Bruker AXS

D8 ADVANCE
Diffraction Solutions

think forward XRD

D8 ADVANCE
Highlights at
a glance

Design:
DAVINCI.DESIGN™ with
DAVINCI.MODE™
DAVINCI.SNAP-LOCK™
DIFFRAC.DAVINCI™

X-ray source:
TWIST-TUBE™

Detectors:
LYNXEYE™
VÅNTEC-1™
SOL-XE™

Optics:
TWIN™, primary
TWIN™, secondary

Best-Data Guarantee™:
Best-Alignment Guarantee™
Best-Detector Guarantee™
 D8 ADVANCE –
designed for the next
era in X-ray diffraction

The development of a new high tech product is judged

by some very formidable standards. However, these
standards become even more exacting when the product
being developed is the successor to the most successful
diffractometer in the world, boasting four thousand
installations in ten years.
Hence it was a very big challenge to develop our new
generation of diffractometers. The objective was to surpass
our previous products and to live up to our role as the top
supplier of X-ray systems for all applications.

We proudly present: the new D8 ADVANCE.

Our new D8 ADVANCE leaves nothing to be desired.
It is completely reliable and convenient to operate,
ergonomic and flexible. All these features are combined
to form a system that guarantees superior quality results,
the shortest possible measurement time and the highest
analytical performance.

Get acquainted with our new D8 ADVANCE!

2
Smart screen key display VÅNTEC-1 1-D detector TWIST-TUBE Compact Eulerian cradle

DAVINCI.SNAP-LOCK Compact XYZ stage SUPER SPEED LYNXEYE 1-D detector

TWIN optics LED shutter display Fixed slits and filters Motorized slit with Auto-Absorber

Axial Sollers LED cabinet illumination Fixed slit assembly SOL-XE energy-dispersive detector

3
4
5
 D8 ADVANCE–
understanding
the sample behind
the signal

X-ray diffraction (XRD) is the ideal,

non-destructive analytical method for
examining all types of samples!
Pharmaceuticals Pressed powder Suspension
XRD enables crystalline phases to be identified,
quantified, and their atomic structure determined
– all with very little sample preparation. This prevents
the risk of destroying the phases and/or modifying
the characteristics of the sample.
In reality, a sample with a complex composition is a
daunting challenge for many other methods – but not
so for XRD. With XRD, every detail in the diffractogram
Loose powder Fibers Small sample amounts
is meaningful and ultimately enables the full
characterization of a sample.
A diffractogram consists of peak positions,
intensities and shapes, which are characteristic of a
specific sample. Using this data, one can deduce the
properties of the sample and obtain information that
includes:
– Phase abundance
Inclusion Capillary Filters
– Phase amounts
– Textures
– Residual stress
– Crystal structure
– Microstructure
The D8 ADVANCE is always supplied together with
our DIFFRAC.SUITE. This latest and most compre-
hensive software package opens all analytical doors
Machined items Bulk sample Coatings and films for you. Thanks to DIFFRAC.SUITE, you are in a posi-
tion to meet any task from the very beginning, and
achieve the desired results. It is unparalleled in terms
of speed, simplicity and reliability.

The key to complete characterization of

your sample: DIFFRAC.SUITE!

6
3-D microstructure Typical 3-D diffraction pattern – the fingerp
of polycrystalline diffraction
material pattern X-ray diffraction on a polycrystalline
material results in a unique pattern. The
pattern is a result of the interference of
waves, which are diffracted by regular
arrangements present in the crystallites.
The dimensions of those so-called
lattice spacings are similar to the wave-
length of the X-rays. Bragg’s law links
the direction of the interference, the
wavelength, and the dimension of

2Theta range (2)

5
Randomly oriented crystallites Uniform diffraction signal
along Debye rings

Incident
beam Sample

Crystallites arranged with Non-uniform diffraction

preferred orientation signal along Debye rings
3
2

Shaped or machined sample Debye rings deformed

to ellipses 1 The sample placed in the center
of the sphere is illuminated by an
X-ray beam. The forward direction
of the beam defines the diffraction
angle 2() = 0°.
2 The crystallites in the sample
diffract X-ray photons forming
cones with specific opening angles.
The angles are defined by the
lattice spacings in the crystallites
and the photon energy or rather
wavelength. The intersection of
the cones with the sphere are the
so-called Debye rings.
Micro-amount of crystallites Individual diffraction spots
along Debye rings 3 The intensity distribution along
the Debye rings reflects the
microstructure of the sample.
In the case of a sample showing
erprint of the sample Measurement Sample
results properties
the arrangement into one equation:
n·
d = ––––––––––
2 · sin 
Crystalline phase
“d” is the lattice spacing to be
identification
determined
“n · ” is the multiple integer of phase composition
the X-ray wavelength Lambda amorphous content
“, Theta” is the direction angle polymorphism
of the interference phase transition

