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TMS570LS1224
SPNS190B – OCTOBER 2012 – REVISED FEBRUARY 2015

TMS570LS1224 16- and 32-Bit RISC Flash Microcontroller

1 Device Overview

1.1
1
Features
• High-Performance Automotive-Grade • Enhanced Timing Peripherals for Motor Control
Microcontroller for Safety-Critical Applications – 7 Enhanced Pulse Width Modulator (ePWM)
– Dual CPUs Running in Lockstep Modules
– ECC on Flash and RAM Interfaces – 6 Enhanced Capture (eCAP) Modules
– Built-In Self-Test (BIST) for CPU and On-chip – 2 Enhanced Quadrature Encoder Pulse (eQEP)
RAMs Modules
– Error Signaling Module With Error Pin • Two Next Generation High-End Timer (N2HET)
– Voltage and Clock Monitoring Modules
• ARM® Cortex®-R4F 32-Bit RISC CPU – N2HET1: 32 Programmable Channels
– 1.66 DMIPS/MHz With 8-Stage Pipeline – N2HET2: 18 Programmable Channels
– FPU With Single- and Double-Precision – 160-Word Instruction RAM Each With Parity
– 12-Region Memory Protection Unit (MPU) Protection
– Open Architecture With Third-Party Support – Each N2HET Includes Hardware Angle
Generator
• Operating Conditions
– Dedicated High-End Timer Transfer Unit (HTU)
– Up to 180-MHz System Clock
for Each N2HET
– Core Supply Voltage (VCC): 1.14 to 1.32 V
• Two 12-Bit Multibuffered Analog-to-Digital
– I/O Supply Voltage (VCCIO): 3.0 to 3.6 V Converter (MibADC) Modules
• Integrated Memory – ADC1: 24 Channels
– 1.25MB of Program Flash With ECC – ADC2: 16 Channels Shared With ADC1
– 192KB of RAM With ECC – 64 Result Buffers Each With Parity Protection
– 64KB of Flash for Emulated EEPROM With • Multiple Communication Interfaces
ECC
– Three CAN Controllers (DCANs)
• 16-Bit External Memory Interface (EMIF)
• 64 Mailboxes Each With Parity Protection
• Common Platform Architecture
• Compliant to CAN Protocol Version 2.0A and
– Consistent Memory Map Across Family 2.0B
– Real-Time Interrupt (RTI) Timer (OS Timer) – Inter-Integrated Circuit (I2C)
– 128-Channel Vectored Interrupt Module (VIM) – Three Multibuffered Serial Peripheral Interface
– 2-Channel Cyclic Redundancy Checker (CRC) (MibSPI) Modules
• Direct Memory Access (DMA) Controller • 128 Words Each With Parity Protection
– 16 Channels and 32 Control Packets • 8 Transfer Groups
– Parity Protection for Control Packet RAM – Up to Two Standard Serial Peripheral Interface
– DMA Accesses Protected by Dedicated MPU (SPI) Modules
• Frequency-Modulated Phase-Locked Loop – Two UART (SCI) Interfaces, One With Local
(FMPLL) With Built-In Slip Detector Interconnect Network (LIN 2.1) Interface
• Separate Nonmodulating PLL Support
• IEEE 1149.1 JTAG, Boundary Scan and ARM • Packages
CoreSight™ Components – 144-Pin Quad Flatpack (PGE) [Green]
• Advanced JTAG Security Module (AJSM) – 337-Ball Grid Array (ZWT) [Green]
• Calibration Capabilities
– Parameter Overlay Module (POM)
• 16 General-Purpose Input/Output (GPIO) Pins
Capable of Generating Interrupts

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,
intellectual property matters and other important disclaimers. PRODUCTION DATA.
TMS570LS1224
SPNS190B – OCTOBER 2012 – REVISED FEBRUARY 2015 www.ti.com

1.2 Applications
• Braking Systems (ABS and ESC) • Active Driver Assistance Systems
• Electric Power Steering (EPS) • Aerospace and Avionics
• HEV and EV Inverter Systems • Railway Communications
• Battery Management Systems • Off-road Vehicles

1.3 Description
The TMS570LS1224 device is a high-performance automotive-grade microcontroller family for safety
systems. The safety architecture includes dual CPUs in lockstep, CPU and memory BIST logic, ECC on
both the flash and the data SRAM, parity on peripheral memories, and loopback capability on peripheral
I/Os.
The TMS570LS1224 device integrates the ARM Cortex-R4F floating-point CPU which offers an efficient
1.66 DMIPS/MHz, and has configurations which can run up to 180 MHz providing up to 298 DMIPS. The
device supports the word-invariant big-endian [BE32] format.
The TMS570LS1224 device has 1.25MB of integrated flash and 192KB of data RAM with single-bit error
correction and double-bit error detection. The flash memory on this device is a nonvolatile, electrically
erasable and programmable memory, implemented with a 64-bit-wide data bus interface. The flash
operates on a 3.3-V supply input (same level as I/O supply) for all read, program, and erase operations.
When in pipeline mode, the flash operates with a system clock frequency of up to 180 MHz. The SRAM
supports single-cycle read and write accesses in byte, halfword, word, and double-word modes throughout
the supported frequency range.
The TMS570LS1224 device features peripherals for real-time control-based applications, including two
Next Generation High-End Timer (N2HET) timing coprocessors with up to 44 I/O terminals, seven
Enhanced Pulse Width Modulator (ePWM) modules with up to 14 outputs, six Enhanced Capture (eCAP)
modules, two Enhanced Quadrature Encoder Pulse (eQEP) modules, and two 12-bit Analog-to-Digital
Converters (ADCs) supporting up to 24 inputs.
The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time
applications. The timer is software-controlled, using a reduced instruction set, with a specialized timer
micromachine and an attached I/O port. The N2HET can be used for pulse-width-modulated outputs,
capture or compare inputs, or general-purpose I/O (GIO). The N2HET is especially well suited for
applications requiring multiple sensor information and drive actuators with complex and accurate time
pulses. A High-End Timer Transfer Unit (HTU) can perform DMA-type transactions to transfer N2HET data
to or from main memory. A Memory Protection Unit (MPU) is built into the HTU.
The ePWM module can generate complex pulse width waveforms with minimal CPU overhead or
intervention. The ePWM is easy to use and it supports both high-side and low-side PWM and deadband
generation. With integrated trip zone protection and synchronization with the on-chip MibADC, the ePWM
module is ideal for digital motor control applications.
The eCAP module is essential in systems where the accurately timed capture of external events is
important. The eCAP can also be used to monitor the ePWM outputs or for simple PWM generation when
the eCAP is not needed for capture applications.
The eQEP module is used for direct interface with a linear or rotary incremental encoder to get position,
direction, and speed information from a rotating machine as used in high-performance motion and
position-control systems.

2 Device Overview Copyright © 2012–2015, Texas Instruments Incorporated

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The device has two 12-bit-resolution MibADCs with 24 total inputs and 64 words of parity-protected buffer
RAM each. The MibADC channels can be converted individually or can be grouped by software for
sequential conversion sequences. Sixteen inputs are shared between the two MibADCs. Each MibADC
supports three separate groupings of channels. Each group can be converted once when triggered or
configured for continuous conversion mode. The MibADC has a 10-bit mode for use when compatibility
with older devices or faster conversion time is desired. MibADC1 also supports the use of external analog
multiplexers.
The device has multiple communication interfaces: three MibSPIs, two SPIs, one LIN, one SCI, three
DCANs, and one I2C. The SPI provides a convenient method of serial high-speed communications
between similar shift-register type devices. The LIN supports the Local Interconnect standard 2.0 and can
be used as a UART in full-duplex mode using the standard Non-Return-to-Zero (NRZ) format. The DCAN
supports the CAN 2.0 (A and B) protocol standard and uses a serial, multimaster communication protocol
that efficiently supports distributed real-time control with robust communication rates of up to 1 Mbps. The
DCAN is ideal for systems operating in noisy and harsh environments (for example, automotive and
industrial fields) that require reliable serial communication or multiplexed wiring.
The I2C module is a multimaster communication module providing an interface between the
microcontroller and an I2C-compatible device through the I2C serial bus. The I2C supports speeds of 100
and 400 Kbps.
A Frequency-Modulated Phase-Locked Loop (FMPLL) clock module is used to multiply the external
frequency reference to a higher frequency for internal use. The Global Clock Module (GCM) manages the
mapping between the available clock sources and the device clock domains.
The device also has an External Clock Prescaler (ECP) module that when enabled, outputs a continuous
external clock on the ECLK terminal. The ECLK frequency is a user-programmable ratio of the peripheral
interface clock (VCLK) frequency. This low-frequency output can be monitored externally as an indicator of
the device operating frequency.
The Direct Memory Access (DMA) controller has 16 channels, 32 control packets, and parity protection on
its memory. An MPU is built into the DMA to protect memory against erroneous transfers.
The Error Signaling Module (ESM) monitors all device errors and determines whether an interrupt or
external error pin (ball) is triggered when a fault is detected. The nERROR terminal can be monitored
externally as an indicator of a fault condition in the microcontroller.
The External Memory Interface (EMIF) provides a memory extension to asynchronous and synchronous
memories or other slave devices.
A Parameter Overlay Module (POM) enhances the calibration capabilities of application code. The POM
can reroute flash accesses to internal memory or to the EMIF, thus avoiding the reprogramming steps
necessary for parameter updates in flash.
With integrated safety features and a wide choice of communication and control peripherals, the
TMS570LS1224 device is an ideal solution for high-performance real-time control applications with safety-
critical requirements.

Table 1-1. Device Information (1)

PART NUMBER PACKAGE BODY SIZE
TMS570LS1224ZWT NFBGA (337) 16.0 mm × 16.0 mm
TMS570LS1224PGE LQFP (144) 20.0 mm × 20.0 mm

(1) For more information, see Section 9, Mechanical Packaging and Orderable Information.

Copyright © 2012–2015, Texas Instruments Incorporated Device Overview 3

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TMS570LS1224
SPNS190B – OCTOBER 2012 – REVISED FEBRUARY 2015 www.ti.com

1.4 Functional Block Diagram

NOTE
The block diagram reflects the 337BGA package. Some pins are multiplexed or not available
in the 144QFP. For details, see the respective terminal functions tables in Section 4.3.

192kB RAM
with ECC 1.25MB
32K 32K Flash
32K 32K with
32K 32K ECC
DMA POM HTU1 HTU2

Dual Cortex-R4F
CPUs in Lockstep Switched Central Resource Switched Central Resource

Main Cross Bar: Arbitration and Prioritization Control

CRC Switched Central Resource Switched Central Resource Peripheral Central Resource Bridge

nPORRST
EMIF_nWAIT
SYS nRST
EMIF_CLK eQEPxA IOMM ECLK
64 KB Flash EMIF_CKE eQEP eQEPxB
for EEPROM EMIF_nCS[4:2]
1,2 eQEPxS
ESM nERROR
Emulation EMIF_nCS[0]
eQEPxI PMM CAN1_RX
with ECC EMIF_ADDR[12:0] DCAN1
CAN1_TX
EMIF EMIF_BA[1:0] eCAP CAN2_RX
eCAP[6:1]
EMIF_DATA[15:0] 1..6 DCAN2 CAN2_TX
EMIF_nDQM[1:0] VIM
CAN3_RX
EMIF_nOE nTZ[3:1] DCAN3 CAN3_TX
EMIF_nWE ePWM SYNCO MIBSPI1_CLK
EMIF_nRAS 1..7 SYNCI MIBSPI1_SIMO[1:0]
EMIF_nCAS ePWMxA MIBSPI1_SOMI[1:0]
RTI MibSPI1
ePWMxB MIBSPI1_nCS[5:0]
MIBSPI1_nENA
SPI2_CLK
SPI2_SIMO
Color Legend for Power Domains DCC1 SPI2_SOMI
SPI2
Core/RAM Core RAM SPI2_nCS[1:0]
always on #1 #2 #1 SPI2_nENA
#3 #2 MIBSPI3_CLK
MIBSPI3_SIMO
#5 DCC2 MibSPI3 MIBSPI3_SOMI
MIBSPI3_nCS[5:0]
MIBSPI3_nENA
SPI4_CLK
SPI4_SIMO
SPI4 SPI4_SOMI
SPI4_nCS0
MibADC1 MibADC2 N2HET1 N2HET2 GIO I2C SPI4_nENA
MIBSPI5_CLK
VCCAD
VSSAD
ADREFHI
ADREFLO

MIBSPI5_SIMO[3:0]
MibSPI5 MIBSPI5_SOMI[3:0]
GIOA[7:0]
GIOB[7:0]

I2C_SDA
I2C_SCL
AD1EVT
AD1IN[7:0]

AD2EVT

N2HET1[31:0]
N2HET1_PIN_nDIS

N2HET2[15:0]
N2HET2[18,16]
N2HET2_PIN_nDIS

MIBSPI5_nCS[3:0]
MIBSPI5_nENA
LIN_RX
LIN
AD1IN[15:8] \
AD2IN[15:8]
AD1IN[23:16] \
AD2IN[7:0]

LIN_TX

SCI SCI_RX
SCI_TX

Figure 1-1. Functional Block Diagram

4 Device Overview Copyright © 2012–2015, Texas Instruments Incorporated

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www.ti.com SPNS190B – OCTOBER 2012 – REVISED FEBRUARY 2015

Table of Contents
1 Device Overview ......................................... 1 6.9 Device Memory Map ................................ 69
1.1 Features .............................................. 1 6.10 Flash Memory ....................................... 75
1.2 Applications ........................................... 2 6.11 Tightly Coupled RAM Interface Module ............. 78
1.3 Description ............................................ 2 6.12 Parity Protection for Accesses to Peripheral RAMs 78
1.4 Functional Block Diagram ............................ 4 6.13 On-Chip SRAM Initialization and Testing ........... 80
2 Revision History ......................................... 6 6.14 External Memory Interface (EMIF) .................. 82
3 Device Comparison ..................................... 8 6.15 Vectored Interrupt Manager ......................... 90
4 Terminal Configuration and Functions ............. 9 6.16 DMA Controller ...................................... 94
4.1 PGE QFP Package Pinout (144-Pin) ................. 9 6.17 Real Time Interrupt Module ......................... 96
4.2 ZWT BGA Package Ball-Map (337 Ball Grid Array) 10 6.18 Error Signaling Module .............................. 98
4.3 Terminal Functions ................................. 11 6.19 Reset / Abort / Error Sources ...................... 102
5 Specifications .......................................... 41 6.20 Digital Windowed Watchdog ....................... 105
5.1 Absolute Maximum Ratings Over Operating Free- 6.21 Debug Subsystem ................................. 106
Air Temperature Range ............................ 41 7 Peripheral Information and Electrical
5.2 ESD Ratings ........................................ 41 Specifications ......................................... 111
5.3 Power-On Hours (POH) ............................. 41 7.1 Enhanced Translator PWM Modules (ePWM) ..... 111
5.4 Device Recommended Operating Conditions....... 42 7.2 Enhanced Capture Modules (eCAP) ............... 116
5.5 Switching Characteristics Over Recommended 7.3 Enhanced Quadrature Encoder (eQEP) ........... 118
Operating Conditions for Clock Domains ........... 43
7.4 Multibuffered 12bit Analog-to-Digital Converter.... 119
5.6 Wait States Required ............................... 43
7.5 General-Purpose Input/Output ..................... 131
5.7 Power Consumption Over Recommended
Operating Conditions ................................ 44
7.6 Enhanced High-End Timer (N2HET) .............. 132

5.8 Input/Output Electrical Characteristics Over 7.7 Controller Area Network (DCAN) .................. 136
Recommended Operating Conditions ............... 45 7.8 Local Interconnect Network Interface (LIN) ........ 137
5.9 Thermal Resistance Characteristics ................ 45 7.9 Serial Communication Interface (SCI) ............. 138
5.10 Output Buffer Drive Strengths ...................... 46 7.10 Inter-Integrated Circuit (I2C) ....................... 139
5.11 Input Timings ........................................ 47 7.11 Multibuffered / Standard Serial Peripheral
Interface ............................................ 142
5.12 Output Timings ...................................... 47
8 Device and Documentation Support .............. 154
5.13 Low-EMI Output Buffers ............................ 49
8.1 Device and Development-Support Tool
6 System Information and Electrical Nomenclature ...................................... 154
Specifications ........................................... 50
8.2 Documentation Support ............................ 156
6.1 Device Power Domains ............................. 50
8.3 Trademarks ........................................ 156
6.2 Voltage Monitor Characteristics ..................... 50
6.3 Power Sequencing and Power On Reset ........... 52
8.4 Electrostatic Discharge Caution ................... 156
8.5 Glossary............................................ 156
6.4 Warm Reset (nRST)................................. 54
8.6 Device Identification................................ 157
6.5 ARM Cortex-R4F CPU Information ................. 55
8.7 Module Certifications............................... 159
6.6 Clocks ............................................... 58
9 Mechanical Packaging and Orderable
6.7 Clock Monitoring .................................... 66
Information ............................................. 164
6.8 Glitch Filters ......................................... 68
9.1 Packaging Information ............................. 164

Copyright © 2012–2015, Texas Instruments Incorporated Table of Contents 5

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TMS570LS1224
SPNS190B – OCTOBER 2012 – REVISED FEBRUARY 2015 www.ti.com

2 Revision History
This data manual revision history highlights the technical changes made to the SPNS190A device-specific
data manual addendum to make it an SPNS190B revision.
Scope: Applicable updates to the Hercules™ TMS570 MCU device family, specifically relating to the
TMS570LS1224 devices, which are now in the production data (PD) stage of development have been
incorporated.

Changes from September 1, 2013 to February 28, 2015 (from A Revision (September 2013) to B Revision) Page

• Updated/Changed section title to "Device Overview" ........................................................................... 1

• Updated/changed the N2HET feature ............................................................................................. 1
• Added Table 1-1, Device Information .............................................................................................. 3
• Added Section 3, Device Comparison ............................................................................................. 8
• Updated/Changed section title to "Terminal Configuration and Functions" ................................................... 9
• Table 4-2 (PGE Enhanced High-End Timer Modules (N2HET)) Updated/Changed N2HET1 time input capture or
output compare pin description .................................................................................................... 13
• Table 4-2 Updated/Changed N2HET2 time input capture or output compare pin description ............................ 14
• Table 4-5Updated/Changed the EPWM1SYNCI Signal Type from "Output" to "Input" .................................... 15
• Table 4-5Updated/Changed the EPWM1SYNCI pin description from "Output" to "Input" ................................. 15
• Table 4-15 (PGE Test and Debug Modules Interface): Updated/Changed TEST pin description ........................ 20
• Table 4-21 (ZWT Enhanced High-End Timer Modules (N2HET)) Updated/Changed N2HET1 time input capture
or output compare pin description ................................................................................................ 24
• Table 4-21 Updated/Changed N2HET2 time input capture or output compare pin description .......................... 25
• Updated/Changed the EPWM1SYNCI pin description from "Output" to "Input" ............................................ 27
• Table 4-32 (External Memory Interface (EMIF)): Global: Deleted EMIF_RNW pin function............................... 32
• Table 4-35 (ZWT Test and Debug Modules Interface): Updated/Changed TEST pin description ....................... 35
• Table 4-37 Changed six BGA balls from NC to Reserved ..................................................................... 35
• Updated/Changed section title to "Specifications" ............................................................................. 41
• Moved Storage temperature range, Tstg back to Section 5.1, Absolute Maximum Ratings Over Operating Free-
Air Temperature Range ............................................................................................................ 41
• Added Section 5.2, Handling Ratings (Automotive) ............................................................................ 41
• Added Section 5.3, Power-On-Hours (POH) .................................................................................... 41
• Moved Thermal Data section here. ............................................................................................... 45
• Section 5.9 (Thermal Resistance Characteristics): Updated/Changed title from "Thermal Data" to "Thermal
Resistance Characteristics" ........................................................................................................ 45
• Added ΘJA test conditions and added ΨJT for PGE package .................................................................. 45
• Added ΘJA test conditions and added ΨJT for ZWT package.................................................................. 45
• Clarified impact of SPI2PC9 register on drive strength of SPI2SOMI pin .................................................. 47
• Changed the number of cycles of tv(RST) from 2252 to 2256 ................................................................... 54
• Table 6-22 (Flash Memory Banks and Sectors): Added associated footnotes ............................................. 75
• Figure 6-10 (TCRAM Block Diagram): Updated/Changed figure ............................................................. 78
• Added table notes identifying address ranges of ESRAM PBIST groups ................................................... 80
• Updated/Changed N2HET2 RAM ending address from "0xFF57FFFF" to "0xFF45FFFF" in Table 6-26, Memory
Initialization .......................................................................................................................... 81
• Updated EMIF Timings ............................................................................................................ 82
• Changed maximum addressable size of asynchronous memories from 16MB to 32KB .................................. 82
• Updated/Changed the EMIF address bus signals from "EMIF_ADDR[21:0]" to "EMIF_ADDR[12:0]" for all figures
in Section 6.14.2, Electrical and Timing Specifications ........................................................................ 82
• Updated/Changed EMIF address from "EMIF_ADDR[21:0]" to "EMIF_ADDR[12:0]" ...................................... 82
• Changed EMIF tsu(EMDV-EMOEH) from 30nS to 9nS ................................................................................ 84
• Changed EMIF th(EMOEH-EMDIV) from 0.5nS to 0nS ............................................................................... 84
• Changed EMIF tsu(EMOEL-EMWAIT) from 4E+30nS to 4E+9nS .................................................................... 84
• Changed EMIF tsu(EMWEL-EMWAIT) from 4E+30nS to 4E+14nS................................................................... 84
• Changed EMIF tsu(EMCEL-EMOEL) from (RS)*E-5 to (RS)*E-6 ..................................................................... 85
• Changed EMIF tsu(EMCEL-EMOEL) from -5 to -6 ..................................................................................... 85
• Changed EMIF th(EMOEH-EMCEH) from (RH)*E -4 to (RH)*E -3 ................................................................... 85
• Changed EMIF th(EMOEH-EMCEH) from (RH)*E +4 to (RH)*E +5 .................................................................. 85
• Changed EMIF th(EMOEH-EMCEH) from -4 to -3 ...................................................................................... 85

6 Revision History Copyright © 2012–2015, Texas Instruments Incorporated

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• Changed EMIF th(EMOEH-EMCEH) from +4 to +5 .................................................................................... 85

• Changed EMIF tsu(EMBAV-EMOEL) from (RS)*E-5 to (RS)*E-6..................................................................... 85
• Changed EMIF th(EMOEH-EMBAIV) from (RS)*E-4 to (RS)*E-3 ..................................................................... 85
• Changed EMIF tsu(EMAV-EMOEL) from (RS)*E-5 to (RS)*E-6 ...................................................................... 85
• Changed EMIF th(EMOEH-EMAIV) from (RS)*E-4 to (RS)*E-3 ...................................................................... 85
• Changed EMIF td(EMWAITH-EMOEH) from 3E-3 to 3E+9 ............................................................................ 85
• Changed EMIF td(EMWAITH-EMOEH) from 4E+30 to 4E+20 ......................................................................... 85
• Changed EMIF tsu(EMDQMV-EMOEL) from (RS)*E-5 to (RS)*E-6 ................................................................... 85
• Changed EMIF th(EMOEH-EMDQMIV) from (RS)*E-4 to (RS)*E-3 ................................................................... 85
• Changed EMIF tsu(EMCEL-EMWEL) from (WS)*E -4 to (WS)*E -3 ................................................................. 86
• Changed EMIF tsu(EMCEL-EMWEL) from -4 to -3 ..................................................................................... 86
• Changed EMIF th(EMWEH-EMCEH) from (WS)*E -4 to (WS)*E -3 .................................................................. 86
• Changed EMIF th(EMWEH-EMCEH) from -4 to -3 ..................................................................................... 86
• Changed EMIF tsu(EMDQMV-EMWEL) from (WS)*E -4 to (WS)*E -3 ................................................................ 86
• Changed EMIF th(EMWEH-EMDQMIV) from (WS)*E -4 to (WS)*E -3 ................................................................ 86
• Changed EMIF tsu(EMBAV-EMWEL) from (WS)*E -4 to (WS)*E -3 ................................................................. 86
• Changed EMIF th(EMWEH-EMBAIV) from (WS)*E -4 to (WS)*E -3 ................................................................. 86
• Changed EMIF tsu(EMAV-EMWEL) from (WS)*E -4 to (WS)*E -3 ................................................................... 86
• Changed EMIF th(EMWEH-EMAIV) from (WS)*E -4 to (WS)*E -3 ................................................................... 86
• Changed EMIF td(EMWAITH-EMWEH) from 3E-4 to 3E+11 ........................................................................... 86
• Changed EMIF td(EMWAITH-EMWEH) from 4E+30 to 4E+24 ........................................................................ 86
• Changed EMIF tsu(EMDV-EMWEL) from (WS)*E -4 to (WS)*E -3 .................................................................. 86
• Changed EMIF th(EMWEH-EMDIV) from (WS)*E -4 to (WS)*E -3 ................................................................... 86
• Changed EMIF tsu(EMDQMV-EMWEL) from (WS)*E -4 to (WS)*E -3 ................................................................ 86
• Changed EMIF th(EMWEH-EMDQMIV) from (WS)*E -4 to (WS)*E -3 ................................................................ 86
• Added JTAG ID for revision C silicon .......................................................................................... 106
• Revised description of ePWM Trip Zone Timing Requirement tw(TZ) ........................................................ 115
• Corrected SPI table note describing Master mode, phase = 0 condition .................................................. 146
• Added Device Identification code for revision C silicon ...................................................................... 157
• Changed address of die identification registers ............................................................................... 157
• Updated/Changed the section title to "Mechanical Packaging and Orderable Information" ............................. 164
• Section 9.1 (Packaging Information): Updated/Changed paragraph ........................................................ 164

Copyright © 2012–2015, Texas Instruments Incorporated Revision History 7

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SPNS190B – OCTOBER 2012 – REVISED FEBRUARY 2015 www.ti.com

3 Device Comparison
Table 3-1 lists the features of the TMS570LS1224 devices.

Table 3-1. TMS570LS1224 Device Comparison (1) (2)

FEATURES DEVICES
Generic Part (3) (3)
TMS570LS3137ZWT TMS570LS1227ZWT TMS570LS1224ZWT TMS570LS1224PGE TMS570LS0714PGE TMS570LS0714PZ TMS570LS0432PZ
Number
Package 337 BGA 337 BGA 337 BGA 144 QFP 144 QFP 100 QFP 100 QFP
CPU ARM Cortex-R4F ARM Cortex-R4F ARM Cortex-R4F ARM Cortex-R4F ARM Cortex-R4F ARM Cortex-R4F ARM Cortex-R4
Frequency (MHz) 180 180 180 160 160 100 80
Flash (KB) 3072 1280 1280 1280 768 768 384
RAM (KB) 256 192 192 192 128 128 32
Data Flash
64 64 64 64 64 64 16
[EEPROM] (KB)
EMAC 10/100 10/100 – – – – –
FlexRay 2-ch 2-ch – – – – –
CAN 3 3 3 3 3 2 2
MibADC
2 (24ch) 2 (24ch) 2 (24ch) 2 (24ch) 2 (24ch) 2 (16ch) 1 (16ch)
12-bit (Ch)
N2HET (Ch) 2 (44) 2 (44) 2 (44) 2 (40) 2 (40) 2 (21) 1 (19)
ePWM Channels – 14 14 14 14 8 –
eCAP Channels – 6 6 6 6 4 0
eQEP Channels – 2 2 2 2 1 1
MibSPI (CS) 3 (6 + 6 + 4) 3 (6 + 6 + 4) 3 (6 + 6 + 4) 3 (5 + 6 + 1) 3 (5 + 6 + 4) 2 (5 + 1) 1 (4)
SPI (CS) 2 (2 + 1) 2 (2 + 1) 2 (2 + 1) 1 (1) 1 (1) 1 (1) 2
SCI (LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) 2 (1 with LIN) 1 (with LIN) 1 (with LIN)
I2C 1 1 1 1 1 – –

(4) 144 (with 16 interrupt 101 (with 16 interrupt 101 (with 16 interrupt 64 (with 10 interrupt 64 (with 10 interrupt 45 (with 9 interrupt 45 (with 8 interrupt
GPIO (INT)
capable) capable) capable) capable) capable) capable) capable)
EMIF 16-bit data 16-bit data 16-bit data – – – –
ETM (Trace) 32-bit – – – – – –
RTP/DMM YES – – – – – –
Operating
-40ºC to 125ºC -40ºC to 125ºC -40ºC to 125ºC -40ºC to 125ºC -40ºC to 125ºC -40ºC to 125ºC -40ºC to 125ºC
Temperature
Core Supply (V) 1.14 V – 1.32 V 1.14 V – 1.32 V 1.14 V – 1.32 V 1.14 V – 1.32 V 1.14 V – 1.32 V 1.14 V – 1.32 V 1.14 V – 1.32 V
I/O Supply (V) 3.0 V – 3.6 V 3.0 V – 3.6 V 3.0 V – 3.6 V 3.0 V – 3.6 V 3.0 V – 3.6 V 3.0 V – 3.6 V 3.0 V – 3.6 V

(1) For additional device variants, see www.ti.com/tms570

(2) This table reflects the maximum configuration for each peripheral. Some functions are multiplexed and not all pins are available at the
same time.
(3) Superset device.
(4) Total number of pins that can be used as general purpose input or output when not used as part of a peripheral.

