Atomic Force Psylla
Atomic Force Psylla
Atomic Force Psylla
We can generate images which look at the sample from any conceivable
angle with simple analysis software
Currently AFM is the most common form of scanning probe microscopy and
is used in all fields of science as chemistry, biology, physics, materials
science, nanotechnology, astronomy, medicine and more
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Advantages of AFM
due to its small size, it can also be combined with other microscopes or
intruments
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Disadvantages of AFM
an AFM image does not reflect the true sample topography, but rather
represents the interaction of the probe with the sample surface
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How does AFM work?
AFM provides a 3D profile of the
surface on a nanoscale, by
measuring forces (Van der Waals
forces, dipole-dipole interactions,
electrostatic forces) between a
sharp probe (<10 nm) and surface at
very short distance (0.2-10 nm
probe-sample separation)
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How are the forces measured?
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Experimental setup of AFM
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The cantilever is a bendable
structure used to hold the tip. It is
basically a spring with stiffness k
The piezoelectric materials are
used for controlling the motion of
the probe as it is scanned across
the sample surface
A laser beam is reflected by the
back side of a reflective cantilever
onto the photodetector
The position of the beam in the
sensor measures the deflection of
the cantilever and in turn the force
between the tip and the sample
The feedback loop includes all of
the structural elements that are
required to hold the probe at a
fixed distance from the sample.
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On which experimental parameters do the spatial
resolutions depend?
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How should a successful atomic force microsope be
designed and constructed?
A feedback controller that permits rapid control so that the probe can follow
the topography on the surface must be created
An X-Y-Z piezoelectric scanner that has linear and calibrated motion must
be created
A stucture that is very rigid must be constructed, so that the probe does not
vibrate relative to the surface
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AFM TIP
The tip of the AFM is used:
for imaging
for measuring forces (and mechanical properties) at the nanoscale
as a nanoscale tool, i.e. for bending, cutting and extracting soft materials
high-resolution image control
In AFM all what is «seen», is seen by the tip, so everything depends on its
shape
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AFM TIP
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AFM TIP
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AFM artifact arising from a tip with a high radius of curvature with respect to
the feature which is to be visualized
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AFM CANTILEVER
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Two equations are key to understanding the behavior of the cantilever:
The first is Stoney's formula, which relates cantilever end deflection δ to applied
stress σ:
The second is the formula relating the cantilever spring constant to the cantilever
dimensions and material
constants:
A change in the force applied to a cantilever can shift the resonance frequency.
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Imaging methods
Contact mode
• tip is in contact with the substrate
• high resolution
• can damage fragile surfaces
Tapping mode
• tip is oscillating and taps the surface
Electrochemical AFM
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What types of forces are measured?
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Modes of operation
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Contact mode (repulsive VdW)
When the spring constant of cantilever is less than surface, the cantilever
bends
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Contact mode
Advantages Disadvantages
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Non-Contact mode (attractive VdW)
The cantilever is oscillated near its resonant frequency (about 100 to 400 kHz)
with an amplitude of a few nanometers (<10 nm)
As the tip comes near the sample surface, the system detects variations in the
resonant frequency or vibration amplitude
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A virus coated on a multilayered polymer surface
was imaged. The delicate surface of the virus
can be clearly seen from the phase information
acquired by Non-Contact mode. 26
Non-contact mode
Advantages Disadvantages
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Tapping mode
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Tapping mode
Advantages Disadvantages
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Epitaxial Silicon (1x1μm2)
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What are force curves?
Force curves measure the amount of force felt by the cantilever as the
probe tip is brought close to - and even indented into - a sample surface
and then pulled away
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The slope of the deflection (C)
provides information on the
hardness of a sample
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Examples of AFM images
Topography Scanning
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Elimination of Extreme Points
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A better view
Now:
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Thickness of a Thin Layer
of Pd on Si Wafer
Systematic error
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Surface roughness
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References
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