Qualitative phase analysis Phase identification

Debye
ring

Crystalline phase
Debye
cones quantification
composition
% crystallinity
polymorph
quantification

Quantitative phase analysis Phase quantification

4 1
Texture analysis
preferred orientation
pole figures, ODFs
texture components
orientation
quantification

Texture analysis Orientation quantification

Residual stress
strain
deformation
preferred orientation, the intensity compressibility
is non-uniform, however it exhibits
stress tensor
symmetries.
hardness
4 Diffraction does not change
the wavelength. Consequently, the
reason for a measured deformation
of the Debye rings is a direction- Stress analysis Residual stress
related lattice spacing change
which is caused by deformation
of the crystallites.
Structural analysis
5 Powder diffraction data are
recorded by scanning a detector lattice parameters
along an arc. If a Debye ring is crystalline structure
crossed, a discrete diffraction peak symmetry
appears in the scan. To record the coordination
diffraction intensities along a Debye
ring, the sample needs to be ro-
tated additionally around its surface
normal.
Crystal structure analysis Structural information
8
 DIFFRAC.SUITE
DIFFRAC.MEASUREMENT
CENTER with:
DIFFRAC.EVA: DIFFRAC.TOPAS:
Phase identification Phase quantification DIFFRAC.LOG
DIFFRAC.COMMANDER
DIFFRAC.WIZARD
DIFFRAC.DAVINCI
DIFFRAC.TOOLS
DIFFRAC.JOBLIST
DIFFRAC.START JOBS
DIFFRAC.CONFIGURATION
DIFFRAC.D8 MANAGER
DIFFRAC.EVALUATION
PACKAGE with:
DIFFRAC.EVA
DIFFRAC.TOPAS
DIFFRAC.LEPTOS
DIFFRAC.LEPTOS: DIFFRAC.MULTEX: DIFFRAC.MULTEX
Residual stress analysis Texture analysis
DIFFRAC.POLYSNAP
DIFFRAC.NANOFIT

DIFFRAC.TOPAS: DIFFRAC.TOPAS:
Structure analysis Microstructure analysis

9
 DAVINCI.DESIGN –
advanced ideas
last forever

“Leonardo da Vinci is revered for his techno-

logical ingenuity and his extraordinary powers
of invention. Leonardo developed a unique
new attitude towards machines. He reasoned
that by understanding how each separate
machine part worked, he could modify them
and combine them in different ways to im-
prove existing machines. Leonardo set out to
write the first systematic explanations of how
machines work and how the elements of
machines can be combined.”
So any qualified engineer is well-advised to take Leonardo’s
principles to heart. For over the centuries, they have lost
none of their universal validity and relevance. It is clearly
apparent which ideals our engineers adhered to when they
developed our new D8 ADVANCE.
Like no other analytical method, X-ray diffraction is charac-
terized by a wide variety of samples, applications and
evaluation methods. This inevitably results in what are
probably the most important demands on a state-of-the-art
X-ray diffractometer: an absolutely open design and
unrestricted, uncompromising modularity; coupled with
maximum user-friendliness, operating convenience and
safe handling. If, on top of this, the system relieves the
user of many of his routine tasks and supports his activities,
then an outstanding solution has been found for all X-ray
diffraction tasks:

Our new D8 ADVANCE with DAVINCI.DE-

SIGN!

10
11
 True plug & play functionality
with fully automatic component
recognition and configuration
Alignment-free switch of
configurations – whatever
your sample, whatever your
application
Absolutely open design with
maximum flexibility for future
adaptions

D8 ADVANCE and
DAVINCI.DESIGN –
the world’s 1st genuine
all-purpose diffractometer
for everyone

We are proud to present the new generation

of our D8 ADVANCE with an abundance of
unparalleled innovations.
The D8 ADVANCE with DAVINCI.DESIGN facilitates a
pioneering diffractometer concept, which eliminates the
problems of awkward configuration and adjustments once
and for all. It is extremely easy to exchange all components
and geometries.
The D8 ADVANCE with DAVINCI.DESIGN is a uniquely
modular system, incorporating all parts of the beam path
without any restriction. From the X-ray tube, through optics
and sample stages all the way to the detectors, any user –
even those with no experience – is capable of changing
from one beam geometry to another or exchanging
individual components with no trouble at all. Therefore,
our D8 ADVANCE offers unparalleled adaptability to any
conceivable application in X-ray diffraction. Our multilevel
design is especially revolutionary and offers you as a
user permanent support as well as doing all the hard
work for you:

Rely on the “Da Vinci trio”!