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4 Terminal Configuration and Functions

4.1 PGE QFP Package Pinout (144-Pin)

AD1IN[15] / AD2IN[15]

AD1IN[14] / AD2IN[14]

AD1IN[13] / AD2IN[13]

AD1IN[12] / AD2IN[12]

AD1IN[11] / AD2IN[11]
AD1IN[23] / AD2IN[7]

AD1IN[22] / AD2IN[6]
AD1IN[8] / AD2IN[8]
MIBSPI5SIMO[0]
MIBSPI5SOMI[0]
MIBSPI1NCS[0]

MIBSPI5NENA
MIBSPI1NENA

MIBSPI1SOMI
MIBSPI1SIMO
MIBSPI5CLK

MIBSPI1CLK
N2HET1[28]

N2HET1[26]
N2HET1[24]
N2HET1[8]

CAN1RX

AD1IN[6]

AD1IN[5]

AD1IN[4]

AD1IN[3]
AD1IN[2]
CAN1TX

AD1EVT
VCCIO
TMS

VCC
VCC
VSS
VSS

VSS
101
102
104

100
108
107
106

103

99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
81
80
79
78
77
76
75
74
73
105

nTRST 109 72 AD1IN[10] / AD2IN[10]

TDI 110 71 AD1IN[1]
TDO 111 70 AD1IN[9] / AD2IN[9]
TCK 112 69 VCCAD
RTCK 113 68 VSSAD
VCC 114 67 ADREFLO
VSS 115 66 ADREFHI
nRST 116 65 AD1IN[21] / AD2IN[5]
nERROR 117 64 AD1IN[20] / AD2IN[4]
N2HET1[10] 118 63 AD1IN[19] / AD2IN[3]
ECLK 119 62 AD1IN[18] / AD2IN[2]
VCCIO 120 61 AD1IN[7]
VSS 121 60 AD1IN[0]
VSS 122 59 AD1IN[17] / AD2IN[1]
VCC 123 58 AD1IN[16] / AD2IN[0]
N2HET1[12] 124 57 VCC
N2HET1[14] 125 56 VSS
GIOB[0] 126 55 MIBSPI3NCS[0]
N2HET1[30] 127 54 MIBSPI3NENA
CAN2TX 128 53 MIBSPI3CLK
CAN2RX 129 52 MIBSPI3SIMO
MIBSPI1NCS[1] 130 51 MIBSPI3SOMI
LINRX 131 50 VSS
LINTX 132 49 VCC
GIOB[1] 133 48 VCC
VCCP 134 47 VSS
VSS 135 46 nPORRST
VCCIO 136 45 VCC
VCC 137 44 VSS
VSS 138 43 VSS
N2HET1[16] 139 42 VCCIO
N2HET1[18] 140 41 N2HET1[15]
N2HET1[20] 141 40 MIBSPI1NCS[2]
GIOB[2] 142 39 N2HET1[13]
VCC 143 38 N2HET1[6]
VSS 144 37 MIBSPI3NCS[1]
10

12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
11
1
2
3
4
5
6
7
8
9
FLTP1
GIOB[3]

GIOA[5]

OSCIN
GIOA[1]

GIOA[7]
GIOA[0]

N2HET1[1]

N2HET1[5]
MIBSPI5NCS[0]

N2HET1[9]
N2HET1[4]
MIBSPI3NCS[3]
MIBSPI3NCS[2]

N2HET1[11]

GIOA[2]

N2HET1[22]
GIOA[6]

N2HET1[7]
VSS
VSS
FLTP2

VSS

Kelvin_GND

VSS

VCCIO

N2HET1[2]
VCCIO

VCC

VCC
N2HET1[3]

TEST
OSCOUT
CAN3RX
CAN3TX

N2HET1[0]

Figure 4-1. PGE QFP Package Pinout (144-Pin)

Note: Pins can have multiplexed functions. Only the default function is depicted in above diagram.

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4.2 ZWT BGA Package Ball-Map (337 Ball Grid Array)

A B C D E F G H J K L M N P R T U V W

AD1IN[15] AD1IN[22] AD1IN[11]

N2HET1 MIBSPI5 MIBSPI1 MIBSPI1 MIBSPI5 MIBSPI5 N2HET1 AD1IN
19 VSS VSS TMS NC CAN3RX AD1EVT / / / VSSAD VSSAD 19
[10] NCS[0] SIMO NENA CLK SIMO[0] [28] [6]
AD2IN[15] AD2IN[6] AD2IN[11]

AD1IN[8] AD1IN[14] AD1IN[13]

N2HET1 MIBSPI1 MIBSPI1 MIBSPI5 MIBSPI5 N2HET1 AD1IN AD1IN
18 VSS TCK TDO nTRST NC CAN3TX NC / / / VSSAD 18
[8] CLK SOMI NENA SOMI[0] [0] [4] [2]
AD2IN[8] AD2IN[14] AD2IN[13]

AD1IN[10] AD1IN[9]
EMIF_ MIBSPI5 MIBSPI5 MIBSPI5 N2HET1 EMIF_ EMIF_ EMIF_ EMIF_ AD1IN AD1IN AD1IN
17 TDI nRST NC NC NC / / 17
nWE SOMI[1] SIMO[3] SIMO[2] [31] nCS[3] nCS[2] nCS[4] nCS[0] [5] [3] [1]
AD2IN[10] AD2IN[9]

AD1IN[23] AD1IN[12] AD1IN[19]

EMIF_ MIBSPI5 MIBSPI5 MIBSPI5
16 RTCK NC NC NC NC NC NC NC NC NC / / / ADREFLO VSSAD 16
BA[1] SIMO[1] SOMI[3] SOMI[2]
AD2IN[7] AD2IN[12] AD2IN[3]

AD1IN[21] AD1IN[20]
EMIF_ EMIF_ EMIF_ EMIF_
15 NC NC NC NC NC NC NC NC NC DATA[0] DATA[1] DATA[2] DATA[3] NC NC / / ADREFHI VCCAD 15
AD2IN[5] AD2IN[4]

AD1IN[18]
N2HET1 AD1IN AD1IN
14 nERROR NC NC NC VCCIO VCCIO VCCIO VCC VCC VCCIO VCCIO VCCIO VCCIO NC NC / 14
[26] [7] [0]
AD2IN[2]

AD1IN[17] AD1IN[16]
N2HET1 N2HET1
13 NC NC EMIF_BA[0] VCCIO VCCIO NC NC / / NC 13
[17] [19]
AD2IN[1] AD2IN[0]

N2HET1 MIBSPI5
12 ECLK NC NC EMIF_nOE VCCIO VSS VSS VCC VSS VSS VCCIO NC NC NC NC 12
[4] NCS[3]

N2HET1 N2HET1 EMIF_

11 NC NC nDQM[1] VCCIO VSS VSS VSS VSS VSS VCCPLL NC NC NC NC NC 11
[14] [30]

EMIF_ EMIF_ MIBSPI3

10 CAN1TX CAN1RX NC nDQM[0] VCC VCC VSS VSS VSS VCC VCC NC NC NC GIOB[3] 10
ADDR[12] NCS[0]

N2HET1 EMIF_ EMIF_ EXTCLKI MIBSPI3 MIBSPI3

9 NC NC ADDR[5] VCC VSS VSS VSS VSS VSS VCCIO NC NC 9
[27] ADDR[11] N2 CLK NENA

EMIF_ EMIF_ EMIF_ MIBSPI3 MIBSPI3

8 NC NC NC ADDR[4] VCCP VSS VSS VCC VSS VSS VCCIO DATA[15] NC NC 8
ADDR[10] SOMI SIMO

EMIF_ EMIF_ EMIF_ N2HET1

7 LINRX LINTX NC ADDR[3] VCCIO VCCIO DATA[14] NC NC nPORRST 7
ADDR[9] [9]

MIBSPI5 EMIF_ EMIF_ EMIF_ N2HET1 MIBSPI5

6 GIOA[4] NC ADDR[2] VCCIO VCCIO VCCIO VCCIO VCC VCC VCCIO VCCIO VCCIO DATA[13] NC NC 6
NCS[1] ADDR[8] [5] NCS[2]

EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ EMIF_ MIBSPI3 N2HET1
5 GIOA[0] GIOA[5] DATA[4] DATA[5] DATA[6] FLTP2 FLTP1 DATA[7] DATA[8] DATA[9] DATA[10] DATA[11] DATA[12] NC NC 5
ADDR[7] ADDR[1] NCS[1] [2]

N2HET1 N2HET1 EMIF_ EMIF_ N2HET1 N2HET1 EMIF_

4 NC NC NC NC NC NC NC NC NC NC NC NC 4
[16] [12] ADDR[6] ADDR[0] [21] [23] nCAS

N2HET1 N2HET1 MIBSPI3 SPI2 N2HET1 MIBSPI1 MIBSPI1 MIBSPI1 EMIF_ EMIF_ N2HET1 SPI2 EMIF_ EMIF_ N2HET1
3 GIOA[6] NC NC NC 3
[29] [22] NCS[3] NENA [11] NCS[1] NCS[2] NCS[3] CLK CKE [25] NCS[0] nWAIT nRAS [6]

MIBSPI3 SPI2 KELVIN_ N2HET1 N2HET1 MIBSPI1 N2HET1

2 VSS GIOA[1] SPI2 CLK GIOB[2] GIOB[5] CAN2TX GIOB[6] GIOB[1] GIOB[0] NC TEST VSS 2
NCS[2] SOMI GND [13] [20] NCS[0] [1]

SPI2 N2HET1 N2HET1 N2HET1 N2HET1 N2HET1

1 VSS VSS GIOA[2] GIOA[3] GIOB[7] GIOB[4] CAN2RX OSCIN OSCOUT GIOA[7] NC VSS VSS 1
SIMO [18] [15] [24] [7] [3]

A B C D E F G H J K L M N P R T U V W

Figure 4-2. ZWT Package Pinout. Top View

Note: Balls can have multiplexed functions. Only the default function is depicted in above diagram.

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4.3 Terminal Functions

Section 4.3.1 and Section 4.3.2 identify the external signal names, the associated pin/ball numbers along
with the mechanical package designator, the pin/ball type (Input, Output, IO, Power or Ground), whether
the pin/ball has any internal pullup/pulldown, whether the pin/ball can be configured as a GPIO, and a
functional pin/ball description. The first signal name listed is the primary function for that terminal. The
signal name in Bold is the function being described. Refer to the I/O Multiplexing Module (IOMM) chapter
of the TMS570LS12x/11x Technical Reference Manual (SPNU515).

NOTE
In the Terminal Functions table below, the "Reset Pull State" is the state of the pull applied to
the terminal while nPORRST is low and immediately after nPORRST goes High. The default
pull direction may change when software configures the pin for an alternate function. The
"Pull Type" is the type of pull asserted when the signal name in bold is enabled for the given
terminal by the IOMM control registers.

All I/O signals except nRST are configured as inputs while nPORRST is low and
immediately after nPORRST goes High. While nPORRST is low, the input buffers
are disabled, and the output buffers are disabled with the default pulls enabled.

All output-only signals have the output buffer disabled and the default pull enabled
while nPORRST is low, and are configured as outputs with the pulls disabled
immediately after nPORRST goes High.

4.3.1 PGE Package

4.3.1.1 Multibuffered Analog-to-Digital Converters (MibADC)

Table 4-1. PGE Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
ADREFHI (1) 66 Power N/A None ADC high reference
supply
ADREFLO (1) 67 Power ADC low reference supply
VCCAD (1) 69 Power Operating supply for ADC
(1)
VSSAD 68 Ground
AD1EVT 86 I/O Pull Down Programmable, ADC1 event trigger input,
20 µA or GPIO
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ 55 I/O Pull Up Programmable, ADC2 event trigger input,
EQEP1I/N2HET2_PIN_nDIS 20 µA or GPIO
AD1IN[0] 60 Input N/A None ADC1 analog input
AD1IN[1] 71
AD1IN[2] 73
AD1IN[3] 74
AD1IN[4] 76
AD1IN[5] 78
AD1IN[6] 80
AD1IN[7] 61

(1) The ADREFHI, ADREFLO, VCCAD and VSSAD connections are common for both ADC cores.
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Table 4-1. PGE Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2) (continued)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
AD1IN[8] / AD2IN[8] 83 Input N/A None ADC1/ADC2 shared
analog inputs
AD1IN[9] / AD2IN[9] 70
AD1IN[10] / AD2IN[10] 72
AD1IN[11] / AD2IN[11] 75
AD1IN[12] / AD2IN[12] 77
AD1IN[13] / AD2IN[13] 79
AD1IN[14] / AD2IN[14] 82
AD1IN[15] / AD2IN[15] 85
AD1IN[16] / AD2IN[0] 58
AD1IN[17] / AD2IN[1] 59
AD1IN[18] / AD2IN[2] 62
AD1IN[19] / AD2IN[3] 63
AD1IN[20] / AD2IN[4] 64
AD1IN[21] / AD2IN[5] 65
AD1IN[22] / AD2IN[6] 81
AD1IN[23] / AD2IN[7] 84
MIBSPI3SOMI[0]/AWM1_EXT_ENA/ECAP2 51 Output Pull Up None AWM1 external analog
mux enable
MIBSPI3SIMO[0]/AWM1_EXT_SEL[0]/ECAP3 52 Output Pull Up None AWM1 external analog
mux select line0
MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A 53 Output Pull Up None AWM1 external analog
mux select line0

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4.3.1.2 Enhanced High-End Timer Modules (N2HET)

Table 4-2. PGE Enhanced High-End Timer Modules (N2HET)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
N2HET1[0]/SPI4CLK/EPWM2B 25 I/O Pull Down Programmable,
20 µA N2HET1 time input
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A 23 capture or output
N2HET1[2]/SPI4SIMO[0]/EPWM3A 30 compare, or GIO.
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B 24 Each terminal has a
suppression filter with a
N2HET1[4]/EPWM4B 36
programmable duration.
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B 31
N2HET1[6]/SCIRX/EPWM5A 38
N2HET1[7]/N2HET2[14]/EPWM7B 33
N2HET1[8]/MIBSPI1SIMO[1] 106
N2HET1[9]/N2HET2[16]/EPWM7A 35
N2HET1[10]/nTZ3 118
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/ EPWM1SYNCO 6
N2HET1[12] 124
N2HET1[13]/SCITX/EPWM5B 39
N2HET1[14] 125
N2HET1[15]/MIBSPI1NCS[4]/ECAP1 41
N2HET1[16]/EPWM1SYNCI/EPWM1SYNCO 139
MIBSPI1NCS[1]/N2HET1[17]/EQEP1S 130 Pull Up
N2HET1[18]/EPWM6A 140 Pull Down
MIBSPI1NCS[2]/N2HET1[19] 40 Pull Up
N2HET1[20]/EPWM6B 141 Pull Down
N2HET1[22] 15
MIBSPI1NENA/N2HET1[23]/ECAP4 96 Pull Up
N2HET1[24]/MIBSPI1NCS[5] 91 Pull Down
MIBSPI3NCS[1]/N2HET1[25]/MDCLK 37 Pull Up
N2HET1[26] 92 Pull Down
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 4 Pull Up
N2HET1[28] 107 Pull Down
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 3 Pull Up
N2HET1[30]/EQEP2S 127 Pull Down
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B 54 Pull Up

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Table 4-2. PGE Enhanced High-End Timer Modules (N2HET) (continued)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS 14 I/O Pull Down Programmable, Disable selected PWM
20 µA (1) outputs
GIOA[2]/N2HET2[0]/ EQEP2I 9 I/O Pull Down Programmable,
20 µA N2HET2 time input
GIOA[6]/N2HET2[4]/EPWM1B 16 capture or output
GIOA[7]/N2HET2[6]/EPWM2A 22 compare, or GPIO
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A 23 Each terminal has a
suppression filter with a
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B 24
programmable duration.
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B 31
N2HET1[7]/N2HET2[14]/EPWM7B 33
N2HET1[9]/N2HET2[16]/EPWM7A 35
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/ EPWM1SYNCO 6
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ 55 I/O Pull Up Programmable, Disable selected PWM
EQEP1I/N2HET2_PIN_nDIS 20 µA (1) outputs
(1) The N2HETx_PIN_nDIS function is always available on this terminal. There is no mux control to select this function. The pull direction is
controlled by the function which is selected by the output mux control for this terminal.

4.3.1.3 Enhanced Capture Modules (eCAP)

Table 4-3. PGE Enhanced Capture Modules (eCAP) (1)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
N2HET1[15]/MIBSPI1NCS[4]/ECAP1 41 I/O Pull Down Fixed 20 µA Enhanced Capture
Pull Up Module 1 I/O
MIBSPI3SOMI[0]/AWM1_EXT_ENA/ECAP2 51 Pull Up Enhanced Capture
Module 2 I/O
MIBSPI3SIMO[0]/AWM1_EXT_SEL[0]/ECAP3 52 Enhanced Capture
Module 3 I/O
MIBSPI1NENA/N2HET1[23]/ECAP4 96 Enhanced Capture
Module 4 I/O
MIBSPI5NENA/MIBSPI5SOMI[1]/ ECAP5 97 Enhanced Capture
Module 5 I/O
MIBSPI1NCS[0]/MIBSPI1SOMI[1]/ECAP6 105 Enhanced Capture
Module 6 I/O
(1) These signals, when used as inputs, are double-synchronized and then optionally filtered with a 6-cycle VCLK4-based counter.

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4.3.1.4 Enhanced Quadrature Encoder Pulse Modules (eQEP)

Table 4-4. PGE Enhanced Quadrature Encoder Pulse Modules (eQEP) (1)
Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A 53 Input Pull Up Fixed 20 µA Enhanced QEP1 Input A
Pull Up
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B 54 Input Enhanced QEP1 Input B
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ 55 I/O Enhanced QEP1 Index
EQEP1I/N2HET2_PIN_nDIS
MIBSPI1NCS[1]/N2HET1[17]/EQEP1S 130 I/O Enhanced QEP1 Strobe
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A 23 Input Pull Down Enhanced QEP2 Input A
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B 24 Input Enhanced QEP2 Input B
GIOA[2]/N2HET2[0]/ EQEP2I 9 I/O Enhanced QEP2 Index
N2HET1[30]/EQEP2S 127 I/O Enhanced QEP2 Strobe
(1) These signals are double-synchronized and then optionally filtered with a 6-cycle VCLK4-based counter.

4.3.1.5 Enhanced Pulse-Width Modulator Modules (ePWM)

Table 4-5. PGE Enhanced Pulse-Width Modulator Modules (ePWM)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS 14 Output Pull Down None Enhanced PWM1 Output
A
GIOA[6]/N2HET2[4]/EPWM1B 16 Enhanced PWM1 Output
B
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/EPWM1SYNCO 6 External ePWM Sync
Pulse Output
N2HET1[16]/EPWM1SYNCI/EPWM1SYNCO 139 Input Fixed 20 µA External ePWM Sync
Pull Up Pulse Input
GIOA[7]/N2HET2[6]/EPWM2A 22 Output None Enhanced PWM2 Output
A
N2HET1[0]/SPI4CLK/EPWM2B 25 Enhanced PWM2 Output
B
N2HET1[2]/SPI4SIMO[0]/EPWM3A 30 Enhanced PWM3 Output
A
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B 31 Enhanced PWM3 Output
B
MIBSPI5NCS[0]/EPWM4A 32 Pull Up Enhanced PWM4 Output
A
N2HET1[4]/EPWM4B 36 Pull Down Enhanced PWM4 Output
B
N2HET1[6]/SCIRX/EPWM5A 38 Enhanced PWM5 Output
A
N2HET1[13]/SCITX/EPWM5B 39 Enhanced PWM5 Output
B
N2HET1[18]/EPWM6A 140 Enhanced PWM6 Output
A
N2HET1[20]/EPWM6B 141 Enhanced PWM6 Output
B
N2HET1[9]/N2HET2[16]/EPWM7A 35 Enhanced PWM7 Output
A
N2HET1[7]/N2HET2[14]/EPWM7B 33 Enhanced PWM7 Output
B

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Table 4-5. PGE Enhanced Pulse-Width Modulator Modules (ePWM) (continued)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 3 Input Pull Up Fixed 20 µA Trip Zone Inputs 1, 2 and
Pull Up 3. These signals are
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 4
either connected
N2HET1[10]/nTZ3 118 Pull Down asynchronously to the
ePWMx trip zone inputs,
or double-synchronized
with VCLK4, or double-
synchronized and then
filtered with a 6-cycle
VCLK4-based counter
before connecting to the
ePWMx trip zone inputs.

4.3.1.6 General-Purpose Input / Output (GPIO)

Table 4-6. PGE General-Purpose Input / Output (GPIO)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
GIOA[0] 2 I/O Pull Down Programmable, General-purpose I/O.
20 µA All GPIO terminals are
GIOA[1] 5
capable of generating
GIOA[2]/N2HET2[0] /EQEP2I 9 interrupts to the CPU on
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS 14 rising / falling / both
edges.
GIOA[6]/N2HET2[4]/EPWM1B 16
GIOA[7]/N2HET2[6]/EPWM2A 22
GIOB[0] 126
GIOB[1] 133
GIOB[2] 142
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ 55 (1) Pull Up
EQEP1I/N2HET2_PIN_nDIS
GIOB[3] 1 Pull Down
(1) GIOB[2] cannot output a level on to pin 55. Only the input functionality is supported so that the application can generate an interrupt
whenever the N2HET2_PIN_nDIS is asserted (driven low). Also, a pull up is enabled on the input. This is not programmable using the
GIO module control registers.

4.3.1.7 Controller Area Network Controllers (DCAN)

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4.3.1.8 Local Interconnect Network Interface Module (LIN)

Table 4-8. PGE Local Interconnect Network Interface Module (LIN)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
LINRX 131 I/O Pull Up Programmable, LIN receive, or GPIO
20 µA
LINTX 132 LIN transmit, or GPIO

4.3.1.9 Standard Serial Communication Interface (SCI)

Table 4-9. PGE Standard Serial Communication Interface (SCI)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
N2HET1[6]/SCIRX/EPWM5A 38 I/O Pull Down Programmable, SCI receive, or GPIO
20 µA
N2HET1[13]/SCITX/EPWM5B 39 SCI transmit, or GPIO

4.3.1.10 Inter-Integrated Circuit Interface Module (I2C)

Table 4-10. PGE Inter-Integrated Circuit Interface Module (I2C)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 4 I/O Pull Up Programmable, I2C serial data, or GPIO
20 µA
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 3 I2C serial clock, or GPIO

4.3.1.11 Standard Serial Peripheral Interface (SPI)

Table 4-11. PGE Standard Serial Peripheral Interface (SPI)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
N2HET1[0]/SPI4CLK/EPWM2B 25 I/O Pull Down Programmable, SPI4 clock, or GPIO
20 µA
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B 24 SPI4 chip select, or GPIO
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A 23 SPI4 enable, or GPIO
N2HET1[2]/SPI4SIMO[0]/EPWM3A 30 SPI4 slave-input master-
output, or GPIO
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B 31 SPI4 slave-output master-
input, or GPIO

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4.3.1.12 Multibuffered Serial Peripheral Interface Modules (MibSPI)

Table 4-12. PGE Multibuffered Serial Peripheral Interface Modules (MibSPI)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
MIBSPI1CLK 95 I/O Pull Up Programmable, MibSPI1 clock, or GPIO
20 µA
MIBSPI1NCS[0]/MIBSPI1SOMI[1]/ECAP6 105 MibSPI1 chip select, or
GPIO
MIBSPI1NCS[1]/N2HET1[17]/EQEP1S 130
MIBSPI1NCS[2]/N2HET1[19] 40
N2HET1[15]/MIBSPI1NCS[4]/ECAP1 41 Pull Down Programmable, MibSPI1 chip select, or
20 µA GPIO
N2HET1[24]/MIBSPI1NCS[5] 91
MIBSPI1NENA/N2HET1[23]/ECAP4 96 Pull Up Programmable, MibSPI1 enable, or GPIO
20 µA
MIBSPI1SIMO[0] 93 MibSPI1 slave-in master-
out, or GPIO
N2HET1[8]/MIBSPI1SIMO[1] 106 Pull Down Programmable, MibSPI1 slave-in master-
20 µA out, or GPIO
MIBSPI1SOMI[0] 94 Pull Up Programmable, MibSPI1 slave-out master-
20 µA in, or GPIO
MIBSPI1NCS[0]/MIBSPI1SOMI[1]/ECAP6 105

MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A 53 I/O Pull Up Programmable, MibSPI3 clock, or GPIO

20 µA
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ 55 MibSPI3 chip select, or
EQEP1I/N2HET2_PIN_nDIS GPIO
MIBSPI3NCS[1]/N2HET1[25]/MDCLK 37
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 4
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 3
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/EPWM1SYNCO 6 Pull Down Programmable, MibSPI3 chip select, or
20 µA GPIO
MIBSPI3NENA /MIBSPI3NCS[5]/N2HET1[31]/EQEP1B 54 Pull Up Programmable, MibSPI3 chip select, or
20 µA GPIO
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B 54 MibSPI3 enable, or GPIO
MIBSPI3SIMO[0]/AWM1_EXT_SEL[0]/ECAP3 52 MibSPI3 slave-in master-
out, or GPIO
MIBSPI3SOMI[0]/AWM1_EXT_ENA/ECAP2 51 MibSPI3 slave-out master-
in, or GPIO

MIBSPI5CLK 100 I/O Pull Up Programmable, MibSPI5 clock, or GPIO

20 µA
MIBSPI5NCS[0]/EPWM4A 32 MibSPI5 chip select, or
GPIO
MIBSPI5NENA/MIBSPI5SOMI[1]/ ECAP5 97 MibSPI5 enable, or GPIO
MIBSPI5SIMO[0]/MIBSPI5SOMI[2] 99 MibSPI5 slave-in master-
out, or GPIO
MIBSPI5SOMI[0] 98 MibSPI5 slave-out master-
in, or GPIO
MIBSPI5NENA/MIBSPI5SOMI[1]/ ECAP5 97 MibSPI5 slave-out master-
in, or GPIO
MIBSPI5SIMO[0]/MIBSPI5SOMI[2] 99 MibSPI5 slave-out master-
in, or GPIO

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4.3.1.13 System Module Interface

Table 4-13. PGE System Module Interface

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
nPORRST 46 Input Pull Down Fixed 100 µA Power-on reset, cold reset
Pull Down External power supply
monitor circuitry must
drive nPORRST low when
any of the supplies to the
microcontroller fall out of
the specified range. This
terminal has a glitch filter.
See Section 6.8.
nRST 116 I/O Pull Up Fixed 100 µA System reset, warm reset,
Pull Up bidirectional.
The internal circuitry
indicates any reset
condition by driving nRST
low.
The external circuitry can
assert a system reset by
driving nRST low. To
ensure that an external
reset is not arbitrarily
generated, TI
recommends that an
external pull-up resistor is
connected to this terminal.
This terminal has a glitch
filter. See Section 6.8.
nERROR 117 I/O Pull Down Fixed 20 µA ESM Error Signal
Pull Down Indicates error of high
severity. See
Section 6.18.

4.3.1.14 Clock Inputs and Outputs

Table 4-14. PGE Clock Inputs and Outputs

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
OSCIN 18 Input N/A None From external
crystal/resonator, or
external clock input
KELVIN_GND 19 Input Kelvin ground for oscillator
OSCOUT 20 Output To external
crystal/resonator
ECLK 119 I/O Pull Down Programmable, External prescaled clock
20 µA output, or GPIO.
GIOA[5]/EXTCLKIN/EPWM1A /N2HET1_PIN_nDIS 14 Input Pull Down Fixed 20 µA External clock input #1
Pull Down

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4.3.1.15 Test and Debug Modules Interface

Table 4-15. PGE Test and Debug Modules Interface

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
TEST 34 Input Pull Down Fixed 100 µA Test enable. This terminal
Pull Down must be connected to
ground directly or via a
pull-down resistor.
nTRST 109 Input JTAG test hardware reset
RTCK 113 Output N/A None JTAG return test clock
TCK 112 Input Pull Down Fixed 100 µA JTAG test clock
Pull Down
TDI 110 Input Pull Up Fixed 100 µA JTAG test data in
Pull Up
TDO 111 Output 100 µA None JTAG test data out
Pull Down
TMS 108 Input Pull Up Fixed 100 µA JTAG test select
Pull Up

4.3.1.16 Flash Supply and Test Pads

Table 4-16. PGE Flash Supply and Test Pads

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
VCCP 134 3.3V N/A None Flash pump supply
Power
FLTP1 7 - N/A- None Flash test pads. These
terminals are reserved for
FLTP2 8
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].

