M 2M G EK KO®

State-of-the-art phased-array flaw detector with TFM

 USER FRIENDLY FLAW DETECTOR
Gekko® is the only compact phased-array ultrasound testing (PAUT) instrumentation offering
intuitive PA features and real-time total focusing method (TFM).

UNIQUE SET OF NDT TECHNIQUES EASY INTERFACE

With a 64-channel parallel architecture, Gekko is the only flaw Gekko’s user-interface is developed to ease the work of
detector offering conventional UT, standard PAUT, TOFD and operators from level 1 operators to experts. Using simple but
real-time Total Focusing Method (TFM). powerful wizards, users can customize reliable field-ready
applications. Thanks to visual libraries and dedicated apps,
COMPLETE TOOLSET the risk for errors is reduced while making the inspection
All Gekko techniques (UT, TOFD, PAUT, TFM) are available for easier and faster.
conventional and phased-array probes as well as dual array
GUIDED
probes (linear and matrix). Delay laws can be calculated
onboard avoiding the need to import them from a PC. With Step-by-step guidance is offered throughout the complete
a fast SSD hard drive, operators can store large inspection inspection process, including equipment definition, calibration
files (10 Gb) and analyze them on the spot using the 10.4’’ and acquisition. Gekko offers 3-click calibration tools for
touchscreen. Incremented data saving and automatic reports probe balancing, material calibration, wedge calibration,
can be customized and exported as PDF files. Data can also TCG and TOFD, for quicker and easier code-compliant
be exported for analysis on a PC using the free viewer provided inspections.
with Gekko.

intuitive and guided GUI 2PA and 3D representation

 COMPLETE NDT TOOLSET
Some procedures require standard UT, others TOFD or PA. With Gekko, all UT-techniques are
included to offer a versatile and field-ready equipment.

WELD INSPECTION
Several features such as weld overlays, exact delay laws,
800% dynamic range and 3D corrected images ease the
diagnostic to detect and size flaws. Combining various
techniques and using up to 8 groups in a single pass
substantially increases the productivity of inspections. Gekko
is compatible with scanners and accessories from various
vendors.

NOZZLE INSPECTION
With the  possibility to define nozzle type geometries
on-board, the Gekko can be used for 3-axis encoded nozzle
inspections (scan, index and skew). Sscan images
superimposed on the Cross-section overlays of the nozzle are
calculated as the operator moves the probes.

CORROSION MAPPING
Gekko can be used with Chain scanners for corrosion
mapping. Real-time data is displayed allowing corrosion
detection. Cscan amplitude and time of flight are available.
 HIGH-RESOLUTION FLAW DETECTOR
For unparalleled resolution detection and characterization, Gekko offers the real-time Total Focusing Method
(TFM) imaging.

REAL-TIME TFM TFM-scan C-scan TFM

TFM is a powerful technique that focuses at each point

of a user-specified zone for accurate defect
characterization and high-resolution imaging. Real-
time imaging with speed of up to 30 frames per second
can be achieved, for clear image and defect contouring.
The TFM has a 256x256 pixels image resolution (65K
points focusing).

EXTENDED TFM IMAGES

A-B-S-C Scan + 3D views are already available for
standard PA. Gekko extends all those views to TFM
allowing an operator to use advanced imaging in a
familiar environment.
Echodynamic A-scan TFM

HYDROGEN BLISTERING CHARACTERIZATION

HTHA High Temperature Hydrogen Attack.

SCREW THREAD INSPECTION

Optimal resolution is obtained along the thread.

HIC Small defect detection for carbon steel specimen.

inspection.
Courtesy of Karl Deutsch
Courtesy of Comex
 BETTER CHARACTERIZATION AND DEFECT SIZING

REAL-TIME TFM
Reduced dead zone: detection of corrosion less than
1mm from the front surface. Pitting detection smaller
than 1 mm.

Corrosion till 1 mm under the surface

Courtesy of Insitut de Soudure

Detection of inclined area

0.5 mm pitting detection

TRUE IMAGING OF 2-MM ELLIPTICAL 3-AXIS POLAR SCANNER FOR COMPOSITE

FATIGUE CRACK INSPECTION
Sizing of defects possible even without a diffraction 3-axis polar scanner motion can be read by the
signal. Gekko and transformed into a X, Y Cscan for
composite inspection. Gekko data files can be up to
True-shape imaging of defects.
10 Gb.