DAVINCI.MODE
DAVINCI.SNAP-LOCK
DIFFRAC.DAVINCI

12
 Failure-safe operation thanks to Tool-free change of all optical The virtual goniometer: real-time
real-time validation of compo- components in a second software representation of the
nents real goniometer with all compo-
Alignment-free change between
nents
Detection of missing or unsuitable different instrument geometries
components and applications Software-guided and -validated
instrument configuration with
True plug & play functionality for Push-button-motorized switch
real-time conflict detection
all components: tubes, optics, between Bragg-Brentano and
sample stages, detectors parallel-beam geometry with Missing or forgotten instrument
TWIN optics details and measurement param-
eters are a thing of the past

DAVINCI.MODE: LYNXEYE 1-D detector: VÅNTEC-1 1-D detector: SOL-XE detector:

real-time component active area 14.4 x 16 mm, active area 50 x 16 mm, true energy-dispersive
recognition and configura- covering > 3° (2) covering > 13° (2) detector
tion dedicated version for very low noise level no need for a secondary
real-time conflict hard radiation below 0.01 cps monochromator
detection

SNAP-LOCK: AUTO-CHANGER: Compact XYZ stage: Compact Eulerian

fast and easy: changing huge sample throughput all drives motorized and cradle:
optics without tools with up to 90 samples software-controlled motorized and software-
alignment-free: all optics for reflection and trans- additional sample controlled phi and chi
retain their alignment mission mode holders for unrivaled ideal stage for stress and
flexibility texture measurements

13
 The “Da Vinci trio”
for one purpose:
uncompromised
ease of use

DAVINCI.MODE
In the DAVINCI.MODE, your D8 ADVANCE monitors and
controls itself in all details. The system knows its own
state at all times. Each component, each component
replacement, and each change of status is automatically
recognized . Each component registers itself with its
specific characteristics on the system and is then
configured automatically. Thanks to DAVINCI.MODE,
it is no longer necessary to make any adjustments after
TWIN optics: Primary monochro- exchanging a component.
for primary and mator:
secondary beam focusing monochromator DAVINCI.SNAP-LOCK
push-button switch for best data quality DAVINCI.SNAP-LOCK is our unique, high-precision
between geometries Mo radiation for highly SNAP-LOCK mechanism, which enables all of the optics
absorbing materials to be exchanged within just a few seconds. Without tools
and – due to DAVINCI.MODE – without any adjustments;
all optics return to perfect alignment every time. Never
before has it been so easy, fast and reliable to change
configurations.

DIFFRAC.DAVINCI

DIFFRAC.DAVINCI is the intelligent virtual goniometer,

which completes the DAVINCI.DESIGN and opens up new,
previously unknown possibilities. DIFFRAC.DAVINCI is a
graphical representation of the actual goniometer showing
Humidity chamber: Capillary furnace:
all beam path components plus their status and providing
fully integrated tempera- compact furnace design
automatic validation of the instrument configuration with
ture and humidity control measurements up to real-time conflict detection. DIFFRAC.DAVINCI offers two
humidity experiments 1,000 °C with fully modes of operation:
between room tempera- integrated temperature
ture and 90 °C control 1. The Instrument Control Mode to configure the
instrument for immediate measurements using the
DIFFRAC.COMMANDER software.
2. The Measurement Planning Mode allows creating
measurement methods using the DIFFRAC.WIZARD
software, providing a graphical definition of the desired
instrument configuration.
DAVINCI.DESIGN:
Intuitive – fail-safe – easy.