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4.3.1.17 Supply for Core Logic: 1.2V nominal

Table 4-17. PGE Supply for Core Logic: 1.2V nominal

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
VCC 17 1.2V N/A None Core supply
Power
VCC 29
VCC 45
VCC 48
VCC 49
VCC 57
VCC 87
VCC 101
VCC 114
VCC 123
VCC 137
VCC 143

4.3.1.18 Supply for I/O Cells: 3.3V nominal

Table 4-18. PGE Supply for I/O Cells: 3.3V nominal

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
VCCIO 10 3.3V N/A None Operating supply for I/Os
Power
VCCIO 26
VCCIO 42
VCCIO 104
VCCIO 120
VCCIO 136

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4.3.1.19 Ground Reference for All Supplies Except VCCAD

Table 4-19. PGE Ground Reference for All Supplies Except VCCAD
Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 144
PGE
VSS 11 Ground N/A None Ground reference
VSS 21
VSS 27
VSS 28
VSS 43
VSS 44
VSS 47
VSS 50
VSS 56
VSS 88
VSS 102
VSS 103
VSS 115
VSS 121
VSS 122
VSS 135
VSS 138
VSS 144

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4.3.2 ZWT Package

4.3.2.1 Multibuffered Analog-to-Digital Converters (MibADC)

Table 4-20. ZWT Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
ADREFHI (1) V15 Power N/A None ADC high reference
supply
ADREFLO (1) V16 Power ADC low reference supply
VCCAD (1) W15 Power Operating supply for ADC
VSSAD V19 Ground N/A None ADC supply power
VSSAD W16
VSSAD W18
VSSAD W19
AD1EVT N19 I/O Pull Down Programmable, ADC1 event trigger input,
20 µA or GPIO
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ V10 I/O Pull Up Programmable, ADC2 event trigger input,
EQEP1I/N2HET2_PIN_nDIS 20 µA or GPIO
AD1IN[0] W14 Input N/A None ADC1 analog input
AD1IN[1] V17
AD1IN[2] V18
AD1IN[3] T17
AD1IN[4] U18
AD1IN[5] R17
AD1IN[6] T19
AD1IN[7] V14
AD1IN[8] / AD2IN[8] P18 Input N/A None ADC1/ADC2 shared
analog inputs
AD1IN[9] / AD2IN[9] W17
AD1IN[10] / AD2IN[10] U17
AD1IN[11] / AD2IN[11] U19
AD1IN[12] / AD2IN[12] T16
AD1IN[13] / AD2IN[13] T18
AD1IN[14] / AD2IN[14] R18
AD1IN[15] / AD2IN[15] P19
AD1IN[16] / AD2IN[0] V13
AD1IN[17] / AD2IN[1] U13
AD1IN[18] / AD2IN[2] U14
AD1IN[19] / AD2IN[3] U16
AD1IN[20] / AD2IN[4] U15
AD1IN[21] / AD2IN[5] T15
AD1IN[22] / AD2IN[6] R19
AD1IN[23] / AD2IN[7] R16
MIBSPI3SOMI[0]/AWM1_EXT_ENA/ECAP2 V8 Output Pull Up None AWM1 external analog
mux enable
MIBSPI3SIMO[0]/AWM1_EXT_SEL[0]/ECAP3 W8 AWM1 external analog
mux select line0
MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A V9 AWM1 external analog
mux select line0
(1) The ADREFHI, ADREFLO, VCCAD and VSSAD connections are common for both ADC cores.

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4.3.2.2 Enhanced High-End Timer Modules (N2HET)

Table 4-21. ZWT Enhanced High-End Timer Modules (N2HET)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
N2HET1[0]/SPI4CLK/EPWM2B K18 I/O Pull Down Programmable,
20 µA N2HET1 time input
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A V2 capture or output
N2HET1[2]/SPI4SIMO[0]/EPWM3A W5 compare, or GIO.
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B U1 Each terminal has a
suppression filter with a
N2HET1[4]/EPWM4B B12
programmable duration.
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B V6
N2HET1[6]/SCIRX/EPWM5A W3
N2HET1[7]/N2HET2[14]/EPWM7B T1
N2HET1[8]/MIBSPI1SIMO[1] E18
N2HET1[9]/N2HET2[16]/EPWM7A V7
N2HET1[10]/nTZ3 D19
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/EPWM1SYNCO E3
N2HET1[12] B4
N2HET1[13]/SCITX/EPWM5B N2
N2HET1[14] A11
N2HET1[15]/MIBSPI1NCS[4]/ECAP1 N1
N2HET1[16]/EPWM1SYNCI/EPWM1SYNCO A4
N2HET1[17] A13
MIBSPI1NCS[1]/N2HET1[17]/ EQEP1S F3
N2HET1[18]/EPWM6A J1
N2HET1[19] B13
MIBSPI1NCS[2]/N2HET1[19] G3
N2HET1[20]/EPWM6B P2
N2HET1[21] H4
MIBSPI1NCS[3]/N2HET1[21] J3
N2HET1[22] B3
N2HET1[23] J4
MIBSPI1NENA/N2HET1[23]/ECAP4 G19 Pull Up
N2HET1[24]/MIBSPI1NCS[5] P1 Pull Down
N2HET1[25] M3
MIBSPI3NCS[1]/N2HET1[25]/MDCLK V5
N2HET1[26] A14
N2HET1[27] A9
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 B2 Pull Up
N2HET1[28] K19 Pull Down
N2HET1[29] A3
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 C3

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Table 4-21. ZWT Enhanced High-End Timer Modules (N2HET) (continued)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
N2HET1[30]/EQEP2S B11 I/O Pull Down Programmable,
20 µA
N2HET1[31] J17
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B W9 Pull Up
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS B5 input Pull Down Programmable, Disable selected PWM
20 µA (1) outputs
GIOA[2]/N2HET2[0] /EQEP2I C1 I/O Pull Down Programmable,
20 µA N2HET2 time input
EMIF_ADDR[0]/N2HET2[1] D4 capture or output
GIOA[3]/N2HET2[2] E1 compare, or GIO.
EMIF_ADDR[1]/N2HET2[3] D5 Each terminal has a
suppression filter with a
GIOA[6]/N2HET2[4]/EPWM1B H3
programmable duration.
EMIF_BA[1]/N2HET2[5] D16
GIOA[7]/N2HET2[6]/EPWM2A M1
EMIF_nCS[0]/N2HET2[7] N17
N2HET1[1]/SPI4NENA/ N2HET2[8]/EQEP2A V2
EMIF_nCS[3]/N2HET2[9] K17
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B U1
EMIF_ADDR[6]/N2HET2[11] C4
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B V6
EMIF_ADDR[7]/N2HET2[13] C5
N2HET1[7]/N2HET2[14]/EPWM7B T1
EMIF_ADDR[8]/N2HET2[15] C6
N2HET1[9]/N2HET2[16]/EPWM7A V7
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/EPWM1SYNCO E3
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ V10 I/O Pull Up Programmable, Disable selected PWM
EQEP1I/N2HET2_PIN_nDIS 20 µA (1) outputs
(1) The N2HETx_PIN_nDIS function is always available on this terminal. There is no mux control to select this function. The pull direction is
controlled by the function which is selected by the output mux control for this terminal.

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4.3.2.3 Enhanced Capture Modules (eCAP)

Table 4-22. ZWT Enhanced Capture Modules (eCAP) (1)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
N2HET1[15]/MIBSPI1NCS[4]/ECAP1 N1 I/O Pull Down Fixed 20 µA Enhanced Capture
Pull Up Module 1 I/O
MIBSPI3SOMI[0]/AWM1_EXT_ENA/ECAP2 V8 I/O Pull Up Enhanced Capture
Module 2 I/O
MIBSPI3SIMO[0]/AWM1_EXT_SEL[0]/ECAP3 W8 I/O Enhanced Capture
Module 3 I/O
MIBSPI1NENA/N2HET1[23]/ECAP4 G19 I/O Enhanced Capture
Module 4 I/O
MIBSPI5NENA/MIBSPI5SOMI[1]/ ECAP5 H18 I/O Enhanced Capture
Module 5 I/O
MIBSPI1NCS[0]/MIBSPI1SOMI[1]/ ECAP6 R2 I/O Enhanced Capture
Module 6 I/O
(1) These signals, when used as inputs, are double-synchronized and then optionally filtered with a 6-cycle VCLK4-based counter.

4.3.2.4 Enhanced Quadrature Encoder Pulse Modules (eQEP)

Table 4-23. ZWT Enhanced Quadrature Encoder Pulse Modules (eQEP) (1)
Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A V9 Input Pull Up Fixed 20 µA Enhanced QEP1 Input A
Pull Up
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B W9 Input Enhanced QEP1 Input B
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ V10 I/O Enhanced QEP1 Index
EQEP1I/N2HET2_PIN_nDIS
MIBSPI1NCS[1]/N2HET1[17]/ EQEP1S F3 I/O Enhanced QEP1 Strobe
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A V2 Input Pull Down Enhanced QEP2 Input A
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B U1 Input Pull Down Enhanced QEP2 Input B
GIOA[2]/N2HET2[0]/ EQEP2I C1 I/O Pull Down Enhanced QEP2 Index
N2HET1[30]/EQEP2S B11 I/O Pull Down Enhanced QEP2 Strobe
(1) These signals are double-synchronized and then optionally filtered with a 6-cycle VCLK4-based counter.

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4.3.2.5 Enhanced Pulse-Width Modulator Modules (ePWM)

Table 4-24. ZWT Enhanced Pulse-Width Modulator Modules (ePWM)

TERMINAL
SIGNA Reset Pull
337 PULL TYPE DESCRIPTION
SIGNAL NAME L TYPE State
ZWT
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS B5 Output Pull Down None Enhanced PWM1 Output A
GIOA[6]/N2HET2[4]/EPWM1B H3 Enhanced PWM1 Output B
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/EPWM1SYNCO E3 External ePWM Sync Pulse
Output
N2HET1[16]/EPWM1SYNCI/EPWM1SYNCO A4 Input Fixed 20 µA External ePWM Sync Pulse
Pull Up Input
GIOA[7]/N2HET2[6]/EPWM2A M1 Output None Enhanced PWM2 Output A
N2HET1[0]/SPI4CLK/EPWM2B K18 Enhanced PWM2 Output B
N2HET1[2]/SPI4SIMO[0]/EPWM3A W5 Enhanced PWM3 Output A
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B V6 Enhanced PWM3 Output B
MIBSPI5NCS[0]/EPWM4A E19 Pull Up Enhanced PWM4 Output A
N2HET1[4]/EPWM4B B12 Pull Down Enhanced PWM4 Output B
N2HET1[6]/SCIRX/EPWM5A W3 Enhanced PWM5 Output A
N2HET1[13]/SCITX/EPWM5B N2 Enhanced PWM5 Output B
N2HET1[18]/EPWM6A J1 Enhanced PWM6 Output A
N2HET1[20]/EPWM6B P2 Enhanced PWM6 Output B
N2HET1[9]/N2HET2[16]/EPWM7A V7 Enhanced PWM7 Output A
N2HET1[7]/N2HET2[14]/EPWM7B T1 Enhanced PWM7 Output B
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 C3 Input Pull Up Fixed 20 µA Trip Zone Inputs 1, 2 and 3.
Pull Up These signals are either
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 B2
connected asynchronously to
N2HET1[10]/nTZ3 D19 Pull Down the ePWMx trip zone inputs,
or double-synchronized with
VCLK4, or double-
synchronized and then
filtered with a 6-cycle
VCLK4-based counter before
connecting to the ePWMx
trip zone inputs.

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4.3.2.6 General-Purpose Input / Output (GPIO)

Table 4-25. ZWT General-Purpose Input / Output (GPIO)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
GIOA[0] A5 I/O Pull Down Programmable, General-purpose I/O.
20 µA All GPIO terminals are
GIOA[1] C2
capable of generating
GIOA[2]/N2HET2[0] /EQEP2I C1 interrupts to the CPU on
GIOA[3]/N2HET2[2] E1 rising / falling / both
edges.
GIOA[4] A6
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS B5
GIOA[6]/N2HET2[4]/EPWM1B H3
GIOA[7]/N2HET2[6]/EPWM2A M1
GIOB[0] M2
GIOB[1] K2
GIOB[2] F2
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ V10 (1)
EQEP1I/N2HET2_PIN_nDIS
GIOB[3] W10
GIOB[4] G1
GIOB[5] G2
GIOB[6] J2
GIOB[7] F1
(1) GIOB[2] cannot output a level on to terminal V10. Only the input functionality is supported so that the application can generate an
interrupt whenever the N2HET2_PIN_nDIS is asserted (driven low). Also, a pull up is enabled on the input. This is not programmable
using the GIO module control registers.

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4.3.2.7 Controller Area Network Controllers (DCAN)

4.3.2.8 Local Interconnect Network Interface Module (LIN)

Table 4-27. ZWT Local Interconnect Network Interface Module (LIN)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
LINRX A7 I/O Pull Up Programmable, LIN receive, or GPIO
20 µA
LINTX B7 LIN transmit, or GPIO

4.3.2.9 Standard Serial Communication Interface (SCI)

Table 4-28. ZWT Standard Serial Communication Interface (SCI)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
N2HET1[6]/SCIRX/EPWM5A W3 I/O Pull Down Programmable, SCI receive, or GPIO
20 µA
N2HET1[13]/SCITX/EPWM5B N2 SCI transmit, or GPIO

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4.3.2.10 Inter-Integrated Circuit Interface Module (I2C)

Table 4-29. ZWT Inter-Integrated Circuit Interface Module (I2C)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 B2 I/O Pull Up Programmable, I2C serial data, or GPIO
20 µA
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 C3 I2C serial clock, or GPIO

4.3.2.11 Standard Serial Peripheral Interface (SPI)

Table 4-30. ZWT Standard Serial Peripheral Interface (SPI)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
SPI2CLK E2 I/O Pull Up Programmable, SPI2 clock, or GPIO
20 µA
SPI2NCS[0] N3 SPI2 chip select, or GPIO
SPI2NENA/SPI2NCS[1] D3 SPI2 chip select, or GPIO
SPI2NENA/SPI2NCS[1] D3 SPI2 enable, or GPIO
SPI2SIMO[0] D1 SPI2 slave-input master-
output, or GPIO
SPI2SOMI[0] D2 SPI2 slave-output master-
input, or GPIO

N2HET1[0]/SPI4CLK/EPWM2B K18 I/O Pull Down Programmable, SPI4 clock, or GPIO

20 µA
N2HET1[3]/SPI4NCS[0]/N2HET2[10]/EQEP2B U1 SPI4 chip select, or GPIO
N2HET1[1]/SPI4NENA/N2HET2[8]/EQEP2A V2 SPI4 enable, or GPIO
N2HET1[2]/SPI4SIMO[0]/EPWM3A W5 SPI4 slave-input master-
output, or GPIO
N2HET1[5]/SPI4SOMI[0]/N2HET2[12]/EPWM3B V6 SPI4 slave-output master-
input, or GPIO

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4.3.2.12 Multibuffered Serial Peripheral Interface Modules (MibSPI)

Table 4-31. ZWT Multibuffered Serial Peripheral Interface Modules (MibSPI)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
MIBSPI1CLK F18 I/O Pull Up Programmable, MibSPI1 clock, or GPIO
20 µA
MIBSPI1NCS[0]/MIBSPI1SOMI[1]/ECAP6 R2 MibSPI1 chip select, or
GPIO
MIBSPI1NCS[1]/N2HET1[17]/EQEP1S F3
MIBSPI1NCS[2]/N2HET1[19] G3
MIBSPI1NCS[3]/N2HET1[21] J3
N2HET1[15]/MIBSPI1NCS[4]/ECAP1 N1 Pull Down Programmable, MibSPI1 chip select, or
20 µA GPIO
N2HET1[24]/MIBSPI1NCS[5] P1
MIBSPI1NENA/N2HET1[23]/ECAP4 G19 Pull Up Programmable, MibSPI1 enable, or GPIO
20 µA
MIBSPI1SIMO[0] F19 MibSPI1 slave-in master-
out, or GPIO
N2HET1[8]/MIBSPI1SIMO[1] E18 Pull Down Programmable, MibSPI1 slave-in master-
20 µA out, or GPIO
MIBSPI1SOMI[0] G18 Pull Up Programmable, MibSPI1 slave-out master-
20 µA in, or GPIO
MIBSPI1NCS[0]/MIBSPI1SOMI[1]/ECAP6 R2

MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A V9 I/O Pull Up Programmable, MibSPI3 clock, or GPIO

20 µA
MIBSPI3NCS[0]/AD2EVT/GIOB[2]/ V10 MibSPI3 chip select, or
EQEP1I/N2HET2_PIN_nDIS GPIO
MIBSPI3NCS[1]/N2HET1[25]/MDCLK V5
MIBSPI3NCS[2]/I2C_SDA/N2HET1[27]/nTZ2 B2
MIBSPI3NCS[3]/I2C_SCL/N2HET1[29]/nTZ1 C3
N2HET1[11]/MIBSPI3NCS[4]/N2HET2[18]/EPWM1SYNCO E3 Pull Down Programmable, MibSPI3 chip select, or
20 µA GPIO
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B W9 Pull Up Programmable, MibSPI3 chip select, or
20 µA GPIO
MIBSPI3NENA/MIBSPI3NCS[5]/N2HET1[31]/EQEP1B W9 MibSPI3 enable, or GPIO
MIBSPI3SIMO[0]/AWM1_EXT_SEL[0]/ECAP3 W8 MibSPI3 slave-in master-
out, or GPIO
MIBSPI3SOMI[0]/AWM1_EXT_ENA/ECAP2 V8 MibSPI3 slave-out master-
in, or GPIO

MIBSPI5CLK H19 I/O Pull Up Programmable, MibSPI5 clock, or GPIO

20 µA
MIBSPI5NCS[0]/EPWM4A E19 MibSPI5 chip select, or
GPIO
MIBSPI5NCS[1] B6
MIBSPI5NCS[2] W6
MIBSPI5NCS[3] T12
MIBSPI5NENA/MIBSPI5SOMI[1]/ECAP5 H18 MibSPI5 enable, or GPIO
MIBSPI5SIMO[0]/MIBSPI5SOMI[2] J19 MibSPI5 slave-in master-
out, or GPIO
MIBSPI5SIMO[1] E16
MIBSPI5SIMO[2] H17
MIBSPI5SIMO[3] G17
MIBSPI5SOMI[0] J18 MibSPI5 slave-out master-
in, or GPIO
MIBSPI5SOMI[1] E17
MIBSPI5NENA/MIBSPI5SOMI[1]/ECAP5 H18
MIBSPI5SOMI[2] H16
MIBSPI5SIMO[0]/MIBSPI5SOMI[2] J19
MIBSPI5SOMI[3] G16

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4.3.2.13 External Memory Interface (EMIF)

Table 4-32. External Memory Interface (EMIF)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
EMIF_CKE L3 Output Pull Up None EMIF Clock Enable
EMIF_CLK K3 I/O None EMIF clock. This is an
output signal in functional
mode. It is gated off by
default, so that the signal
is pulled up. PINMUX29[8]
must be cleared to enable
this output.
EMIF_nOE E12 Output Pull Up None EMIF Read Enable
EMIF_nWAIT P3 I/O Pull Up Fixed 20 µA EMIF Extended Wait
Pull Up Signal
EMIF_nWE D17 Output Pull Up None EMIF Write Enable
EMIF_nCAS R4 Output EMIF column address
strobe
EMIF_nRAS R3 Output EMIF row address strobe
EMIF_nCS[0]/N2HET2[7] (1) N17 Output EMIF chip select,
synchronous
EMIF_nCS[2] L17 Output EMIF chip selects,
asynchronous
EMIF_nCS[3]/N2HET2[9] (1) K17 Output
This applies to chip
EMIF_nCS[4] M17 Output selects 2, 3 and 4
EMIF_nDQM[0] E10 Output EMIF Data Mask or Write
Strobe.
EMIF_nDQM[1] E11 Output
Data mask for SDRAM
devices, write strobe for
connected asynchronous
devices.
EMIF_BA[0] E13 Output EMIF bank address or
address line
EMIF_BA[1]/N2HET2[5] (1) D16 Output EMIF bank address or
address line
EMIF_ADDR[0]/N2HET2[1] (1) D4 Output EMIF address
(1)
EMIF_ADDR[1]/N2HET2[3] D5 Output
EMIF_ADDR[2] E6 Output
EMIF_ADDR[3] E7 Output
EMIF_ADDR[4] E8 Output
EMIF_ADDR[5] E9 Output
EMIF_ADDR[6]/N2HET2[11] (1) C4 Output
EMIF_ADDR[7]/N2HET2[13] (1) C5 Output
(1)
EMIF_ADDR[8]/N2HET2[15] C6 Output
EMIF_ADDR[9] C7 Output
EMIF_ADDR[10] C8 Output
EMIF_ADDR[11] C9 Output
EMIF_ADDR[12] C10 Output

(1) These signals are tri-stated and pulled up by default after power-up. Any application that requires the EMIF must set the bit 31 of the
system module general-purpose register GPREG1.
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Table 4-32. External Memory Interface (EMIF) (continued)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
EMIF_DATA[0] K15 I/O Pull Up Fixed 20 µA EMIF Data
Pull Up
EMIF_DATA[1] L15 I/O
EMIF_DATA[2] M15 I/O
EMIF_DATA[3] N15 I/O
EMIF_DATA[4] E5 I/O
EMIF_DATA[5] F5 I/O
EMIF_DATA[6] G5 I/O
EMIF_DATA[7] K5 I/O
EMIF_DATA[8] L5 I/O
EMIF_DATA[9] M5 I/O
EMIF_DATA[10] N5 I/O
EMIF_DATA[11] P5 I/O
EMIF_DATA[12] R5 I/O
EMIF_DATA[13] R6 I/O
EMIF_DATA[14] R7 I/O
EMIF_DATA[15] R8 I/O

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4.3.2.14 System Module Interface

Table 4-33. ZWT System Module Interface

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
nPORRST W7 Input Pull Down Fixed 100 µA Power-on reset, cold reset
Pull Down External power supply
monitor circuitry must
drive nPORRST low when
any of the supplies to the
microcontroller fall out of
the specified range. This
terminal has a glitch filter.
See Section 6.8.
nRST B17 I/O Pull Up Fixed 100 µA System reset, warm reset,
Pull Up bidirectional.
The internal circuitry
indicates any reset
condition by driving nRST
low.
The external circuitry can
assert a system reset by
driving nRST low. To
ensure that an external
reset is not arbitrarily
generated, TI
recommends that an
external pull-up resistor is
connected to this terminal.
This terminal has a glitch
filter. See Section 6.8.
nERROR B14 I/O Pull Down Fixed 20 µA ESM Error Signal
Pull Down Indicates error of high
severity. See
Section 6.18.

4.3.2.15 Clock Inputs and Outputs

Table 4-34. ZWT Clock Inputs and Outputs

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
OSCIN K1 Input N/A None From external
crystal/resonator, or
external clock input
KELVIN_GND L2 Input Kelvin ground for oscillator
OSCOUT L1 Output To external
crystal/resonator
ECLK A12 I/O Pull Down Programmable, External prescaled clock
20 µA output, or GIO.
GIOA[5]/EXTCLKIN/EPWM1A/N2HET1_PIN_nDIS B5 Input Pull Down 20 µA External clock input #1
EXTCLKIN2 R9 Input External clock input #2
VCCPLL P11 1.2V N/A None Dedicated core supply for
Power PLL's

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4.3.2.16 Test and Debug Modules Interface

Table 4-35. ZWT Test and Debug Modules Interface

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
TEST U2 Input Pull Down Fixed 100 µA Test enable. This terminal
Pull Down must be connected to
ground directly or via a
pull-down resistor.
nTRST D18 Input JTAG test hardware reset
RTCK A16 Output N/A None JTAG return test clock
TCK B18 Input Pull Down Fixed 100 µA JTAG test clock
Pull Down
TDI A17 Input Pull Up Fixed 100 µA JTAG test data in
Pull Up
TDO C18 Output 100 µA None JTAG test data out
Pull Down
TMS C19 Input Pull Up Fixed 100 µA JTAG test select
Pull Up

4.3.2.17 Flash Supply and Test Pads

Table 4-36. ZWT Flash Supply and Test Pads

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
VCCP F8 3.3V N/A None Flash pump supply
Power
FLTP1 J5 - N/A None Flash test pads. These
terminals are reserved for
FLTP2 H5
TI use only. For proper
operation these terminals
must connect only to a
test pad or not be
connected at all [no
connect (NC)].

4.3.2.18 Reserved

Table 4-37. Reserved

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
Reserved A15 - N/A None Reserved. These balls are
connected to internal logic
Reserved B15 - N/A None
but are not outputs nor do
Reserved B16 - N/A None they have internal pulls.
Reserved A8 - N/A- None They are subject to ±1 µA
leakage current.
Reserved B8 - N/A None
Reserved B9 - N/A None

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4.3.2.19 No Connects

Table 4-38. No Connects

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
NC C11 - N/A None No Connects. These balls
are not connected to any
NC C12 - N/A None
internal logic and can be
NC C13 - N/A None connected to the PCB
NC C14 - N/A None ground without affecting
the functionality of the
NC C15 - N/A None device.
NC C16 - N/A None
NC C17 - N/A None
NC D6 - N/A None
NC D7 - N/A None
NC D8 - N/A None
NC D9 - N/A None
NC D10 - N/A None
NC D11 - N/A None
NC D12 - N/A None
NC D13 - N/A None
NC D14 - N/A None
NC D15 - N/A None
NC E4 - N/A None
NC E14 - N/A None
NC E15 - N/A None
NC F4 - N/A None
NC F15 - N/A None
NC F16 - N/A None
NC F17 - N/A None
NC G4 - N/A None
NC G15 - N/A None
NC H15 - N/A None
NC J15 - N/A None
NC J16 - N/A None
NC K4 - N/A None
NC K16 - N/A None
NC L4 - N/A None
NC L16 - N/A None
NC L18 - N/A None
NC L19 - N/A None
NC M4 - N/A None
NC M16 - N/A None
NC N4 - N/A None
NC N16 - N/A None
NC N18 - N/A None
NC P4 - N/A None

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Table 4-38. No Connects (continued)

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
NC P15 - N/A None No Connects. These balls
are not connected to any
NC P16 - N/A None
internal logic and can be
NC P17 - N/A None connected to the PCB
NC R1 - N/A None ground without affecting
the functionality of the
NC R10 - N/A None device.
NC R11 - N/A None
NC R12 - N/A None
NC R13 - N/A None
NC R14 - N/A None
NC R15 - N/A None
NC T2 - N/A None
NC T3 - N/A None
NC T4 - N/A None
NC T5 - N/A None
NC T6 - N/A None
NC T7 - N/A None
NC T8 - N/A None
NC T9 - N/A None
NC T10 - N/A None
NC T11 - N/A None
NC T13 - N/A None
NC T14 - N/A None
NC U3 - N/A- None
NC U4 - N/A None
NC U5 - N/A None
NC U6 - N/A None
NC U7 - N/A None
NC U8 - N/A None
NC U9 - N/A None
NC U10 - N/A None
NC U11 - N/A None
NC U12 - N/A None
NC V3 - N/A None
NC V4 - N/A None
NC V11 - N/A None
NC V12 - N/A None
NC W4 - N/A None
NC W11 - N/A None
NC W12 - N/A None
NC W13 - N/A None

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4.3.2.20 Supply for Core Logic: 1.2V nominal

Table 4-39. ZWT Supply for Core Logic: 1.2V nominal

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
VCC F9 1.2V N/A None Core supply
Power
VCC F10
VCC H10
VCC J14
VCC K6
VCC K8
VCC K12
VCC K14
VCC L6
VCC M10
VCC P10

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4.3.2.21 Supply for I/O Cells: 3.3V nominal

Table 4-40. ZWT Supply for I/O Cells: 3.3V nominal

Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
VCCIO F6 3.3V N/A None Operating supply for I/Os
Power
VCCIO F7
VCCIO F11
VCCIO F12
VCCIO F13
VCCIO F14
VCCIO G6
VCCIO G14
VCCIO H6
VCCIO H14
VCCIO J6
VCCIO L14
VCCIO M6
VCCIO M14
VCCIO N6
VCCIO N14
VCCIO P6
VCCIO P7
VCCIO P8
VCCIO P9
VCCIO P12
VCCIO P13
VCCIO P14

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4.3.2.22 Ground Reference for All Supplies Except VCCAD

Table 4-41. ZWT Ground Reference for All Supplies Except VCCAD
Terminal Signal Reset Pull Pull Type Description
Type State
Signal Name 337
ZWT
VSS A1 Ground N/A None Ground reference
VSS A2
VSS A18
VSS A19
VSS B1
VSS B19
VSS H8
VSS H9
VSS H11
VSS H12
VSS J8
VSS J9
VSS J10
VSS J11
VSS J12
VSS K9
VSS K10
VSS K11
VSS L8
VSS L9
VSS L10
VSS L11
VSS L12
VSS M8
VSS M9
VSS M11
VSS M12
VSS V1
VSS W1
VSS W2

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5 Specifications
(1)
5.1 Absolute Maximum Ratings Over Operating Free-Air Temperature Range
MIN MAX UNIT
VCC (2) -0.3 1.43 V
(2)
Supply voltage range: VCCIO, VCCP -0.3 4.6 V
VCCAD -0.3 6.25 V
All input pins, with exception of ADC pins -0.3 4.6 V
Input voltage range:
ADC input pins -0.3 6.25 V
IIK (VI < 0 or VI > VCCIO)
-20 +20 mA
All pins, except AD1IN[23:0] or AD2IN[15:0]
Input clamp current: IIK (VI < 0 or VI > VCCAD)
-10 +10 mA
AD1IN[23:0] or AD2IN[15:0]
Total -40 +40 mA
Operating free-air temperature range, TA: -40 125 °C
Operating junction temperature range, TJ: -40 150 °C
Storage temperature range, Tstg -65 150 °C
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) Maximum-rated conditions for extended periods may affect device reliability. All voltage values are with respect to their associated
grounds.

