100 mm.
f
l
a
3. Lifting of the base from the reference surface 9. Keep the column, which guides the slider, clean. If dust or dirt
When setting the scriber height from a gauge block stack, or from a accumulates on it, sliding becomes difficult, leading to errors in setting and
workpiece feature, the base may lift from the surface plate if excessive measuring.
downwards force is used on the slider, and this results in measurement PG
error. For accurate setting, move the slider slowly downwards while 10. When scribing, securely lock the slider in position using the clamping 25
moving the scriber tip to and fro over the gauge block surface (or feature). arrangements provided. It is advisable to confirm the setting after clamping
The correct setting is when the scriber is just felt to lightly touch as it moves because the act of clamping on some height gauges can alter the setting
over the edge of the surface. It is also necessary to make sure that the slightly. If this is so, allowance must be made when setting to allow for this
surface plate and height gauge base reference surface are free of dust or effect.
burrs before use.
11. Parallelism between the scriber measuring face and the base reference
surface should be 0.01 mm or better. Remove any dust or burrs on the
mounting surface when installing the scriber or lever-type dial indicator
before measurement. Keep the scriber and other parts securely fixed in
place during measurement.
12. If the main scale of the height gauge can be moved, move it as required
to set the zero point, and securely tighten the fixing nuts.
13. Errors due to parallax error are not negligible. When reading a value,
always look straight at the graduations.
14. Handling after use

Completely wipe away any water and oil. Lightly apply a thin coating of
anti-corrosion oil and let dry before storage.
15. Notes on storage:

 Avoid direct sunlight, high temperatures, low temperatures, and high
4. Error due to inclination of the main scale (column) humidity during storage.
According to JIS standards, the perpendicularity of the column reference  If a digital height gauge will not be used for more than three months,
edge to the base reference surface should be better than: remove the battery before storage.
 If a protective cover is provided, use the cover during storage to
L prevent dust from adhering to the column.
(0.01 + ) mm L = measured length in mm
1000
This is not a very onerous specification. For example, the perpendicularity

limit allowable is 0.61 mm when L is 600 mm. This is because this error
factor has a small influence and does not change the inclination of the
slider, unlike a warped column.
5. Relationship between accuracy and temperature

Height gauges are made of several materials. Note that some combinations
of workpiece material, room temperature, and workpiece temperature may
affect measuring accuracy if this effect is not allowed for by performing a
correction calculation.
6. The tip of a height gauge scriber is very sharp and must be handled
carefully if personal injury is to be avoided.
7. Do not damage a digital height gauge scale by engraving an

identification number or other information on it with an electric marker
pen.
8. Carefully handle a height gauge so as not to drop it or bump it against

anything.

Gauge blocks
Definition of the metre Thermal stabilization time
The 17th General Conference of Weights and Measures in 1983 decided The following figure shows the degree of dimensional change when
on a new definition of the meter unit as the length of the path travelled handling a 100 mm steel gauge block with bare hands.
by light in a vacuum during a time interval of 1/299 792 458 of a second.
PG The gauge block is the practical realization of this unit and as such is used
Time fingers are released
26 widely throughout industry. 9
8
7 The gauge block is held with five fingers
Elongation (µm)
6
5 The gauge block is held with three fingers
4
3
2
1
5 10 20 30 40 50 60 70
Lapse of time (minutes)
Selection, preparation and assembly of a gauge block stack

Select gauge blocks to be combined to make up the size required for the stack.
1. Take the following points into account when selecting gauge blocks. d. Lightly press the optical flat to check if the interference fringes
a. Use the minimum number of blocks whenever possible. disappear.
b. Select thick gauge blocks whenever possible. Judgement 2: If the interference fringes disappear, no burr exists on
c. Select the size from the one that has the least significant digit the measuring face.
required, and then work back through the more significant digits. Judgement 3: If some interference fringes remain locally while the
flat is gently moved to and fro, a burr exists on the measuring face.
2. Clean the gauge blocks with an appropriate cleaning agent. If the fringes move along with the optical flat, there is a burr on the
optical flat.
3. Check the measuring faces for burrs by using an optical flat as follows: e. Remove burrs, if any, from the measuring face using a flat,
fine-grained abrasive stone such as a Ceraston or Arkansas stone.
4. Apply a very small amount of oil to the measuring face and spread it
evenly across the face. (Wipe the face until the oil film is almost
removed.) Grease, spindle oil, Vaseline, etc., are commonly used.
a. Wipe each measuring face clean.

b. Gently place the optical flat on the gauge block measuring face.
c. Lightly slide the optical flat until interference fringes appear.
Judgement 1: If no interference fringes appear, it is assumed that there
is a large burr or contaminant on the measuring face.
5. Gently overlay the faces of the gauge blocks to be wrung together. There are three methods to use (i, ii and iii as shown below) according to the size of
blocks being wrung:
i) Wringing thick gauge blocks ii) Wringing a thick gauge block iii) Wringing thin gauge blocks PG
to a thin gauge block 27
Cross the gauge blocks at 90º in the Overlap one side of a thin gauge To prevent thin gauge blocks from
middle of the measuring faces. block on one side of a thick gauge bending, first wring a thin gauge
block. block onto a thick gauge block.
Rotate the gauge blocks while Slide the thin gauge block while Then, wring the other thin gauge
applying slight force to them. You will pressing the entire overlapped area to block onto the first thin gauge block.
get a sense of wringing by sliding the align the measuring faces with each
blocks. other.
Align the measuring faces with each Finally, remove the thick gauge block
other. from the stack.
Apply an optical flat to the surface of one

thin gauge block to check the wringing state.
Irregular
interference
fringes
Wipe the exposed measuring face(s) and

continue building up the stack, in the
same manner as above, until complete.

Dial gauges and digital indicators
Nomenclature
PG
Sensitivity indication
28
Limit hand Cap
Bezel
clamp
Bezel
Scale graduations
Pointer
Revolution counter
Stem
Plunger (or spindle)
Contact point
Dial faces
Dial gauges intended for measurement of lengths comparable with the range of a micrometer are generally multi-revolution types with a continuously
graduated dial, with the numerals increasing clockwise. Some also have numerals increasing anticlockwise, for measuring in the reverse direction.
A purely reverse-reading dial is for use on depth or bore gauges. Those gauges intended for comparison measurement have a balanced dial with
the numerals increasing in both directions from zero, for reading small differences from a reference surface, and may be limited to one revolution
to aid error-free reading.
0.01 mm types 0.001 mm types (high sensitivity)
> Bi-directional (multi-revolution) > Balanced (multi-revolution) > Standard scale spacing > Balanced (multi-revolution)
> Reverse reading (multi-revolution) > Balanced (one revolution) > Double scale spacing > Balanced (one revolution)
Dial indicator standard B7503 : 2011 (extract from JIS/Japanese Industrial Standards)
Maximum permissible error
Maximum permissible error (MPE) in measurement characteristics – dial indicators with ø50 mm bezel or larger
Graduation (mm) 0.01 0.005 0.001
PG
29
Over 1 and Over 3 and Over 5 and Over 10 and Over 20 and Over 30 and Over 50 and Over 1 and Over 2 and
Measuring range (mm) 1 or less 5 or less 1 or less
up to 3 up to 5 up to 10 up to 20 up to 30 up to 50 up to 100 up to 2 up to 5
Retrace error 3 3 3 3 5 7 8 9 3 2 2 3
Repeatability 3 3 3 3 4 5 5 5 3 0.5 0.5 1
Arbitrary 1/10 revolution 5 5 5 5 8 10 10 12 5 2 2 3.5
Indication error
Arbitrary 1/2 revolution 8 8 9 9 10 12 12 17 9 3.5 4 5

Arbitrary one revolution 8 9 10 10 15 15 15 20 10 4 5 6
Entire measuring range 8 10 12 15 25 30 40 50 12 5 7 10
MPE for one revolution type dial indicators does not define the indication error of arbitrary 1/2 and 1 revolution
Maximum permissible error (MPE) in measurement characteristics – dial indicators with bezel smaller than ø50 mm
and back plunger type dial indicators
Graduation (mm) 0.01 0.005 0.002 0.001
Measuring range (mm) 1 or less Over 1 and up to 3 Over 3 and up to 5 Over 5 and up to 10 5 or less 1 or less 1 or less
Retrace error 4 4 4 5 3.5 2.5 2
Repeatability 3 3 3 3 3 1 1
Arbitrary 1/10 revolution 8 8 8 9 6 2.5 2.5
Indication error
Arbitrary 1/2 revolution 11 11 12 12 9 4.5 4

Arbitrary one revolution 12 12 14 14 10 5 4.5
Entire measuring range 15 16 18 20 12 6 5
MPE for one revolution type dial indicators does not define the indication error of arbitrary 1/2 and 1 revolution
Note: Values in the tables above apply at 20ºC.

The measurement characteristics of a dial indicator have to meet both maximum permissible error (MPE) and measurement force permissible limits (MPL) at any position within the measuring range in any posture
when the measurement characteristics are not specified by the manufacturer.
Mounting a dial gauge

Mounting method Example Note
Mounting hole tolerance: ø8G7(+0.005 to 0.02)


Clamping screw: M4 to M6

Clamping the stem ore
rm Clamping position: 8 mm or more from the lower edge of the stem

directly with a screw mo
8m Maximum clamping torque: 150N·cm when clamping with a single M5 screw

Note that excessive clamping torque may adversely affect spindle movement.

Clamping the stem

by split-clamp Mounting hole tolerance: ø8G7(+0.005 to 0.02)

fastening
M6 screw
Plain washer Lugs can be changed 90 degrees in orientation according to the application. (The lug is set horizontally

when shipped.)
Lug mounting Lugs of some Series 1 models (No.1911,1913-10&1003), however, cannot be altered to horizontal.