14
15
 1

DIFFRAC.DAVINCI
The virtual goniometer:
1 Instrument Control Mode

– Real-time component recogni-

tion and status display
– Push-button switch between
Bragg-Brentano and parallel-
beam geometry with TWIN
optics
2
2 Conflict detection
DAVINCI.SNAP-LOCK
– Detection of missing,
misplaced or unsuitable
components
3 Measurement Planning Mode
– Choice between all compo-
nents configured for the
present system
– Parameterization of all fixed
and motorized components,
e.g. slit sizes, absorber thick-
3 ness, instrument geometry
(TWIN optics setting)

16
17
 Ultimate X-ray, machine and
electric safety in compliance with
the latest EU directives
Audit-proven quality management
system
Ergonomic, clearly visible and
fail-safe warning and operator
control elements
Every experiment can be
repeated years later with exactly
the same instrument configuration
and measurement parameters
Good Diffraction
Practice – absolute
safety is our
top priority

Before we ever release a new instrument, we

have already passed all audits regarding safety
and standards. Each instrument always complies
with the world’s highest statutory requirements
regarding X-ray, machine and electrical safety.
This confidence is obtained after stringent scrutiny
by independent institutions.
Regarding X-ray safety, the following applies:
Even under extraordinary test conditions, any
location outside the cabinet of our D8 ADVANCE
will exhibit significantly less than one micro-Sievert
per hour, in accordance with EURATOM
instructions. Irrespective of the instrument
configuration, under measurement conditions,
the radiation level is in the nano-Sievert range.
Two independent, fail-safe safety circuits with
separate shutter and ”X-ray On“ monitoring
guarantee that the most recent radiation and
personnel safety regulations are observed.
Furthermore, all warning and operating elements
are installed ergonomically, clearly visible, and
coordinated with one another in an elegant and
state-of-the-art design.
Design and development of our systems comply
with certified ISO 9001:2008 and GAMP
processes and procedures.

18
 Conforms to:
96/29/EURATOM
RöV
DIN EN 954-1 Cat. 3
2006/42/EG
X-ray tube LED status display Instrument ON status DIN EN 61010-1/-2
CSA C22.2 No. 1010
EN 61000-6-1/-2/-3/-4
… and many more
Approved by:
TÜV
PTB
BfS
NEMKO

Smart screen keys for instrument status display Instrument status display in software

19
 VÅNTEC-1 1-D detector LYNXEYE 1-D detector SOL-XE energy-dispersive Scintillation counter
detector

Instrument alignment – a sound base for accuracy!

0.040 Instrument alignment

± 0.01° 2Theta over
0.030 the whole angular range
– guaranteed!
0.020 Why is this important?
Accurate and verifiable
0.010 + 0.010°2 instrument alignment is
Delta 2Theta [°]

a basic requirement for

0.000 accurate and reliable
data.
-0.010

-0.020

-0.030

-0.040

20.00 40.00 60.00 80.00 100.00 120.00 140.00

2Theta [°]

20
 Solid and maintenance-free
goniometer design for mechanical
strength and long life
Instrument performance
verification with NIST corundum
standard SRM 1976a
Instrument alignment ±0.01° 2
over the whole angular range

Best-Data Guarantee – Optional IQOQ procedures for

regulated industries such as the
pharmaceutical industry
the kind of quality LYNXEYE compound silicon strip
detector with all channels fully
you can trust functional
VÅNTEC-1 detector with
patented MIKROGAP technology
for large 2Theta coverage without
defective areas

1) Alignment Guarantee: We guarantee

that the accuracy of each peak position over
the entire angular range is better than
±0.01° 2Theta!

Before delivery and during installation, every single instru-

ment must pass a strict test based on the internationally
accepted Standard Reference Material (SRM) 1976a
supplied by the American National Institute of Standards
and Technology (NIST). This standard is always included
in the delivery, enabling you to monitor instrument
performance at any time.

2) Detector Guarantee: We guarantee

absolutely faultless detectors, without any
defective detector areas!
This is due to Bruker AXS’ proprietary detector design of
LYNXEYE and VÅNTEC-1. Bruker AXS‘ 100% quality
distinguishes its detectors and means that they guarantee
the best possible data.

Best-Data Guarantee – unique at Bruker AXS.

Ultra-high-precision goniometer

21
 Everything is
possible –
D8 ADVANCE

No matter whether you are interested in the

position, the intensity or the shape of the Data acquisition with
diffraction peaks, our D8 ADVANCE provides DIFFRAC.COMMANDER
the best possible data quality in the shortest
time for all applications. Unrivaled and guaran-
teed: thanks to Bruker AXS’ DAVINCI.DESIGN
and Best-Data Guarantee!
Irrespective of how varied your applications, tasks
and samples may be, analysis becomes so simple with
our D8 ADVANCE. Thanks to its modularity and our
DAVINCI.DESIGN, you can always configure a
D8 ADVANCE exactly to satisfy your analytical needs!
The D8 ADVANCE is the basis that guarantees your
success.