5.2 ESD Ratings

VALUE UNIT
Human body model (HBM), per AEC Q100-002 (1) ±2 kV
Electrostatic discharge All pins ±500 V
VESD Charged device model (CDM),
(ESD) performance:
per AEC Q100-011 Corner pins on 144-pin PGE
±750 V
(1, 36, 37, 72, 73, 108, 109, 144)
Corner balls on 337-ball ZWT
±750 V
(A1, A19, W1, W19)
(1) AEC Q100-002 indicates HBM stressing is done in accordance with the ANSI/ESDA/JEDEC JS‑001 specification.

5.3 Power-On Hours (POH) (1) (2)

JUNCTION
NOMINAL CORE VOLTAGE (VCC) LIFETIME POH
TEMPERATURE (Tj)
1.2 105ºC 100K
(1) This information is provided solely for your convenience and does not extend or modify the warranty provided under TI's standard terms
and conditions for TI semiconductor products.
(2) To avoid significant degradation, the device power-on hours (POH) must be limited to those specified in this table. To convert to
equivalent POH for a specific temperature profile, see the Calculating Equivalent Power-on-Hours for Hercules Safety MCUs Application
Report (SPNA207).

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5.4 Device Recommended Operating Conditions (1)

MIN NOM MAX UNIT
VCC Digital logic supply voltage (Core) 1.14 1.2 1.32 V
VCCPLL PLL Supply Voltage 1.14 1.2 1.32 V
VCCIO Digital logic supply voltage (I/O) 3 3.3 3.6 V
VCCAD MibADC supply voltage 3 5.25 V
VCCP Flash pump supply voltage 3 3.3 3.6 V
VSS Digital logic supply ground 0 V
VSSAD MibADC supply ground -0.1 0.1 V
VADREFHI A-to-D high-voltage reference source VSSAD VCCAD V
VADREFLO A-to-D low-voltage reference source VSSAD VCCAD V
VSLEW Maximum positive slew rate for VCCIO, VCCAD and VCCP supplies 1 V/µs
TA Operating free-air temperature -40 125 °C
(2)
TJ Operating junction temperature -40 150 °C
(1) All voltages are with respect to VSS, except VCCAD, which is with respect to VSSAD
(2) Reliability data is based upon a temperature profile that is equivalent to 100,000 power-on hours at 105°C junction temperature.

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5.5 Switching Characteristics Over Recommended Operating Conditions for Clock Domains

Table 5-1. Clock Domain Timing Specifications

PARAMETER DESCRIPTION CONDITIONS MAX UNIT
Pipeline mode
160 MHz
enabled
PGE
Pipeline mode
50 MHz
disabled
fHCLK HCLK - System clock frequency
Pipeline mode
180 MHz
enabled
ZWT
Pipeline mode
50 MHz
disabled
fGCLK GCLK - CPU clock frequency fHCLK MHz
fVCLK VCLK - Primary peripheral clock frequency 100 MHz
VCLK2 - Secondary peripheral clock
fVCLK2 100 MHz
frequency
VCLK3 - Secondary peripheral clock
fVCLK3 100 MHz
frequency
VCLK4 - Secondary peripheral clock
fVCLK4 150 MHz
frequency
VCLKA1 - Primary asynchronous
fVCLKA1 100 MHz
peripheral clock frequency
VCLKA2 - Secondary asynchronous
fVCLKA2 100 MHz
peripheral clock frequency
VCLKA3 - Primary asynchronous
fVCLKA3 100 MHz
peripheral clock frequency
VCLKA4 - Secondary asynchronous
fVCLKA4 100 MHz
peripheral clock frequency
fRTICLK RTICLK - clock frequency fVCLK MHz

5.6 Wait States Required

RAM
Address Wait States 0
0MHz fHCLK(max)
Data Wait States 0
0MHz fHCLK(max)
Flash (Main Memory)
Address Wait States 0 1
0MHz 150MHz fHCLK(max)
Data Wait States 0 1 2 3
0MHz 50MHz 100MHz 150MHz fHCLK(max)
Flash (Data Memory) 0 1 2 3
Data Wait States 0MHz 50MHz 100MHz 150MHz fHCLK(max)
Figure 5-1. Wait States Scheme

As shown in the figure above, the TCM RAM can support program and data fetches at full CPU speed without
any address or data wait states required.
The TCM flash can support zero address and data wait states up to a CPU speed of 50 MHz in nonpipelined
mode. The flash supports a maximum CPU clock speed of 160 MHz in pipelined mode for the PGE Package and
180 MHz for the ZWT package, with one address wait state and three data wait states.
The flash wrapper defaults to non-pipelined mode with zero address wait state and one random-read data wait
state.

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5.7 Power Consumption Over Recommended Operating Conditions

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
(1) (2)
VCC digital supply current (operating mode) fHCLK = 160MHz 170 350
mA
fVCLK = fHCLK/2; Flash in pipelined mode; VCCmax fHCLK = 180MHz 190 (1)
370 (2)

ICC LBIST/PBIST clock 215 (1) 470 (3) (4) mA

VCC Digital supply current (LBIST/PBIST mode) frequency = 80MHz
LBIST/PBIST clock (3) (4)
240 (1) 470 mA
frequency = 90MHz
ICCPLL VCCPLL digital supply current (operating mode) VCCPLL = VCCPLLmax 10 mA
ICCIO VCCIO Digital supply current (operating mode. No DC load, VCCmax 10 mA
Single ADC
operational, 15
VCCADmax
ICCAD VCCAD supply current (operating mode) mA
Both ADCs
operational, 30
VCCADmax
Single ADC
operational, 3
ADREFHImax
IADREFHI ADREFHI supply current (operating mode) mA
Both ADCs
operational, 6
ADREFHImax
read from 1 bank
and program
ICCP VCCP supply current 55 mA
another bank,
VCCPmax
(1) The typical value is the average current for the nominal process corner and junction temperature of 25C.
(2) The maximum ICC, value can be derated
• linearly with voltage
• by 1 ma/MHz for lower operating frequency when fHCLK= 2 * fVCLK
• for lower junction temperature by the equation below where TJK is the junction temperature in Kelvin and the result is in milliamperes.
170 - 0.068 e0.0185 TJK
(3) The maximum ICC, value can be derated
• linearly with voltage
• by 1.5 ma/MHz for lower operating frequency
• for lower junction temperature by the equation below where TJK is the junction temperature in Kelvin and the result is in milliamperes.
170 - 0.068 e0.0185 TJK
(4) LBIST and PBIST currents are for a short duration, typically less than 10ms. They are usually ignored for thermal calculations for the
device and the voltage regulator

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5.8 Input/Output Electrical Characteristics Over Recommended Operating Conditions (1)

PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
Vhys Input hysteresis All inputs 180 mV
VIL Low-level input voltage All inputs -0.3 0.8 V
VIH High-level input voltage All inputs 2 VCCIO + 0.3 V
IOL = IOLmax 0.2 VCCIO
IOL = 50 µA, standard
0.2
output mode
VOL Low-level output voltage V
IOL = 50 µA, low-EMI
output mode (see 0.2 VCCIO
Section 5.13)
IOH = IOHmax 0.8 VCCIO
IOH = 50 µA, standard
VCCIO -0.3
output mode
VOH High-level output voltage V
IOH = 50 µA, low-EMI
output mode (see 0.8 VCCIO
Section 5.13)
VI < VSSIO - 0.3 or VI
IIK Input clamp current (I/O pins) (2) -3.5 3.5 mA
> VCCIO + 0.3
IIH Pulldown 20µA VI = VCCIO 5 40
IIH Pulldown 100µA VI = VCCIO 40 195
II Input current (I/O pins) IIL Pullup 20µA VI = VSS -40 -5 µA
IIL Pullup 100µA VI = VSS -195 -40
All other pins No pullup or pulldown -1 1
CI Input capacitance 2 pF
CO Output capacitance 3 pF
(1) Source currents (out of the device) are negative while sink currents (into the device) are positive.
(2) If the input voltage extends outside of the range VIL to VIH then the input current must be limited to IIK to maintain proper operation. See
the application note SPNA201 for more information on limiting input clamp currents.

5.9 Thermal Resistance Characteristics

Table 5-2 shows the thermal resistance characteristics for the QFP - PGE mechanical package.
Table 5-3 shows the thermal resistance characteristics for the BGA - ZWT mechanical package.

Table 5-2. Thermal Resistance Characteristics (PGE Package)

°C/W
Junction-to-free air thermal resistance, Still
RΘJA 40
air using JEDEC 2S2P test board
RΘJB Junction-to-board thermal resistance 27.2
RΘJC Junction-to-case thermal resistance 7.3
ΨJT Junction-to-package top, Still air 0.10

Table 5-3. Thermal Resistance Characteristics (ZWT Package)

°C/W
Junction-to-free air thermal resistance, Still
RΘJA air (includes 5x5 thermal via cluster in 2s2p 18.8
PCB connected to 1st ground plane)
RΘJB Junction-to-board thermal resistance 14.1
RΘJC Junction-to-case thermal resistance 7.1

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Table 5-3. Thermal Resistance Characteristics (ZWT Package) (continued)

°C/W
Junction-to-package top, Still air (includes
ΨJT 5x5 thermal via cluster in 2s2p PCB 0.33
connected to 1st ground plane)

5.10 Output Buffer Drive Strengths

Table 5-4. Output Buffer Drive Strengths

LOW-LEVEL OUTPUT CURRENT,
IOL for VI=VOLmax
or SIGNALS
HIGH-LEVEL OUTPUT CURRENT,
IOH for VI=VOHmin

MIBSPI5CLK, MIBSPI5SOMI[0], MIBSPI5SOMI[1], MIBSPI5SOMI[2], MIBSPI5SOMI[3],

MIBSPI5SIMO[0], MIBSPI5SIMO[1], MIBSPI5SIMO[2], MIBSPI5SIMO[3],
TMS, TDI, TDO, RTCK,
SPI4CLK, SPI4SIMO, SPI4SOMI, nERROR,
N2HET2[1], N2HET2[3], N2HET2[5], N2HET2[7], N2HET2[9], N2HET2[11], N2HET2[13],
N2HET2[15]
8 mA
ECAP1, ECAP4, ECAP5, ECAP6
EQEP1I, EQEP1S, EQEP2I, EQEP2S
EPWM1A, EPWM1B, EPWM1SYNCO, ETPW2A, EPWM2B, EPWM3A, EPWM3B,
EPWM4A, EPWM4B, EPWM5A, EPWM5B, EPWM6A, EPWM6B, EPWM7A, EPWM7B
EMIF_ADDR[0:12], EMIF_BA[0:1], EMIF_CKE, EMIF_CLK, EMIF_DATA[0:15], EMIF_nCAS,
EMIF_nCS[0:4], EMIF_nDQM[0:1], EMIF_nOE, EMIF_nRAS, EMIF_nWAIT, EMIF_nWE,
EMIF_RNW

TEST,
MIBSPI3SOMI, MIBSPI3SIMO, MIBSPI3CLK, MIBSPI1SIMO, MIBSPI1SOMI, MIBSPI1CLK,
4 mA
ECAP2, ECAP3
nRST

AD1EVT,
CAN1RX, CAN1TX, CAN2RX, CAN2TX, CAN3RX, CAN3TX,
GIOA[0-7], GIOB[0-7],
LINRX, LINTX,
2 mA zero-dominant
MIBSPI1nCS[0], MIBSPI1nCS[1-3], MIBSPI1nENA, MIBSPI3nCS[0-3], MIBSPI3nENA,
MIBSPI5nCS[0-3], MIBSPI5nENA,
N2HET1[0-31], N2HET2[0], N2HET2[2], N2HET2[4], N2HET2[5], N2HET2[6], N2HET2[7],
N2HET2[8], N2HET2[9], N2HET2[10], N2HET2[11], N2HET2[12], N2HET2[13], N2HET2[14],
N2HET2[15], N2HET2[16], N2HET2[18],
SPI2nCS[0], SPI2nENA, SPI4nCS[0], SPI4nENA

ECLK,
selectable 8 mA / 2 mA SPI2CLK, SPI2SIMO, SPI2SOMI
The default output buffer drive strength is 8 mA for these signals.

Table 5-5. Selectable 8 mA/2 mA Control

Signal Control Bit Address 8 mA 2 mA
ECLK SYSPC10[0] 0xFFFF FF78 0 1
SPI2CLK SPI2PC9[9] 0xFFF7 F668 0 1
SPI2SIMO SPI2PC9[10] 0xFFF7 F668 0 1

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Table 5-5. Selectable 8 mA/2 mA Control (continued)

Signal Control Bit Address 8 mA 2 mA
SPI2SOMI SPI2PC9[11] (1) 0xFFF7 F668 0 1
(1) Either SPI2PC9[11] or SPI2PC9[24] can change the output strength of the SPI2SOMI pin. In case of a 32-bit write where these two bits
differ, SPI2PC9[11] determines the drive strength.

5.11 Input Timings

t pw
VCCIO
Input V IH VIH

VIL V IL
0

Figure 5-2. TTL-Level Inputs

Table 5-6. Timing Requirements for Inputs (1)

Parameter MIN MAX Unit
tpw Input minimum pulse width tc(VCLK) + 10 (2) ns
tin_slew Time for input signal to go from VIL to VIH or from VIH to VIL 1 ns
(1) tc(VCLK) = peripheral VBUS clock cycle time = 1 / f(VCLK)
(2) The timing shown above is only valid for pin used in general-purpose input mode.

5.12 Output Timings

Table 5-7. Switching Characteristics for Output Timings versus Load Capacitance ©L)
Parameter MIN MAX Unit
Rise time, tr 8 mA low EMI pins CL = 15 pF 2.5 ns
(see Table 5-4)
CL = 50 pF 4
CL = 100 pF 7.2
CL = 150 pF 12.5
Fall time, tf CL = 15 pF 2.5 ns
CL = 50 pF 4
CL = 100 pF 7.2
CL = 150 pF 12.5
Rise time, tr 4 mA low EMI pins CL = 15 pF 5.6 ns
(see Table 5-4)
CL = 50 pF 10.4
CL = 100 pF 16.8
CL = 150 pF 23.2
Fall time, tf CL = 15 pF 5.6 ns
CL= 50 pF 10.4
CL = 100 pF 16.8
CL = 150 pF 23.2

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Table 5-7. Switching Characteristics for Output Timings versus Load Capacitance ©L) (continued)
Parameter MIN MAX Unit
Rise time, tr 2 mA-z low EMI pins CL = 15 pF 8 ns
(see Table 5-4)
CL = 50 pF 15
CL = 100 pF 23
CL = 150 pF 33
Fall time, tf CL = 15 pF 8 ns
CL = 50 pF 15
CL = 100 pF 23
CL = 150 pF 33
Rise time, tr Selectable 8 mA / 2 mA-z 8 mA mode CL = 15 pF 2.5 ns
pins
CL = 50 pF 4
(see Table 5-4)
CL = 100 pF 7.2
CL = 150 pF 12.5
Fall time, tf CL = 15 pF 2.5 ns
CL = 50 pF 4
CL = 100 pF 7.2
CL = 150 pF 12.5
Rise time, tr 2 mA-z mode CL = 15 pF 8 ns
CL = 50 pF 15
CL = 100 pF 23
CL = 150 pF 33
Fall time, tf CL = 15 pF 8 ns
CL = 50 pF 15
CL = 100 pF 23
CL = 150 pF 33

tr tf
VCCIO
Output V OH VOH

VOL VOL
0

Figure 5-3. CMOS-Level Outputs

Table 5-8. Timing Requirements for Outputs (1)

Parameter MIN MAX UNIT
td(parallel_out) Delay between low to high, or high to low transition of general-purpose output signals 6 ns
that can be configured by an application in parallel, e.g. all signals in a GIOA port, or
all N2HET1 signals, etc.
(1) This specification does not account for any output buffer drive strength differences or any external capacitive loading differences. Check
Table 5-4 for output buffer drive strength information on each signal.

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5.13 Low-EMI Output Buffers

The low-EMI output buffer has been designed explicitly to address the issue of decoupling sources of
emissions from the pins which they drive. This is accomplished by adaptively controlling the impedance of
the output buffer, and is particularly effective with capacitive loads.
This is not the default mode of operation of the low-EMI output buffers and must be enabled by setting the
system module GPCR1 register for the desired module or signal, as shown in . The adaptive impedance
control circuit monitors the DC bias point of the output signal. The buffer internally generates two
reference levels, VREFLOW and VREFHIGH, which are set to approximately 10% and 90% of VCCIO,
respectively.
Once the output buffer has driven the output to a low level, if the output voltage is below VREFLOW, then
the output buffer’s impedance will increase to hi-Z. A high degree of decoupling between the internal
ground bus and the output pin will occur with capacitive loads, or any load in which no current is flowing,
e.g. the buffer is driving low on a resistive path to ground. Current loads on the buffer which attempt to pull
the output voltage above VREFLOW will be opposed by the buffer’s output impedance so as to maintain
the output voltage at or below VREFLOW.
Conversely, once the output buffer has driven the output to a high level, if the output voltage is above
VREFHIGH then the output buffer’s impedance will again increase to hi-Z. A high degree of decoupling
between internal power bus ad output pin will occur with capacitive loads or any loads in which no current
is flowing, e.g. buffer is driving high on a resistive path to VCCIO. Current loads on the buffer which
attempt to pull the output voltage below VREFHIGH will be opposed by the buffer’s output impedance so
as to maintain the output voltage at or above VREFHIGH.
The bandwidth of the control circuitry is relatively low, so that the output buffer in adaptive impedance
control mode cannot respond to high-frequency noise coupling into the buffer’s power buses. In this
manner, internal bus noise approaching 20% peak-to-peak of VCCIO can be rejected.
Unlike standard output buffers which clamp to the rails, an output buffer in impedance control mode will
allow a positive current load to pull the output voltage up to VCCIO + 0.6V without opposition. Also, a
negative current load will pull the output voltage down to VSSIO – 0.6V without opposition. This is not an
issue since the actual clamp current capability is always greater than the IOH / IOL specifications.
The low-EMI output buffers are automatically configured to be in the standard buffer mode when the
device enters a low-power mode.

Table 5-9. Low-EMI Output Buffer Hookup

Module or Signal Name Control Register to Enable Low-EMI Mode
Module: MibSPI1 GPREG1.0
Module: SPI2 GPREG1.1
Module: MibSPI3 GPREG1.2
Reserved GPREG1.3
Module: MibSPI5 GPREG1.4
Reserved GPREG1.5
Module: EMIF GPREG1.6
Reserved GPREG1.7
Signal: TMS GPREG1.8
Signal: TDI GPREG1.9
Signal: TDO GPREG1.10
Signal: RTCK GPREG1.11
Signal: TEST GPREG1.12
Signal: nERROR GPREG1.13
Signal: AD1EVT GPREG1.14

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6 System Information and Electrical Specifications

6.1 Device Power Domains
The device core logic is split up into multiple power domains to optimize the Self-Test Clock Configuration
power for a given application use case. There are 7 power domains in total: PD1, PD2, PD3, PD5,
RAM_PD1, and RAM_PD2. Refer to Section 1.4 for more information.
PD1 is an "always-ON" power domain, which cannot be turned off. Each of the other power domains can
be turned OFF one time during device initialization as per the application requirement. Refer to the Power
Management Module (PMM) chapter of TMS570LS12x/11x Technical Reference Manual (SPNU515) for
more details.

NOTE
The clocks to a module must be turned off before powering down the core domain that
contains the module.

NOTE
The logic in the modules that are powered down loses its power completely. Any access to
modules that are powered down results in an abort being generated. When power is
restored, the modules power-up to their default states (after normal power-up). No register or
memory contents are preserved in the core domains that are turned off.

6.2 Voltage Monitor Characteristics

A voltage monitor is implemented on this device. The purpose of this voltage monitor is to eliminate the
requirement for a specific sequence when powering up the core and I/O voltage supplies.

6.2.1 Important Considerations

• The voltage monitor does not eliminate the need of a voltage supervisor circuit to ensure that the device is held in
reset when the voltage supplies are out of range.
• The voltage monitor only monitors the core supply (VCC) and the I/O supply (VCCIO). The other supplies are not
monitored by the VMON. For example, if the VCCAD or VCCP are supplied from a source different from that for
VCCIO, then there is no internal voltage monitor for the VCCAD and VCCP supplies.

6.2.2 Voltage Monitor Operation

The voltage monitor generates the Power Good MCU signal (PGMCU) as well as the I/Os Power Good IO
signal (PGIO) on the device. During power-up or power-down, the PGMCU and PGIO are driven low when
the core or I/O supplies are lower than the specified minimum monitoring thresholds. The PGIO and
PGMCU being low isolates the core logic as well as the I/O controls during the power-up or power-down
of the supplies. This allows the core and I/O supplies to be powered up or down in any order.
When the voltage monitor detects a low voltage on the I/O supply, it will assert a power-on reset. When
the voltage monitor detects an out-of-range voltage on the core supply, it asynchronously makes all output
pins high impedance, and asserts a power-on reset. The voltage monitor is disabled when the device
enters a low power mode.
The VMON also incorporates a glitch filter for the nPORRST input. Refer to Section 6.3.3.1 for the timing
information on this glitch filter.

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Table 6-1. Voltage Monitoring Specifications

PARAMETER MIN TYP MAX UNIT
VCC low - VCC level below this 0.75 0.9 1.13 V
threshold is detected as too low.
Voltage monitoring VCC high - VCC level above this 1.40 1.7 2.1
VMON
thresholds threshold is detected as too high.
VCCIO low - VCCIO level below this 1.85 2.4 2.9
threshold is detected as too low.

6.2.3 Supply Filtering

The VMON has the capability to filter glitches on the VCC and VCCIO supplies.
The following table shows the characteristics of the supply filtering. Glitches in the supply larger than the
maximum specification cannot be filtered.

Table 6-2. VMON Supply Glitch Filtering Capability

Parameter MIN MAX
Width of glitch on VCC that can be filtered 250 ns 1 µs
Width of glitch on VCCIO that can be filtered 250 ns 1 µs

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6.3 Power Sequencing and Power On Reset

6.3.1 Power-Up Sequence

There is no timing dependency between the ramp of the VCCIO and the VCC supply voltage. The power-
up sequence starts with the I/O voltage rising above the minimum I/O supply threshold, (see Table 6-4 for
more details), core voltage rising above the minimum core supply threshold and the release of power-on
reset. The high frequency oscillator will start up first and its amplitude will grow to an acceptable level. The
oscillator start up time is dependent on the type of oscillator and is provided by the oscillator vendor. The
different supplies to the device can be powered up in any order.
The device goes through the following sequential phases during power up.

Table 6-3. Power-Up Phases

Oscillator start-up and validity check 1032 oscillator cycles
eFuse autoload 1160 oscillator cycles
Flash pump power-up 688 oscillator cycles
Flash bank power-up 617 oscillator cycles
Total 3497 oscillator cycles

The CPU reset is released at the end of the above sequence and fetches the first instruction from address
0x00000000.

6.3.2 Power-Down Sequence

The different supplies to the device can be powered down in any order.

6.3.3 Power-On Reset: nPORRST

This is the power-on reset. This reset must be asserted by an external circuitry whenever the I/O or core
supplies are outside the specified recommended range. This signal has a glitch filter on it. It also has an
internal pulldown.

6.3.3.1 nPORRST Electrical and Timing Requirements

Table 6-4. Electrical Requirements for nPORRST

NO Parameter MIN MAX Unit
VCCPORL VCC low supply level when nPORRST must be active during power- 0.5 V
up
VCCPORH VCC high supply level when nPORRST must remain active during 1.14 V
power-up and become active during power down
VCCIOPORL VCCIO / VCCP low supply level when nPORRST must be active during 1.1 V
power-up
VCCIOPORH VCCIO / VCCP high supply level when nPORRST must remain active 3.0 V
during power-up and become active during power down
VIL(PORRST) Low-level input voltage of nPORRST VCCIO > 2.5V 0.2 * VCCIO V
Low-level input voltage of nPORRST VCCIO < 2.5V 0.5 V
3 tsu(PORRST) Setup time, nPORRST active before VCCIO and VCCP > VCCIOPORL 0 ms
during power-up
6 th(PORRST) Hold time, nPORRST active after VCC > VCCPORH 1 ms
7 tsu(PORRST) Setup time, nPORRST active before VCC < VCCPORH during power 2 µs
down
8 th(PORRST) Hold time, nPORRST active after VCCIO and VCCP > VCCIOPORH 1 ms
9 th(PORRST) Hold time, nPORRST active after VCC < VCCPORL 0 ms

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Table 6-4. Electrical Requirements for nPORRST (continued)

NO Parameter MIN MAX Unit
tf(nPORRST) 475 2000 ns
Filter time nPORRST pin;
pulses less than MIN will be filtered out, pulses greater than MAX
will generate a reset.

3.3 V VCCIOPORH
VCCIOPORH VCCIO / VCCP
8

1.2 V VCCPORH
VCCPORH VCC
7
6
6
VCCIOPORL 7 VCCIOPORL
VCCPORL VCCPORL
VCC (1.2 V)
VCCIO / VCCP(3.3 V) 3 9
VIL(PORRST) VIL VIL VIL VIL(PORRST)
nPORRST
NOTE: There is no timing dependency between the ramp of the VCCIO and the VCC supply voltage; this is just an exemplary drawing.

Figure 6-1. nPORRST Timing Diagram

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6.4 Warm Reset (nRST)

This is a bidirectional reset signal. The internal circuitry drives the signal low on detecting any device reset
condition. An external circuit can assert a device reset by forcing the signal low. On this terminal, the
output buffer is implemented as an open drain (drives low only). To ensure an external reset is not
arbitrarily generated, TI recommends that an external pullup resistor is connected to this terminal.
This terminal has a glitch filter. It also has an internal pullup.

6.4.1 Causes of Warm Reset

Table 6-5. Causes of Warm Reset

DEVICE EVENT SYSTEM STATUS FLAG
Power-Up Reset Exception Status Register, bit 15
Oscillator fail Global Status Register, bit 0
PLL slip Global Status Register, bits 8 and 9
Watchdog exception / Debugger reset Exception Status Register, bit 13
Software Reset Exception Status Register, bit 4
External Reset Exception Status Register, bit 3

6.4.2 nRST Timing Requirements

Table 6-6. nRST Timing Requirements

PARAMETER MIN MAX UNIT
(1)
tv(RST) Valid time, nRST active after 2256 tc(OSC) ns
nPORRST inactive
Valid time, nRST active (all other 32 tc(VCLK)
System reset conditions)
tf(nRST) 475 2000 ns
Filter time nRST pin;
pulses less than MIN will be
filtered out, pulses greater than
MAX will generate a reset
(1) Assumes the oscillator has started up and stabilized before nPORRST is released ..

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6.5 ARM Cortex-R4F CPU Information

6.5.1 Summary of ARM Cortex-R4F CPU Features

The features of the ARM Cortex-R4F CPU include:
• An integer unit with integral Embedded ICE-RT logic.
• High-speed Advanced Microprocessor Bus Architecture (AMBA) Advanced eXtensible Interfaces (AXI)
for Level two (L2) master and slave interfaces.
• Floating Point Coprocessor
• Dynamic branch prediction with a global history buffer, and a 4-entry return stack
• Low interrupt latency.
• Non-maskable interrupt.
• A Harvard Level one (L1) memory system with:
– Tightly-Coupled Memory (TCM) interfaces with support for error correction or parity checking
memories
– ARMv7-R architecture Memory Protection Unit (MPU) with 12 regions
• Dual core logic for fault detection in safety-critical applications.
• An L2 memory interface:
– Single 64-bit master AXI interface
– 64-bit slave AXI interface to TCM RAM blocks
• A debug interface to a CoreSight Debug Access Port (DAP).
• A Performance Monitoring Unit (PMU).
• A Vectored Interrupt Controller (VIC) port.
For more information on the ARM Cortex-R4F CPU, see www.arm.com.