D-Scan and TFM reconstruction Cartography acquisition and 3D view

SPECIFICATIONS
GENER AL I/O
10.4‘’ high contrast resistive screen 1 IPEX connector for phased-array (can be
L x W x H: 410mm x 284mm x 126mm 4 LEMO 00 connectors for UT-TOFD (4PR)
Resolution 1024x768 px upgraded to 2 with splitter)

Operating temperature range: Weight: 6kg (without battery) 3 encoder inputs 1 external trigger
from -10°C to 45°C | 14°F to 113°F 0,480g /battery
Remote control and data transfer through
Storage temperature range: 3 USB 2.0
Designed for IP66 Ethernet
-10°C to 60°C | 14°F to 140°F with battery
1 RJ 45 Ethernet connector 16 analog I/O
Operating time: 4h (hot swappable battery) Shock resistance according to MIL-STD-810G

PHASED-ARR AY
Maximum active aperture: 64 elements Linear scanning, sectorial scanning, compound scanning, CIVA Laws
Total number of channels : 64 Focusing modes: true depth, sound path, projection
Linear, matrix, DLA and DMA probes CIVA fueled phased-array calculator
Up to 6 probes | Up to 8 groups | Up to 2,048 delay-laws On-board focal law calculation on plate, cylinder, T & Y, nozzle

REAL-TIME TFM
Reconstruction channels: up to 64 elements Max number of points of the TFM image: up to 1Mpi (post-processing)
Max refresh rate: up to 80fps Sound paths: direct (L or S), indirect and converted modes
Real-time Adaptive TFM (ATFM) module 4 resolution levels
All calibration wizards (including TCG) available A-Scan, B-Scan, C-Scan, D-Scan, Echodynamic, Top view, Side view, 3D view

PULSERS

Negative square pulse, width: 35ns to 1250ns Negative square pulse, width: 30ns to 1250ns
Phased array channels : 1
HT voltage: from 12V to 100V (with 1V step) UT-TOFD channels : 2
HT voltage: from 12V to 200V (with 1V step)
Max. PRF: up to 20kHz Max. PRF: up to 20kHz

RECEIVERS
Input impedance: 50 Ω Input impedance: 50 Ω
Frequency range: 0.4 to 20MHz Frequency range: 0.6 to 25MHz
Phased array channels : 1
Max. input signal: 1.2Vpp UT-TOFD channels : 2
Max. input signal: 1.4 Vpp
Gain: up to 120dB (0.1dB step)
Gain: up to 120dB (0.1dB step)
Cross-talk between two channels < 50 dB

DIGITIZER ACQUISITION
Hardware acquisition gates (true-depth or Max. data flow 150 MB/s on a 128Gb SSD
Digitizing and real-time summation on 64 channels 16bits amplitude resolution
soundpath) (extensible up to 1 To)
FIR filters Max. sampling frequency: 100 MHz
A-Scan/Peak data recording Data compression
Real-time averaging up to x32 Digitizing depth up to 16k samples FMC recording Inspection data file size: SSD limitation
Rectified, RF, envelope A-scan range or delay max 65k samples Acquisition trigger on time, event, encoder Data frame loss indication

WIZARDS ANALYSIS

CAD overlay and 3D view Scanner resolution calibration CaptureTM software with analysis and
Compatibility with CIVA analysis and EnlightTM
reporting tools – Free PC Viewer
Real-time phased array calculator Amplitude calibration (TCG, ACG, DAC, DGS)
A-Scan, B-Scan, C-Scan, D-Scan, Echodynamic, Part & weld overlay: plate, cylinder, T or Y
Base-time calibration for conventional UT & PA Probe design | Weld geometry design Top view, Side view, 3D view section, nozzle
Analysis gates Digital gain , measurement indicators
Wedge calibration (angle, height, velocity) Amplitude balancing, dead element check
TOFD Lateral wave linearization and removal Customizable inspection report
Part geometry with parametric shapes:
Specimen velocity calibration
plate, cylinder, T & Y, nozzle Csv data export Amplitude range: up to 800%

1
Standard: EN ISO 18563-1 for phased array channels. / 2 Standard: EN ISO 12668-1 for conventional channels.

The information in this document is accurate as of its publication. Actual products may differ from those presented herein.

©2018 Eddyfi Technologies. M2M, Gekko, Capture, Enlight, and their associated logos are trademarks or registered trademarks of Eddyfi Technologies in the
United States and/or other countries. Eddyfi Technologies reserves the right to change product offerings and specifications without notice. 2018-08-30
www.m2m-ndt.com [email protected]