To avoid cosine-effect error, ensure that any type of gauge or indicator is mounted with its plunger in

line with the intended measurement direction.
Care of the plunger

 Do not lubricate the plunger. Doing so might cause dust to accumulate, resulting in a malfunction.
 If the plunger movement is poor, wipe the upper and lower plunger surfaces with a dry or alcohol-soaked cloth. If the movement is not improved by
cleaning, contact Mitutoyo for repair.
 Before making a measurement or calibration, confirm that the plunger moves upward and downward smoothly, and the stability of the zero point.

Dial gauges and digital indicators
Contact point Effect of orientation on measuring force
Screw thread is standardized on M2.5 x 0.45 (length: 5 mm). Incomplete
Position Example Remarks
thread section at the root of the screw shall be less than 0.7 mm when
fabricating a contact point.
PG
30
5 2
1 0 9
8
Plunger pointing
3 7
4 5 6
downward —
(normal position)
M2.5 x 0.45 M2.5 x 0.45, depth 7 mm

Incomplete thread section ø3 counterbore, depth 1 mm Ground
shall be less than 0.7 mm
If measurement is performed
Setting the origin of a digital indicator with the plunger horizontal the
The specification in the range of 0.2 mm from the end of the stroke is not measuring force is less than when
it is pointing downward. In this
guaranteed for digital indicators. When setting the zero point or presetting case be sure to check the operation
Ground
a specific value, be sure to lift the spindle at least 0.2 mm from the end Plunger and repeatability of the indicator
horizontal or digital display. For guaranteed-
of the stroke.
operation specifications according
to orientation of digital indicators
and dial gauges, refer to the
product descriptions in a general
catalogue.
Ground
If measurement is performed with

the plunger is pointing upward the
measuring force is less than when
4 5 6
it pointing downward. In this case
be sure to check the operation
7 3
8 2
1 0 9
Plunger pointing and repeatability of the indicator

upward or digital display. For guaranteed-
operation specifications according
0.2 mm
to orientation of digital indicators

and dial gauges, refer to the
product descriptions in a general
Ground
catalogue.
Dial test indicator standard B7533 : 1990 (extract from JIS/Japanese Industrial Standards)
Accuracy of indication
Permissible indication errors of dial test indicators are as per the table below.
Graduation (mm) Measuring range (mm) Wide range accuracy Adjacent error Repeatability Retrace error
0.5 5
3
0.01 0.8 8 5 3
1.0 10 4*
0.2
0.002 3 2 1 2
0.28
* Applies to indicators with a stylus over 35 mm long.

Note: Values in the table above apply at 20°C.
Dial test indicators and the cosine effect
The reading of any indicator will not represent an accurate measurement if its measuring direction is misaligned with the intended direction of measurement
(cosine effect). Because the measuring direction of a dial test indicator is at right angles to a line drawn through the contact point and the stylus pivot, this
effect can be minimized by setting the stylus to minimize angle θ (as shown in the figures). If necessary, the dial reading can be compensated for the actual
θ value by using the table below to give the result of measurement. True value = indicated value x compensation factor. PG
31
Workpiece movement Workpiece movement

direction direction
Stylus movement
Stylus movement direction L1 : True value
direction θ
L2 : Indicated value
L1
θ
L2
L1 = L2 x Cosθ
Always minimize the angle between movement directions during use.
θ
θ
Compensating for a non-zero angle
Examples
If a 0.200 mm measurement is indicated on the dial at various values of θ, the
true measurements are:
Angle Compensation value For θ = 10º,
10º 0.98
0.200 mm x 0.98 = 0.196 mm
20º 0.94 For θ = 20º,
0.200 mm x 0.94 = 0.188 mm
30º 0.86
40º 0.76 For θ = 30º,
0.200 mm x 0.86 = 0.172 mm
50º 0.64
60º 0.50
Note: A special contact point of involute form can be used to apply

compensation automatically and allow measurement to be performed
without manual compensation for any angle from 0 to 30º. (This type
of contact point is custom-made.)

Linear gauges
Plain stem and stem with locknut Comparative measurement
The stem used to mount a linear gauge head is classified as a plain A measurement method where a workpiece dimension is found by
type or locknut type as illustrated below. The locknut stem allows fast measuring the difference in size between the workpiece and a master
and secure clamping of the linear gauge head. The plain stem has the gauge representing the nominal workpiece dimension.
PG advantage of wider application and slight positional adjustment in the
32 axial direction on final installation, although it does requires a split- Precautions in mounting a Laser Hologage
fixture clamping arrangement or adhesive fixing. However, take care so To fix the Laser Hologage, insert the stem into the dedicated stand or
as not to exert excessive force on the stem. fixture.
Clamp Clamp
Stem Stem
screw screw
> Stem locknut type > Plain stem Clamp Clamp
Measuring force Recommended hole diameter on the fixing side: 15 mm +0.034/-0.014

This is the force exerted on a workpiece during measurement by the  Machine the clamping hole so that its axis is parallel with the
contact point of a linear gauge head, at its stroke end, expressed in measuring direction. Mounting the gauge at an angle will cause a
newtons. measuring error.
 When fixing the Laser Hologage, do not clamp the stem too tightly.
Ingress Protection codes Over-tightening the stem may impair the sliding ability of the plunger.
 If measurement is performed while moving the Laser Hologage,
IP54 mount it so that the cable will not be strained and no undue force
will be exerted on the gauge head.
Type Level Description
Protects the human body and
protects against foreign objects.
5: Dust protected Protection against harmful dust. Zero-setting
Water splashing against the The display unit can be set to read 0 (zero) at any position of the plunger.
Protects against exposure to 4: Splash-proof
enclosure from any direction
water. type
shall have no harmful effect.
IP66
Type Level Description

Protection against contact with Protection from dust ingress.
the human body and foreign 6: Dust tight Complete protection against
objects. contact.
Water jets directed against the
Protects against exposure to 6: Water-resistant
enclosure from any direction
water. type
shall have no harmful effect.
Presetting
Any numeric value can be set on the display unit for starting the count
Precautions in mounting a gauge head from this value.
 Insert the stem of the gauge into the mounting clamp of a measuring
unit or a stand and tighten the clamp screw.
 Notice that excessively tightening the stem can cause problems with
spindle operation.
 Never use a mounting method in which the stem is clamped by direct
contact with a screw.
 Never mount a linear gauge by any part other than the stem.
 Mount the gauge head so that it is in line with the intended direction
of measurement. Mounting the head at an angle to this direction will
cause an error in measurement.
 Exercise care so as not to exert a force on the gauge through the cable.
Direction changeover Open collector output
The measuring direction of the gauge plunger can be set so that the An external load, such as a relay or a logic circuit, can be driven from
output increases as the plunger is pushed inward, or vice versa. the collector output of a transistor inside the display unit which is itself
controlled by a tolerance judgement result, etc.
PG
Relay output 33
+/– Access to the contacts of a single pole 2-way relay inside the display
unit are provided. The relay state can be controlled by a tolerance
Datum plane judgement result, etc.
Digimatic code
A communication protocol for connecting the output of measuring
tools with various Mitutoyo data processing units. This allows output
MAX, MIN, TIR settings connection to a Digimatic Mini Processor DP-1VR for performing
The display unit can hold the maximum (MAX) and minimum (MIN) various statistical calculations and creating histograms, etc.
values, and MAX - MIN value during measurement.
BCD output
A system for outputting data in binary-coded decimal notation from
the display unit.
Runout value (TIR) = MAX - MIN
RS-232C output
MAX
A serial communication interface in which data can be transmitted
MAX bidirectionally under the EIA standards. For the transmission procedure,
MIN refer to the specifications of each measuring instrument.
MIN
Tolerance setting
Tolerance limits can be set in various display units for automatically
indicating if a measurement falls within those limits.

Laser scan micrometers
Compatibility Re-assembly after removal from the base
A laser scan micrometer is adjusted together with an ID Unit supplied Observe the following limits when re-assembling the emission unit and
with the measuring unit. The ID Unit, which has the same code number reception unit to minimize measurement errors due to misalignment of
and the same serial number as the measuring unit, must be installed in the laser's optical axis with the reception unit.
PG the display unit.
34 Alignment within the horizontal plane
The workpiece and measuring conditions a) Parallel deviation between reference lines C and D:
Measurement errors may be caused due to the difference between X (in the transverse direction)
visible and invisible lasers and the shape or surface roughness of a Reference
workpiece. To minimize this possibility, calibrate the instrument using a line D
master of the same shape and the same value of surface roughness as Reference
line C
the workpiece whenever possible. If measurements show unacceptable
dispersion, it is possible to improve accuracy by making as many
X
measurements as possible on a workpiece and averaging the results.
Electrical interference b) Angle between reference lines C and D:

To avoid operational errors, do not route the signal cable and relay θx (angle)
cable of the laser scan micrometer alongside a high-voltage line or Reference
other cable capable of inducing noise current in nearby conductors. line D
Ground all appropriate units and cable shields. Reference
line C
Connection to a computer θx
If the laser scan micrometer is to be connected to an external personal
computer via the RS-232C interface, ensure that the cable connections
conform to the specification. Alignment within the vertical plane
c) Parallel deviation between reference planes A and B:
Laser safety Y (in height)
Mitutoyo laser scan micrometers use a low-power visible laser for
Reference
measurement. The laser is a CLASS 2 EN/IEC60825-1 (2007) device. plane B
Warning and explanation labels, as shown below, are attached to the Reference
laser scan micrometers as is appropriate. plane A
d) Angle between reference planes A and B:

θy (angle)
Reference
plane B
Reference
plane A
θy
Allowable limits of optical axis misalignment
Distance between
Model emission unit and X and Y θx and θy
reception unit
68 mm (2.68") or less within 0.5 mm (.02") within 0.4º (7.0 mrad)
LSM-501S
LSM-503S
LSM-506S
LSM-512S
LSM-516S 800 mm (31.50") or less within 1.0 mm (.04") within 0.09º (1.6 mrad)
PG
35
Reference
edge
> In-line measurement of glass fibre or fine wire > X- and Y-axis measurement of electrical cables > Measurement of thickness variation of film or
diameter. and fibres. sheet.
Reference
edge
Reference
edge
> Measurement of film or sheet thickness. > Measurement of laser disk and magnetic disk > Measurement of tape width.
head movement.
Out of Reference
roundness edge
> Measurement of outer diameter of cylinder. > Measurement of outer diameter and roundness > Dual system for measuring a large outside
of cylinder. diameter.
Gap
> Measurement of gap between rollers. > Measurement of outer diameter of optical > Measurement of form.
connector and ferrule.
> Measurement of spacing of IC chip leads.