6.5.2 ARM Cortex-R4F CPU Features Enabled by Software

The following CPU features are disabled on reset and must be enabled by the application if required.
• ECC On Tightly-Coupled Memory (TCM) Accesses
• Hardware Vectored Interrupt (VIC) Port
• Floating Point Coprocessor
• Memory Protection Unit (MPU)

6.5.3 Dual Core Implementation

The device has two Cortex-R4F cores, where the output signals of both CPUs are compared in the CCM-
R4 unit. To avoid common mode impacts the signals of the CPUs to be compared are delayed by 2 clock
cycles as shown in Figure 6-3.
The CPUs have a diverse CPU placement given by following requirements:
• different orientation; for example, CPU1 = "north" orientation, CPU2 = "flip west" orientation
• dedicated guard ring for each CPU

North Flip West

F
F

Figure 6-2. Dual - CPU Orientation

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6.5.4 Duplicate clock tree after GCLK

The CPU clock domain is split into two clock trees, one for each CPU, with the clock of the 2nd CPU
running at the same frequency and in phase to the clock of CPU1. See Figure 6-3.

6.5.5 ARM Cortex-R4F CPU Compare Module (CCM-R4) for Safety

This device has two ARM Cortex-R4F CPU cores, where the output signals of both CPUs are compared in
the CCM-R4 unit. To avoid common mode impacts the signals of the CPUs to be compared are delayed in
a different way as shown in the figure below.

Output + Control

CCM-R4
2 cycle delay
CCM-R4 compare
CPU1CLK compare error

CPU 1 CPU 2

2 cycle delay

CPU2CLK

Input + Control

Figure 6-3. Dual Core Implementation

To avoid an erroneous CCM-R4 compare error, the application software must initialize the registers of
both CPUs before the registers are used, including function calls where the register values are pushed
onto the stack.

6.5.6 CPU Self-Test

The CPU STC (Self-Test Controller) is used to test the two Cortex-R4F CPU Cores using the
Deterministic Logic BIST Controller as the test engine.
The main features of the self-test controller are:
• Ability to divide the complete test run into independent test intervals
• Capable of running the complete test as well as running few intervals at a time
• Ability to continue from the last executed interval (test set) as well as ability to restart from the
beginning (First test set)
• Complete isolation of the self-tested CPU core from rest of the system during the self-test run
• Ability to capture the Failure interval number
• Timeout counter for the CPU self-test run as a fail-safe feature

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6.5.6.1 Application Sequence for CPU Self-Test

1. Configure clock domain frequencies.
2. Select number of test intervals to be run.
3. Configure the timeout period for the self-test run.
4. Enable self-test.
5. Wait for CPU reset.
6. In the reset handler, read CPU self-test status to identify any failures.
7. Retrieve CPU state if required.

For more information see TMS570LS12x/11x Technical Reference Manual (SPNU515).

6.5.6.2 CPU Self-Test Clock Configuration

The maximum clock rate for the self-test is 90MHz. The STCCLK is divided down from the CPU clock.
This divider is configured by the STCCLKDIV register at address 0xFFFFE108.
For more information see TMS570LS12x/11x Technical Reference Manual (SPNU515).

6.5.6.3 CPU Self-Test Coverage

Table 6-7 shows CPU test coverage achieved for each self-test interval. It also lists the cumulative test
cycles. The test time can be calculated by multiplying the number of test cycles with the STC clock period.

Table 6-7. CPU Self-Test Coverage

INTERVALS TEST COVERAGE, % TEST CYCLES
0 0 0
1 62.13 1365
2 70.09 2730
3 74.49 4095
4 77.28 5460
5 79.28 6825
6 80.90 8190
7 82.02 9555
8 83.10 10920
9 84.08 12285
10 84.87 13650
11 85.59 15015
12 86.11 16380
13 86.67 17745
14 87.16 19110
15 87.61 20475
16 87.98 21840
17 88.38 23205
18 88.69 24570
19 88.98 25935
20 89.28 27300
21 89.50 28665
22 89.76 30030
23 90.01 31395
24 90.21 32760

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6.6 Clocks

6.6.1 Clock Sources

The table below lists the available clock sources on the device. Each of the clock sources can be enabled
or disabled using the CSDISx registers in the system module. The clock source number in the table
corresponds to the control bit in the CSDISx register for that clock source.
The table also shows the default state of each clock source.

Table 6-8. Available Clock Sources

Clock
Name Description Default State
Source #
0 OSCIN Main Oscillator Enabled
1 PLL1 Output From PLL1 Disabled
2 Reserved Reserved Disabled
3 EXTCLKIN1 External Clock Input #1 Disabled
4 LFLPO Low Frequency Output of Internal Reference Oscillator Enabled
High Frequency Output of Internal Reference
5 HFLPO Enabled
Oscillator
6 PLL2 Output From PLL2 Disabled
7 EXTCLKIN2 External Clock Input #2 Disabled

6.6.1.1 Main Oscillator

The oscillator is enabled by connecting the appropriate fundamental resonator/crystal and load capacitors
across the external OSCIN and OSCOUT pins as shown in Figure 6-4. The oscillator is a single stage
inverter held in bias by an integrated bias resistor. This resistor is disabled during leakage test
measurement and low power modes.
TI strongly encourages each customer to submit samples of the device to the resonator/crystal
vendors for validation. The vendors are equipped to determine what load capacitors will best tune
their resonator/crystal to the microcontroller device for optimum start-up and operation over
temperature/voltage extremes.
An external oscillator source can be used by connecting a 3.3 V clock signal to the OSCIN pin and leaving
the OSCOUT pin unconnected (open) as shown in the figure below.

(see Note B)
OSCIN Kelvin_GND OSCOUT OSCIN OSCOUT
C1 C2
External
(see Note A) Clock Signal
(toggling 0 V to 3.3 V)

Crystal

(a) (b)

Note A: The values of C1 and C2 should be provided by the resonator/crystal vendor.

Note B: Kelvin_GND should not be connected to any other GND.

Figure 6-4. Recommended Crystal/Clock Connection

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6.6.1.1.1 Timing Requirements for Main Oscillator

Table 6-9. Timing Requirements for Main Oscillator

Parameter MIN Type MAX Unit
tc(OSC) Cycle time, OSCIN (when using a sine-wave input) 50 200 ns
tc(OSC_SQR) Cycle time, OSCIN, (when input to the OSCIN is a 50 200 ns
square wave )
tw(OSCIL) Pulse duration, OSCIN low (when input to the OSCIN 15 ns
is a square wave)
tw(OSCIH) Pulse duration, OSCIN high (when input to the OSCIN 15 ns
is a square wave)

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6.6.1.2 Low Power Oscillator

The Low Power Oscillator (LPO) is comprised of two oscillators — HF LPO and LF LPO, in a single
macro.

6.6.1.2.1 Features
The main features of the LPO are:
• Supplies a clock at extremely low power for power-saving modes. This is connected as clock source #
4 of the Global Clock Module.
• Supplies a high-frequency clock for non-timing-critical systems. This is connected as clock source # 5
of the Global Clock Module.
• Provides a comparison clock for the crystal oscillator failure detection circuit.
BIAS_EN

LFEN LFLPO

LF_TRIM
Low
Power
HFEN HFLPO
Oscillator
HF_TRIM HFLPO_VALID

nPORRST

Figure 6-5. LPO Block Diagram

Figure 6-5 shows a block diagram of the internal reference oscillator. This is a low power oscillator (LPO)
and provides two clock sources: one nominally 80KHz and one nominally 10MHz.

Table 6-10. LPO Specifications

Parameter MIN Typical MAX Unit
Clock Detection oscillator fail frequency - lower threshold, using 1.375 2.4 4.875 MHz
untrimmed LPO output
oscillator fail frequency - higher threshold, using 22 38.4 78 MHz
untrimmed LPO output
LPO - HF oscillator untrimmed frequency 5.5 9 19.5 MHz
(fHFLPO)
trimmed frequency 8 9.6 11 MHz
startup time from STANDBY (LPO BIAS_EN High for 10 µs
at least 900µs)
cold startup time 900 µs
LPO - LF oscillator untrimmed frequency 36 85 180 kHz
startup time from STANDBY (LPO BIAS_EN High for 100 µs
at least 900µs)
cold startup time 2000 µs

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6.6.1.3 Phase Locked Loop (PLL) Clock Modules

The PLL is used to multiply the input frequency to some higher frequency.
The main features of the PLL are:
• Frequency modulation can be optionally superimposed on the synthesized frequency of PLL1. The
frequency modulation capability of PLL2 is permanently disabled.
• Configurable frequency multipliers and dividers.
• Built-in PLL Slip monitoring circuit.
• Option to reset the device on a PLL slip detection.

6.6.1.3.1 Block Diagram

Figure 6-6 shows a high-level block diagram of the two PLL macros on this microcontroller. PLLCTL1 and
PLLCTL2 are used to configure the multiplier and dividers for the PLL1. PLLCTL3 is used to configure the
multiplier and dividers for PLL2.

OSCIN /NR INTCLK VCOCLK /OD post_ODCLK /R PLLCLK

/1 to /64 PLL /1 to /8 /1 to /32

fPLLCLK = (fOSCIN / NR) * NF / (OD * R)

/NF
/1 to /256

OSCIN /NR2 INTCLK2 VCOCLK2 /OD2 post_ODCLK2 /R2 PLL2CLK

/1 to /64 PLL#2 /1 to /8 /1 to /32

/NF2 f PLL2CLK = (fOSCIN / NR2) * NF2 / (OD2 * R2)

/1 to /256

Figure 6-6. PLLx Block Diagram

6.6.1.3.2 PLL Timing Specifications

Table 6-11. PLL Timing Specifications

PARAMETER MIN MAX UNIT
fINTCLK PLL1 Reference Clock frequency 1 f(OSC_SQR) MHz
fpost_ODCLK Post-ODCLK – PLL1 Post-divider input 400 MHz
clock frequency
fVCOCLK VCOCLK – PLL1 Output Divider (OD) input 150 550 MHz
clock frequency
fINTCLK2 PLL2 Reference Clock frequency 1 f(OSC_SQR) MHz
fpost_ODCLK2 Post-ODCLK – PLL2 Post-divider input 400 MHz
clock frequency
fVCOCLK2 VCOCLK – PLL2 Output Divider (OD) input 150 550 MHz
clock frequency

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6.6.1.4 External Clock Inputs

The device supports up to two external clock inputs. This clock input must be a square wave input. The
electrical and timing requirements for these clock inputs are specified below. The external clock sources
are not checked for validity. They are assumed valid when enabled.

Table 6-12. External Clock Timing and Electrical Specifications

Parameter Description Min Max Unit
fEXTCLKx External clock input frequency 80 MHz
tw(EXTCLKIN)H EXTCLK high-pulse duration 6 ns
tw(EXTCLKIN)L EXTCLK low-pulse duration 6 ns
viL(EXTCLKIN) Low-level input voltage -0.3 0.8 V
viH(EXTCLKIN) High-level input voltage 2 VCCIO + 0.3 V

6.6.2 Clock Domains

6.6.2.1 Clock Domain Descriptions

The table below lists the device clock domains and their default clock sources. The table also shows the
system module control register that is used to select an available clock source for each clock domain.

Table 6-13. Clock Domain Descriptions

Clock Domain Name Default Clock Clock Source Description
Source Selection Register
HCLK OSCIN GHVSRC • Is disabled through the CDDISx registers bit 1
• Used for all system modules including DMA, ESM
GCLK OSCIN GHVSRC • Always the same frequency as HCLK
• In phase with HCLK
• Is disabled separately from HCLK through the CDDISx registers
bit 0
• Can be divided by 1up to 8 when running CPU self-test (LBIST)
using the CLKDIV field of the STCCLKDIV register at address
0xFFFFE108
GCLK2 OSCIN GHVSRC • Always the same frequency as GCLK
• 2 cycles delayed from GCLK
• Is disabled along with GCLK
• Gets divided by the same divider setting as that for GCLK when
running CPU self-test (LBIST)
VCLK OSCIN GHVSRC • Divided down from HCLK
• Can be HCLK/1, HCLK/2, ... or HCLK/16
• Is disabled separately from HCLK through the CDDISx registers
bit 2
VCLK2 OSCIN GHVSRC • Divided down from HCLK
• Can be HCLK/1, HCLK/2, ... or HCLK/16
• Frequency must be an integer multiple of VCLK frequency
• Is disabled separately from HCLK through the CDDISx registers
bit 3
VCLK3 OSCIN GHVSRC • Divided down from HCLK
• Can be HCLK/1, HCLK/2, ... or HCLK/16
• Is disabled separately from HCLK through the CDDISx registers
bit 8
VCLK4 OSCIN GHVSRC • Divided down from HCLK
• Can be HCLK/1, HCLK/2, ... or HCLK/16
• Is disabled separately from HCLK through the CDDISx registers
bit 9

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Table 6-13. Clock Domain Descriptions (continued)

Clock Domain Name Default Clock Clock Source Description
Source Selection Register
VCLKA1 VCLK VCLKASRC • Defaults to VCLK as the source
• Is disabled through the CDDISx registers bit 4
VCLKA2 VCLK VCLKASRC • Defaults to VCLK as the source
• Is disabled through the CDDISx registers bit 5
VCLKA4_S VCLK VCLKACON1 • Defaults to VCLK as the source
• Frequency can be as fast as HCLK frequency
• Is disabled through the CDDISx registers bit 11
VCLKA4_DIVR VCLK VCLKACON1 • Divided down from the VCLKA4_S using the VCLKA4R field of
the VCLKACON1 register at address 0xFFFFE140
• Frequency can be VCLKA4_S/1, VCLKA4_S/2, ..., or
VCLKA4_S/8
• Default frequency is VCLKA4_S/2
• Is disabled separately through the VCLKACON1 register
VCLKA4_DIV_CDDIS bit only if the VCLKA4_S clock is not
disabled
RTICLK VCLK RCLKSRC • Defaults to VCLK as the source
• If a clock source other than VCLK is selected for RTICLK, then
the RTICLK frequency must be less than or equal to VCLK/3
– Application can ensure this by programming the RTI1DIV
field of the RCLKSRC register, if necessary
• Is disabled through the CDDISx registers bit 6

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6.6.2.2 Mapping of Clock Domains to Device Modules

Each clock domain has a dedicated functionality as shown in the figures below.

GCM
OSCIN
0 GCLK, GCLK2 (to CPU)
PLL #1 (FMzPLL)
HCLK (to SYSTEM)
1
/1..64 X1..256 /1..8 /1..32 * /1..16 VCLK _peri (VCLK to peripherals on PCR1)
VCLK_sys (VCLK to system modules)
80kHz 4
/1..16 VCLK2 (to N2HETx and HTUx)
Low Power
Oscillator 10MHz 5 VCLK3 (to EMIF)
/1..16
PLL #2 (FMzPLL)
6 /1..16 VCLK4 (to ePWM, eQEP, eCAP)
/1..64 X1..256 /1..8 /1..32 *
* the frequency at this node must not 3
EXTCLKIN 1 0
exceed the maximum HCLK specifiation. 1
EXTCLKIN2 7 3
4 VCLKA1 (to DCANx)
5
6
7
VCLK

0
1
3
4 /1, 2, 4, or 8
5
6 RTICLK (to RTI, DWWD)
7
VCLK

VCLKA1 VCLK VCLK2

VCLK2

HRP
/1,2,..1024 /1,2,..256 /2,3..224 /1,2..32 /1,2..65536 /1,2..256 /1..64

N2HETx
TU
Prop_seg Phase_seg2 LRP
ECLK I2C baud /20 ..2 5
SPI LIN / SCI ADCLK
Baud Rate rate
Baud Rate
Phase_seg1
SPIx,MibSPIx LIN, SCI External Clock I2C High Loop
MibADCx
Resolution Clock
EXTCLKIN1
CAN Baud Rate NTU[3]
PLL#2 output
NTU[2] N2HETx
Reserved RTI
DCANx NTU[1]
Reserved
NTU[0]

Figure 6-7. Device Clock Domains

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6.6.3 Clock Test Mode

The platform architecture defines a special mode that allows various clock signals to be brought out on to
the ECLK pin and N2HET1[12] device outputs. This mode is called the Clock Test mode. It is very useful
for debugging purposes and can be configured through the CLKTEST register in the system module.

Table 6-14. Clock Test Mode Options

SEL_ECP_PIN SEL_GIO_PIN
= SIGNAL ON ECLK = SIGNAL ON N2HET1[12]
CLKTEST[3-0] CLKTEST[11-8]
0000 Oscillator 0000 Oscillator Valid Status
0001 Main PLL free-running clock output 0001 Main PLL Valid status
0010 Reserved 0010 Reserved
0011 EXTCLKIN1 0011 Reserved
0100 LFLPO 0100 Reserved
0101 HFLPO 0101 HFLPO Valid status
0110 Secondary PLL free-running clock output 0110 Secondary PLL Valid Status
0111 EXTCLKIN2 0111 Reserved
1000 GCLK 1000 LFLPO
1001 RTI Base 1001 Oscillator Valid status
1010 Reserved 1010 Oscillator Valid status
1011 VCLKA1 1011 Oscillator Valid status
1100 Reserved 1100 Oscillator Valid status
1101 Reserved 1101 Reserved
1110 VCLKA4_DIVR 1110 VCLKA4_S
1111 Reserved 1111 Oscillator Valid status

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6.7 Clock Monitoring

The LPO Clock Detect (LPOCLKDET) module consists of a clock monitor (CLKDET) and an internal low
power oscillator (LPO).
The LPO provides two different clock sources – a low frequency (LFLPO) and a high frequency (HFLPO).
The CLKDET is a supervisor circuit for an externally supplied clock signal (OSCIN). In case the OSCIN
frequency falls out of a frequency window, the CLKDET flags this condition in the global status register
(GLBSTAT bit 0: OSC FAIL) and switches all clock domains sourced by OSCIN to the HFLPO clock (limp
mode clock).
The valid OSCIN frequency range is defined as: fHFLPO / 4 < fOSCIN < fHFLPO * 4.

6.7.1 Clock Monitor Timings

For more information on LPO and Clock detection, refer to Table 6-10.

lower upper
fail pass fail
threshold threshold

1.375 4.875 22 78 f[MHz]

Figure 6-8. LPO and Clock Detection, Untrimmed HFLPO

6.7.2 External Clock (ECLK) Output Functionality

The ECLK pin can be configured to output a pre-scaled clock signal indicative of an internal device clock.
This output can be externally monitored as a safety diagnostic.

6.7.3 Dual Clock Comparators

The Dual Clock Comparator (DCC) module determines the accuracy of selectable clock sources by
counting the pulses of two independent clock sources (counter 0 and counter 1). If one clock is out of
spec, an error signal is generated. For example, the DCC1 can be configured to use HFLPO as the
reference clock (for counter 0) and VCLK as the "clock under test" (for counter 1). This configuration
allows the DCC1 to monitor the PLL output clock when VCLK is using the PLL output as its source.
An additional use of this module is to measure the frequency of a selectable clock source, using the input
clock as a reference, by counting the pulses of two independent clock sources. Counter 0 generates a
fixed-width counting window after a preprogrammed number of pulses. Counter 1 generates a fixed-width
pulse (1 cycle) after a pre-programmed number of pulses. This pulse sets as an error signal if counter 1
does not reach 0 within the counting window generated by counter 0.

6.7.3.1 Features
• Takes two different clock sources as input to two independent counter blocks.
• One of the clock sources is the known-good, or reference clock; the second clock source is the "clock under test."
• Each counter block is programmable with initial, or seed values.
• The counter blocks start counting down from their seed values at the same time; a mismatch from the expected
frequency for the clock under test generates an error signal which is used to interrupt the CPU.

6.7.3.2 Mapping of DCC Clock Source Inputs

Table 6-15. DCC1 Counter 0 Clock Sources

CLOCK SOURCE [3:0] CLOCK NAME
others oscillator (OSCIN)
0x5 high frequency LPO

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Table 6-15. DCC1 Counter 0 Clock Sources (continued)

CLOCK SOURCE [3:0] CLOCK NAME
0xA test clock (TCK)

Table 6-16. DCC1 Counter 1 Clock Sources

KEY [3:0] CLOCK SOURCE [3:0] CLOCK NAME
others - N2HET1[31]
0x0 Main PLL free-running clock output
0x1 PLL #2 free-running clock output
0x2 low frequency LPO
0xA 0x3 high frequency LPO
0x4 reserved
0x5 EXTCLKIN1
0x6 EXTCLKIN2
0x7 reserved
0x8 - 0xF VCLK

Table 6-17. DCC2 Counter 0 Clock Sources

CLOCK SOURCE [3:0] CLOCK NAME
others oscillator (OSCIN)
0xA test clock (TCK)

Table 6-18. DCC2 Counter 1 Clock Sources

KEY [3:0] CLOCK SOURCE [3:0] CLOCK NAME
others - N2HET2[0]
0xA 00x0 - 0x7 Reserved
0x8 - 0xF VCLK

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6.8 Glitch Filters

A glitch filter is present on the following signals.

Table 6-19. Glitch Filter Timing Specifications

Pin Parameter MIN MAX Unit
nPORRST tf(nPORRST) 475 2000 ns
Filter time nPORRST pin;
pulses less than MIN will be filtered out, pulses greater than
MAX will generate a reset (1)
nRST tf(nRST) 475 2000 ns
Filter time nRST pin;
pulses less than MIN will be filtered out, pulses greater than
MAX will generate a reset
TEST tf(TEST) 475 2000 ns
Filter time TEST pin;
pulses less than MIN will be filtered out, pulses greater than
MAX will pass through
(1) The glitch filter design on the nPORRST signal is designed such that no size pulse will reset any part of the microcontroller (flash pump,
I/O pins, etc.) without also generating a valid reset signal to the CPU.

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6.9 Device Memory Map

6.9.1 Memory Map Diagram

The figure below shows the device memory map.

0xFFFFFFFF
SYSTEM Modules
0xFFF80000
Peripherals - Frame 1
0xFF000000
CRC
0xFE000000
RESERVED
0xFCFFFFFF
0xFC000000 Peripherals - Frame 2
RESERVED
0xF07FFFFF

Flash Module Bus2 Interface

(Flash ECC, OTP and

EEPROM Emulation accesses)
0xF0000000
RESERVED
0x87FFFFFF EMIF (128MB)
0x80000000 CS0 SDRAM
RESERVED
0x6FFFFFFF reserved
CS4
0x6C000000 EMIF (32KB * 3)
0x68000000
CS3
0x64000000 Async RAM
0x60000000 CS2

RESERVED

0x2013FFFF
Flash (1.25MB) (Mirrored Image)
0x20000000
RESERVED
0x0842FFFF
0x08400000 RAM - ECC
RESERVED
0x0802FFFF
RAM (192KB)
0x08000000
RESERVED
0x0013FFFF
Flash (1.25MB)
0x00000000
Figure 6-9. Memory Map

The Flash memory is mirrored to support ECC logic testing. The base address of the mirrored Flash
image is 0x2000 0000.

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6.9.2 Memory Map Table

Table 6-20. Device Memory Map

FRAME ADDRESS RANGE RESPNSE FOR ACCESS TO
FRAME CHIP FRAME ACTUAL
MODULE NAME UNIMPLEMENTED LOCATIONS IN
SELECT START END SIZE SIZE
FRAME
Memories tightly coupled to the ARM Cortex-R4F CPU
TCM Flash CS0 0x0000_0000 0x00FF_FFFF 16MB 1.25MB
TCM RAM + RAM
CSRAM0 0x0800_0000 0x0BFF_FFFF 64MB 192KB
ECC Abort
Flash mirror
Mirrored Flash 0x2000_0000 0x20FF_FFFF 16MB 1.25MB
frame
External Memory Accesses
EMIF Chip Select
EMIF select 2 0x6000_0000 0x63FF_FFFF 64MB 32KB
2 (asynchronous)
EMIF Chip Select
EMIF select 3 0x6400_0000 0x67FF_FFFF 64MB 32KB
3 (asynchronous) Access to "Reserved" space will
EMIF Chip Select generate Abort
EMIF select 4 0x6800_0000 0x6BFF_FFFF 64MB 32KB
4 (asynchronous)
EMIF Chip Select
EMIF select 0 0x8000_0000 0x87FF_FFFF 128MB 128MB
0 (synchronous)
Flash Module Bus2 Interface
Customer OTP,
0xF000_0000 0xF000_1FFF 8KB 4KB
TCM Flash Banks
Customer OTP,
0xF000_E000 0xF000_FFFF 8KB 2KB
Bank 7
Customer
OTP–ECC, TCM 0xF004_0000 0xF004_03FF 1KB 512B
Flash Banks
Customer
OTP–ECC, 0xF004_1C00 0xF004_1FFF 1KB 256B
Bank 7
TI OTP, TCM
0xF008_0000 0xF008_1FFF 8KB 4KB
Flash Banks
TI OTP, Abort
0xF008_E000 0xF008_FFFF 8KB 2KB
Bank 7
TI OTP–ECC,
0xF00C_0000 0xF00C_03FF 1KB 512B
TCM Flash Banks
TI OTP–ECC,
0xF00C_1C00 0xF00C_1FFF 1KB 256B
Bank 7
Bank 7 – ECC 0xF010_0000 0xF013_FFFF 256KB 8KB
Bank 7 0xF020_0000 0xF03F_FFFF 2MB 64KB
Flash Data Space
0xF040_0000 0xF04F_FFFF 1MB 160KB
ECC
EMIF slave interfaces
EMIF Registers 0xFCFF_E800 0xFCFF_E8FF 256B 256B Abort
SCR5: Enhanced Timer Peripherals
ePWM1 0xFCF7_8C00 0xFCF7_8CFF 256B 256B Abort
ePWM2 0xFCF7_8D00 0xFCF7_8DFF 256B 256B Abort
ePWM3 0xFCF7_8E00 0xFCF7_8EFF 256B 256B Abort
ePWM4 0xFCF7_8F00 0xFCF7_8FFF 256B 256B Abort
ePWM5 0xFCF7_9000 0xFCF7_90FF 256B 256B Abort
ePWM6 0xFCF7_9100 0xFCF7_91FF 256B 256B Abort
ePWM7 0xFCF7_9200 0xFCF7_92FF 256B 256B Abort
eCAP1 0xFCF7_9300 0xFCF7_93FF 256B 256B Abort

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Table 6-20. Device Memory Map (continued)

FRAME ADDRESS RANGE RESPNSE FOR ACCESS TO
FRAME CHIP FRAME ACTUAL
MODULE NAME UNIMPLEMENTED LOCATIONS IN
SELECT START END SIZE SIZE
FRAME
eCAP2 0xFCF7_9400 0xFCF7_94FF 256B 256B Abort
eCAP3 0xFCF7_9500 0xFCF7_95FF 256B 256B Abort
eCAP4 0xFCF7_9600 0xFCF7_96FF 256B 256B Abort
eCAP5 0xFCF7_9700 0xFCF7_97FF 256B 256B Abort
eCAP6 0xFCF7_9800 0xFCF7_98FF 256B 256B Abort
eQEP1 0xFCF7_9900 0xFCF7_99FF 256B 256B Abort
eQEP2 0xFCF7_9A00 0xFCF7_9AFF 256B 256B Abort
Cyclic Redundancy Checker (CRC) Module Registers
Accesses above 0x200 generate
CRC CRC frame 0xFE00_0000 0xFEFF_FFFF 16MB 512B
abort.
Peripheral Memories
MIBSPI5 RAM PCS[5] 0xFF0A_0000 0xFF0B_FFFF 128KB 2KB Abort for accesses above 2KB
MIBSPI3 RAM PCS[6] 0xFF0C_0000 0xFF0D_FFFF 128KB 2KB Abort for accesses above 2KB
MIBSPI1 RAM PCS[7] 0xFF0E_0000 0xFF0F_FFFF 128KB 2KB Abort for accesses above 2KB
Wrap around for accesses to
unimplemented address offsets lower
DCAN3 RAM PCS[13] 0xFF1A_0000 0xFF1B_FFFF 128KB 2KB
than 0x7FF. Abort generated for
accesses beyond offset 0x800.
Wrap around for accesses to
unimplemented address offsets lower
DCAN2 RAM PCS[14] 0xFF1C_0000 0xFF1D_FFFF 128KB 2KB
than 0x7FF. Abort generated for
accesses beyond offset 0x800.
Wrap around for accesses to
unimplemented address offsets lower
DCAN1 RAM PCS[15] 0xFF1E_0000 0xFF1F_FFFF 128KB 2KB
than 0x7FF. Abort generated for
accesses beyond offset 0x800.
Wrap around for accesses to
unimplemented address offsets lower
MIBADC2 RAM 8KB
than 0x1FFF. Abort generated for
accesses beyond 0x1FFF.
PCS[29] 0xFF3A_0000 0xFF3B_FFFF 128KB Look-Up Table for ADC2 wrapper.
Starts at address offset 0x2000 and
MIBADC2 Look- ends at address offset 0x217F. Wrap
384B
Up Table around for accesses between offsets
0x0180 and 0x3FFF. Abort generated
for accesses beyond offset 0x4000.
Wrap around for accesses to
unimplemented address offsets lower
MIBADC1 RAM 8KB
than 0x1FFF. Abort generated for
accesses beyond 0x1FFF.
PCS[31] 0xFF3E_0000 0xFF3F_FFFF 128KB Look-Up Table for ADC1 wrapper.
Starts at address offset 0x2000 and
MibADC1 Look- ends at address offset 0x217F. Wrap
384B
Up Table around for accesses between offsets
0x0180 and 0x3FFF. Abort generated
for accesses beyond offset 0x4000.
Wrap around for accesses to
unimplemented address offsets lower
N2HET2 RAM PCS[34] 0xFF44_0000 0xFF45_FFFF 128KB 16KB
than 0x3FFF. Abort generated for
accesses beyond 0x3FFF.
Wrap around for accesses to
unimplemented address offsets lower
N2HET1 RAM PCS[35] 0xFF46_0000 0xFF47_FFFF 128KB 16KB
than 0x3FFF. Abort generated for
accesses beyond 0x3FFF.
HTU2 RAM PCS[38] 0xFF4C_0000 0xFF4D_FFFF 128KB 1KB Abort
HTU1 RAM PCS[39] 0xFF4E_0000 0xFF4F_FFFF 128KB 1KB Abort

