Ceph Tracings-Custom and Advanced Features: Show Photo of Occlusion During Digitizing
Ceph Tracings-Custom and Advanced Features: Show Photo of Occlusion During Digitizing
Ceph Tracings-Custom and Advanced Features: Show Photo of Occlusion During Digitizing
During treatment a patient's radiograph will indicate if landmarks or structures have changed. For accuracy and simplicity
digitize a progress or final x-ray using overlay tracings from the initial radiograph. Transfer all the structures that did not
change.
The Overlay module enables you to quickly and accurately trace cephalometric radiographs.
Overlay a tracing from another timepoint. Only digitize the landmarks that changed.
The custom analyses you define are stored in two files: CstAnalysis.bin and CstLateralMs.bin. The CstLateralMs.bin file
is only present if you have created custom group categories or custom norms. You can copy these two files to another
computer to share your custom analyses. Bear in mind, however, that copying these two files to another computer
overwrites any custom analyses that were already defined on the target computer.
Also, upgrading Dolphin Imaging does not overwrite these two files. Therefore, your
custom analyses are retained when you upgrade the software.
Custom Analysis Editor can be accessed either from the Cephalometric Measurements or the Digitize Setup window.
Tracing Lines- These lines identify the structures that Dolphin Imaging can
automatically draw when you digitize a patient's radiograph using a particular
analysis.
Use Landmarks- These landmarks are included in the analysis but are not used
to create measurements and tracing lines.
Modify an existing analysis
The easiest and most common usage is to start with an
existing analysis and modify it to include additional
measurements and landmarks as desired.
File | Open
Search All- Select this radio button to find an analysis item based on one or more of the
following search criteria.
Measurement Type- Check this box and select from the associated drop-down
list box to find measurements of a particular type. You can view measurements that are
distances, angles, percentages (ratios), or measurements of any other type.
Uses Landmarks- Check this box and click Landmarks to find an analysis item
that uses one or more landmarks.
Name Contains- Enter a partial name in this text box to find an analysis item
based on its name.
Custom Analysis Editor
Setting Properties for a Measurement
To set properties for a measurement:
Double-click a measurement in the Used
Measurements list box.
If you are viewing properties for a measurement from the Used Measurements list box, set any properties for this
measurement, and click OK. For measurements from the Available Measurements list box, you can only view the properties.
Drop-down list box: Select from a list of the tracing locations currently-defined for this
measurement.
Drop-down list box: Select from a list of the norm sets currently defined for this measurement.
Enter the norm values in the cells in the table. The number of
table cells depends on whether the Norms Vary by Age and
Norms Vary by Race boxes are checked.
Symbols
When you add an item to your custom analysis, the selected
Displays on measurement table item moves to the Used Measurements, Used Tracing
Lines, or Used Misc. Landmarks list box, as appropriate.
Displays on tracing
If the item is a measurement, a symbol in the left column indi-
Displays during tracing
cates whether the item will appear on measurement tables or
Displays on tracing as a number tracings. If the measurement's properties specify that
it should appear on both, the item appears twice.