Lab 08
Lab 08
Experiment 8
Transistor Characteristics
1 Motivation
Like diodes, transistors are a fundamental element of modern electronics. They are used as am-
plifiers in signal processing and as voltage-controlled switches. They are the building block for
operational amplifier integrated circuits used in a wide array of linear and nonlinear circuit appli-
cations. As switches, they are used to construct gates in digital logic circuitry.
2 Background
A transistor is a 3-terminal “active” electronic component, meaning one that behaves as if it has an
internal source (current or voltage). There are two main categories of transistors, bipolar-junction
(BJT) and field-effect (FET). Each is based on P-N semiconductor junctions. The BJT behaves as
a current-controlled current source, and the FET behaves as a voltage-controlled current source.
This makes them useful as voltage and current amplifiers. Both can be used as switches. The
MOSFET version of the FET has enormous input resistance and is preferred for constructing logic
gates.
In this experiment you will investigate the basic properties of the PNP version of the BJT and the
N-channel version of the junction field-effect transistor (JFET). The part schematics and package
illustrations for these are shown in Fig. 1.
CAUTION! It is easy to get confused when you turn the transistors over to install them in the
socket on the circuit board. You are now looking at the top.
E D
B
G
C S
Figure 1: Circuit schematics and lead diagrams for bipolar-junction PNP (2N3906) and
N-Channel JFET (2N5486). It is standard to show aa bottom view of the leads for transistors
(and vacuum tubes). Perversely, integrated circuits are always shown from the top.
3 Equipment
For this experiment, you will use:
• One Topward dual DC power supply, set for independent supplies (slide switches)
• Two DMM4020 digital multimeters
• Two Keithley digital multimeters
• One circuit board for testing transistors
• One ELC variable resistance box
• One 2N3906 PNP BJT transistor (parts cabinet)
• One 2N5486 N-CHAN JFET transistor (parts cabinet)
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Exp 8: Transistor Characteristics PHY 321, 2022F
C IB
VCE V B −
A 10 kΩ + V0
100 kΩ
E VBE
V IE
A
Figure 2: Circuit for characterizing a bipolar junction transistor. Note the polarity of the DC
voltage source, which is shown appropriate for a PNP transistor. The polarity would be opposite
when working with an NPN transistor.
4 Procedure
1. The Bipolar Junction Transistor (2N3906): The schematic for the circuit board for
testing transistors is shown in Fig. 2. To complete the circuit, you will first add the four
meters shown in the schematic before adding the DC voltage supply. Use a Keithley DMM
on the 200 µA scale to measure IB . Use the other Keithley DMM to measure IE . Use the two
Tektronix DMM’s to measure VCE and VBE (via the VΩ HI-LO inputs on the left). Please
be careful setting up the meters! A current meter has very low (ideally zero) resistance
and must be connected in series within a branch of a circuit. If you accidentally place an
ammeter across two points in a circuit, the short circut can cause large current to flow that
damages components.
(a) Begin by measuring IE and VBE as a function of the base current, IB , for a fixed value
of VCE . To do this, complete the circuit as follows: (1) turn the 10 kΩ potentiometer all
the way counter-clockwise until the knob stops, which moves the wiper to ground. (2)
Connect the ammeters noting their polarity for direction of the current. (3) Connect
the voltmeters and the DC voltage supply, being careful to observe polarities. (4) The
circuit is mostly prewired (look at the underside of the board), but you need to add one
banana patch cable between the terminals for V0 and the transistor’s collector. After
double checking your connections, (5) insert the transistor into the socket on the circuit
board and then turn on the source and adjust V0 until VCE = −12 V.
(b) Turning the potentiometer will change the base-to-emitter voltage, VBE , and therefore
the base current IB . Measure and tabulate IE and VBE as a function of IB . Increase IB
in 2 µA steps from 0 < IB < 10 µA and then 10 µA steps from 10 < IB < 50 µA. You
will notice that VBE drifts slowly when IB is increased or decreased. This drift is caused
by heating of the transistor’s P-N junctions, which are sensitive to temperature. Pause
briefly after each change in IB to allow the temperature to stabilize before taking your
readings. Calculate β (aka hf e ) for your data using β = IC /IB and make a graph of β
versus IE .