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Table 6-20. Device Memory Map (continued)

FRAME ADDRESS RANGE RESPNSE FOR ACCESS TO
FRAME CHIP FRAME ACTUAL
MODULE NAME UNIMPLEMENTED LOCATIONS IN
SELECT START END SIZE SIZE
FRAME
Debug Components
CoreSight Debug Reads return zeros, writes have no
CSCS0 0xFFA0_0000 0xFFA0_0FFF 4KB 4KB
ROM effect
Cortex-R4F Reads return zeros, writes have no
CSCS1 0xFFA0_1000 0xFFA0_1FFF 4KB 4KB
Debug effect
POM CSCS4 0xFFA0_4000 0xFFA0_4FFF 4KB 4KB Abort
Peripheral Control Registers
Reads return zeros, writes have no
HTU1 PS[22] 0xFFF7_A400 0xFFF7_A4FF 256B 256B
effect
Reads return zeros, writes have no
HTU2 PS[22] 0xFFF7_A500 0xFFF7_A5FF 256B 256B
effect
Reads return zeros, writes have no
N2HET1 PS[17] 0xFFF7_B800 0xFFF7_B8FF 256B 256B
effect
Reads return zeros, writes have no
N2HET2 PS[17] 0xFFF7_B900 0xFFF7_B9FF 256B 256B
effect
Reads return zeros, writes have no
GIO PS[16] 0xFFF7_BC00 0xFFF7_BDFF 512B 256B
effect
Reads return zeros, writes have no
MIBADC1 PS[15] 0xFFF7_C000 0xFFF7_C1FF 512B 512B
effect
Reads return zeros, writes have no
MIBADC2 PS[15] 0xFFF7_C200 0xFFF7_C3FF 512B 512B
effect
Reads return zeros, writes have no
I2C PS[10] 0xFFF7_D400 0xFFF7_D4FF 256B 256B
effect
Reads return zeros, writes have no
DCAN1 PS[8] 0xFFF7_DC00 0xFFF7_DDFF 512B 512B
effect
Reads return zeros, writes have no
DCAN2 PS[8] 0xFFF7_DE00 0xFFF7_DFFF 512B 512B
effect
Reads return zeros, writes have no
DCAN3 PS[7] 0xFFF7_E000 0xFFF7_E1FF 512B 512B
effect
Reads return zeros, writes have no
LIN PS[6] 0xFFF7_E400 0xFFF7_E4FF 256B 256B
effect
Reads return zeros, writes have no
SCI PS[6] 0xFFF7_E500 0xFFF7_E5FF 256B 256B
effect
Reads return zeros, writes have no
MibSPI1 PS[2] 0xFFF7_F400 0xFFF7_F5FF 512B 512B
effect
Reads return zeros, writes have no
SPI2 PS[2] 0xFFF7_F600 0xFFF7_F7FF 512B 512B
effect
Reads return zeros, writes have no
MibSPI3 PS[1] 0xFFF7_F800 0xFFF7_F9FF 512B 512B
effect
Reads return zeros, writes have no
SPI4 PS[1] 0xFFF7_FA00 0xFFF7_FBFF 512B 512B
effect
Reads return zeros, writes have no
MibSPI5 PS[0] 0xFFF7_FC00 0xFFF7_FDFF 512B 512B
effect
System Modules Control Registers and Memories
DMA RAM PPCS0 0xFFF8_0000 0xFFF8_0FFF 4KB 4KB Abort
Wrap around for accesses to
VIM RAM PPCS2 0xFFF8_2000 0xFFF8_2FFF 4KB 1KB unimplemented address offsets
between 1KB and 4KB.
Flash Module PPCS7 0xFFF8_7000 0xFFF8_7FFF 4KB 4KB Abort
eFuse Controller PPCS12 0xFFF8_C000 0xFFF8_CFFF 4KB 4KB Abort
Power
Management PPSE0 0xFFFF_0000 0xFFFF_01FF 512B 512B Abort
Module (PMM)

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Table 6-20. Device Memory Map (continued)

FRAME ADDRESS RANGE RESPNSE FOR ACCESS TO
FRAME CHIP FRAME ACTUAL
MODULE NAME UNIMPLEMENTED LOCATIONS IN
SELECT START END SIZE SIZE
FRAME
Reads return zeros, writes have no
PCR registers PPS0 0xFFFF_E000 0xFFFF_E0FF 256B 256B
effect
System Module -
Reads return zeros, writes have no
Frame 2 (see PPS0 0xFFFF_E100 0xFFFF_E1FF 256B 256B
effect
SPNU515)
Reads return zeros, writes have no
PBIST PPS1 0xFFFF_E400 0xFFFF_E5FF 512B 512B
effect
Generates address error interrupt, if
STC PPS1 0xFFFF_E600 0xFFFF_E6FF 256B 256B
enabled
IOMM
Reads return zeros, writes have no
Multiplexing PPS2 0xFFFF_EA00 0xFFFF_EBFF 512B 512B
effect
Control Module
Reads return zeros, writes have no
DCC1 PPS3 0xFFFF_EC00 0xFFFF_ECFF 256B 256B
effect
Reads return zeros, writes have no
DMA PPS4 0xFFFF_F000 0xFFFF_F3FF 1KB 1KB
effect
Reads return zeros, writes have no
DCC2 PPS5 0xFFFF_F400 0xFFFF_F4FF 256B 256B
effect
Reads return zeros, writes have no
ESM PPS5 0xFFFF_F500 0xFFFF_F5FF 256B 256B
effect
Reads return zeros, writes have no
CCMR4 PPS5 0xFFFF_F600 0xFFFF_F6FF 256B 256B
effect
Reads return zeros, writes have no
RAM ECC even PPS6 0xFFFF_F800 0xFFFF_F8FF 256B 256B
effect
Reads return zeros, writes have no
RAM ECC odd PPS6 0xFFFF_F900 0xFFFF_F9FF 256B 256B
effect
Reads return zeros, writes have no
RTI + DWWD PPS7 0xFFFF_FC00 0xFFFF_FCFF 256B 256B
effect
Reads return zeros, writes have no
VIM Parity PPS7 0xFFFF_FD00 0xFFFF_FDFF 256B 256B
effect
Reads return zeros, writes have no
VIM PPS7 0xFFFF_FE00 0xFFFF_FEFF 256B 256B
effect
System Module -
Reads return zeros, writes have no
Frame 1 (see PPS7 0xFFFF_FF00 0xFFFF_FFFF 256B 256B
effect
SPNU515)

6.9.3 Special Consideration for CPU Access Errors Resulting in Imprecise Aborts
Any CPU write access to a Normal or Device type memory, which generates a fault, will generate an
imprecise abort. The imprecise abort exception is disabled by default and must be enabled for the CPU to
handle this exception. The imprecise abort handling is enabled by clearing the "A" bit in the CPU’s
program status register (CPSR).

6.9.4 Master/Slave Access Privileges

The table below lists the access permissions for each bus master on the device. A bus master is a module
that can initiate a read or a write transaction on the device.
Each slave module on the main interconnect is listed in the table. A "Yes" indicates that the module listed
in the "MASTERS" column can access that slave module.

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Table 6-21. Master / Slave Access Matrix

MASTERS ACCESS MODE SLAVES ON MAIN SCR
Flash Module Non-CPU CRC EMIF Slave Peripheral
Bus2 Interface: Accesses to Interface Control
OTP, ECC, Bank Program Flash Registers, All
7 and CPU Data Peripheral
RAM Memories, And
All System
Module Control
Registers And
Memories
CPU READ User/Privilege Yes Yes Yes Yes Yes
CPU WRITE User/Privilege No Yes Yes Yes Yes
DMA User Yes Yes Yes Yes Yes
POM User Yes Yes Yes Yes Yes
DAP Privilege Yes Yes Yes Yes Yes
HTU1 Privilege No Yes Yes Yes Yes
HTU2 Privilege No Yes Yes Yes Yes

6.9.5 Special Notes on Accesses to Certain Slaves

Write accesses to the Power Domain Management Module (PMM) control registers are limited to the CPU
(master id = 1). The other masters can only read from these registers.
A debugger can also write to the PMM registers. The master-id check is disabled in debug mode.
The device contains dedicated logic to generate a bus error response on any access to a module that is in
a power domain that has been turned OFF.

6.9.6 Parameter Overlay Module (POM) Considerations

• The POM can map onto up to 8MB of the internal or external memory space. The starting address and the size of
the memory overlay are configurable through the POM control registers. Care must be taken to ensure that the
overlay is mapped on to available memory.
• ECC must be disabled by software through CP15 in case POM overlay is enabled; otherwise ECC errors will be
generated.
• POM overlay must not be enabled when the flash and internal RAM memories are swapped through the MEM
SWAP field of the Bus Matrix Module Control Register 1 (BMMCR1).
• When POM is used to overlay the flash on to internal or external RAM, there is a bus contention possibility when
another master accesses the TCM flash. This results in a system hang.
– The POM implements a timeout feature to detect this exact scenario. The timeout needs to be enabled
whenever POM overlay is enabled.
– The timeout can be enabled by writing 1010 to the Enable TimeOut (ETO) field of the POM Global Control
register (POMGLBCTRL, address = 0xFFA04000).
– In case a read request by the POM cannot be completed within 32 HCLK cycles, the timeout (TO) flag is set in
the POM Flag register (POMFLG, address = 0xFFA0400C). Also, an abort is generated to the CPU. This can
be a prefetch abort for an instruction fetch or a data abort for a data fetch.
– The prefetch- and data-abort handlers must be modified to check if the TO flag in the POM is set. If so, then
the application can assume that the timeout is caused by a bus contention between the POM transaction and
another master accessing the same memory region. The abort handlers need to clear the TO flag, so that any
further aborts are not misinterpreted as having been caused due to a timeout from the POM.

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6.10 Flash Memory

6.10.1 Flash Memory Configuration

Flash Bank: A separate block of logic consisting of 1 to 16 sectors. Each flash bank normally has a
customer-OTP and a TI-OTP area. These flash sectors share input/output buffers, data paths, sense
amplifiers, and control logic.
Flash Sector: A contiguous region of flash memory which must be erased simultaneously due to physical
construction constraints.
Flash Pump: A charge pump which generates all the voltages required for reading, programming, or
erasing the flash banks.
Flash Module: Interface circuitry required between the host CPU and the flash banks and pump module.

Table 6-22. Flash Memory Banks and Sectors

Memory Arrays (or Banks) Sector Segment Low Address High Address
No.
BANK0 (1.25MBytes) (1) 0 16K Bytes 0x0000_0000 0x0000_3FFF
1 16K Bytes 0x0000_4000 0x0000_7FFF
2 16K Bytes 0x0000_8000 0x0000_BFFF
3 16K Bytes 0x0000_C000 0x0000_FFFF
4 16K Bytes 0x0001_0000 0x0001_3FFF
5 16K Bytes 0x0001_4000 0x0001_7FFF
6 32K Bytes 0x0001_8000 0x0001_FFFF
7 128K Bytes 0x0002_0000 0x0003_FFFF
8 128K Bytes 0x0004_0000 0x0005_FFFF
9 128K Bytes 0x0006_0000 0x0007_FFFF
10 128K Bytes 0x0008_0000 0x0009_FFFF
11 128K Bytes 0x000A_0000 0x000B_FFFF
12 128K Bytes 0x000C_0000 0x000D_FFFF
13 128K Bytes 0x000E_0000 0x000F_FFFF
14 128K Bytes 0x0010_0000 0x0011_FFFF
15 128K Bytes 0x0012_0000 0x0013_FFFF
BANK7 (64KBytes) for EEPROM emulation (2) (3) 0 16K Bytes 0xF020_0000 0xF020_3FFF
1 16K Bytes 0xF020_4000 0xF020_7FFF
2 16K Bytes 0xF020_8000 0xF020_BFFF
3 16K Bytes 0xF020_C000 0xF020_FFFF
(1) The Flash banks are 144-bit wide bank with ECC support.
(2) The flash bank7 can be programmed while executing code from flash bank0.
(3) Code execution is not allowed from flash bank7.

6.10.2 Main Features of Flash Module

• Support for multiple flash banks for program and/or data storage
• Simultaneous read access on a bank while performing program or erase operation on any other bank
• Integrated state machines to automate flash erase and program operations
• Pipelined mode operation to improve instruction access interface bandwidth
• Support for Single Error Correction Double Error Detection (SECDED) block inside Cortex-R4F CPU
– Error address is captured for host system debugging
• Support for a rich set of diagnostic features

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6.10.3 ECC Protection for Flash Accesses

All accesses to the program flash memory are protected by Single Error Correction Double Error Detection
(SECDED) logic embedded inside the CPU. The flash module provides 8 bits of ECC code for 64 bits of
instructions or data fetched from the flash memory. The CPU calculates the expected ECC code based on
the 64 bits received and compares it with the ECC code returned by the flash module. A single-bit error is
corrected and flagged by the CPU, while a multibit error is only flagged. The CPU signals an ECC error
through its Event bus. This signaling mechanism is not enabled by default and must be enabled by setting
the "X" bit of the Performance Monitor Control Register, c9.
MRC p15,#0,r1,c9,c12,#0 ;Enabling Event monitor states
ORR r1, r1, #0x00000010
MCR p15,#0,r1,c9,c12,#0 ;Set 4th bit (‘X’) of PMNC register
MRC p15,#0,r1,c9,c12,#0

The application must also explicitly enable the CPU's ECC checking for accesses on the CPU's ATCM
and BTCM interfaces. These are connected to the program flash and data RAM respectively. ECC
checking for these interfaces can be done by setting the B1TCMPCEN, B0TCMPCEN and ATCMPCEN
bits of the System Control coprocessor's Auxiliary Control Register, c1.
MRC p15, #0, r1, c1, c0, #1
ORR r1, r1, #0x0e000000 ;Enable ECC checking for ATCM and BTCMs
DMB
MCR p15, #0, r1, c1, c0, #1

6.10.4 Flash Access Speeds

For information on flash memory access speeds and the relevant wait states required, refer to Section 5.6.

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6.10.5 Program Flash

Table 6-23. Timing Requirements for Program Flash

Parameter MIN NOM MAX Unit
tprog(144bit) Wide Word (144bit) programming time 40 300 µs
tprog(Total) 1.25MByte programming time (1) -40°C to 125°C 13 s
0°C to 60°C, for first 3.3 6.6 s
25 cycles
terase(bank0) Sector/Bank erase time (2) -40°C to 125°C 0.03 4 s
0°C to 60°C, for first 16 100 ms
25 cycles
twec Write/erase cycles with 15 year Data Retention -40°C to 125°C 1000 cycles
requirement
(1) This programming time includes overhead of state machine, but does not include data transfer time. The programming time assumes
programming 144 bits at a time at the maximum specified operating frequency.
(2) During bank erase, the selected sectors are erased simultaneously. The time to erase the bank is specified as equal to the time to erase
a sector.

6.10.6 Data Flash

Table 6-24. Timing Requirements for Data Flash

Parameter MIN NOM MAX Unit
tprog(144bit) Wide Word (144bit) programming time 40 300 µs
tprog(Total) EEPROM Emulation (bank 7) 64KByte -40°C to 125°C 660 ms
programming time (1)
0°C to 60°C, for first 165 330 ms
25 cycles
terase(bank7) EEPROM Emulation (bank 7) Sector/Bank -40°C to 125°C 0.2 8 s
erase time (2)
0°C to 60°C, for first 14 100 ms
25 cycles
twec Write/erase cycles with 15 year Data Retention -40°C to 125°C 100000 cycles
requirement
(1) This programming time includes overhead of state machine, but does not include data transfer time. The programming time assumes
programming 144 bits at a time at the maximum specified operating frequency.
(2) During bank erase, the selected sectors are erased simultaneously. The time to erase the bank is specified as equal to the time to erase
a sector.

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6.11 Tightly Coupled RAM Interface Module

Figure 6-10 illustrates the connection of the Tightly Coupled RAM (TCRAM) to the Cortex-R4F CPU.

36 Bit
Upper 32 bits data & 3636 Bit
Bit
wide
wide
Cortex-R4F 4 ECC bits wideRAM
RAM
RAM
TCM BUS TCRAM
B0
TCM Interface 1 36 Bit
72 Bit data + ECC 3636 Bit
Bit
wide
wide
wideRAM
Lower 32 bits data & RAM
RAM
4 ECC bits

36 Bit
Upper 32 bits data & 3636 Bit
Bit
wide
B1 wide
wideRAM
4 ECC bits
TCM RAM
RAM
TCM BUS
TCRAM
72 Bit data + ECC Interface 2 36 Bit
3636 Bit
Bit
wide
wide
wide
RAM
Lower 32 bits data & RAM
RAM
4 ECC bits

Figure 6-10. TCRAM Block Diagram

6.11.1 Features
The features of the Tightly Coupled RAM (TCRAM) Module are:
• Acts as slave to the BTCM interface of the Cortex-R4F CPU
• Supports the internal ECC scheme of the CPU by providing 64-bit data and 8-bit ECC code
• Monitors CPU Event Bus and generates single or multibit error interrupts
• Stores addresses for single and multibit errors
• Supports RAM trace module
• Provides CPU address bus integrity checking by supporting parity checking on the address bus
• Performs redundant address decoding for the RAM bank chip select and ECC select generation logic
• Provides enhanced safety for the RAM addressing by implementing two 36-bit-wide byte-interleaved RAM banks
and generating independent RAM access control signals to the two banks
• Supports auto-initialization of the RAM banks along with the ECC bits

6.11.2 TCRAM ECC Support

The TCRAM interface passes on the ECC code for each data read by the Cortex-R4F CPU from the RAM.
It also stores the contents of the CPU ECC port in the ECC RAM when the CPU does a write to the RAM.
The TCRAM interface monitors the CPU event bus and provides registers for indicating single/multibit
errors and also for identifying the address that caused the single or multibit error. The event signaling and
the ECC checking for the RAM accesses must be enabled inside the CPU.
For more information see TMS570LS12x/11x Technical Reference Manual (SPNU515).

6.12 Parity Protection for Accesses to Peripheral RAMs

Accesses to some peripheral RAMs are protected by odd/even parity checking. During a read access the
parity is calculated based on the data read from the peripheral RAM and compared with the good parity
value stored in the parity RAM for that peripheral. If any word fails the parity check, the module generates
a parity error signal that is mapped to the Error Signaling Module. The module also captures the
peripheral RAM address that caused the parity error.
The parity protection for peripheral RAMs is not enabled by default and must be enabled by the
application. Each individual peripheral contains control registers to enable the parity protection for
accesses to its RAM.

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NOTE
The CPU read access gets the actual data from the peripheral. The application can choose
to generate an interrupt whenever a peripheral RAM parity error is detected.

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6.13 On-Chip SRAM Initialization and Testing

6.13.1 On-Chip SRAM Self-Test Using PBIST

6.13.1.1 Features
• Extensive instruction set to support various memory test algorithms
• ROM-based algorithms allow application to run TI production-level memory tests
• Independent testing of all on-chip SRAM

6.13.1.2 PBIST RAM Groups

Table 6-25. PBIST RAM Grouping

Test Pattern (Algorithm)
March 13N (1) March 13N (1)
triple read triple read
two port single port
Memory RAM Group Test Clock MEM Type slow read fast read
(cycles) (cycles)
ALGO MASK ALGO MASK ALGO MASK ALGO MASK
0x1 0x2 0x4 0x8
PBIST_ROM 1 ROM CLK ROM 24578 8194
STC_ROM 2 ROM CLK ROM 19586 6530
DCAN1 3 VCLK Dual Port 25200
DCAN2 4 VCLK Dual Port 25200
DCAN3 5 VCLK Dual Port 25200
(2)
ESRAM1 6 HCLK Single Port 266280
MIBSPI1 7 VCLK Dual Port 33440
MIBSPI3 8 VCLK Dual Port 33440
MIBSPI5 9 VCLK Dual Port 33440
VIM 10 VCLK Dual Port 12560
MIBADC1 11 VCLK Dual Port 4200
DMA 12 HCLK Dual Port 18960
N2HET1 13 VCLK Dual Port 31680
HTU1 14 VCLK Dual Port 6480
MIBADC2 18 VCLK Dual Port 4200
N2HET2 19 VCLK Dual Port 31680
HTU2 20 VCLK Dual Port 6480
ESRAM5 (3) 21 HCLK Single Port 266280
(4)
ESRAM6 22 HCLK Single Port 266280
(1) There are several memory testing algorithms stored in the PBIST ROM. However, TI recommends the March13N algorithm for
application testing.
(2) ESRAM1: Address 0x08000000 - 0x0800FFFF
(3) ESRAM5: Address 0x08010000 - 0x0801FFFF
(4) ESRAM6: Address 0x08020000 - 0x0802FFFF

The PBIST ROM clock frequency is limited to 100MHz, if 100MHz < HCLK <= HCLKmax, or HCLK, if
HCLK <= 100MHz.
The PBIST ROM clock is divided down from HCLK. The divider is selected by programming the ROM_DIV
field of the Memory Self-Test Global Control Register (MSTGCR) at address 0xFFFFFF58.

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6.13.2 On-Chip SRAM Auto Initialization

This microcontroller allows some of the on-chip memories to be initialized through the Memory Hardware
Initialization mechanism in the System module. This hardware mechanism allows an application to
program the memory arrays with error detection capability to a known state based on their error detection
scheme (odd/even parity or ECC).
The MINITGCR register enables the memory initialization sequence, and the MSINENA register selects
the memories that are to be initialized.
For more information on these registers see TMS570LS12x/11x Technical Reference Manual (SPNU515).
The mapping of the different on-chip memories to the specific bits of the MSINENA registers is shown in
Table 6-26.

Table 6-26. Memory Initialization

ADDRESS RANGE
CONNECTING MODULE MSINENA REGISTER BIT #
BASE ADDRESS ENDING ADDRESS
RAM (PD#1) 0x08000000 0x0800FFFF 0 (1)
RAM (RAM_PD#1) 0x08010000 0x0801FFFF 0 (1)
RAM (RAM_PD#2) 0x08020000 0x0802FFFF 0 (1)
MIBSPI5 RAM 0xFF0A0000 0xFF0BFFFF 12 (2)
MIBSPI3 RAM 0xFF0C0000 0xFF0DFFFF 11 (2)
MIBSPI1 RAM 0xFF0E0000 0xFF0FFFFF 7 (2)
DCAN3 RAM 0xFF1A0000 0xFF1BFFFF 10
DCAN2 RAM 0xFF1C0000 0xFF1DFFFF 6
DCAN1 RAM 0xFF1E0000 0xFF1FFFFF 5
MIBADC2 RAM 0xFF3A0000 0xFF3BFFFF 14
MIBADC1 RAM 0xFF3E0000 0xFF3FFFFF 8
N2HET2 RAM 0xFF440000 0xFF45FFFF 15
N2HET1 RAM 0xFF460000 0xFF47FFFF 3
HTU2 RAM 0xFF4C0000 0xFF4DFFFF 16
HTU1 RAM 0xFF4E0000 0xFF4FFFFF 4
DMA RAM 0xFFF80000 0xFFF80FFF 1
VIM RAM 0xFFF82000 0xFFF82FFF 2
(1) The TCM RAM interface module has separate control bits to select the RAM power domain that is to be auto-initialized.
(2) The MibSPIx modules perform an initialization of the transmit and receive RAMs as soon as the module is released from its local reset..
This is independent of whether the application chooses to initialize the MibSPIx RAMs using the system module auto-initialization
method. The MibSPIx module must be first brought out of its local reset in order to use the system module auto-initialization method.

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6.14 External Memory Interface (EMIF)

6.14.1 Features
The EMIF includes many features to enhance the ease and flexibility of connecting to external
asynchronous memories or SDRAM devices. The EMIF features includes support for:
• 3 addressable chip select for asynchronous memories of up to 32KB each
• 1 addressable chip select space for SDRAMs up to 128MB
• 8 or 16-bit data bus width
• Programmable cycle timings such as setup, strobe, and hold times as well as turnaround time
• Select strobe mode
• Extended Wait mode
• Data bus parking

6.14.2 Electrical and Timing Specifications

6.14.2.1 Asynchronous RAM

3
1

EMIF_nCS[3:2]

EMIF_BA[1:0]

EMIF_ADDR[12:0]

EMIF_nDQM[1:0]

4 5
8 9
6 7
29 30
10
EMIF_nOE
13
12

EMIF_DATA[15:0]

EMIF_nWE

Figure 6-11. Asynchronous Memory Read Timing

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SETUP STROBE Extended Due to EMIF_WAIT STROBE HOLD

EMIF_nCS[3:2]

EMIF_BA[1:0]

EMIF_ADDR[12:0]

EMIF_DATA[15:0]

14
11
EMIF_nOE

2
2
EMIF_WAIT Asserted Deasserted

Figure 6-12. EMIFnWAIT Read Timing Requirements

15
1

EMIF_nCS[3:2]

EMIF_BA[1:0]

EMIF_ADDR[12:0]

EMIF_nDQM[1:0]

16 17
18 19
20 21
24
22 23
EMIF_nWE

27
26

EMIF_DATA[15:0]

EMIF_nOE

Figure 6-13. Asynchronous Memory Write Timing

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SETUP STROBE Extended Due to EMIF_WAIT STROBE HOLD

EMIF_nCS[3:2]

EMIF_BA[1:0]

EMIF_ADDR[12:0]

EMIF_DATA[15:0]

28
25
EMIF_nWE

2
2
EMIF_WAIT Asserted Deasserted

Figure 6-14. EMIFnWAIT Write Timing Requirements

Table 6-27. EMIF Asynchronous Memory Timing Requirements (1)

NO. Value Unit
MIN NOM MAX
Reads and Writes
E EMIF clock period 11 ns
2 tw(EM_WAIT) Pulse duration, EMIF_nWAIT 2E ns
assertion and deassertion
Reads
12 tsu(EMDV-EMOEH) Setup time, EMIF_DATA[15:0] 9 ns
valid before EMIFnOE high
13 th(EMOEH-EMDIV) Hold time, EMIF_DATA[15:0] 0 ns
valid after EMIF_nOE high
14 tsu(EMOEL-EMWAIT) Setup Time, EMIF_nWAIT 4E+9 ns
asserted before end of Strobe
Phase (2)
Writes
28 tsu(EMWEL-EMWAIT) Setup Time, EMIF_nWAIT 4E+14 ns
asserted before end of Strobe
Phase (2)
(1) E = EMIF_CLK period in ns.
(2) Setup before end of STROBE phase (if no extended wait states are inserted) by which EMIFnWAIT must be asserted to add extended
wait states. Figure 6-12 and Figure 6-14 describe EMIF transactions that include extended wait states inserted during the STROBE
phase. However, cycles inserted as part of this extended wait period should not be counted; the 4E requirement is to the start of where
the HOLD phase would begin if there were no extended wait cycles.