Linear scales
Glossary
 Absolute system  RS-232C

A measurement mode in which every point measurement is made An interface standard that uses an asynchronous method of serial
PG relative to a fixed origin point. transmission of data over an unbalanced transmission line for data
36 exchange between transmitters located relatively close to each
 Incremental system other. It is a means of communication mainly used for connecting a
A measurement mode in which every point measurement is made personal computer with peripherals.
relative to a certain stored reference point, which is subject to
change according to the requirements of the workpiece  Line driver output
dimensioning scheme. This output features fast operating speeds of several tens to several
hundreds of nanoseconds and a relatively long transmission
 Origin offset distance of several hundreds of metres. A differential-voltmeter line
A function that enables the origin point of a coordinate system to driver (RS422A compatible) is used as an I/F to the NC controller in
be translated to another point offset from the fixed origin point. the linear scale system.
For this function to work, a system needs a permanently stored
origin point.  BCD
A notation of expressing the numerals 0 through 9 for each digit
 Restoring the origin point of a decimal number by means of four-bit binary sequence. Data
A function that stops each axis of a machine accurately in position transmission is one-way output by means of TTL or open collector.
specific to the machine while slowing it with the aid of integrated
limit switches.  RS-422
An interface standard that uses serial transmission of bits in
 Sequence control differential form over a balanced transmission line. RS-422 is
A type of control that sequentially performs control steps according superior in its data transmission characteristics and in its capability
to a prescribed order. of operating with only a single power supply of +5V.
 Numerical control  Accuracy

A way of controlling the movements of a machine by encoded The accuracy specification of a scale is given in terms of the
commands created and implemented with the aid of a computer maximum error to be expected between the indicated and true
(CNC). A sequence of commands typically forms a part program that positions at any point, within the range of that scale, at a
instructs a machine to perform a complete operation on a temperature of 20ºC. Since there is no international standard
workpiece. defined for scale units, each manufacturer has a specific way of
specifying accuracy. The accuracy specifications given in our
 Binary output catalogue have been determined using laser interferometry.
Refers to output of data in binary form (ones and zeros) that
represent numbers as integer powers of 2.  Narrow range accuracy
Scale gratings on a scale unit normally adopt 20 µm pitch though it
varies according to the kind of scale. The narrow range accuracy
refers to the accuracy determined by measuring one pitch of each
grating at the limit of resolution (1 µm for example).
Specifying linear scale accuracy
Positional indication accuracy

The accuracy of a linear scale is determined by comparing the positional value indicated by the linear scale with the corresponding value from a
laser length measuring machine at regular intervals using the accuracy inspection system as shown in the figure below. As the temperature of the PG
inspection environment is 20ºC, the accuracy of the scale applies only in an environment at this temperature. Other inspection temperatures may be 37
used to comply with internal standards.
> Overview of accuracy inspection system.
Computer
Laser length measuring
Digital counter
machine counter
Optical axis of laser beam
Cube corner
Interferometer
Fixture
Laser source Scale unit
Movable carriage
The accuracy of the scale at each point is defined in terms of an error value that is calculated using the following formula:
Error = Value indicated by the linear scale - corresponding value indicated by the laser inspection system
A graph in which the error at each point in the effective positioning range is plotted is called an accuracy diagram. There are two methods used to
specify the accuracy of a scale, unbalanced or balanced, described below.
1) Unbalanced accuracy specification: maximum minus minimum error

This method simply specifies the maximum error minus the minimum Scale error at any point in range
E relative to start of range
error from the accuracy graph, as shown below. It is of the form:
E = (α + βL) µm. L is the effective positioning range (mm), and α and Error Max. difference
in scale error: E (µm)
β are factors specified for each model. For example, if a particular 0
type of scale has an accuracy specification of (3 + 3L/1000) µm and
Effective positioning range
an effective measuring range of 1000 mm, E is 6 µm.
2) Balanced accuracy specification: plus and minus about the mean error Scale error at any point in range
This method specifies the maximum error relative to the mean error relative to mean error over range
E
from the accuracy graph. It is of the form: e = ±(E/2) µm. This is mainly Error Mean error Max. error about
0 mean error:
used in separate-type (retrofit) scale unit specifications.
±(E/2) µm
Effective positioning range
A linear scale detects displacement based on graduations of constant pitch. Two-phase sine wave signals with the same pitch as the graduations
are obtained by detecting the graduations. Interpolating these signals in the electrical circuit makes it possible to read a value smaller than the
graduations by generating pulse signals that correspond to the desired resolution. For example, if the graduation pitch is 20 µm, interpolated values
can generate a resolution of 1 µm. The accuracy of this processing is not error-free and is called interpolation accuracy. The linear scale's overall
positional accuracy specification depends both on the pitch error of the graduations and interpolation accuracy.

Profile projectors
Erect image and inverted image Type of illumination
An image of an object projected onto a screen is erect if it is orientated
the same way as the object on the stage. If the image is reversed top  Contour illumination
to bottom, left to right and by movement with respect to the object An illumination method to observe a workpiece by transmitted light
PG on the stage (as shown in the figure below) it is referred to as an and is used mainly for measuring the magnified contour image of a
38 inverted image (also known as a reversed image, which is probably workpiece.
more accurate).
 Coaxial surface illumination
Projection screen An illumination method whereby a workpiece is illuminated by
light transmitted coaxially through the lens for the observation/
measurement of the surface. (A half-mirror or a projection lens with
a built-in half-mirror is needed.)
 Oblique surface illumination

An erect image An inverted image
A method of illumination by obliquely illuminating the workpiece
surface. This method provides an image of enhanced contrast,
allowing it to be observed three-dimensionally and clearly. However,
note that an error is apt to occur in dimensional measurement with
Top of the stage this method of illumination. (An oblique mirror is needed. Models in
the PJ-H30 series are supplied with an oblique mirror.)
F = workpiece, = X-axis movement, = Y-axis movement

Field of view
The maximum diameter of object space that can be projected using a
Working distance particular lens.
Refers to the distance from the face of the projection lens to the surface
of a workpiece in focus. It is represented by L in the diagram below. Screen diameter of profile projector
Field of view diameter =
Magnification of projection lens used
Example: If a 5X magnification lens is used for a projector with a screen of

ø500 mm:
500 mm
Field of view diameter is given by = 100 mm
5
L
Magnification accuracy
The magnification accuracy of a projector when using a certain lens is
established by projecting an image of a reference object and comparing
the size of the image of this object, as measured on the screen, with
the expected size (calculated from the lens magnification) to produce a
percentage magnification accuracy figure. The reference object is often
in the form of a small, graduated glass scale called a stage micrometer or
standard scale, and the projected image of this is measured with a larger
glass scale known as a reading scale.
Note: that magnification accuracy is not the same as measuring accuracy.
L - lM
ΔM(%) = x 100
lM
ΔM(%): Magnification accuracy expressed as a percentage of the nominal lens

magnification
L: Length of the projected image of the reference object measured on the screen
l: Length of the reference object
M: Magnification of the projection lens
Telecentric optical system
An optical system where the illuminating rays of light are parallel to the optical axis in object and/or image space. This means that magnification is
nearly constant over a range of working distances, therefore almost eliminating perspective error. The image does not vary in size though the image
blurs as the object is shifted along the optical axis. For measuring projectors and measuring microscopes, an identical effect is obtained by placing a
lamp filament at the focal point of a condenser lens instead of a lens stop so that the object is illuminated with parallel rays of light. (See the figure PG
below.) 39
> Telecentric contour illumination
Focal point on the image side Projection screen surface
Principal ray
Light source
(lamp)
Optical axis
Condenser lens Workpiece Projection lens
Object surface

Microscopes
Numerical aperture (NA) Infinity optical system
The NA figure is important because it indicates the resolving power An optical system where the objective forms its image at infinity and
of an objective lens. The larger the NA value the finer the detail that a tube lens is placed within the body tube between the objective and
can be seen. A lens with a larger NA also collects more light and will the eyepiece to produce the intermediate image. After passing through
PG normally provide a brighter image with a shallower depth of focus than the objective the light effectively travels parallel to the optical axis to
40 one with a smaller NA value. the tube lens through what is termed the infinity space within which
auxiliary components can be placed, such as differential interference
NA = n·Sinθ
contrast (DIC) prisms, polarizers, etc., with minimal effect on focus and
The formula above shows that NA depends on n, the refractive index aberration corrections.
of the medium that exists between the front of an objective and the
specimen (for air, n = 1.0), and angle θ, which is the half-angle of the
A point-source on the workpiece
maximum cone of light that can enter the lens.
Light from point source is
Objective lens
focused at the intermediate
Resolving power (R) Image forming image plane
(tube) lens
The minimum detectable distance between two image points,
representing the limit of resolution. Resolving power (R) is determined
by numerical aperture (NA) and wavelength (λ) of the illumination.
λ f1 f2
R= (µm)
2(NA)2
Infinity space
λ = 0.55 µm is often used as the reference wavelength
Note: Magnification of the objective = f2 /f1
Working distance (WD)