This is how you use DAVINCI.DESIGN:

Define the task, select the desired beam geometry, optics, Instrument setup planning
with DIFFRAC.WIZARD
sample stage and detector. Put your desired configuration
together in a few steps – and it’s done! The rest: compo-
nent identification, configuration and adjustment are
carried out completely without user intervention by
DAVINCI.MODE.

Powder diffraction has never been so simple,

flexible and reliable. D8 ADVANCE with
DAVINCI.DESIGN – revolutionary ease of use
with uncompromised data quality!

Quantitative phase analysis

with DIFFRAC.TOPAS

22
 Unlimited flexibility and upgrade-
ability thanks to DAVINCI.DESIGN
Completely new DIFFRAC.SUITE
software package for instrument
control and data evaluation
Free choice between all
D8 ADVANCE optics and detectors

Bragg-Brentano geometry with LYNXEYE detector

LYNXEYE
X-ray source
K filter

Fixed slit Fixed slit

Rotation
sample
stage

23
 Up to 500 times faster with Intelligent sample handling:
SUPER SPEED LYNXEYE or
9-position FLIP-STICK and
VÅNTEC-1
90-position AUTO-CHANGER for
Unique radial Soller slit for reflection and transmission
VÅNTEC-1 for lowest background
Sample loading at any time
Large energy-dispersive SOL-XE
Definition of priority samples
detector for best peak-to-back-
ground ratio Automatic resumption of
interrupted measurements

Bragg-Brentano geometry with energy-dispersive SOL-XE detector High-throughput diffraction with LYNXEYE detector and AUTO-CHANGER

SOL-XE
LYNXEYE
X-ray source X-ray source
K filter

Fixed slit
Fixed slit
Motorized Motorized
slit slit

Rotation
sample 90-position
stage AUTO-CHANGER

24
 More speed,
more samples,
more sensitivity:
D8 ADVANCE
Phase identification with DIFFRAC.EVA

There are many tasks for which you

simply need more intensity and higher
sample throughput. Hence, our
D8 ADVANCE offers a host of high-perfor-
mance components for all applications.
Our 1-D detectors, LYNXEYE and VÅNTEC-1, are
what make high-resolution data collection possible in
an extremely short time. These two unique detectors
are both SUPER SPEED components. They enable
performance to be enhanced up to a factor of 500,
either in terms of intensity or sample throughput!
If your analysis results are impaired by sample
Phase quantification with DIFFRAC.TOPAS
fluorescence, then the energy-dispersive SOL-XE
detector will be your first choice. The SOL-XE
provides an excellent peak-to-background ratio
because it suppresses sample fluorescence and
K radiation almost entirely.
High intensities and short measurement times
naturally facilitate a correspondingly high sample
throughput. The D8 ADVANCE is also excellently
equipped for this. With the FLIP-STICK sample stage
or our AUTO-CHANGER, it is possible to meet all
requirements. These multisample stages can be
used in reflection and transmission mode with almost
all types of samples: powder, bulk, suspensions,
small sample quantities, air-sensitive samples ...
Screening and quality control with DIFFRAC.POLYSNAP

25
 Advanced applications:
easy transmission
with the
D8 ADVANCE
The properties of the sample determine
which instrument geometry is best:
transmission or reflection. Therefore, the
D8 ADVANCE affords you the freedom to
choose. Crystal structure determination
with DIFFRAC.TOPAS
For small sample quantities, preferred orientations,
organic materials with low absorption coefficients,
sensitive samples, fluids … measurements in transmis-
sion geometry are the top choice. For applications such
as structure analysis, kinetic processes or Small Angle
X-ray Scattering (SAXS), this is the preferred setup as
well. Achieve the best results for these tasks, with the
most advantageous components and DAVINCI.DESIGN.
Let’s begin with the primary optics. We advise to use
our focusing Göbel mirror for highest intensity. Our
primary monochromator guarantees even better data
quality with pure K
1 radiation. These optics are both
excellent for SAXS experiments as well.
Preparation in capillaries or between foils, analysis of Indexing with DIFFRAC.TOPAS
solid samples or powders, measurements at high or
low temperatures are all concerns of your application.
No matter which choice you make, all components are
identified and configured fully automatically without any
further adjustments. Even the question of transmission
or reflection is not a prior concern with our FLIP-STICK
and AUTO-CHANGER. It is possible to change between
two geometries conveniently from your workstation.
And, last but not least, there is always the question
of data quality and measurement time. With the
SUPER SPEED components, LYNXEYE and VÅNTEC-1,
transmission measurements are performed in minutes
thanks to the simultaneous capture of large 2Theta
angles and extreme sensitivity to signals.
SAXS with DIFFRAC.NANOFIT
Meet the D8 ADVANCE in transmission.

