Iec EVAL
Iec EVAL
Iec EVAL
: EED32N804871 Page 1 of 28
Prepared for:
China Leadshine Technology Co., Ltd.
11/F, Block A3, iPark No. 1001 Xueyuan Blvd.,
Nanshan District Shenzhen,China
Prepared by:
Centre Testing International Group Co., Ltd.
Hongwei Industrial Zone, Bao’an 70 District,
Shenzhen, Guangdong, China
TEL: +86-755-3368 3668
FAX: +86-755-3368 3385
3. MEASUREMENT UNCERTAINTY
Where relevant, the following measurement uncertainty levels have been estimated for tests
performed on the Product as specified in CISPR 16-4-2. This uncertainty represents an
expanded uncertainty expressed at approximately the 95% confidence level using a
coverage factor of k=2.
Test item Value (dB)
Conducted disturbance 3.1
Radiated disturbance (30MHz to 1GHz) 4.9
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The highest frequency of less than 108 MHz, the measurement shall only be made
the internal sources of the up to 1 GHz.
EUT is : between 108 MHz and 500 MHz, the measurement shall
only be made up to 2 GHz.
between 500 MHz and 1 GHz, the measurement shall
only be made up to 5 GHz.
above 1 GHz, the measurement shall be made up to 5
times the highest frequency or 6 GHz, whichever is less.
Model difference: Their electrical circuit design, layout, components used and
internal wiring are identical. The difference is naming and
software version. The test model is iSV2-RS6040 and the
test results are applicable to the others.
Notes:
1. All the equipment/cables were placed in the worst-case configuration to maximize the emission during
the test.
2. Grounding was established in accordance with the manufacturer’s requirements and conditions for the
intended use.
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Instrumentation: The following list contains equipments used at CTI for testing.
The calibrations of the measuring instruments, including any accessories that may effect
such calibration, are checked frequently to assure their accuracy. Adjustments are made
and correction factors applied in accordance with instructions contained in the manual for
the measuring instrument.
Equipment used during the tests:
Shielding Room No. 3 - Conducted disturbance Test
Equipment Manufacturer Model Serial No. Due Date
Receiver R&S ESCI 100435 04/14/2022
LISN R&S ENV216 100098 03/03/2022
Shielding Room No. 3 - Fast transients / Surges Test (EN 61000-4-4) (EN 61000-4-5)
Equipment Manufacturer Model Serial No. Due Date
Compact Generator EM-Test UCS500M/6B V0603101093 04/14/2022
6. CONDUCTED DISTURBANCE
6.1 Limits
Limits
Limits
Frequency range dB(μV)
(MHz)
Quasi-peak Average
0,15 to 0,50 89 76
0,50 to 30 83 70
NOTE: The lower limit shall apply at the transition frequency.
Note: 1. Margin(dB)=Limit(dBuV)-Measurement(dBuV).
2. Measurement(dBuV)=Reading_Level(dBuV)+Correct Factor(dB).
3. Correct Factor(dB)=Cable Loss(dB)+LISN Factor(dB).
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7. RADIATED EMISSION
7.1 LIMITS
30-230 50
230-1000 57
NOTE: The lower limit shall apply at the transition frequencies.
30MHz ~ 1GHz:
30MHz ~ 1GHz:
a. The Product was placed on the non-conductive turntable 0.8m above the ground at a
chamber.
b. Set the spectrum analyzer/receiver in Peak detector, Max Hold mode, and 120 kHz RBW.
Record the maximum field strength of all the pre-scan process in the full band when the
antenna is varied between 1~4 m in both horizontal and vertical, and the turntable is rotated
from 0 to 360 degrees.
c. For each frequency whose maximum record was higher or close to limit, measure its QP
value: vary the antenna’s height and rotate the turntable from 0 to 360 degrees to find the
height and degree where Product radiated the maximum emission, then set the test
frequency analyzer/receiver to QP Detector and specified bandwidth with Maximum Hold
Mode, and record the maximum value.
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7.4 GRAPHS AND DATA
Note: 1. Margin(dB)=Measurement-Limit.
2. Measurement(dBuV/m)=Reading_Level+Correct Factor.
3. Correct Factor(dB)=Ant Factor+Cable loss.
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8. IMMUNITY TEST
General Performance Criteria
Product Standard EN IEC 61000-6-2:2019
The apparatus shall continue to operate as intended during and after the test.
No degradation of performance or loss of function is allowed below a
performance level specified by the manufacturer, when the apparatus is used
as intended. The performance level may be replaced by a permissible loss of
CRITERION A
performance. If the minimum performance level or the permissible
performance loss is not specified by the manufacturer, either of these may be
derived from the product description and documentation and what the user
may reasonably expect from the apparatus if used as intended.
a. Electrostatic discharges were applied only to those points and surfaces of the Product
that are accessible to users during normal operation.
b. The test was performed with at least ten single discharges on the pre-selected points in
the most sensitive polarity.
c. The time interval between two successive single discharges was at least 1 second.
d. The ESD generator was held perpendicularly to the surface to which the discharge was
applied and the return cable was at least 0.2 meters from the Product.
e. Contact discharges were applied to the non-insulating coating, with the pointed tip of the
generator penetrating the coating and contacting the conducting substrate.
f. Air discharges were applied with the round discharge tip of the discharge electrode
approaching the Product as fast as possible (without causing mechanical damage) to touch
the Product. After each discharge, the ESD generator was removed from the Product and
re-triggered for a new single discharge. The test was repeated until all discharges were
complete.
g. At least ten single discharges (in the most sensitive polarity) were applied to the
Horizontal Coupling Plane at points on each side of the Product. The ESD generator was
positioned vertically at a distance of 0.1 meters from the Product with the discharge
electrode touching the HCP.
h. At least ten single discharges (in the most sensitive polarity) were applied to the center of
one vertical edge of the Vertical Coupling Plane in sufficiently different positions that the four
faces of the Product were completely illuminated. The VCP (dimensions 0.5m x 0.5m) was
placed vertically to and 0.1 meters from the Product.
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8.1.4 RESULTS & PERFORMANCE
Min. No. of
Discharge Voltage Discharge per Required Performance
Discharge Position
Method (±kV) polarity Level Criterion
(Each Point)
Conductive Surfaces 4 10 B A
Contact
Indirect Discharge HCP 4 10 B A
Discharge
Indirect Discharge VCP 4 10 B A
Above 1GHz:
Report No. : EED32N804871 Page 19 of 28
Front, Right,
80 - 1000 10 A A
Back, Left
Front, Right,
1400 - 6000 3 A A
Back, Left
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Voltage Performance
Coupling Polarity Required Level
(kV) Criterion
DC power ports 2 ± B A
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8.4 SURGES
8.4.1 TEST SPECIFICATION
Basic Standard : EN IEC 61000-6-2 & IEC 61000-4-5
Test Port : Input DC power ports
Wave-Shape : Open Circuit Voltage - 1.2 / 50 us
Pulse Repetition Rate : 1 pulse / min.
Test Events : 5 pulses (positive & negative) for each polarity
8.4.2 BLOCK DIAGRAM OF TEST SETUP
Voltage Performance
Coupling Line Polarity Required Level
(kV) Criterion
DC port 0.5 ± B A
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View of Product-1
View of Product-2
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View of Product-3
View of Product-4
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View of Product-5
The test report is effective only with both signature and specialized stamp. The result(s) shown in this
report refer only to the sample(s) tested. Without written approval of CTI, this report can’t be reproduced
except in full.
*** End of Report ***