The distance between the front end of a microscope objective and the Finite optical system
surface of the workpiece at which the sharpest focusing is obtained. An optical system that uses an objective to form the intermediate
image at a finite position. Light from the workpiece passing through
Parfocal distance the objective is directed toward the intermediate image plane (located
The distance between the mounting position of a microscope objective at the front focal plane of the eyepiece) and converges in that plane.
and the surface of the workpiece at which the sharpest focusing is
obtained. Objective lenses mounted together in the same turret should
A point-source on the workpiece
have the same parfocal distance so that when another objective is
brought into use the amount of refocussing needed is minimal. Objective lens Light from point source is
focused at the intermediate
image plane
L1 L2
Note: Magnification of the objective = L 2 /L1

Working
distance Focal length (f)
The distance from the principal point to the focal point of a lens: if
Parfocal distance f1 represents the focal length of an objective and f2 represents the
focal length of an image forming (tube) lens then magnification is
determined by the ratio between the two. (In the case of the infinity-
Focal point correction optical system.)
Light rays travelling parallel to the optical axis of a converging lens
system and passing through that system will converge (or focus) to a Focal length of the image-forming (tube) lens
Objective magnification =
point on the axis known as the rear focal point, or image focal point. Focal length of the objective
200 200
Example: 1X = Example: 10X =
200 20
Depth of focus (DOF) Erect image
Also known as depth of field, this is the distance (measured in the An image in which the orientations of left, right, top, bottom and
direction of the optical axis) between the two planes which define the moving directions are the same as those of a workpiece on the
limits of acceptable image sharpness when the microscope is focused workstage.
on an object. As the numerical aperture (NA) increases, the depth of PG
focus becomes shallower, as shown by the expression below: Field number (FN), real field of view, and 41
monitor display magnification
λ
DOF = The observation range of the sample surface is determined by the
2(NA)2
diameter of the eyepiece’s field stop. The value of this diameter in
Note: λ = 0.55 µm is often used as the reference wavelength millimetres is called the field number (FN). In contrast, the real field of
view is the range on the workpiece surface when actually magnified
Example: For an M Plan Apo 100X lens (NA = 0.7). and observed with the objective lens. The real field of view can be
The depth of focus of this objective is:
calculated with the following formula:
0.55 µm
= 0.6 µm
2 x 0.72
1. The range of the workpiece that can be observed with the
microscope (diameter)
Bright-field illumination and dark-field FN of eyepiece
illumination Real field of view =
Objective lens magnification
In brightfield illumination a full cone of light is focused by the objective
on the specimen surface. This is the normal mode of viewing with an 24
Example: The real field of view of a 1X lens is 24 =
optical microscope. With darkfield illumination, the inner area of the 1
24
light cone is blocked so that the surface is only illuminated by light from Example: The real field of view of a 10X lens is 2.4 =
10
an oblique angle. Darkfield illumination is good for detecting surface
scratches and contamination.
2. Monitor observation range
Apochromat objective and achromat objective
 An apochromat objective is a lens corrected for chromatic aberration The size of the camera image
Monitor observation range = sensor (diagonal length)
(colour blur) in three colours (red, blue, yellow).
Objective lens magnification
 An achromat objective is a lens corrected for chromatic aberration
in two colours (red, blue).
Size of image sensor
Format Diagonal length Length Height
Magnification
1/3" 6.0 4.8 3.6
The ratio of the size of a magnified object image created by an optical
1/2" 8.0 6.4 4.8
system to that of the object. Magnification commonly refers to
2/3" 11.0 8.8 6.6
lateral magnification although it can mean lateral, vertical, or angular
magnification.
3. Monitor display magnification
Principal ray Display diagonal length
A ray considered to be emitted from an object point off the optical on the monitor
Objective lens magnification =
axis and passing through the centre of an aperture diaphragm in a lens Diagonal length of
system. camera image sensor
Aperture diaphragm
An adjustable circular aperture which controls the amount of light
passing through a lens system. It is also referred to as an aperture stop
and its size affects image brightness and depth of focus.
Field stop
A stop which controls the field of view in an optical instrument.
Telecentric system
An optical system where the light rays are parallel to the optical
axis in object and/or image space. This means that magnification is
nearly constant over a range of working distances, therefore almost
eliminating perspective error.

Vision measuring machines
Vision measurement
Vision measuring machines mainly provide the following processing capabilities.
 Edge detection
PG Detecting/measuring edges in the XY plane.
42
 Auto focusing
Focusing and Z measurement.
 Pattern recognition
Alignment, positioning, and checking a feature.
Image storage
An image is comprised of a regular array of pixels. This is just like a picture on fine plotting paper with each square solid-filled differently.
640 pixels
Display
screen
CCD PC
Video signal
480 pixels
High-speed
camera
lens A/D converter Frame grabber
Amplifier
Grey scale
A PC stores an image after internally converting it to numeric values. A numeric value is assigned to each pixel of an image. Image quality varies
depending on how many levels of grey scale are defined by the numeric values. The PC provides two types of grey scale: two-level and multi-level.
The pixels in an image are usually displayed as 256-level grey scale.
PG
> 2-level grey scale > Multi-level grey scale 43
255
Pixels in an image brighter than a given level are displayed as white and all Each pixel is displayed as one of 256 levels between black and white. This
other pixels are displayed as black. allows high-fidelity images to be displayed.
Difference in image quality

Difference between 2-level and 256-level grey-scale images.
> Sample image displayed in 2-level grey scale. > Sample image displayed in 256-level grey scale.
Variation in image depending on threshold level

The three pictures below are the same image displayed as 2-level grey scale at different slice levels (threshold levels). In a 2-level grey-scale image,
different images are provided as shown above due to a difference in slice level. Therefore, the 2-level grey scale is not used for high-precision vision
measurement since numeric values will change depending on the threshold level that is set.

Vision measuring machines
Dimensional measurement Edge detection
An image consists of pixels. If the number of pixels in a section to be How to actually detect a workpiece edge in an image is described using
measured is counted and multiplied by the size of a pixel, then the the following monochrome picture as an example. Edge detection is
section can be converted to a numeric value in length. For example, performed within a given domain. A symbol which visually defines
PG assume that the total number of pixels in the lateral size of a square this domain is referred to as a tool. Multiple tools are provided to suit
44 workpiece is 300 pixels as shown in the figure below. If a pixel size is various workpiece geometries or measurement data.
10 µm under imaging magnification, the total length of the workpiece
is given by 10 µm x 300 pixels = 3000 µm = 3 mm. Tool
The edge detection system scans

within the tool area as shown in
10 µm
the figure at left and detects the
boundary between light and shade.
300 pixels
255
Grey scale
127
0 (1) Scan start position
Tool position (2) Edge detection position
(1) (2) (3) (3) Scan end position
> Example of numeric values assigned to pixels on the tool.

244 241 220 193 97 76 67 52 53 53
243 242 220 195 94 73 66 54 53 55
244 246 220 195 94 75 64 56 51 50
High-resolution measurement
When enlarged...
Grey scale
Grey scale
Tool position Tool position
A position the system recognizes as an edge may be in error by up to one pixel width using
normal image processing. This will prevent the execution of high-resolution measurement.
To increase the accuracy in edge detection, sub-pixel image processing is used. An edge is detected by determining interpolation curve from adjacent
pixel data as shown below. As a result, it allows measurement with a resolution higher than 1 pixel.
Grey scale
Grey scale
Tool position Tool position
Image signal without sub-pixel processing. Image signal with sub-pixel processing. The image signal profile approaches an analogue
waveform like this.
Measurement along multiple portions of an image
Large features that cannot be contained on one screen have to be
measured by precisely controlling the position of the CCD sensor and
stage so as to locate each reference point within individual images. By
this means the system can measure even a large circle, as shown below, PG
by detecting the edge while moving the stage across various parts of 45
the periphery.
Composite coordinates of a point

Since measurement is performed while individual measured positions are stored, the system can measure dimensions that cannot be included in one
screen, without problems.
> Machine coordinate system > Vision coordinate system
Mz Vx
V
My
Vy
Mx
Measuring machine stage position: M = (Mx, My, Mz) Detected edge position (from the centre of vision): V = (Vx, Vy)
Actual coordinates are given by X = (Mx + Vx), Y = (My + Vy), and Z = Mz, respectively.
Principle of auto focusing Variation in contrast depending on the

The system can perform XY-plane measurement, but cannot perform focus condition
height measurement using only the CCD camera image. The system is
commonly provided with the Auto Focus (AF) mechanism for height Edge contrast is low due to out-of-focus edges.
measurement. The following explains the AF mechanism that uses a
common image, although some systems may use an AF laser.
High
Low
Contrast in the scanning direction
CCD
Z coordinate
In-focus Edge contrast is high due to sharp, in-focus edges.

height
High
Contrast ratio
Low
Contrast in the scanning direction
> The AF system analyses an image while moving the CCD up and down in
the Z axis. In the analysis of image contrast, an image in sharp focus
will show a peak contrast and one out of focus will show a low contrast.
Therefore, the height at which the image contrast peaks is the just-in-focus
height.