(c) Measure the input resistance, rin (hie ), as follows: keeping VCE constant (e.g, VCE =
−8 V), set IB = 6 µA and measure IE and VBE then repeat for IB = 10 µA. Calculate
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Exp 8: Transistor Characteristics PHY 321, 2022F
the input resistance using Eq. 1. (A typical value is hie = 3.5 kΩ.)
δVBE
hie = (1)
δIB VCE =constant
(d) Table 8.1 in Sprott summarizes a comparison of the models for the “ideal” and “real”
transistor with the more complete T -network shown in Fig. 8.5(a). For the “real” transis-
tor, the input resistance, rin , is related to the “transresistance” by rin = (β+1)rtr ≈ βrtr ,
where β = hf e is the current gain. The first row in Table 8.1 gives the equivalents for
hie (the input resistance you found above). In the entry under “T -network”, the base
resistance, rB , is typically small and can be ignored. Also, since rC rE , the parallel
combination rC ||rE ≈ rE , so hie ≈ βrE . In this approximation, the transresistance,
rtr , is the same as rE . These are used interchangeably in Sprott’s text. Calculate
β = hf e = δIE /δIB for your measurements in step (c) and then determine rtr . Compare
your result with the expected value, rtr ≈ rd ≈ 26 mV/hIE i, where hIE i is the average
of the two values from step (c), and rd is the “dynamic resistance” (Sprott Eq. 8.3).
(e) (Optional, come back if time remains) For signal transistors like the 2N3906, the rela-
tionship between VBE and IE is given approximately by
IE = I0 eeVBE /kT − 1 . (2)
The I-V characteristic depends on (absolute) temperature, T , because the electron ther-
mal velocity affects diffusion across the P-N junction. Technically, parameter I0 also
depends on T , but Eq. 2 is a good approximation for fixed T . Make a semi-log plot of IE
vs VBE and verify that the low-current region is linear (in semi-log). You can determine
eVBE /kT from the slope of a linear fit to your data, assuming that eVBE /kT 1. How
does your result compare with the expected value, e/kT ≈ 26 mV for room tempera-
ture? This temperature dependence is interesting physics, but it is rarely important in
transistor applications.
RD =1 kΩ
D
VDS IG
V
G +
A 10 kΩ − − V1
S 100 kΩ + V0
VGS
V
IS
A
Figure 3: Circuit for characterizing a field-effect transistor. Note the polarity of the DC voltage
sources, which are shown appropriate for an N-Channel FET. The polarities would be opposite
when testing a P-Channel FET.
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Exp 8: Transistor Characteristics PHY 321, 2022F
2. The Field-Effect Transistor (2N5486): You will now measure the properties of an N-
channel junction field-effect transistor (JFET). The setup is shown in Fig. 3, which is almost
the same as before but with two additions. For a JFET, the potentials between the gate and
drain relative to the source have opposite signs, so you need to add a second DC supply, V1 , to
provide (positive) voltage at the drain. You also need to add resistor RD . Note that the lead
order of the 2N5486 package is different than the 2N3906 package. (In actual applications, the
DC operating point can be established using one DC voltage supply and additional resistors.)
(a) Make sure you ground the negative terminal of the V1 supply and the positive terminal of
the V0 supply. The DMMs measure the source current, IS , the gate current, IG , and the
voltages, VDS and VGS . From Kirchhoff’s current rule, the drain current ID = IS − IG .
After double checking the connections and polarities, turn on the power supplies and set
V0 = −5 V and V1 = 0 V.
(b) An FET can be used as a voltage-controlled variable resistor. The resistance of the drain-
source channel is adjusted by varying the gate voltage, VGS . (Internally this changes the
width of the depletion region.) Turn the potentiometer fully CCW so that VGS = 0.
Now vary VDS (by adjusting V1 ) from 0 V to +2.0 V in 0.2 V steps and from +2.0 V to
+10.0 V in 2.0 V steps. You should see that IG is always very small, hence ID = IS .
Why is IG small? Tabulate your data and make a plot of ID versus VDS . Determine the
resistance of the drain-source channel, RDS , from the ohmic (linear) region of the plot.
(c) Now measure the characteristics of the JFET in the “pinch-off” region where ID is nearly
independent of VDS , i.e., the transistor acts like a current source. This is the region where
a JFET is used as an amplifier. Set VGS = −1.5 V by adjusting the potentiometer, and
then vary VDS from +2.0 V to +20 V in 2.0 V steps. Tabulate your data and make a plot
of ID versus VDS .