26
 Johansson monochromators for
all common wavelengths from
Cr to Mo
Best data quality with parallel and
focusing Göbel mirrors for all
common wavelengths
Software-controlled switch be-
tween reflection and transmission
with parallel-beam Göbel mirrors
Unmatched crystal structure and
nano structure analysis
Tablet screening Capillary furnace

Capillary geometry with Johansson monochromator for pure K1 radiation High-throughput diffraction with LYNXEYE detector and AUTO-CHANGER
and VÅNTEC-1 detector, with unique radial Soller to reduce diffuse scattering

VÅNTEC-1 LYNXEYE
Johansson Focusing
monochromator Göbel mirror

Rotation
Radial Soller sample
stage

Capillary
sample 90-position
stage AUTO-CHANGER

27
 Reactive atmospheres and high-
pressure experiments
Non-ambient experiments in
LYNXEYE reflection and capillary geometry
Focusing from 10 K up to 2,300 °C
Göbel mirror
Superior VÅNTEC-1 detector with
large angular coverage and
unique radial Soller for both
Fixed slit
scanning and SNAPSHOT mode
Humidity experiments from room
temperature up to 90 °C, fully
Capillary software-integrated
furnace
Temperature-dependent reflec-
tometry from –180 °C up to 800 °C

High-speed humidity measurements with the HOT HUMIDITY HTK1200N oven and LYNXEYE detector
system and VÅNTEC-1 detector

TWIN optics VÅNTEC-1

a) Göbel mirror LYNXEYE
b) Motorized slit

K filter
Radial Soller Motorized Motorized
slit slit

HOT HUMIDITY High-temperature

chamber chamber

28
D8 ADVANCE –
your sample
under controlled
non-ambient
conditions
DIFFRAC.WIZARD to set up
high-temperature experiments

The properties of your samples can change under

the influence of temperature, pressure, atmosphere or
humidity. What could be more obvious than to simulate
these conditions and to equip the D8 ADVANCE with
one of the many sample chambers and 1-D detectors
that enable you to study the impact “in situ” in the
laboratory?

Two unique components enable the

D8 ADVANCE to observe fast changes of
sample properties: our LYNXEYE and our
VÅNTEC-1 detectors.
To obtain outstanding data quality in FAST-SCAN mode, 3-D view with DIFFRAC.EVA
you can complement the VÅNTEC-1 with our radial Soller
to suppress scattering not coming from the sample,
such as air scattering.
It goes without saying that the entire control of the
sample chambers is integrated in our DIFFRAC.SUITE
and the chambers are identified automatically, thanks
to DAVINCI.MODE. Hence it is very easy for you to
graphically create even complex measuring sequences.

Iso-intensity view with DIFFRAC.EVA

29
 Maximum flexibility with TWIN optics
for primary and secondary beam path
Push-button switch between Bragg-
Brentano and parallel-beam geometries
Superb LYNXEYE detector for a wide
variety of applications

TWIN/TWIN setup in Bragg-Brentano

geometry
LYNXEYE

TWIN optics TWIN optics

a) Göbel mirror a) Equatorial Soller
b) Motorized slit b) Motorized slit

30
 Primary TWIN optics set to Göbel
mirror for highest flux density
LYNXEYE in 0-D mode and turned
by 90° to cover an extremely large
dynamic range
Film thickness from 0.1 nm up to
200 nm
Standardless density, roughness,
and stackings determination with
highest accuracy

KNIFE EDGE collimator for reflectometry

90°

0°

LYNXEYE detector in 0° and 90° position Reflectometry TWIN/TWIN setup with LYNXEYE detector in 90° position

KNIFE EDGE
collimator
LYNXEYE,
90° turned
TWIN optics
a) Göbel mirror
b) Motorized slit