Surface measurement
Nominal characteristics of contact (stylus) instruments, ISO 3274: 1996
Appearance Measurement loop Workpiece surface Stylus shape

Drive unit
PG A typical shape for a stylus end is conical with a spherical tip.
46 Feed device Reference guide skid Stylus tip Tip radius: rtip = 2 µm, 5 µm or 10 µm
Cone angle: 60°, 90°
Probe In typical surface roughness testers, the taper angle of the stylus
Reference line Measurement profile end is 60º unless otherwise specified.
60° 90°
Transducer
Amplifier
R2
R2
µm
µm
Z-axis signal
transfer unit 60° 90°
AD converter
Input/output
Quantized
measurement profile
R5
R5
µm
µm
60° 90°
Nominal texture
suppression
R1
R1
Profile filter
0µ
0µ
m
m
Input/output
Primary profile
Static measuring force
Nominal radius of Static measuring force at Tolerance on static

Parameter evaluation curvature of stylus tip the mean position of stylus measuring force variations
(µm) (mN) (mN/µm)
2 0.75 0.035
Elements of a Surface Roughness Tester 5
0.75 (4.0)* 0.2
10
* The maximum value of static measuring force at the average position of a stylus is to be 4.0 mN for a
Column special structured probe including a replaceable stylus.
Relationship between cutoff value and stylus tip radius

The following table lists the relationship between the roughness profile
Feed device cutoff value λc, stylus tip radius rtip, and cutoff ratio λc/λs.
Measuring loop
λc λs λc/ λs Maximum rtip Maximum sampling length
(mm) (µm) (µm) (µm)
Probe (pickup) 0.08 2.5 30 2 0.5
Workpiece 0.25 2.5 100 2 0.5

0.8 2.5 300 2 *1 0.5
2.5 8.0 300 5 *2 1.5
8.0 25.0 300 10 *2 5.0
*1 For a surface with Ra>0.5 µm or Rz>3 µm, a significant error will not usually occur in a measurement
even if rtip = 5 µm.
*2 If a cutoff value λs is 2.5 µm or 8 µm, attenuation of the signal due to the mechanical filtering effect
of a stylus with the recommended tip radius appears outside the roughness profile pass band.
Therefore, a small error in stylus tip radius or shape does not affect parameter values calculated from
measurements. If a specific cutoff ratio is required, the ratio must be defined.
Stylus
Fixture Base
Metrological characterization of phase correct Surface profiles, ISO 4287: 1997
filters, ISO 11562: 1996
A profile filter is a phase-correct filter without phase delay (cause of
Primary profile
profile distortion dependent on wavelength). The weight function of a 100
phase-correct filter shows a normal (Gaussian) distribution in which the PG
Transmission %
Roughness profile Waviness profile
amplitude transmission is 50% at the cutoff wavelength.
50
47
Data processing flow

λs λc λf
Surface profile Definition: Wavelength
on the real surface Profile that results from the
intersection of the real surface
and a plane rectangular to it. Primary profile
Measurement Profile obtained from the measured profile by applying a low-pass filter
with cutoff value λs to remove the shortest wavelength components
Measured profile Definition: that are of no relevance to measurement.
Locus of the centre of the stylus
tip that traces the workpiece
surface.
AD conversion
Definition:
Quantized profile
Data obtained by quantizing
the measured profile.
Suppresses irrelevant geometry of the

surface, such as inclination of a flat feature Roughness profile
and curvature of a cylindrical feature, using Profile obtained from the primary profile by suppressing the longer
the least squares method. wavelength components using a high-pass filter of cutoff value λc.
Low-pass filter of cutoff

value λs
Primary profile Primary profile parameters
Waviness profile
Profile obtained by applying a band-pass filter to the primary profile to
High-pass filter of cutoff Band-pass filter that passes remove the longer wavelengths above λf and the shorter wavelengths
value λc wavelengths between cutoff below λc.
values λc and λf
Roughness profile Waviness profile
Roughness profile parameters Waviness profile profile

Surface measurement
Definition of parameters, ISO 4287: 1997
Amplitude parameters (peak and valley) Mean height of the primary profile elements Pc, the roughness
profile elements Rc and the waviness profile elements Wc.
PG Maximum peak height of the primary profile Pp, the roughness Mean value of the profile element heights Zt within a sampling length.
48 profile Rp and the waviness profile Wp.
Largest profile peak height Zp within a sampling length. 1 m
Pc, Rc, Wc = ∑ Zt
m i=1 i
Rp
Zt3
Zt4
Zt5
Zt6
Zt2
Zt1
Sampling length
Sampling length
Maximum valley depth of the primary profile Pv, the roughness
profile Rv and the waviness profile Wv.
Largest profile valley depth Zv within a sampling length. Total height of the primary profile Pt, the roughness profile Rt
and the waviness profile Wt.
Sum of the height of the largest profile peak height Zp and the largest
profile valley depth Zv within the evaluation length.
Rz
Rz
Rt
Rv
Rz
Sampling
Sampling length length Evaluation length
Maximum height of the primary profile Pz, the roughness profile

Rz and the waviness profile Wz. Amplitude parameters (average of ordinates)
Sum of height of the largest profile peak height Zp and the largest
profile valley depth Zv within a sampling length. Arithmetical mean deviation of the primary profile Pa, the
roughness profile Ra and the waviness profile Wa.
Arithmetic mean of the absolute ordinate values Z(x) within a sampling
length.
Rp
1 l
Pa, Ra, Wa = ∫ |Z(x)|dx
Rz
l 0
With l as lp, lr, or l w according to the case
Rv
Sampling length
Root mean square deviation of the primary profile Pq, the
roughness profile Rq and the waviness profile Wq.
In old JIS and ISO 4287-1: 1984, Rz was used to indicate the ten point Root mean square value of the ordinate values Z(x) within a sampling
height of irregularities. Care must be taken because differences between
results obtained according to the existing and old standards are not always
length.
negligibly small. (Be sure to check whether the drawing instructions
conform to existing or old standards.)
1 l 2
Pq, Rq, Wq = ∫ Z (x)dx
l 0
With l as lp, lr, or l w according to the case
Skewness of the primary profile Psk, the roughness profile Rsk Spacing parameters
and the waviness profile Wsk.
Quotient of the mean cube value of the ordinate values Z(x) and the Mean width of the primary profile elements PSm, the roughness PG
cube of Pq, Rq, or Wq respectively, within a sampling length. profile elements RSm and the waviness profile elements WSm. 49
Mean value of the profile element widths Xs within a sampling length.
1 1 Ir 3
Rsk = ∫ Z (x)dx
Rq3 Ir 0 1 m
PSm, RSm, WSm = ∑X
m i = 1 Si
The above equation defines Rsk. Psk and Wsk are defined in a similar
Xs1 Xs2 Xs3 Xs4 Xs5 Xs6
manner. Psk, Rsk, and Wsk are measures of the asymmetry of the
probability density function of the ordinate values.
Kurtosis of the primary profile Pku, the roughness profile Rku

and the waviness profile Wku.
Quotient of the mean quartic value of the ordinate values Z(x) and the
fourth power of Pq, Rq, or Wq respectively, within a sampling length.
Sampling length
1 1 Ir 4
Rku = 4 ∫ Z (x)dx
Rq Ir 0
JIS specific parameters
The above equation defines Rku. Pku and Wku are defined in a similar Ten-point height of irregularities, RzJIS .
manner. Pku, Rku, and Wku are measures of the sharpness of the Sum of the absolute mean height of the five highest profile peaks and
probability density function of the ordinate values. the absolute mean depth of the five deepest profile valleys, measured
from the mean line within the sampling length of a roughness profile.
Hybrid parameters This profile is obtained from the primary profile using a phase-correct
band-pass filter with cutoff values of lc and ls.
Root mean square slope of the primary profile PΔq, the
roughness profile RΔq and the waviness profile WΔq. (Zp1 + Zp2 + Zp3 + Zp4 + Zp5) + (Zv1 + Zv2 + Zv3 + Zv4 + Zv5)
Root mean square value of the ordinate slopes dZ/dX within a sampling RzJIS =
5
length.
dZ (x)
dZ (x)
dx
dx
Zp1
Zp3
Zp2
Zp4
Zp5
dZ (x)
dZ (x)
Zv5
dx
dx
Zv4
Zv3
Zv2
Zv1
dZ (x)
dx
Sampling length
Symbol Profile used

RzJIS82 Surface profile as measured
Roughness profile derived from the primary profile using a
RzJIS94
phase-correct high-pass filter
Arithmetic mean deviation of the profile Ra75.

Arithmetic mean of the absolute values of the profile deviations from
the mean line within the sampling length of the roughness profile
(75%). This profile is obtained from a measurement profile using an
analogue high-pass filter with an attenuation factor of 12db/octave and
a cutoff value of λc.
1 ln
Ra75 = ∫ |Z(x)|dx
ln 0

Surface measurement
Definition of parameters (cont.)
Curves, probability density function and related parameters Probability density function
(profile height amplitude distribution curve).
PG Material ratio curve of the profile (Abbott-Firestone curve). Sample probability density function of the ordinate Z(x) within the
50 Curve representing the material ratio of the profile as a function of evaluation length.
section level c.
Mean line
Mean line
c
0 20 40 60 80 100 Evaluation length Amplitude density

Sampling length
Rmr(c),%
Material ratio of the primary profile Pmr(c), the roughness Sampling length for surface roughness
profile Rmr(c) and the waviness profile Wmr(c). parameters, ISO 4288: 1996
Ratio of the material length of the profile elements Ml (c) at a given level
c to the evaluation length. Table 1: Sampling lengths for aperiodic profile roughness parameters
(Ra, Rq, Rsk, Rku, RΔq), material ratio curve, probability density
Ml(c) function, and related parameters.
Pmr(c), Rmr(c), Wmr(c) =
ln
Ra (µm) Sampling length lr (mm) Evaluation length ln (mm)
(0.006)<Ra≤0.02 0.08 0.4
0.02<Ra≤0.1 0.25 1.25
Section height difference of the primary profile Pδc, the
0.1<Ra≤2 0.8 4.0
roughness profile Rδc and the waviness profile Wδc.
2<Ra≤10 2.5 12.5
Vertical distance between two section levels of a given material ratio.
10<Ra≤80 8.0 40.0
Pδc = c (Rmr1) – c (Rmr2); Rmr1<Rmr2 Table 2: Sampling lengths for aperiodic profile roughness parameters
(Rz, Rv, Rp, Rc, Rt).
Rz, Rz1max. (µm) Sampling length lr (mm) Evaluation length ln (mm)