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Table 6-28. EMIF Asynchronous Memory Switching Characteristics (1) (2) (3)
NO PARAMETER Value UNIT
MIN NOM MAX
Reads and Writes
1 td(TURNAROUND) Turnaround time (TA)*E - 4 (TA)*E (TA)*E + 3 ns
Reads
3 tc(EMRCYCLE) EMIF read cycle time (EW = 0) (RS+RST+RH)* (RS+RST+RH)* (RS+RST+RH)* ns
E -3 E E+3
EMIF read cycle time (EW = 1) (RS+RST+RH+( (RS+RST+RH+( (RS+RST+RH+( ns
EWC*16))*E -3 EWC*16))*E EWC*16))*E +
3
4 tsu(EMCEL-EMOEL) Output setup time, (RS)*E-6 (RS)*E (RS)*E+3 ns
EMIF_nCS[4:2] low to
EMIF_nOE low (SS = 0)
Output setup time, -6 0 +3 ns
EMIF_nCS[4:2] low to
EMIF_nOE low (SS = 1)
5 th(EMOEH-EMCEH) Output hold time, EMIF_nOE (RH)*E -3 (RH)*E (RH)*E + 5 ns
high to EMIF_nCS[4:2] high (SS
= 0)
Output hold time, EMIF_nOE -3 0 +5 ns
high to EMIF_nCS[4:2] high (SS
= 1)
6 tsu(EMBAV-EMOEL) Output setup time, (RS)*E-6 (RS)*E (RS)*E+3 ns
EMIF_BA[1:0] valid to
EMIF_nOE low
7 th(EMOEH-EMBAIV) Output hold time, EMIF_nOE (RH)*E-3 (RH)*E (RH)*E+5 ns
high to EMIF_BA[1:0] invalid
8 tsu(EMAV-EMOEL) Output setup time, (RS)*E-6 (RS)*E (RS)*E+3 ns
EMIF_ADDR[12:0] valid to
EMIFnOE low
9 th(EMOEH-EMAIV) Output hold time, EMIF_nOE (RH)*E-3 (RH)*E (RH)*E+5 ns
high to EMIF_ADDR[12:0]
invalid
10 tw(EMOEL) EMIF_nOE active low width (EW (RST)*E-3 (RST)*E (RST)*E+3 ns
= 0)
EMIF_nOE active low width (EW (RST+(EWC*16 (RST+(EWC*16 (RST+(EWC*16 ns
= 1) )) *E-3 ))*E )) *E+3
11 td(EMWAITH-EMOEH) Delay time from EMIF_nWAIT 3E+9 4E 4E+20 ns
deasserted to EMIF_nOE high
29 tsu(EMDQMV-EMOEL) Output setup time, (RS)*E-6 (RS)*E (RS)*E+3 ns
EMIF_nDQM[1:0] valid to
EMIF_nOE low
30 th(EMOEH-EMDQMIV) Output hold time, EMIF_nOE (RH)*E-3 (RH)*E (RH)*E+5 ns
high to EMIF_nDQM[1:0] invalid
Writes
15 tc(EMWCYCLE) EMIF write cycle time (EW = 0) (WS+WST+WH (WS+WST+WH (WS+WST+WH ns
)* E-3 )*E )* E+3
EMIF write cycle time (EW = 1) (WS+WST+WH (WS+WST+WH (WS+WST+WH ns
+( EWC*16))*E +(E WC*16))*E +( EWC*16))*E
-3 +3

(1) TA = Turnaround, RS = Read setup, RST = Read strobe, RH = Read hold, WS = Write setup, WST = Write strobe, WH = Write hold,
MEWC = Maximum external wait cycles. These parameters are programmed through the Asynchronous Bank and Asynchronous Wait
Cycle Configuration Registers. These support the following ranges of values: TA[4–1], RS[16–1], RST[64–1], RH[8–1], WS[16–1],
WST[64–1], WH[8–1], and MEWC[1–256]. See the TMS570LS12x/11x Technical Reference Manual (SPNU515) for more information.
(2) E = EMIF_CLK period in ns.
(3) EWC = external wait cycles determined by EMIF_nWAIT input signal. EWC supports the following range of values. EWC[256–1]. Note
that the maximum wait time before timeout is specified by bit field MEWC in the Asynchronous Wait Cycle Configuration Register. See
the TMS570LS12x/11x Technical Reference Manual (SPNU515) for more information.
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Table 6-28. EMIF Asynchronous Memory Switching Characteristics(1)(2)(3) (continued)

NO PARAMETER Value UNIT
MIN NOM MAX
16 tsu(EMCEL-EMWEL) Output setup time, (WS)*E -3 (WS)*E (WS)*E + 3 ns
EMIF_nCS[4:2] low to
EMIF_nWE low (SS = 0)
Output setup time, -3 0 +3 ns
EMIF_nCS[4:2] low to
EMIF_nWE low (SS = 1)
17 th(EMWEH-EMCEH) Output hold time, EMIF_nWE (WH)*E-3 (WH)*E (WH)*E+3 ns
high to EMIF_nCS[4:2] high (SS
= 0)
Output hold time, EMIF_nWE -3 0 +3 ns
high to EMIF_CS[4:2] high (SS =
1)
18 tsu(EMDQMV-EMWEL) Output setup time, (WS)*E-3 (WS)*E (WS)*E+3 ns
EMIF_BA[1:0] valid to
EMIF_nWE low
19 th(EMWEH-EMDQMIV) Output hold time, EMIF_nWE (WH)*E-3 (WH)*E (WH)*E+3 ns
high to EMIF_BA[1:0] invalid
20 tsu(EMBAV-EMWEL) Output setup time, (WS)*E-3 (WS)*E (WS)*E+3 ns
EMIF_BA[1:0] valid to
EMIF_nWE low
21 th(EMWEH-EMBAIV) Output hold time, EMIF_nWE (WH)*E-3 (WH)*E (WH)*E+3 ns
high to EMIF_BA[1:0] invalid
22 tsu(EMAV-EMWEL) Output setup time, (WS)*E-3 (WS)*E (WS)*E+3 ns
EMIF_ADDR[12:0] valid to
EMIF_nWE low
23 th(EMWEH-EMAIV) Output hold time, EMIF_nWE (WH)*E-3 (WH)*E (WH)*E+3 ns
high to EMIF_ADDR[12:0]
invalid
24 tw(EMWEL) EMIF_nWE active low width (WST)*E-3 (WST)*E (WST)*E+3 ns
(EW = 0)
EMIF_nWE active low width (WST+(EWC*1 (WST+(EWC*1 (WST+(EWC*1 ns
(EW = 1) 6)) *E-3 6))*E 6)) *E+3
25 td(EMWAITH-EMWEH) Delay time from EMIF_nWAIT 3E+11 4E 4E+24 ns
deasserted to EMIF_nWE high
26 tsu(EMDV-EMWEL) Output setup time, (WS)*E-3 (WS)*E (WS)*E+3 ns
EMIF_DATA[15:0] valid to
EMIF_nWE low
27 th(EMWEH-EMDIV) Output hold time, EMIF_nWE (WH)*E-3 (WH)*E (WH)*E+3 ns
high to EMIF_DATA[15:0] invalid
31 tsu(EMDQMV-EMWEL) Output setup time, (WH)*E-3 (WH)*E (WH)*E+3 ns
EMIF_nDQM[1:0] valid to
EMIF_nWE low
32 th(EMWEH-EMDQMIV) Output hold time, EMIF_nWE (WH)*E-3 (WH)*E (WH)*E+3 ns
high to EMIF_nDQM[1:0] invalid

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6.14.2.2 Synchronous Timing

BASIC SDRAM 1
READ OPERATION 2 2
EMIF_CLK

3 4
EMIF_nCS[0]

5 6

EMIF_nDQM[1:0]
7 8
EMIF_BA[1:0]

7 8
EMIF_ADDR[12:0]

19
2 EM_CLK Delay
17 20 18
EMIF_DATA[15:0]

11 12
EMIF_nRAS

13 14
EMIF_nCAS

EMIF_nWE

Figure 6-15. Basic SDRAM Read Operation

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BASIC SDRAM 1
WRITE OPERATION 2 2
EMIF_CLK

3 4
EMIF_CS[0]

5 6
EMIF_DQM[1:0]

7 8
EMIF_BA[1:0]

7 8
EMIF_ADDR[12:0]

9
10

EMIF_DATA[15:0]

11 12
EMIF_nRAS

13
EMIF_nCAS

15 16
EMIF_nWE

Figure 6-16. Basic SDRAM Write Operation

Table 6-29. EMIF Synchronous Memory Timing Requirements

NO. Parameter MIN MAX Unit
19 tsu(EMIFDV-EM_CLKH) Input setup time, read data valid on 2 ns
EMIF_DATA[15:0] before EMIF_CLK
rising
20 th(CLKH-DIV) Input hold time, read data valid on 2 ns
EMIF_DATA[15:0] after EMIF_CLK
rising

Table 6-30. EMIF Synchronous Memory Switching Characteristics

NO. Parameter MIN MAX Unit
1 tc(CLK) Cycle time, EMIF clock EMIF_CLK 22 ns
2 tw(CLK) Pulse width, EMIF clock EMIF_CLK 5 ns
high or low
3 td(CLKH-CSV) Delay time, EMIF_CLK rising to 13 ns
EMIF_nCS[0] valid
4 toh(CLKH-CSIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_nCS[0] invalid
5 td(CLKH-DQMV) Delay time, EMIF_CLK rising to 13 ns
EMIF_nDQM[1:0] valid
6 toh(CLKH-DQMIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_nDQM[1:0] invalid
7 td(CLKH-AV) Delay time, EMIF_CLK rising to 13 ns
EMIF_ADDR[12:0] and EMIFBA[1:0]
valid

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Table 6-30. EMIF Synchronous Memory Switching Characteristics (continued)

NO. Parameter MIN MAX Unit
8 toh(CLKH-AIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_ADDR[12:0] and EMIF_BA[1:0]
invalid
9 td(CLKH-DV) Delay time, EMIF_CLK rising to 13 ns
EMIF_DATA[15:0] valid
10 toh(CLKH-DIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_DATA[15:0] invalid
11 td(CLKH-RASV) Delay time, EMIF_CLK rising to 13 ns
EMIF_nRAS valid
12 toh(CLKH-RASIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_nRAS invalid
13 td(CLKH-CASV) Delay time, EMIF_CLK rising to 13 ns
EMIF_nCAS valid
14 toh(CLKH-CASIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_nCAS invalid
15 td(CLKH-WEV) Delay time, EMIF_CLK rising to 13 ns
EMIF_nWE valid
16 toh(CLKH-WEIV) Output hold time, EMIF_CLK rising to 1 ns
EMIF_nWE invalid
17 tdis(CLKH-DHZ) Delay time, EMIF_CLK rising to 7 ns
EMIF_DATA[15:0] tri-stated
18 tena(CLKH-DLZ) Output hold time, EMIF_CLK rising to 1 ns
EMIF_DATA[15:0] driving

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6.15 Vectored Interrupt Manager

The vectored interrupt manager (VIM) provides hardware assistance for prioritizing and controlling the
many interrupt sources present on this device. Interrupts are caused by events outside of the normal flow
of program execution. Normally, these events require a timely response from the central processing unit
(CPU); therefore, when an interrupt occurs, the CPU switches execution from the normal program flow to
an interrupt service routine (ISR).

6.15.1 VIM Features

The VIM module has the following features:
• Supports 128 interrupt channels.
– Provides programmable priority and enable for interrupt request lines.
• Provides a direct hardware dispatch mechanism for fastest IRQ dispatch.
• Provides two software dispatch mechanisms when the CPU VIC port is not used.
– Index interrupt
– Register vectored interrupt
• Parity protected vector interrupt table against soft errors.

6.15.2 Interrupt Request Assignments

Table 6-31. Interrupt Request Assignments

Modules Interrupt Sources Default VIM Interrupt
Channel
ESM ESM High level interrupt (NMI) 0
Reserved Reserved 1
RTI RTI compare interrupt 0 2
RTI RTI compare interrupt 1 3
RTI RTI compare interrupt 2 4
RTI RTI compare interrupt 3 5
RTI RTI overflow interrupt 0 6
RTI RTI overflow interrupt 1 7
RTI RTI timebase interrupt 8
GIO GIO interrupt A 9
N2HET1 N2HET1 level 0 interrupt 10
HTU1 HTU1 level 0 interrupt 11
MIBSPI1 MIBSPI1 level 0 interrupt 12
LIN LIN level 0 interrupt 13
MIBADC1 MIBADC1 event group interrupt 14
MIBADC1 MIBADC1 sw group 1 interrupt 15
DCAN1 DCAN1 level 0 interrupt 16
SPI2 SPI2 level 0 interrupt 17
Reserved Reserved 18
CRC CRC Interrupt 19
ESM ESM Low level interrupt 20
SYSTEM Software interrupt (SSI) 21
CPU PMU Interrupt 22
GIO GIO interrupt B 23
N2HET1 N2HET1 level 1 interrupt 24
HTU1 HTU1 level 1 interrupt 25
MIBSPI1 MIBSPI1 level 1 interrupt 26

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Table 6-31. Interrupt Request Assignments (continued)

Modules Interrupt Sources Default VIM Interrupt
Channel
LIN LIN level 1 interrupt 27
MIBADC1 MIBADC1 sw group 2 interrupt 28
DCAN1 DCAN1 level 1 interrupt 29
SPI2 SPI2 level 1 interrupt 30
MIBADC1 MIBADC1 magnitude compare interrupt 31
Reserved Reserved 32
DMA FTCA interrupt 33
DMA LFSA interrupt 34
DCAN2 DCAN2 level 0 interrupt 35
Reserved Reserved 36
MIBSPI3 MIBSPI3 level 0 interrupt 37
MIBSPI3 MIBSPI3 level 1 interrupt 38
DMA HBCA interrupt 39
DMA BTCA interrupt 40
EMIF AEMIFINT3 41
DCAN2 DCAN2 level 1 interrupt 42
Reserved Reserved 43
DCAN1 DCAN1 IF3 interrupt 44
DCAN3 DCAN3 level 0 interrupt 45
DCAN2 DCAN2 IF3 interrupt 46
FPU FPU interrupt 47
Reserved Reserved 48
SPI4 SPI4 level 0 interrupt 49
MIBADC2 MibADC2 event group interrupt 50
MIBADC2 MibADC2 sw group1 interrupt 51
Reserved Reserved 52
MIBSPI5 MIBSPI5 level 0 interrupt 53
SPI4 SPI4 level 1 interrupt 54
DCAN3 DCAN3 level 1 interrupt 55
MIBSPI5 MIBSPI5 level 1 interrupt 56
MIBADC2 MibADC2 sw group2 interrupt 57
Reserved Reserved 58
MIBADC2 MibADC2 magnitude compare interrupt 59
DCAN3 DCAN3 IF3 interrupt 60
FMC FSM_DONE interrupt 61
Reserved Reserved 62
N2HET2 N2HET2 level 0 interrupt 63
SCI SCI level 0 interrupt 64
HTU2 HTU2 level 0 interrupt 65
I2C I2C level 0 interrupt 66
Reserved Reserved 67-72
N2HET2 N2HET2 level 1 interrupt 73
SCI SCI level 1 interrupt 74
HTU2 HTU2 level 1 interrupt 75
Reserved Reserved 76-79
HWAG1 HWA_INT_REQ_H 80
HWAG2 HWA_INT_REQ_H 81

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Table 6-31. Interrupt Request Assignments (continued)

Modules Interrupt Sources Default VIM Interrupt
Channel
DCC1 DCC done interrupt 82
DCC2 DCC2 done interrupt 83
Reserved Reserved 84
PBIST Controller PBIST Done Interrupt 85
Reserved Reserved 86-87
HWAG1 HWA_INT_REQ_L 88
HWAG2 HWA_INT_REQ_L 89
ePWM1INTn ePWM1 Interrupt 90
ePWM1TZINTn ePWM1 Trip Zone Interrupt 91
ePWM2INTn ePWM2 Interrupt 92
ePWM2TZINTn ePWM2 Trip Zone Interrupt 93
ePWM3INTn ePWM3 Interrupt 94
ePWM3TZINTn ePWM3 Trip Zone Interrupt 95
ePWM4INTn ePWM4 Interrupt 96
ePWM4TZINTn ePWM4 Trip Zone Interrupt 97
ePWM5INTn ePWM5 Interrupt 98
ePWM5TZINTn ePWM5 Trip Zone Interrupt 99
ePWM6INTn ePWM6 Interrupt 100
ePWM6TZINTn ePWM6 Trip Zone Interrupt 101
ePWM7INTn ePWM7 Interrupt 102
ePWM7TZINTn ePWM7 Trip Zone Interrupt 103
eCAP1INTn eCAP1 Interrupt 104
eCAP2INTn eCAP2 Interrupt 105
eCAP3INTn eCAP3 Interrupt 106
eCAP4INTn eCAP4 Interrupt 107
eCAP5INTn eCAP5 Interrupt 108
eCAP6INTn eCAP6 Interrupt 109
eQEP1INTn eQEP1 Interrupt 110
eQEP2INTn eQEP2 Interrupt 111
Reserved Reserved 112-127

NOTE
Address location 0x00000000 in the VIM RAM is reserved for the phantom interrupt ISR
entry; therefore only request channels 0..126 can be used and are offset by 1 address in the
VIM RAM.

NOTE
The EMIF_nWAIT signal has a pull-up on it. The EMIF module generates a "Wait Rise"
interrupt whenever it detects a rising edge on the EMIF_nWAIT signal. This interrupt
condition is indicated as soon as the device is powered up. This can be ignored if the
EMIF_nWAIT signal is not used in the application. If the EMIF_nWAIT signal is actually used
in the application, then the external slave memory must always drive the EMIF_nWAIT signal
such that an interrupt is not caused due to the default pull-up on this signal.

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NOTE
The lower-order interrupt channels are higher priority channels than the higher-order interrupt
channels.

NOTE
The application can change the mapping of interrupt sources to the interrupt channels
through the interrupt channel control registers (CHANCTRLx) inside the VIM module.

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6.16 DMA Controller

The DMA controller is used to transfer data between two locations in the memory map in the background
of CPU operations. Typically, the DMA is used to:
• Transfer blocks of data between external and internal data memories
• Restructure portions of internal data memory
• Continually service a peripheral

6.16.1 DMA Features

• CPU independent data transfer
• One 64-bit master port that interfaces to the Memory System.
• FIFO buffer(4 entries deep and each 64bit wide)
• Channel control information is stored in RAM protected by parity
• 16 channels with individual enable
• Channel chaining capability
• 32 peripheral DMA requests
• Hardware and Software DMA requests
• 8, 16, 32 or 64-bit transactions supported
• Multiple addressing modes for source/destination (fixed, increment, offset)
• Auto-initiation
• Power-management mode
• Memory Protection with four configurable memory regions

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6.16.2 Default DMA Request Map

The DMA module on this microcontroller has 16 channels and up to 32 hardware DMA requests. The
module contains DREQASIx registers which are used to map the DMA requests to the DMA channels. By
default, channel 0 is mapped to request 0, channel 1 to request 1, and so on.
Some DMA requests have multiple sources, as shown in Table 6-32. The application must ensure that
only one of these DMA request sources is enabled at any time.

Table 6-32. DMA Request Line Connection

Modules DMA Request Sources DMA Request
(1)
MIBSPI1 MIBSPI1[1] DMAREQ[0]
MIBSPI1 MIBSPI1[0] (2) DMAREQ[1]
SPI2 SPI2 receive DMAREQ[2]
SPI2 SPI2 transmit DMAREQ[3]
MIBSPI1 / MIBSPI3 / DCAN2 MIBSPI1[2] / MIBSPI3[2] / DCAN2 IF3 DMAREQ[4]
MIBSPI1 / MIBSPI3 / DCAN2 MIBSPI1[3] / MIBSPI3[3] / DCAN2 IF2 DMAREQ[5]
DCAN1 / MIBSPI5 DCAN1 IF2 / MIBSPI5[2] DMAREQ[6]
MIBADC1 / MIBSPI5 MIBADC1 event / MIBSPI5[3] DMAREQ[7]
MIBSPI1 / MIBSPI3 / DCAN1 MIBSPI1[4] / MIBSPI3[4] / DCAN1 IF1 DMAREQ[8]
MIBSPI1 / MIBSPI3 / DCAN2 MIBSPI1[5] / MIBSPI3[5] / DCAN2 IF1 DMAREQ[9]
MIBADC1 / I2C / MIBSPI5 MIBADC1 G1 / I2C receive / MIBSPI5[4] DMAREQ[10]
MIBADC1 / I2C / MIBSPI5 MIBADC1 G2 / I2C transmit / MIBSPI5[5] DMAREQ[11]
RTI / MIBSPI1 / MIBSPI3 RTI DMAREQ0 / MIBSPI1[6] / MIBSPI3[6] DMAREQ[12]
RTI / MIBSPI1 / MIBSPI3 RTI DMAREQ1 / MIBSPI1[7] / MIBSPI3[7] DMAREQ[13]
(1)
MIBSPI3 / MibADC2 / MIBSPI5 MIBSPI3[1] / MibADC2 event / MIBSPI5[6] DMAREQ[14]
MIBSPI3 / MIBSPI5 MIBSPI3[0] (2) / MIBSPI5[7] DMAREQ[15]
MIBSPI1 / MIBSPI3 / DCAN1 / MibADC2 MIBSPI1[8] / MIBSPI3[8] / DCAN1 IF3 / MibADC2 G1 DMAREQ[16]
MIBSPI1 / MIBSPI3 / DCAN3 / MibADC2 MIBSPI1[9] / MIBSPI3[9] / DCAN3 IF1 / MibADC2 G2 DMAREQ[17]
RTI / MIBSPI5 RTI DMAREQ2 / MIBSPI5[8] DMAREQ[18]
RTI / MIBSPI5 RTI DMAREQ3 / MIBSPI5[9] DMAREQ[19]
N2HET1 / N2HET2 / DCAN3 N2HET1 DMAREQ[4] / N2HET2 DMAREQ[4] / DCAN3 DMAREQ[20]
IF2
N2HET1 / N2HET2 / DCAN3 N2HET1 DMAREQ[5] / N2HET2 DMAREQ[5] / DCAN3 DMAREQ[21]
IF3
MIBSPI1 / MIBSPI3 / MIBSPI5 MIBSPI1[10] / MIBSPI3[10] / MIBSPI5[10] DMAREQ[22]
MIBSPI1 / MIBSPI3 / MIBSPI5 MIBSPI1[11] / MIBSPI3[11] / MIBSPI5[11] DMAREQ[23]
N2HET1 / N2HET2 / SPI4 / MIBSPI5 N2HET1 DMAREQ[6] / N2HET2 DMAREQ[6] / SPI4 DMAREQ[24]
receive / MIBSPI5[12]
N2HET1 / N2HET2 / SPI4 / MIBSPI5 N2HET1 DMAREQ[7] / N2HET2 DMAREQ[7] / SPI4 DMAREQ[25]
transmit / MIBSPI5[13]
CRC / MIBSPI1 / MIBSPI3 CRC DMAREQ[0] / MIBSPI1[12] / MIBSPI3[12] DMAREQ[26]
CRC / MIBSPI1 / MIBSPI3 CRC DMAREQ[1] / MIBSPI1[13] / MIBSPI3[13] DMAREQ[27]
LIN / MIBSPI5 LIN receive / MIBSPI5[14] DMAREQ[28]
LIN / MIBSPI5 LIN transmit / MIBSPI5[15] DMAREQ[29]
MIBSPI1 / MIBSPI3 / SCI / MIBSPI5 MIBSPI1[14] / MIBSPI3[14] / SCI receive / DMAREQ[30]
MIBSPI5[1] (1)
MIBSPI1 / MIBSPI3 / SCI / MIBSPI5 MIBSPI1[15] / MIBSPI3[15] / SCI transmit / DMAREQ[31]
MIBSPI5[0] (2)
(1) Receive DMA when configured in standard SPI mode
(2) Transmit DMA when configured in standard SPI mode

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6.17 Real Time Interrupt Module

The real-time interrupt (RTI) module provides timer functionality for operating systems and for
benchmarking code. The RTI module can incorporate several counters that define the timebases needed
for scheduling an operating system.
The timers also allow you to benchmark certain areas of code by reading the values of the counters at the
beginning and the end of the desired code range and calculating the difference between the values.

6.17.1 Features
The RTI module has the following features:
• Two independent 64 bit counter blocks
• Four configurable compares for generating operating system ticks or DMA requests. Each event can
be driven by either counter block 0 or counter block 1.
• Fast enabling/disabling of events
• Two time-stamp (capture) functions for system or peripheral interrupts, one for each counter block

6.17.2 Block Diagrams

Figure 6-17 shows a high-level block diagram for one of the two 64-bit counter blocks inside the RTI
module. Both the counter blocks are identical except the Network Time Unit (NTUx) inputs are only
available as time base inputs for the counter block 0.

31 0
Compare
up counter
RTICPUCx OVLINTx
31 0
Up counter = 31 0
RTICLK RTIUCx
Free running counter To Compare
NTU0
RTIFRCx Unit
NTU1
NTU2
NTU3
31 0 31 0
Capture Capture
up counter free running counter
RTICAUCx RTICAFRCx

CAP event source 0 External

CAP event source 1 control

Figure 6-17. Counter Block Diagram

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31 0
Update
compare
RTIUDCPy

+
31 0
Compare DMAREQy
RTICOMPy
From counter
block 0 =
From counter INTy
block 1
Compare
control

Figure 6-18. Compare Block Diagram

6.17.3 Clock Source Options

The RTI module uses the RTI1CLK clock domain for generating the RTI time bases.
The application can select the clock source for the RTI1CLK by configuring the RCLKSRC register in the
System module at address 0xFFFFFF50. The default source for RTI1CLK is VCLK.
For more information on clock sources refer to Table 6-8 and Table 6-13.

6.17.4 Network Time Synchronization Inputs

The RTI module supports 4 Network Time Unit (NTU) inputs that signal internal system events, and which
can be used to synchronize the time base used by the RTI module. On this device, these NTU inputs are
connected as shown below.

Table 6-33. Network Time Synchronization Inputs

NTU Input Source
0 Reserved
1 Reserved
2 PLL2 Clock output
3 EXTCLKIN1 clock input

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6.18 Error Signaling Module

The Error Signaling Module (ESM) manages the various error conditions on the microcontroller. The error
condition is handled based on a fixed severity level assigned to it. Any severe error condition can be
configured to drive a low level on a dedicated device terminal called nERROR. This can be used as an
indicator to an external monitor circuit to put the system into a safe state.

6.18.1 Features
The features of the Error Signaling Module are:
• 128 interrupt/error channels are supported, divided into 3 different groups
– 64 channels with maskable interrupt and configurable error pin behavior
– 32 error channels with non-maskable interrupt and predefined error pin behavior
– 32 channels with predefined error pin behavior only
• Error pin to signal severe device failure
• Configurable timebase for error signal
• Error forcing capability

6.18.2 ESM Channel Assignments

The Error Signaling Module (ESM) integrates all the device error conditions and groups them in the order
of severity. Group1 is used for errors of the lowest severity while Group3 is used for errors of the highest
severity. The device response to each error is determined by the severity group it is connected to.
Table 6-35 shows the channel assignment for each group.