TWIN optics
a) Equatorial Soller
b) Motorized slit

XYZ stage

31
 Primary TWIN optics set to Göbel Primary TWIN optics set to Göbel
mirror for highest flux density mirror for highest flux density
Secondary TWIN optics for push- LYNXEYE in 1-D mode for fast
button switch to equatorial Soller slit data collection
LYNXEYE in O-D mode for high- Software-controlled sub-micron
resolution parallel-beam geometry sample mapping with versatile
compact XYZ stage
Grazing incidence diffraction for
optimum thin-film diffraction signals Fast and accurate sample posi-
tioning with double-laser system

Grazing incidence diffraction TWIN/TWIN setup Microdiffraction TWIN/TWIN setup

TWIN optics LYNXEYE

a) Göbel mirror
LYNXEYE b) Motorized slit
TWIN optics
a) Göbel mirror
b) Motorized slit

TWIN optics
a) Equatorial Soller TWIN optics
b) Motorized slit a) Equatorial Soller
b) Motorized slit

Pin hole
collimator

XYZ stage XYZ stage

32
 Ultimate flexibility
and push-button
ease of use –
D8 ADVANCE with
TWIN/TWIN setup

Imagine you could easily switch between

Structure analysis with DIFFRAC.TOPAS such diverse applications as phase ID or
reflectometry (XRR), or between grazing
incidence diffraction (GID) and microdiffraction
(μXRD), or between investigations of residual
stress and structure determination …
without even touching the optics. Wouldn’t
that be brilliant? Yes! That is exactly what our
D8 ADVANCE with DAVINCI.DESIGN has been
made for: TWIN/TWIN setup.
With the TWIN optics on the primary side, you can switch
with motor support between Göbel mirror for parallel-beam
geometry and a variable divergence slit for Bragg-Brentano
Phase identification with DIFFRAC.EVA geometry. With the secondary TWIN, you can change
between an equatorial Soller slit and a variable slit. If all of
this is complemented by the desired sample stage and our
unique LYNXEYE detector, you have the most flexible
diffractometer in the world!
For the switch between different geometries, you do not
have to get up from your desk or make adjustments of any
kind. One mouse click and the new beam path is ready to
measure. DAVINCI.DESIGN makes it possible.
Do you need any other optics, filters, slits or sample
stages? No problem! Simply snap-in the desired optics or
exchange the sample stage and DAVINCI.MODE takes care
of the rest.

Reflectometry analysis with DIFFRAC.LEPTOS Our D8 ADVANCE with TWIN/TWIN setup:

no compromises, superb variability and
more time for pure measurements!

33
 Switching from
line to point focus –
no big deal:
TWIST-TUBE
Most powder diffraction applications on polycrys-
talline samples are done with line focus. For texture
measurements, point focus is most suited. Hence,
fast and easy switching between line and point focus
is a stunning feature for a true all-purpose diffrac-
tometer. Compact Eulerian cradle with XY stage TWIST-TUBE head

With conventional instrumentation, one has no choice

but to drain off the cooling water, exchange the tube,
plug the cable again etc. – and, at great effort, con-
vert the geometry. Then switch on, ramp up and
readjust …

No more! Thanks to TWIST-TUBE

technology, designed and patented by
Bruker AXS, you can now conveniently
switch between line and point focus
applications.
This is how our TWIST-TUBE works: Release fix-
tures, rotate tube head, fix in position and measure! Changing the tube focus Texture setup with TWIST-TUBE
To do so, you do not have to disconnect cables or un-
screw tubes. DAVINCI.MODE takes care of the rest
because the system identifies the appropriate
configuration automatically.

Easy TWIST-TUBE texture!

34
 Patented TWIST-TUBE design
compatible to standard tube
dimensions
Fast and easy switching of the
tube focus orientations
No realignment and automatic
focus orientation detection thanks
to DAVINCI.MODE
No need to disconnect cables
and hoses

Texture analysis with

DIFFRAC.MULTEX

Texture analysis with

DIFFRAC.MULTEX

Typical texture setup with the TWIST-TUBE and compact Eulerian cradle

TWIST-TUBE Scintillation
counter

Straightforward measurement
design with DIFFRAC.WIZARD

Parallel-beam
POLYCAP
Eulerian
cradle

35
 XYZ stage for accurate sample Easy change to the ideal texture
positioning and mapping configuration – TWIST-TUBE and
DAVINCI.DESIGN
VÅNTEC-1 for SNAPSHOT residual
stress investigations Compact Eulerian cradle for both
iso- and side-inclination modes
Fast and accurate sample positioning
with double-laser system POLYCAP for high-speed, high-flux
texture analysis
Traditional sin²(psi) method as well as
the multi hkl evaluation method Intelligent setup of measurement
schemes with DIFFRAC.WIZARD
From normal and shear stress up to
the complete stress tensor Texture determination based on the
component method or the traditional
Retained austenite determination
spherical harmonics method
based on both the traditional RIR and
Rietveld method for complex alloys