(0.025)<Rz, Rz1max.≤0.1 0.08 0.4
0.1<Rz, Rz1max.≤0.5 0.25 1.25
c0
0.5<Rz, Rz1max.≤10 0.8 4.0
Rδc
10<Rz, Rz1max.≤50 2.5 12.5

c1
50<Rz, Rz1max.≤200 8.0 40.0
1) Rz is used for measurement of Rz, Rv, Rp, Rc, and Rt.
2) Rz1max. only used for measurement of Rz1max., Rv1max., Rp1max., and Rc1max.
Table 3: Sampling lengths for measurement of periodic roughness

profile roughness parameters and periodic or aperiodic profile
0 10 20 30 40 50 60 70 80 90 100 parameter Rsm.
Rmr0 Rmr
Rsm (mm) Sampling length lr (mm) Evaluation length ln (mm)
0.013<Rsm≤0.04 0.08 0.4
Relative material ratio of the primary profile Pmr, the roughness
0.04<Rsm≤0.13 0.25 1.25
profile Rmr and the waviness profile Wmr.
0.13<Rsm≤0.4 0.8 4.0
Material ratio determined at a profile section level Rδc (or Pδc or Wδc),
0.4<Rsm≤1.3 2.5 12.5
related to the reference section level c0.
1.3<Rsm≤4 8.0 40.0
Pmr, Rmr, Wmr = Pmr (c1), Rmr (c1), Wmr (c1)

where c1 = c0 – Rδc (Rδc, Wδc)
c0 = c (Pm0, Rmr0, Wmr0)
Procedure for determining a sampling length
> Fig 1: Procedure for determining the sampling length of an aperiodic profile if it is not specified. PG
51
Estimate Ra, Rz, Rz1max., or RSm according to recorded

waveforms, visual inspection, etc.
Estimate the sampling length from an estimated value

and Tables 1 to 3
Measure Ra, Rz, Rz1max., or RSm according to the estimated

value of the sampling length
Does each measured value meet the parameter range of Table No Change to a longer or
1, 2, or 3? shorter sampling length
Yes
No
Has a shorter sampling length been tried? Change to a shorter sampling length
Yes
Measure the parameter according to the final sampling length
> Fig 2: Procedure for determining the sampling length of a periodic profile if it is not specified.
Estimate RSm from a measured roughness profile
Estimate the sampling length from an estimated value

and Table 3
Measure RSm according to the estimated value of

the sampling length
No Change the sampling length so as to

Does the measured value meet the condition of Table 3?
meet the condition of Table 3
Yes
Measure the parameter according to the final sampling length

Contour measurement
Traceable angle Simple or complex arm guidance
The maximum angle at which a stylus can trace upwards or downwards In the case of a simple pivoted arm, the locus that the stylus tip traces
along the contour of a workpiece, in the stylus travel direction, is during vertical movement (Z direction) is a circular arc that results in an
referred to as the traceable angle. A one-sided sharp stylus with a tip unwanted offset in X, for which compensation has to be made. The
PG angle of 12° (as in the figure) below can trace a maximum 77° of up larger the arc movement, the larger is the unwanted X displacement
52 slope and a maximum 87° of down slope. For a conical stylus (30° (δ) that has to be compensated (see figure below). The alternative is
cone), the traceable angle is smaller. An up slope with an angle of 77° to use a complex mechanical linkage arrangement to obtain a linear
or less overall may actually include an angle of more than 77° due to translation locus in Z, and therefore avoid the need to compensate in X.
the effect of surface roughness. Surface roughness also affects the
measuring force. Compensating for arm rotation
The stylus is carried on a pivoted arm so it rotates as the surface is
traced and the contact tip does not track purely in the Z direction.
Therefore it is necessary to apply compensation in the X direction to
ensure accuracy. There are three methods of compensating for arm
Down slope
rotation.
1: Mechanical compensation
Up slope 77º or less 87º or less δ
Example: For models CV-3200/4500, the same type of stylus (SPH-71:

one-sided sharp stylus with a tip angle of 12°) can trace a maximum 77°
up slope and a maximum 83° down slope.
2: Electrical compensation or 3: Software processing
Compensating for stylus tip radius
Stylus
A recorded profile represents the locus of the centre of the ball tip
δ Measuring arm
rolling on a workpiece surface. (A typical radius is 0.025 mm.) Obviously
this is not the same as the true surface profile so, in order to obtain an
Fulcrum
accurate profile record, it is necessary to compensate for the effect of
the tip radius through data processing.
Workpiece contour
Recorded profile
RxM Stylus δ: Unwanted displacement in X to be compensated
To measure a workpiece contour that involves a large displacement in

M the vertical direction with high accuracy, one of these compensation
Rx
RxM methods needs to be implemented.
R: Stylus tip radius

M: Measurement magnification Z axis measurement methods
Though the X axis measurement method commonly adopted is by
means of a digital scale, the Z axis measurement divides into analogue
If a profile is read from the recorder through a template or scale, it is methods (using a differential transformer, etc.) and digital scale
necessary to compensate for the stylus tip radius beforehand according methods. Analogue methods vary in Z axis resolution depending on
to the applied measurement magnification. the measurement magnification and measuring range. Digital scale
methods have fixed resolution. Generally, a digital scale method
Accuracy provides higher accuracy than an analogue method.
As the detector units of the X and Z axes incorporate scales, the
magnification accuracy is displayed not as a percentage but as the Overload safety cutout
linear displacement accuracy for each axis. If an excessive force (overload) is exerted on the stylus tip due, perhaps,
to the tip encountering a too-steep slope on a workpiece feature, or
a burr, etc., a safety device automatically stops operation and sounds
an alarm buzzer. This type of instrument is commonly equipped with
separate safety devices for the tracing direction (X axis) load and
vertical direction (Y axis) load. For example, models CV-3200/4500
are fitted with a safety device that functions if the arm comes off the
detector mount.
Contour analysis Tolerancing with design data
The measured contour is input into the data processing section in Measured workpiece contour data can be compared with design data
real time and a dedicated program performs the analysis, controlled in terms of actual and designed shapes rather than just analysis of
through the mouse and/or keyboard. Angle, radius, step, pitch and individual dimensions. In this technique each deviation of the measured
other data are directly displayed as numerical values. Analysis combining contour from the intended contour is displayed and recorded. Also, PG
coordinate systems can be easily performed. Stylus tip-radius correction data from one workpiece example can be processed so as to become 53
is applied and the result is output to a printer as the recorded profile. the master design data to which other workpieces are compared. This
function is particularly useful when the shape of a section greatly
Best-fitting affects product performance, or when its shape has an influence on
If there is a standard for surface profile data, tolerancing with design the relationship between mating or assembled parts.
data is performed according to the standard. If there is no standard, or
if tolerancing only with shape is desired, best-fitting between design Data combination
data and measurement data can be performed. Conventionally, if tracing a complete contour is prevented by stylus
traceable-angle restrictions then it has to be divided into several
> Before best-fit processing > After best-fit processing sections that are then measured and evaluated separately. This function
avoids this undesirable situation by combining the separate sections
Measured data Measured data
into one contour by overlaying common elements (lines, points) onto
each other. With this function the complete contour can be displayed
and various analyses performed in the usual way.
Design Design
data data
Data 1 Data 2
The best-fit processing algorithm searches for deviations between

both sets of data and derives a coordinate system in which the sum Data combination
of squares of the deviations is a minimum when the measured data is
overlaid on the design data.
> Aspheric lens contour. > Inner/outer ring contour of a bearing. > Internal gear teeth.
> Female thread form. > Male thread form. > Gauge contour.

Roundform measurement
The following overview is based on the ISO 1101: 2012 and ISO 4291: 1985 standards. Refer to these standards for more detail if required.
Roundness Straightness
Any circumferential line must be contained within the tolerance zone Any line on the surface must lie within the tolerance zone formed
PG formed between two coplanar circles with a difference in radii of t. between two parallel straight lines a distance t apart and in the
54 direction specified
> Notation example.
0.1
> Notation example.
0.1
> Tolerance zone.

> Tolerance zone. t
t
> Verification example using a > Verification example using a

roundness tester. roundness tester.
Flatness Cylindricity
The surface must be contained within the tolerance zone formed The surface must be contained within the tolerance zone formed
between two parallel planes a distance t apart. between two coaxial cylinders with a difference in radii of t.
> Notation example. > Notation example.

0.1 0.1
> Tolerance zone. > Tolerance zone.
t > Verification example using a > Verification example using a

Concentricity Coaxiality
The centre point must be contained within the tolerance zone formed The axial line must be contained within the tolerance zone formed by a
by a circle of diameter t concentric with the datum. cylinder of diameter t concentric with the datum.
> Notation example. > Notation example.

A
ø0.08 A
A ø0.08 A

øt øt
Datum axis
Datum
centre > Verification example using a > Verification example using a
Perpendicularity
The line or surface must be contained within the tolerance zone formed by a cylinder of diameter t perpendicular to the datum or between two
planes a distance t apart perpendicular to the datum.
> Notation example: Axis-to-Plane. > Notation example: Plane-to-Axis.

PG
A
ø0.08 A ø0.08 A 55

øt
Datum
Datum A
centre
> Verification example using a t

> Verification example using a
Circular runout
The line must be contained within the tolerance zone formed between two coplanar and/or concentric circles a distance t apart concentric with the
datum.
> Notation example: Radial. > Notation example: Axial.
0.1 A 0.1 A
A A

øt
Datum axis Datum axis

roundness tester. t roundness tester.
Total runout
The surface must be contained within the tolerance zone formed between two coaxial cylinders with a difference in radii of t, or planes a distance t
apart, concentric with or perpendicular to the datum.
> Notation example: Radial. > Notation example: Axial.
0.1 A 0.1 A
A A

t
Datum axis Datum axis

roundness tester. t roundness tester.