(d) In the “pinch-off” region, the JFET behaves like a voltage-controlled current source.
Use your data from steps (b) and (c) for VDS = +10 V to determine the “forward
transconductance”. (A typical value is gf s = 5 mf.)
δID
gf s = (3)
δVGS VDS =constant
(e) As a nearly ideal current source, a JFET has a large but finite output resistance, ros (see
the equivalent circuit in Sprott Fig. 7.16). Evalutate the output resistance in the pinch-
off region, ros = δVDS /δID , using your measurements from step (c) with VDS = +10 V
and +20 V.
(f) FET’s (usually MOSFETs) are very useful as switches and gates. The “switch” is closed
when VGS = 0 and open when |VGS | > |VP |, the critical pinch-off voltage (also called
VGS(off) ). With VDS = +12 V, vary the potentiometer to change the gate-source voltage,
VGS . Measure and tabulate ID as a function of VDS by varying VGS = 0 V in −0.5 V
steps up to the critical pinch-off voltage. (You can adjust V1 to maintain VDS = +12 V.)
Plot ID versus VGS and determine the “off” voltage for the JFET. The plot should look
roughly parabolic as VGS approaches VP .
4 Page 4/10
2N3906 / MMBT3906 / PZT3906
2N3906 MMBT3906 PZT3906
C C
E E
C
C TO-92 B
B B
E SOT-23 SOT-223
Mark: 2A
*These ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
NOTES:
1) These ratings are based on a maximum junction temperature of 150 degrees C.
2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
OFF CHARACTERISTICS
V(BR)CEO Collector-Emitter Breakdown Voltage* IC = -1.0 mA, IB = 0 -40 V
V(BR)CBO Collector-Base Breakdown Voltage IC = -10 µ A, IE = 0 -40 V
V(BR)EBO Emitter-Base Breakdown Voltage IE = -10 µ A, IC = 0 -5.0 V
IBL Base Cutoff Current VCE = -30 V, V BE= -3.0 V -50 nA
ICEX Collector Cutoff Current VCE = -30 V, V BE= -3.0 V -50 nA
ON CHARACTERISTICS
hFE DC Current Gain * IC = -0.1 mA, VCE= -1.0 V 60
IC = -1.0 mA, VCE = -1.0 V 80
IC = -10 mA, VCE = -1.0 V 100 300
IC = -50 mA, VCE = -1.0 V 60
IC = -100 mA, VCE = -1.0 V 30
VCE(sat) Collector-Emitter Saturation Voltage IC = -10 mA, I B = -1.0 mA -0.25 V
IC = -50 mA, I B = -5.0 mA -0.4 V
VBE(sat) Base-Emitter Saturation Voltage IC = -10 mA, IB = -1.0 mA -0.65 -0.85 V
IC = -50 mA, IB = -5.0 mA -0.95 V
SWITCHING CHARACTERISTICS
td Delay Time VCC = -3.0 V, VBE = -0.5 V, 35 ns
tr Rise Time IC = -10 mA, IB1= -1.0 mA 35 ns
ts Storage Time VCC = -3.0 V, IC = -10 mA 225 ns
tf Fall Time IB1 = IB2 = -1.0 mA 75 ns
Spice Model
PNP (Is=1.41f Xti=3 Eg=1.11 Vaf=18.7 Bf=180.7 Ne=1.5 Ise=0 Ikf=80m Xtb=1.5 Br=4.977 Nc=2 Isc=0 Ikr=0
Rc=2.5 Cjc=9.728p Mjc=.5776 Vjc=.75 Fc=.5 Cje=8.063p Mje=.3677 Vje=.75 Tr=33.42n Tf=179.3p Itf=.4 Vtf=4
Xtf=6 Rb=10)
2N3906 / MMBT3906 / PZT3906
PNP General Purpose Amplifier
(continued)
Typical Characteristics
250 0.3
V CE = 1 .0V β = 10
0.25
125 °C
200
0.2
150 0.15 25 °C
25 °C
0.1
100 125°C
- 40 °C
0.05
- 40 °C
50 0
0.1 0.2 0.5 1 2 5 10 20 50 100 1 10 100 200
I C - COLLECTOR CURRE NT (mA) I C - COLLECTOR CURRENT (mA)
1
1 β = 10
- 40 °C
0.8
0.8
- 40 °C
25 °C
125 °C 0.6 25 °C
0.6
125 °C
0.4 0.4
V CE = 1V
0.2 0.2
0 0
1 10 100 200 0.1 1 10 25
I C - COLLECTOR CURRE NT (mA) I C - COLLECTOR CURRENT (mA)
1 6
4 C ibo
0.1
2
0.01 0
25 50 75 100 125 0.1 1 10
TA - AMBIE NT TEMP ERATURE (° C) REVERSE BIAS VOLTAGE (V)
2N5484 / 2N5485 / 2N5486 / MMBF5484 / MMBF5485 / MMBF5486
Discrete POWER & Signal
Technologies
2N5484 MMBF5484
2N5485 MMBF5485
2N5486 MMBF5486
D
G TO-92
S SOT-23 S
D
Mark: 6B / 6M / 6H
N-Channel RF Amplifier
This device is designed primarily for electronic switching
applications such as low On Resistance analog switching.