Stress measurements in iso-inclination (omega) mode Texture or stress measurements in side-inclination (psi) mode

LYNXEYE VÅNTEC-1,
SNAPSHOT
TWIST-TUBE mode

TWIN optics
a) Equatorial Soller
TWIST-TUBE b) Motorized slit

Parallel-beam
POLYCAP

Eulerian
cradle
Parallel-beam
POLYCAP
XYZ stage

36
 Texture and residual
stress – take
it easy with the
D8 ADVANCE
When examining stress and texture of machined
items, one actually analyzes the crystallite deforma-
tion and orientation distribution locally. That requires
a maximum number of possibilities for aligning the
sample, obtaining maximum intensity at a particular
Residual stress analysis with
DIFFRAC.LEPTOS spot, and obtaining maximum resolution and
detection area.

Voilà, the D8 ADVANCE!

Maximum degrees of freedom:
With our extremely compact, high-precision Eulerian
cradle, you can automatically rotate and incline your
sample (phi, chi). Alternatively, the compact
XYZ stage provides the possibility for the controlled
alignment and mapping of samples in all directions.
Maximum intensity:
Texture analysis with DIFFRAC.MULTEX
Higher intensity means less measurement time.
Furthermore, one often requires the intensity at only
one specific point. This is what our POLYCAP lenses
are for.
Maximum resolution and maximum speed:
Anyone requiring maximum resolution and maximum
speed will, of course, use our SUPER SPEED
detectors – LYNXEYE and VÅNTEC-1.

D8 ADVANCE – leaving your

competition far behind!
Texture analysis with DIFFRAC.MULTEX

37
Applications

Phase Identification
Phase Quantification
Microstructure Analysis
Structure Analysis
Residual Stress
Texture
Reflectometry
Small Angle X-ray Scattering

No match,
due to physical limitations

Match

Perfect match
 aim 01980
Technical Data
Configurations Vertical goniometer, Theta/2Theta or Theta/Theta geometry
Measuring circle diameter Predefined at 500 mm, 560 mm and 600 mm
(depending on set-up) or any intermediate setting
Angular range 360°
(without accessories)

All configurations and specifications are subject to change without notice. Order No.: DOC-B88-EXS018. © 2009 Bruker AXS. Printed in Germany.
Max. usable angular range –110° < 2Theta 168°
(depending on accessories)
Angle positioning Stepper motors with optical encoders
Smallest addressable increment 0.0001°
Instrument alignment Equal or better than ± 0.01° 2Theta; NIST SRM 1976a always included
(at constant climate)
Maximum angular speed 20°/s
(depending on accessories)
Detectors Point detectors: Scintillation counter
SOL-XE energy dispersive
1-D detectors: LYNXEYE
VÅNTEC-1
All detectors guaranteed without defective/dead strips or areas
General space and infrastructure requirements:
Exterior dimensions 1,868 x 1,300 x 1,135 mm
(h x w x d) 73.5 x 51.2 x 44.7 inch
Weight 770 kg
(without optional electronics)
Cooling water supply Min. 4 l/min, pressure 4 bar to 7.5 bar, no pressure on outlet side,
(without optional internal water chiller) temperature: 10 °C to 20 °C
Power supply Single phase: 208 to 240 V
Three phases: 120 V, 230 V, 240 V;
47 to 63 Hz
Maximum power consumption 6.5 kVA
(without controllers for optional equipment)

www.bruker-axs.com Bruker AXS GmbH Bruker AXS Inc.

TWIST-TUBE:
Karlsruhe, Germany Madison, WI, USA DE 10 2006 053 760 B4 patent
MIKROGAP technology, VÅNTEC-1:
Tel. +49 (7 21) 5 95-28 88 Tel. +1 (800) 234-XRAY US 6,340,819 B1 patent
LYNXEYE turned 90°:
Fax +49 (7 21) 5 95-45 87 Tel. +1 (608) 276-3000 EP 1 647 840 A2 patent;
[email protected] Fax +1 (608) 276-3006 EP 1 510 811 B1 patent

[email protected]