Roundform measurement
Adjustment prior to measurement
Centering Levelling
A displacement offset (eccentricity) between the turntable axis of a Any inclination (θ) of the axis of a workpiece with respect to the
PG roundness tester and that of the workpiece results in distortion of the rotational axis of the measuring instrument will cause an elliptic error
56 measured form (limaçon error) and consequentially produces an error (e) in the roundness value. Levelling must be performed so that these
in the calculated roundness value. The larger the eccentricity, the larger axes are sufficiently parallel.
is the error in calculated roundness. Therefore the workpiece should be
centered (axes made coincident) before measurement. Some roundness
testers support accurate measurement with a limaçon error correction
function. The effectiveness of this function can be seen in the graph θ
below. D
Turntable axis Workpiece axis
Eccentricity
D e
> Effect of eccentricity compensation function > Inclination versus elliptic error
1000 ø1 100
ø2 Workpiece
ø5 diameter
ø10 (mm) ø200
100 10 ø100
Error due to eccentricity (µm)
ø20
Error due to inclination (µm)
ø50
ø50
ø100 ø20
10
ø200
1 ø10 Workpiece
ø5 diameter
ø2 (mm)
1 0.1 ø1
0.1 0.01
0.01 0.001
1 10 100 1000 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1
Eccentricity (µm) Inclination (degrees)
Evaluating the measured profile roundness

Roundness (RONt) testers use the measurement data to generate reference circles whose dimensions define the roundness value. There are four
methods of generating these circles, as shown below, and as each method has individual characteristics the method that best matches the function
of the workpiece should be chosen.
> Least squares circle method > Minimum zone circles method > Minimum circumscribed circle > Maximum inscribed circle
(LSCI) (MZCI) method (MCCI) method (MICI)
ΔZ ΔZ ΔZ ΔZ
q z c i
Rmin Rmin Rmin Rmin
Rmax Rmax Rmax Rmax
RONt = Rmax - Rmin RONt = Rmax - Rmin RONt = Rmax - Rmin RONt = Rmax - Rmin
A circle is fitted to the measured profile Two concentric circles are positioned to The smallest circle that can enclose The largest circle that can be enclosed
such that the sum of the squares of enclose the measured profile such that the measured profile is created. The by the profile data is created. The
the departure of the profile data from their radial difference is a minimum. The roundness figure is then defined as roundness figure is then defined as
this circle is a minimum. The roundness roundness figure is then defined as the the maximum departure of the profile the maximum departure of the profile
figure is then defined as the difference radial separation of these two circles. from this circle. This circle is sometimes from this circle. This circle is sometimes
between the maximum departures of referred to as the ring gauge circle. referred to as the plug gauge circle.
the profile from this circle (highest peak
to the lowest valley).
Effect of filter settings on the measured profile
Roundness (RONt) values as measured are greatly affected by variation of filter cutoff value. It is necessary to set the filter appropriately for the
evaluation required.
> No filtering > Low-pass filtering

PG
RONt = 22.14 µm RONt = 16.60 µm RONt = 12.35 µm RONt = 20.72 µm RONt = 22.04 µm 57
15 upr 50 upr 150 upr 500 upr
RONt = 17.61 µm RONt = 18.76 µm RONt = 14.50 µm

> Band-pass filtering
15-150 upr 15-500 upr 50-500 upr
Interpreting waviness in the measured profile
> Unfiltered measurement result 90

Amplitude
180 0 0
0 90 180 270 360
270 Angle
A 1 UPR condition indicates eccentricity of the workpiece relative to the rotational axis A 5 to 14 UPR condition often indicates unbalance factors in the machining method or
of the measuring instrument. The amplitude of undulation components depends on the processes used to produce the workpiece.
levelling adjustment
90
90
Amplitude
180 0 0
Amplitude
0 90 180 270 360

180 0 0
0 90 180 270 360
270 Angle
270 Angle
90
A 2 UPR condition may indicate: (1) insufficient levelling adjustment on the measuring
Amplitude
instrument; (2) circular runout due to incorrect mounting of the workpiece on the 180 0 0
machine tool that created its shape; (3) the form of the workpiece is elliptical by design 0 90 180 270 360
as in, for example, an IC-engine piston.
270 Angle
90
A 15 (or more) UPR condition is usually caused by tool chatter, machine vibration, coolant
Amplitude
180 0 0 delivery effects, material non-homogeneity, etc., and is generally more important to the
0 90 180 270 360
function than to the fit of a workpiece.
270 90
Angle
Amplitude
A 3 to 4 UPR condition may indicate: (1) Deformation due to over-tightening of the 0

180 0
holding chuck on the measuring instrument; (2) Relaxation deformation due to stress 0 90 180 270 360
release after unloading from the holding chuck on the machine tool that created its
shape. 270 Angle
90
90
Amplitude
Amplitude
180 0 0
0 90 180 270 360 180 0 0
0 90 180 270 360
270
Angle 270 Angle
90
Amplitude
180 0 0
0 90 180 270 360
270 Angle

Hardness testing
Hardness test methods and guidelines for selection of a hardness testing machine
Test method
Micro hardness Micro surface Vickers Rockwell Rockwell Brinell Shore For sponge, Rebound
Factors to consider
(Micro-Vickers) material Superficial rubber, type
characteristics and plastic portable
PG IC wafer ● ●
58
Carbide, ceramics (cutting tool) ▲ ● ●
Steel (heat-treated material, raw material) ● ▲ ● ● ● ● ●
Material
Non-ferrous metal ● ▲ ● ● ● ●
Plastic ▲ ● ●
Grinding stone ●
Casting ●
Sponge, rubber ●
Thin metal sheet (safety razor, metal foil) ● ● ● ●
Thin film, plating, painting, surface layer (nitrided layer) ● ●
Small parts, acicular parts (clock hand, sewing-machine needle) ● ▲
Large specimen (structure) ● ● ●
Form
Metallic material configuration (hardness for each phase of multi-

● ●
layer alloy)
Plastic plate ▲ ▲ ● ●
Sponge, rubber plate ●
Strength or physical property of materials ● ● ● ● ● ● ● ● ▲
Heat treatment process ● ● ● ● ▲ ▲
Carburized case depth ● ●
Decarburized layer depth ● ● ●
Flame or high-frequency hardening layer depth
Application
● ● ●
Hardenability test ● ●
Maximum hardness of a welded spot ●
Weld hardness ● ●
High-temperature hardness (high-temperature characteristics, hot-
●
workability)
Fracture toughness (ceramics) ● ●
Key: ● = Very suitable, ▲ = Suitable
Methods of hardness measurement
1) Vickers 2) Knoop
Vickers hardness is a test method that has the widest application As shown in the following formula, Knoop hardness is a value obtained
range, allowing hardness inspection with an arbitrary test force. This by dividing test force by the projected area A (mm2) of an indentation,
test has an extremely large number of application fields particularly which is calculated from the longer diagonal length d (mm) of the
for hardness tests conducted with a test force less than 9.807N indentation formed by pressing a rhomboidal diamond indenter
(1 kgf). As shown in the following formula, Vickers hardness is a value (opposing edge angles of 172º30' and 130º) into a specimen with test
determined by dividing test force F (N) by contact area S (mm2) between force F applied. Knoop hardness can also be measured by replacing the
a specimen and an indenter, which is calculated from diagonal length d Vickers indenter of a micro hardness testing machine with a Knoop
(mm, mean of two directional lengths) of an indentation formed by the indenter.
indenter (a square pyramidal diamond, opposing face angle θ = 136º) in
F:N
the specimen using a test force F (N). k is a constant (1/g = 1/9.80665). F F F F
HK = k = 0.102 = 0.102 2 = 1.451 2 d : mm
A A cd d
c : constant
F F 2F sin θ2 F F:N
HV = k = 0.102 = 0.102 = 0.1891 2
S S d2 d d : mm 3) Rockwell and Rockwell Superficial
To measure Rockwell or Rockwell Superficial hardness, first apply
The error in the calculated Vickers hardness is given by the following a preload force and then the test force to a specimen and return to
formula. Here, Δd1, Δd2, and a represent the measurement error that the preload force using a diamond indenter (tip cone angle: 120º, tip
is due to the microscope, an error in reading an indentation, and the radius: 0.2 mm) or a sphere indenter (steel ball or carbide ball). This
length of an edge line generated by opposing faces of an indenter tip, hardness value is obtained from the hardness formula expressed by
respectively. The unit of Δθ is degrees. the difference in indentation depth h (µm) between the preload and
test forces. Rockwell uses a preload force of 98.07N, and Rockwell
ΔHV ΔF Δd1 + Δd2 a2 Superficial 29.42N. A specific symbol provided in combination with a
≅ - 2( ) - 2 3.5 x 10-3Δθ
HV F d d type of indenter, test force, and hardness formula is known as a scale.
International standards define various scales of related hardness.
Relationship between Vickers hardness and the minimum recommended thickness of a specimen
Test force
F: N
F: kgf 4.903 x 10-3
Minimum thickness Diagonal length
of specimen of indentation 0.001 9.807 x 10-3
PG
t: mm d: mm 0.002 19.61 x 10-3 59
0.001 0.003 29.42 x 10-3
Vickers hardness 0.001 0.005 49.03 x 10-3
0.002
HV 0.003 0.002 0.01 98.07 x 10-3
d 0.005 0.003 0.02 0.1961
2000 0.005 0.03 0.2942
0.01
h
0.01 0.05 0.4903

1000 0.02
t
500 0.03 0.02 0.1 0.9807

300 0.05 0.03 0.2 1.961
F 200 0.05 0.3 2.942
HV = 0.1891 2 0.1
d 100 0.1 0.5 4.903
t > 1.5d 0.2
h ≅ d/7 50 0.3 0.2 1 9.807
30 0.5 0.3 2 19.61
t : Thickness of specimen (mm) 20 0.5 3 29.42
d : Diagonal length (mm) 1
Example 1 5 49.03
h : Depth of indentation (mm) Specimen thickness t: 0.15 mm 2
3 2 10 98.07
Specimen hardness: 185HV1
Test force F: 9.807N (1 kgf) 20 196.1
30 294.2
Diagonal length d: 0.1 mm
50 490.3
Relationship between Rockwell / Rockwell Superficial hardness and the minimum recommended
thickness of a specimen
> Rockwell hardness > Rockwell hardness > Rockwell Superficial hardness
1.8 3.30 1.4
Minimum thickness of specimen (mm)
1.7 3.15 1.2