Sourced from Process 50.
*These ratings are limiting values above which the serviceability of any semiconductor device may be impaired.
NOTES:
1) These ratings are based on a maximum junction temperature of 150 degrees C.
2) These are steady state limits. The factory should be consulted on applications involving pulsed or low duty cycle operations.
OFF CHARACTERISTICS
V(BR)GSS Gate-Source Breakdown Voltage IG = - 1.0 µA, VDS = 0 - 25 V
IGSS Gate Reverse Current VGS = - 20 V, VDS = 0 - 1.0 nA
VGS = - 20 V, VDS = 0, TA = 100°C - 0.2 µA
VGS(off) Gate-Source Cutoff Voltage VDS = 15 V, ID = 10 nA 2N5484 - 0.3 - 3.0 V
2N5485 - 0.5 - 4.0 V
2N5486 - 2.0 - 6.0 V
ON CHARACTERISTICS
IDSS Zero-Gate Voltage Drain Current* VDS = 15 V, VGS = 0 2N5484 1.0 5.0 mA
2N5485 4.0 10 mA
2N5486 8.0 20 mA
Typical Characteristics
r DS - DRAIN ON RESISTANCE ( Ω)
TA = -55 C
O
500 V GS(OFF) = -1.0V
ID - DRAIN CURRENT (mA)
16
T A = +25 C
O
300
200 -2.5 V
12 T A = +125O C O
TA = -55 C -5.0V
O 100
T A = +25 C
8 -8.0 V
T A = +125O C 50
30
4
20 V DS = 100mV
-2.5 V V =0V
GS
0 10
0 -1 -2 -3 -4 -5 -50 0 50 100 150
VGS- GATE-SOURCE VOLTAGE(V) T A - AMBIENT TEMPERATURE (°C)
7 5
5V .0V
O
TA = -55 C V = 15V T A = +25 C
O
DS
-0. -1
I D -- DRAIN CURRENT (mA)
6 O
V
T A = +25 C
4 TYP V GS(OFF)
= -5.0V -1.5
5 T A = +125O C -2.0V
TA = -55 C
O
0V
=
4
3 -2.5V
GS
O
T A = +25 C V
3 T A = +125O C 2 -3.0V
2 -3.5V
V GS(OFF) = -4.5V 1
1 -2.5 V -4.0V
0 0
0 -1 -2 -3 -4 -5 0 0.2 0.4 0.6 0.8 1
VGS- GATE-SOURCE VOLTAGE(V) VDS - DRAIN-SOURCE VOLTAGE(V)
100
-- DRAIN CURRENT ( mA )
O
T A = +25 C gfs, I DSS @ V DS = 15 V, V GS = 0 PULSE
V GS(OFF)
= -5.5V
f = 1.0 kHz 5.0V r DS @ VDS= 100mV, V GS = 0 50
20
V = 5v 10V 30
10 DG 15V
5 20
5 10 20V
15 10
20 15 10
20
1 5
V GS(OFF)
= -3.5V
0.5 3
DSS
20 2
V GS(OFF)
= -1.5V VGS(OFF) @ VGS = 15V, I D= 1nA
I
0.1 10 1
0.01 0.02 0.05 0.1 0.2 0.5 1 2 5 10 -1 -2 -3 -5 -7 - 10
I D -- DRAIN CURRENT (mA) V - GATE-SOURCE VOLTAGE(V)
GS