HRT
1.6 3.00 1.0
1.5 2.85 0.8
1.4 2.70 0.6

1.3 2.55 0.4 HRN
1.2 2.40 0.2
1.1 2.25 0.0
1.0 2.10 10 20 30 40 50 60 70 80 90 100
0.9 1.95 15N
0.8 1.80 30N
0.7 1.65 15T
0.6 1.50 45N
0.5 1.35 30T
0.4 1.20 45T
0.3 1.05
0.2 0.90
0.1 0.75
10 20 30 40 50 60 70 80 90 100 20 30 40 50 60 70 80 90 100
HRD HRH
HRC HRE
HRA HRF
HRK
HRG
HRB
Rockwell hardness scales Rockwell Superficial hardness scales

Test force Test force
Scale Indenter Application Scale Indenter Application
(N) (N)
A 588.4 Carbide, thin steel sheet 15N 147.1
Thin, hard layer on steel such as a carburized
D Diamond 980.7 Case-hardening steel 30N Diamond 294.2
or nitrided layer
C 1471 Steel (greater than 100HRB or less than 70HRC) 45N 441.3
F Ball with a 588.4 Bearing metal, annealed copper 15T Ball with a 147.1
B diameter of 980.7 Brass 30T diameter of 294.2 Thin metal sheet of soft steel, brass, bronze, etc.
G 1.5875 mm 1471 Hard aluminium alloy, beryllium copper, phosphor bronze 45T 1.5875 mm 441.3
H Ball with a 588.4 Bearing metal, grinding stone 15W Ball with a 147.1
E diameter of 980.7 30W diameter of 294.2 Plastic, zinc, bearing alloy
3.175 mm Bearing metal
K 1471 45W 3.175 mm 441.3
L Ball with a 588.4 15X Ball with a 147.1
M diameter of 980.7 Plastic, lead 30X diameter of 294.2 Plastic, zinc, bearing alloy
P 6.35 mm 1471 45X 6.35 mm 441.3
R Ball with a 588.4 15Y Ball with a 147.1
S diameter of 980.7 Plastic 30Y diameter of 294.2 Plastic, zinc, bearing alloy
V 12.7 mm 1471 45Y 12.7 mm 441.3

Coordinate measuring machines
Coordinate measuring machines for general measurement applications are available in many configurations, but the three types described below are
among the most popular. Points of comparison include stability, measuring volume versus total volume ratio, workpiece clamping convenience and
initial cost, among others. The fixed bridge type is favoured for machines in the highest accuracy class.
PG Moving bridge CMM

60 This type comprises a vertically moving ram (the Z axis) attached to
a carriage that moves horizontally (the X axis) on a bridge structure
supported by a base, on which it moves horizontally (the Y axis). The
workpiece is mounted on the base.
Z X
Fixed bridge CMM

This type comprises a vertically moving ram (the Z axis) attached to a
carriage that moves horizontally (the X axis) on a bridge structure rigidly
attached to a base, on which a table moves horizontally (the Y axis). The
workpiece is mounted on the moving table.
Z X
Horizontal arm CMM

This type comprises a horizontally moving ram (the Z axis) attached to
a carriage that moves vertically (the Y axis) on a column supported by
a base, on which it moves horizontally (the X axis). The workpiece is
mounted on the base.
Z X
The probe system
PG
61
Ram
Probe changing system

Probe extension
Probe
Stylus changing system
Probing system
Stylus extension
Stylus system
(composed of stylus Stylus shaft (or shank)
system components)
Stylus tip
Stylus
Tip diameter

Coordinate measuring machines
The procedure for assessing the performance of CMMs is defined in the multi-part international standard ISO 10360. This page gives you an
overview of the CMM-specific parameters defined in this standard that may be referenced in Mitutoyo catalogues and product brochures.
Maximum permissible measuring error (MPE) of length measurement E0,MPE (ISO 10360-2:2001)
PG This part of ISO 10360 defines acceptance and reverification tests for coordinate measuring machines. The test procedure is that a coordinate
62 measuring machine (CMM) is made to perform a series of measurements on five different test lengths in each of seven directions, as shown in
Figure 1, to produce a set of 35 measurements. This sequence is then repeated twice to produce 105 measurements in all. If these results, including
allowances for the uncertainty of measurement, are equal to or less than the values specified by the manufacturer then the performance of the
CMM has been proved to meet its specification.
The standard allows up to five measurements to exceed the specified value (two NG results among 3-time measurements in the same position
are not allowed). If this is the case, additional 10-times measurements for the relevant position are performed. If all the 10 results, including the
uncertainty allowance, are within the specified value, the CMM is assumed to pass the test. The uncertainties to be considered in determining the
maximum permissible measuring error are those concerning calibration and alignment methods used with the particular material standards of length
involved with the test. (The values obtained by adding an extended uncertainty combining the above two uncertainties to all test results must be less
than the specified value.) The result of the test may be expressed in any of the following three forms (unit: µm).
> Figure 1
Typical test measurement directions within the CMM measuring volume.
A: Constant (µm) specified by the manufacturer

E0,MPE = A + L/K ≤ B K: Dimensionless constant specified by the manufacturer
E0,MPE = A + L/K L: Measured length (mm)
E0,MPE = B
B: Upper limit value (µm) specified by the manufacturer
Maximum permissible scanning probing error MPETHP (ISO 10360-4:2000)

This part of ISO 10360 defines the accuracy of a CMM equipped with a scanning probe. The test procedure is to perform a scanning measurement
of 4 planes on the standard sphere and then, for the least squares sphere centre calculated using all the measurement points, calculate the range
(dimension A in Figure 2) in which all measurement points exist. Based on the least squares sphere centre calculated above, calculate the distance
between the calibrated standard sphere radius and the maximum measurement point or minimum measurement point, and take the larger distance
(dimension B in Figure 2). Add an extended uncertainty that combines the uncertainty of the stylus tip shape and the uncertainty of the standard test
sphere shape to each A and B dimension. If both calculated values are less than the specified values, this scanning probe test is passed.
Stylus Calibrated value

Least squares sphere of standard sphere
radius
45º
Scan plane 2
Scan plane 1
Scan plane 3
Least squares
sphere centre
Scan plane 4 A
Measurement
points B
> Figure 2
Target measurement planes for the maximum permissible scanning probing error and its evaluation concept.
Maximum permissible single stylus form error PFTU,MPE (ISO 10360-5:2010)
This part of ISO 10360 defines the accuracy of a CMM using stylus contacting probing systems. The test procedure is that a probe is used to measure
defined target points on a standard sphere (25 points, as in Figure 3) and the result used to calculate the position of the sphere centre by a least
squares method. Then the distance R from the sphere centre for each of the 25 measurement points is calculated, and the radius difference Rmax -
Rmin is computed. An extended uncertainty that combines the uncertainty of the stylus tip shape and that of the standard test sphere is added to PG
the radius difference. If this final calculated value is equal to or less than the specified value, the probe has passed the test. 63
> Figure 2
Target points on standard sphere
for determining the maximum
permissible probing error.
22.5º
22.5º a
22.5º
22.5º
22.5º

PG
64
Mitutoyo Europe GmbH
ENGLISH EDITION
Borsigstr. 8 -10
41469 Neuss
T +49 (0) 2137 -102-0
F +49 (0) 2137 -102-351
[email protected]
www.mitutoyo.eu Precision instruments in dimensional metrology

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What are the different types of measuring instruments described in the document?

What are the different types of measuring instruments described in the document?

How is the accuracy of coordinate measuring machines tested according to ISO 10360 standards?

How is the accuracy of coordinate measuring machines tested according to ISO 10360 standards?

Mitutoyo Europe GmbH

QUICK GUIDE TO MEASUREMENT

Dial gauges and digital indicators 28

Laser scan micrometers 34

Vision measuring machines 42

Coordinate measuring machines 60

Quick Guide to Measurement

Independent confirmation of compliance

> Testing for EMC compatibilty.

Quick Guide to Measurement

Population Process capability

Dispersion Note: If a characteristic follows the normal distribution, 99.74% of the

Unilateral tolerance ... if only the upper limit is stipulated

Measured values Specific examples of Cp values for bilateral tolerancing:

Quick Guide to Measurement

Standard analogue outside micrometer

Measuring faces Spindle Sleeve Index line Adjusting nut

Thimble scale Thimble

Digital outside micrometer

Measuring faces Sleeve Thimble

Index line Ratchet

Digimatic output connector

Display reading HOLD button

Blade micrometer Inside micrometer, caliper type Spline micrometer

Tube micrometer Point micrometer Screw thread micrometer

Disc type outside micrometer Gear tooth micrometer V-anvil micrometer

Quick Guide to Measurement

Index line Thimble line Index line Thimble line

Micrometer with vernier scale (graduation: 0.001 mm)

Micrometer with mechanical-digit display (digital step:

The above experimental graph shows how a particular micrometer

Measurement error (µm)

Quick Guide to Measurement

a) Apparent reduction in diameter

two planes two planes Thread type Optimum wire size

1. Perform correction calculation.

Then, assign the calculated M to

Optical parallel Fringes seen on the spindle

Parallelism can be estimated using an optical parallel held between the

General notes on using the micrometer

8. Be careful not to drop or bump the micrometer on anything. Do

Quick Guide to Measurement

> Flat face > Spherical face > Anti-rotation device

etc., which require ultra-fine feed or adjustment of spindle. 5 45

Guidelines for self-made fixtures

Quick Guide to Measurement

Long spindle types are also available. Please consult Mitutoyo.

2. Stem types 6. Thimble mounting

> Threaded > Flanged

> Standard > Reverse 9. All-stainless construction

0 0 10. Simple packaging

> Offset zero > Graduations only

Type Maximum loading limit

(1) Locknut (2) Split-body clamp (3) Setscrew clamp

Mounting method Damaging / dislodging load*