Table 6-34. ESM Groups

ERROR GROUP INTERRUPT CHARACTERISTICS INFLUENCE ON ERROR PIN
Group1 maskable, low or high priority configurable
Group2 non-maskable, high priority fixed
Group3 no interrupt generated fixed

Table 6-35. ESM Channel Assignments

ERROR Condition Group Channels
Reserved Group1 0
MibADC2 - RAM parity error Group1 1
DMA - MPU configuration violation Group1 2
DMA - control packet RAM parity error Group1 3
Reserved Group1 4
DMA - error on DMA read access, imprecise error Group1 5
FMC - correctable ECC error: bus1 and bus2 interfaces Group1 6
(does not include accesses to Bank 7)
N2HET1 - RAM parity error Group1 7
HTU1/HTU2 - dual-control packet RAM parity error Group1 8
HTU1/HTU2 - MPU configuration violation Group1 9
PLL1 - Slip Group1 10
Clock Monitor - oscillator fail Group1 11
Reserved Group1 12
DMA - error on DMA write access, imprecise error Group1 13
Reserved Group1 14
VIM RAM - parity error Group1 15
Reserved Group1 16
MibSPI1 - RAM parity error Group1 17
MibSPI3 - RAM parity error Group1 18

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Table 6-35. ESM Channel Assignments (continued)

ERROR Condition Group Channels
MibADC1 - RAM parity error Group1 19
Reserved Group1 20
DCAN1 - RAM parity error Group1 21
DCAN3 - RAM parity error Group1 22
DCAN2 - RAM parity error Group1 23
MibSPI5 - RAM parity error Group1 24
Reserved Group1 25
RAM even bank (B0TCM) - correctable ECC error Group1 26
CPU - self-test failed Group1 27
RAM odd bank (B1TCM) - correctable ECC error Group1 28
Reserved Group1 29
DCC1 - error Group1 30
CCM-R4 - self-test failed Group1 31
Reserved Group1 32
Reserved Group1 33
N2HET2 - RAM parity error Group1 34
FMC - correctable ECC error (Bank 7 access) Group1 35
FMC - uncorrectable ECC error (Bank 7 access) Group1 36
IOMM - Access to unimplemented location in IOMM frame, or write access Group1 37
detected in unprivileged mode
Power domain controller compare error Group1 38
Power domain controller self-test error Group1 39
eFuse Controller Error – this error signal is generated when any bit in the eFuse Group1 40
controller error status register is set. The application can choose to generate an
interrupt whenever this bit is set to service any eFuse controller error conditions.
eFuse Controller - Self Test Error. This error signal is generated only when a self Group1 41
test on the eFuse controller generates an error condition. When an ECC self test
error is detected, group 1 channel 40 error signal will also be set.
PLL#2 - Slip Group1 42
Reserved Group1 43
Reserved Group1 44
Reserved Group1 45
Reserved Group1 46
Reserved Group1 47
Reserved Group1 48
Reserved Group1 49
Reserved Group1 50
Reserved Group1 51
Reserved Group1 52
Reserved Group1 53
Reserved Group1 54
Reserved Group1 55
Reserved Group1 56
Reserved Group1 57
Reserved Group1 58
Reserved Group1 59
Reserved Group1 60
Reserved Group1 61
DCC2 - error Group1 62

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Table 6-35. ESM Channel Assignments (continued)

ERROR Condition Group Channels
Reserved Group1 63
Reserved Group2 0
Reserved Group2 1
CCMR4 - dual-CPU lock-step error Group2 2
Reserved Group2 3
FMC - uncorrectable address parity error on accesses to main flash Group2 4
Reserved Group2 5
RAM even bank (B0TCM) - uncorrectable redundant address decode error Group2 6
Reserved Group2 7
RAM odd bank (B1TCM) - uncorrectable redundant address decode error Group2 8
Reserved Group2 9
RAM even bank (B0TCM) - address bus parity error Group2 10
Reserved Group2 11
RAM odd bank (B1TCM) - address bus parity error Group2 12
Reserved Group2 13
Reserved Group2 14
Reserved Group2 15
TCM - ECC live lock detect Group2 16
Reserved Group2 17
Reserved Group2 18
Reserved Group2 19
Reserved Group2 20
Reserved Group2 21
Reserved Group2 22
Reserved Group2 23
Windowed Watchdog (WWD) violation Group2 24
Reserved Group2 25
Reserved Group2 26
Reserved Group2 27
Reserved Group2 28
Reserved Group2 29
Reserved Group2 30
Reserved Group2 31
Reserved Group3 0
eFuse Farm - autoload error Group3 1
Reserved Group3 2
RAM even bank (B0TCM) - ECC uncorrectable error Group3 3
Reserved Group3 4
RAM odd bank (B1TCM) - ECC uncorrectable error Group3 5
Reserved Group3 6
FMC - uncorrectable ECC error: ATCM and Flash OTP interfaces Group3 7
(does not include address parity error and errors on accesses to Bank 7 data
memory)
Reserved Group3 8
Reserved Group3 9
Reserved Group3 10
Reserved Group3 11
Reserved Group3 12

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6.19 Reset / Abort / Error Sources

Table 6-36. Reset/Abort/Error Sources

ESM HOOKUP
ERROR SOURCE SYSTEM MODE ERROR RESPONSE
group.channel
CPU TRANSACTIONS
Precise write error (NCNB/Strongly Ordered) User/Privilege Precise Abort (CPU) n/a
Precise read error (NCB/Device or Normal) User/Privilege Precise Abort (CPU) n/a
Imprecise write error (NCB/Device or Normal) User/Privilege Imprecise Abort (CPU) n/a
Undefined Instruction Trap
Illegal instruction User/Privilege n/a
(CPU) (1)
MPU access violation User/Privilege Abort (CPU) n/a
SRAM
B0 TCM (even) ECC single error (correctable) User/Privilege ESM 1.26
Abort (CPU), ESM =>
B0 TCM (even) ECC double error (non-correctable) User/Privilege 3.3
nERROR
B0 TCM (even) uncorrectable error (for example, redundant
User/Privilege ESM => NMI => nERROR 2.6
address decode)
B0 TCM (even) address bus parity error User/Privilege ESM => NMI => nERROR 2.10
B1 TCM (odd) ECC single error (correctable) User/Privilege ESM 1.28
Abort (CPU), ESM =>
B1 TCM (odd) ECC double error (non-correctable) User/Privilege 3.5
nERROR
B1 TCM (odd) uncorrectable error (for example, redundant
User/Privilege ESM => NMI => nERROR 2.8
address decode)
B1 TCM (odd) address bus parity error User/Privilege ESM => NMI => nERROR 2.12
FLASH WITH CPU BASED ECC
FMC correctable error - Bus1 and Bus2 interfaces (does not
User/Privilege ESM 1.6
include accesses to Bank 7)
FMC uncorrectable error - Bus1 and Bus2 accesses Abort (CPU), ESM =>
User/Privilege 3.7
(does not include address parity error) nERROR
FMC uncorrectable error - address parity error on Bus1
User/Privilege ESM => NMI => nERROR 2.4
accesses
FMC correctable error - Accesses to Bank 7 User/Privilege ESM 1.35
FMC uncorrectable error - Accesses to Bank 7 User/Privilege ESM 1.36
DMA TRANSACTIONS
External imprecise error on read (Illegal transaction with ok
User/Privilege ESM 1.5
response)
External imprecise error on write (Illegal transaction with ok
User/Privilege ESM 1.13
response)
Memory access permission violation User/Privilege ESM 1.2
Memory parity error User/Privilege ESM 1.3
High-End Timer Transfer Unit 1 (HTU1)
NCNB (Strongly Ordered) transaction with slave error response User/Privilege Interrupt => VIM n/a
External imprecise error (Illegal transaction with ok response) User/Privilege Interrupt => VIM n/a
Memory access permission violation User/Privilege ESM 1.9
Memory parity error User/Privilege ESM 1.8
High-End Timer Transfer Unit 2 (HTU2)
NCNB (Strongly Ordered) transaction with slave error response User/Privilege Interrupt => VIM n/a
External imprecise error (Illegal transaction with ok response) User/Privilege Interrupt => VIM n/a
Memory access permission violation User/Privilege ESM 1.9
Memory parity error User/Privilege ESM 1.8

(1) The Undefined Instruction TRAP is NOT detectable outside the CPU. The trap is taken only if the instruction reaches the execute stage
of the CPU.
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Table 6-36. Reset/Abort/Error Sources (continued)

ESM HOOKUP
ERROR SOURCE SYSTEM MODE ERROR RESPONSE
group.channel
N2HET1
Memory parity error User/Privilege ESM 1.7
N2HET2
Memory parity error User/Privilege ESM 1.34
MIBSPI
MibSPI1 memory parity error User/Privilege ESM 1.17
MibSPI3 memory parity error User/Privilege ESM 1.18
MibSPI5 memory parity error User/Privilege ESM 1.24
MIBADC
MibADC1 Memory parity error User/Privilege ESM 1.19
MibADC2 Memory parity error User/Privilege ESM 1.1
DCAN
DCAN1 memory parity error User/Privilege ESM 1.21
DCAN2 memory parity error User/Privilege ESM 1.23
DCAN3 memory parity error User/Privilege ESM 1.22
PLL
PLL slip error User/Privilege ESM 1.10
PLL #2 slip error User/Privilege ESM 1.42
CLOCK MONITOR
Clock monitor interrupt User/Privilege ESM 1.11
DCC
DCC1 error User/Privilege ESM 1.30
DCC2 error User/Privilege ESM 1.62
CCM-R4
Self test failure User/Privilege ESM 1.31
Compare failure User/Privilege ESM => NMI => nERROR 2.2
VIM
Memory parity error User/Privilege ESM 1.15
VOLTAGE MONITOR
VMON out of voltage range n/a Reset n/a
CPU SELFTEST (LBIST)
CPU Selftest (LBIST) error User/Privilege ESM 1.27
PIN MULTIPLEXING CONTROL
Mux configuration error User/Privilege ESM 1.37
POWER DOMAIN CONTROL
PSCON compare error User/Privilege ESM 1.38
PSCON self-test error User/Privilege ESM 1.39
eFuse CONTROLLER
eFuse Controller Autoload error User/Privilege ESM => nERROR 3.1
eFuse Controller - Any bit set in the error status register User/Privilege ESM 1.40
eFuse Controller self-test error User/Privilege ESM 1.41
WINDOWED WATCHDOG
WWD Non-Maskable Interrupt exception n/a ESM => NMI => nERROR 2.24
ERRORS REFLECTED IN THE SYSESR REGISTER
Power-Up Reset n/a Reset n/a
Oscillator fail / PLL slip (2) n/a Reset n/a

(2) Oscillator fail/PLL slip can be configured in the system register (SYS.PLLCTL1) to generate a reset.
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Table 6-36. Reset/Abort/Error Sources (continued)

ESM HOOKUP
ERROR SOURCE SYSTEM MODE ERROR RESPONSE
group.channel
Watchdog exception n/a Reset n/a
CPU Reset (driven by the CPU STC) n/a Reset n/a
Software Reset n/a Reset n/a
External Reset n/a Reset n/a

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6.20 Digital Windowed Watchdog

This device includes a digital windowed watchdog (DWWD) module that protects against runaway code
execution.
The DWWD module allows the application to configure the time window within which the DWWD module
expects the application to service the watchdog. A watchdog violation occurs if the application services the
watchdog outside of this window, or fails to service the watchdog at all. The application can choose to
generate a system reset or an ESM group2 error signal in case of a watchdog violation.
The watchdog is disabled by default and must be enabled by the application. Once enabled, the watchdog
can only be disabled upon a system reset.

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6.21 Debug Subsystem

6.21.1 Block Diagram

The device contains an ICEPICK module to allow JTAG access to the scan chains.

Boundary Scan
Boundary Scan I/F
TRST
BSR/BSDL Debug
TMS ROM1
TCK
RTCK Debug APB
TDI
TDO Secondary Tap 0 DAP
APB Mux
AHB-AP APB slave
POM Cortex
R4F
to SCR1 via A2A from
ICEPICK_C

PCR1/Bridge

Secondary Tap 2
AJSM
Test Tap 0
eFuse Farm

Test Tap 1
PSCON

Figure 6-19. Debug Subsystem Block Diagram

6.21.2 Debug Components Memory Map

Table 6-37. Debug Components Memory Map

FRAME ADDRESS RANGE RESPNSE FOR ACCESS TO
FRAME CHIP FRAME ACTUA
MODULE NAME UNIMPLEMENTED LOCATIONS IN
SELECT START END SIZE L SIZE
FRAME
CoreSight Debug Reads return zeros, writes have no
CSCS0 0xFFA0_0000 0xFFA0_0FFF 4KB 4KB
ROM effect
Cortex-R4F Reads return zeros, writes have no
CSCS1 0xFFA0_1000 0xFFA0_1FFF 4KB 4KB
Debug effect

6.21.3 JTAG Identification Code

The JTAG ID code for this device is the same as the device ICEPick Identification Code.

Table 6-38. JTAG ID Code

Silicon Revision ID
Rev A 0x0B95502F
Rev B 0x2B95502F
Rev C 0x3B95502F

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6.21.4 Debug ROM

The Debug ROM stores the location of the components on the Debug APB bus:

Table 6-39. Debug ROM table

ADDRESS DESCRIPTION VALUE
0x000 pointer to Cortex-R4F 0x0000 1003
0x001 Reserved 0x0000 2002
0x002 Reserved 0x0000 3002
0x003 POM 0x0000 4003
0x004 end of table 0x0000 0000

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6.21.5 JTAG Scan Interface Timings

Table 6-40. JTAG Scan Interface Timing (1)

No. Parameter Min MAX Unit
fTCK TCK frequency (at HCLKmax) 12 MHz
fRTCK RTCK frequency (at TCKmax and HCLKmax) 10 MHz
1 td(TCK -RTCK) Delay time, TCK to RTCK 24 ns
2 tsu(TDI/TMS - RTCKr) Setup time, TDI, TMS before RTCK rise (RTCKr) 26 ns
3 th(RTCKr -TDI/TMS) Hold time, TDI, TMS after RTCKr 0 ns
4 th(RTCKr -TDO) Hold time, TDO after RTCKf 0 ns
5 td(TCKf -TDO) Delay time, TDO valid after RTCK fall (RTCKf) 12 ns
(1) Timings for TDO are specified for a maximum of 50pF load on TDO

TCK

RTCK

1 1

TMS
TDI
2
3

TDO

4
5

Figure 6-20. JTAG Timing

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6.21.6 Advanced JTAG Security Module

This device includes a an Advanced JTAG Security Module (AJSM). which provides maximum security to
the device’s memory content by allowing users to secure the device after programming.

Flash Module Output

OTP Contents
(example)
H L H L ... H L L H
Unlock By Scan ...
Register

Internal Tie-Offs L L H H H H L L
(example only)

UNLOCK
128-bit comparator

Internal Tie-Offs H L L H H L L H
(example only)
Figure 6-21. AJSM Unlock

The device is unsecure by default by virtue of a 128-bit visible unlock code programmed in the OTP
address 0xF0000000.The OTP contents are XOR-ed with the "Unlock By Scan" register contents. The
outputs of these XOR gates are again combined with a set of secret internal tie-offs. The output of this
combinational logic is compared against a secret hard-wired 128-bit value. A match results in the
UNLOCK signal being asserted, so that the device is now unsecure.
A user can secure the device by changing at least one bit in the visible unlock code from 1 to 0. Changing
a 0 to 1 is not possible since the visible unlock code is stored in the One Time Programmable (OTP) flash
region. Also, changing all the 128 bits to zeros is not a valid condition and will permanently secure the
device.
Once secured, a user can unsecure the device by scanning an appropriate value into the "Unlock By
Scan" register of the AJSM module. This register is accessible by configuring an IR value of 0b1011 on
the AJSM TAP. The value to be scanned is such that the XOR of the OTP contents and the Unlock-By-
Scan register contents results in the original visible unlock code.
The Unlock-By-Scan register is reset only upon asserting power-on reset (nPORRST).
A secure device only permits JTAG accesses to the AJSM scan chain through the Secondary Tap # 2 of
the ICEPick module. All other secondary taps, test taps and the boundary scan interface are not
accessible in this state.

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6.21.7 Boundary Scan Chain

The device supports BSDL-compliant boundary scan for testing pin-to-pin compatibility. The boundary
scan chain is connected to the Boundary Scan Interface of the ICEPICK module.

Device Pins (conceptual)

TRST TDI
IC E P ICK

TMS Boundary Scan Interface

Boundary
TCK Scan TDO
RTCK
TDI
TDO BSDL

Figure 6-22. Boundary Scan Implementation (Conceptual Diagram)

Data is serially shifted into all boundary-scan buffers through TDI, and out through TDO.

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7 Peripheral Information and Electrical Specifications

7.1 Enhanced Translator PWM Modules (ePWM)
Figure 7-1 illustrates the connections between the seven ePWM modules (ePWM1,2,3,4,5,6,7) on the
device.

PINMMR36[25]

NHET1_LOOP_SYNC
EPWMSYNCI

EPWM1A
VIM EPWM1TZINTn

VIM EPWM1INTn
EPWM1B
TZ1/2/3n
ADC Wrapper Mux SOCA1, SOCB1
Selector EPWM1
VBus32
EQEP1 + EQEP2 EQEP1ERR / EQEP2ERR / TZ4n
EQEP1ERR or EQEP2ERR
System Module OSC FAIL or PLL Slip VCLK4, SYS_nRST
TZ5n
Debug Mode Entry EPWM1ENCLK
CPU TBCLKSYNC
TZ6n

EPWM2/3/4/5/6TZINTn EPWM2/3/4/5/6A
VIM

VIM EPWM2/3/4/5/6INTn
EPWM2/3/4/5/6B

IOMUX
TZ1/2/3n
ADC Wrapper Mux SOCA2/3/4/5/6
Selector EPWM
SOCB2/3/4/5/6
2/3/4/5/6 VBus32
EQEP1 + EQEP2 EQEP1ERR / EQEP2ERR / TZ4n
EQEP1ERR or EQEP2ERR VCLK4, SYS_nRST
System Module OSC FAIL or PLL Slip TZ5n EPWM2/3/4/5/6ENCLK
CPU Debug Mode Entry TBCLKSYNC
TZ6n

EPWM7TZINTn EPWM7A
VIM

VIM EPWM7INTn
EPWM7B
TZ1/2/3n
Mux SOCA7, SOCB7
ADC Wrapper Selector EPWM
7 VBus32
EQEP1 + EQEP2 EQEP1ERR / EQEP2ERR /
TZ4n
EQEP1ERR or EQEP2ERR
System Module OSC FAIL or PLL SLip VCLK4, SYS_nRST
TZ5n
EPWM7ENCLK
CPU Debug Mode Entry TBCLKSYNC
TZ6n

Pulse
Stretch, EPWMSYNCO
8 VCLK4
cycles

VBus32 / VBus32DP ECAP ECAP1

ECAP1INTn 1
VIM

Figure 7-1. ePWMx Module Interconnections

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7.1.1 ePWM Clocking and Reset

Each ePWM module has a clock enable (EPWMxENCLK). When SYS_nRST is active low, the clock
enables are ignored and the ePWM logic is clocked so that it can reset to a proper state. When
SYS_nRST goes in-active high, the state of clock enable is respected.

Table 7-1. ePWMx Clock Enable Control

ePWM Module Instance Control Register to Enable Clock Default Value
ePWM1 PINMMR37[8] 1
ePWM2 PINMMR37[16] 1
ePWM3 PINMMR37[24] 1
ePWM4 PINMMR38[0] 1
ePWM5 PINMMR38[8] 1
ePWM6 PINMMR38[16] 1
ePWM7 PINMMR38[24] 1

The default value of the control registers to enable the clocks to the ePWMx modules is 1. This means
that the VCLK4 clock connections to the ePWMx modules are enabled by default. The application can
choose to gate off the VCLK4 clock to any ePWMx module individually by clearing the respective control
register bit.

7.1.2 Synchronization of ePWMx Time Base Counters

A time-base synchronization scheme connects all of the ePWM modules on a device. Each ePWM
module has a synchronization input (EPWMxSYNCI) and a synchronization output (EPWMxSYNCO). The
input synchronization for the first instance (ePWM1) comes from an external pin. Figure 7-1 shows the
synchronization connections for all the ePWMx modules. Each ePWM module can be configured to use or
ignore the synchronization input. Refer to the ePWM chapter in the TMS570LS12x/11x Technical
Reference Manual (SPNU515) for more information.

7.1.3 Synchronizing all ePWM Modules to the N2HET1 Module Time Base
The connection between the N2HET1_LOOP_SYNC and SYNCI input of ePWM1 module is implemented
as shown in Figure 7-2.

N2HET1_LOOP_SYNC EXT_LOOP_SYNC
N2HET1 N2HET2

2 VCLK4 cycles
Pulse Strength
SYNCI
ePWM1
ePWM1_SYNCI

ePWM1_SYNCI_SYNCED
PINMMR36[25]
ePWM1_SYNCI_FILTERED

PINMMR47[8,9,10]
Figure 7-2. Synchronizing Time Bases Between N2HET1, N2HET2 and ePWMx Modules

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7.1.4 Phase-Locking the Time-Base Clocks of Multiple ePWM Modules

The TBCLKSYNC bit can be used to globally synchronize the time-base clocks of all enabled ePWM
modules on a device. This bit is implemented as PINMMR37 register bit 1.
When TBCLKSYNC = 0, the time-base clock of all ePWM modules is stopped. This is the default
condition.
When TBCLKSYNC = 1, all ePWM time-base clocks are started with the rising edge of TBCLK aligned.
For perfectly synchronized TBCLKs, the prescaler bits in the TBCTL register of each ePWM module must
be set identically. The proper procedure for enabling the ePWM clocks is as follows:
1. Enable the individual ePWM module clocks (if disable) using the control registers shown in Table 7-1.
2. Configure TBCLKSYNC = 0. This will stop the time-base clock within any enabled ePWM module.
3. Configure the prescaler values and desired ePWM modes.
4. Configure TBCLKSYNC = 1.

7.1.5 ePWM Synchronization with External Devices

The output sync from EPWM1 Module is also exported to a device output terminal so that multiple devices
can be synchronized together. The signal pulse is stretched by eight VCLK4 cycles before being exported
on the terminal as the EPWM1SYNCO signal.

7.1.6 ePWM Trip Zones

The ePWMx modules have six trip zone inputs each. These are active-low signals. The application can
control the ePWMx module response to each of the trip zone input separately. The timing requirements
from the assertion of the trip zone inputs to the actual response are specified in Section 7.1.8.

7.1.6.1 Trip Zones TZ1n, TZ2n, TZ3n

These three trip zone inputs are driven by external circuits and are connected to device-level inputs.
These signals are either connected asynchronously to the ePWMx trip zone inputs, or double-
synchronized with VCLK4, or double-synchronized and then filtered with a 6-cycle VCLK4-based counter
before connecting to the ePWMx. By default, the trip zone inputs are asynchronously connected to the
ePWMx modules.

Table 7-2. Connection to ePWMx Modules for Device-Level Trip Zone Inputs
Trip Zone Input Control for Control for Double-Synchronized Control for Double-Synchronized and Filtered
Asynchronous Connection to ePWMx Connection to ePWMx
Connection to ePWMx
TZ1n PINMMR46[16] = 1 PINMMR46[16] = 0 AND PINMMR46[16] = 0 AND PINMMR46[17] = 0
PINMMR46[17] = 1 AND PINMMR46[18] = 1
TZ2n PINMMR46[24] = 1 PINMMR46[24] = 0 AND PINMMR46[24] = 0 AND PINMMR46[25] = 0
PINMMR46[25] = 1 AND PINMMR46[26] = 1
TZ3n PINMMR47[0] = 1 PINMMR47[0] = 0 AND PINMMR47[1] PINMMR47[0] = 0 AND PINMMR47[1] = 0 AND
=1 PINMMR47[2] = 1

7.1.6.2 Trip Zone TZ4n

This trip zone input is dedicated to eQEPx error indications. There are two eQEP modules on this device.
Each eQEP module indicates a phase error by driving its EQEPxERR output High. The following control
registers allow the application to configure the trip zone input (TZ4n) to each ePWMx module based on
the application’s requirements.

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Table 7-3. TZ4n Connections for ePWMx Modules

ePWMx Control for TZ4n = Control for TZ4n = not(EQEP1ERR) Control for TZ4n = not(EQEP2ERR)
not(EQEP1ERR OR
EQEP2ERR)
ePWM1 PINMMR41[0] = 1 PINMMR41[0] = 0 AND PINMMR41[1] PINMMR41[0] = 1 AND PINMMR41[1] = 0 AND
=1 PINMMR41[2] = 1
ePWM2 PINMMR41[8] PINMMR41[8] = 0 AND PINMMR41[9] PINMMR41[8] = 1 AND PINMMR41[9] = 0 AND
=1 PINMMR41[10] = 1
ePWM3 PINMMR41[16] PINMMR41[16] = 0 AND PINMMR41[16] = 1 AND PINMMR41[17] = 0
PINMMR41[17] = 1 AND PINMMR41[18] = 1
ePWM4 PINMMR41[24] PINMMR41[24] = 0 AND PINMMR41[24] = 1 AND PINMMR41[25] = 0
PINMMR41[25] = 1 AND PINMMR41[26] = 1
ePWM5 PINMMR42[0] PINMMR42[0] = 0 AND PINMMR42[1] PINMMR42[0] = 1 AND PINMMR42[1] = 0 AND
=1 PINMMR42[2] = 1
ePWM6 PINMMR42[8] PINMMR42[8] = 0 AND PINMMR42[9] PINMMR42[8] = 1 AND PINMMR42[9] = 0 AND
=1 PINMMR42[10] = 1
ePWM7 PINMMR42[16] PINMMR42[16] = 0 AND PINMMR42[16] = 1 AND PINMMR42[17] = 0
PINMMR42[17] = 1 AND PINMMR42[18] = 1

7.1.6.3 Trip Zone TZ5n

This trip zone input is dedicated to a clock failure on the device. That is, this trip zone input is asserted
whenever an oscillator failure or a PLL slip is detected on the device. The application can use this trip
zone input for each ePWMx module in order to prevent the external system from going out of control when
the device clocks are not within expected range (system running at limp clock).
The oscillator failure and PLL slip signals used for this trip zone input are taken from the status flags in the
system module. These are level signals are set until cleared by the application.

7.1.6.4 Trip Zone TZ6n

This trip zone input to the ePWMx modules is dedicated to a debug mode entry of the CPU. If enabled,
the user can force the PWM outputs to a known state when the emulator stops the CPU. This prevents the
external system from going out of control when the CPU is stopped.

7.1.7 Triggering of ADC Start of Conversion Using ePWMx SOCA and SOCB Outputs
A special scheme is implemented in order to select the actual signal used for triggering the start of
conversion on the two ADCs on this device. This scheme is defined in Section 7.4.2.3.

7.1.8 Enhanced Translator-Pulse Width Modulator (ePWMx) Timings

Table 7-4. ePWMx Timing Requirements

PARAMETER TEST CONDITIONS MIN MAX UNIT
tw(SYNCIN) Synchronization input pulse width Asynchronous 2 tc(VCLK4) cycles
Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter

Table 7-5. ePWMx Switching Characteristics

PARAMETER TEST CONDITIONS MIN MAX UNIT
tw(PWM) Pulse duration, ePWMx output high or low 33.33 ns
tw(SYNCOUT Synchronization Output Pulse Width 8 tc(VCLK4) cycles
)
td(PWM)tza Delay time, trip input active to PWM forced high, no pin load 25 ns
OR Delay time, trip input active to PWM forced
low

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Table 7-5. ePWMx Switching Characteristics (continued)

PARAMETER TEST CONDITIONS MIN MAX UNIT
td(TZ- Delay time, trip input active to PWM Hi-Z 20 ns
PWM)HZ

Table 7-6. ePWMx Trip-Zone Timing Requirements

PARAMETER TEST CONDITIONS MIN MAX UNIT
tw(TZ) Pulse duration, TZn input low Asynchronous 2 * HSPCLKDIV * ns
CLKDIV * tc(VCLK4) (1)
Synchronous 2 tc(VCLK4) ns
Synchronous, with input 8 tc(VCLK4) ns
filter
(1) Refer to the ePWM chapter of the TMS570LS12x/11x Technical Reference Manual (SPNU515) for more information on the clock divider
fields HSPCLKDIV and CLKDIV.

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7.2 Enhanced Capture Modules (eCAP)

Figure 7-3 shows how the eCAP modules are interconnected on this microcontroller.

EPWM1SYNCO

ECAP1SYNCI

ECAP1

VIM ECAP1INTn ECAP1

VBus32

VCLK4, SYS_nRST

ECAP1ENCLK
ECAP1SYNCO

ECAP2SYNCI

IOMUX
ECAP2

VIM ECAP2INTn ECAP

2/3/4/5
VBus32

VCLK4, SYS_nRST

ECAP2SYNCO ECAP2ENCLK

ECAP6

VIM ECAP VBus32

ECAP6INTn 6
VCLK4, SYS_nRST

ECAP6ENCLK

Figure 7-3. eCAP Module Connections

7.2.1 Clock Enable Control for eCAPx Modules

Each of the ECAPx modules have a clock enable (ECAPxENCLK). These signals need to be generated
from a device-level control register. When SYS_nRST is active low, the clock enables are ignored and the
ECAPx logic is clocked so that it can reset to a proper state. When SYS_nRST goes in-active high, the
state of clock enable is respected.

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Table 7-7. eCAPx Clock Enable Control

ePWM Module Instance Control Register to Enable Clock Default Value
eCAP1 PINMMR39[0] 1
eCAP2 PINMMR39[8] 1
eCAP3 PINMMR39[16] 1
eCAP4 PINMMR39[24] 1
eCAP5 PINMMR40[0] 1
eCAP6 PINMMR40[8] 1

The default value of the control registers to enable the clocks to the eCAPx modules is 1. This means that
the VCLK4 clock connections to the eCAPx modules are enabled by default. The application can choose
to gate off the VCLK4 clock to any eCAPx module individually by clearing the respective control register
bit.

7.2.2 PWM Output Capability of eCAPx

When not used in capture mode, each of the eCAPx modules can be used as a single-channel PWM
output. This is called the auxiliary PWM (APWM) mode of operation of the eCAP modules. Refer to the
eCAP chapter of the TMS570LS12x/11x Technical Reference Manual (SPNU515) for more information.

7.2.3 Input Connection to eCAPx Modules

The input connection to each of the eCAP modules can be selected between a double-VCLK4-
synchronized input or a double-VCLK4-synchronized and filtered input, as shown in Table 7-8.

Table 7-8. Device-Level Input Connection to eCAPx Modules

Input Signal Control for Double-Synchronized Connection to Control for Double-Synchronized and Filtered
eCAPx Connection to eCAPx
eCAP1 PINMMR43[0] = 1 PINMMR43[0] = 0 AND PINMMR43[1] = 1
eCAP2 PINMMR43[8] = 1 PINMMR43[8] = 0 AND PINMMR43[9] = 1
eCAP3 PINMMR43[16] = 1 PINMMR43[16] = 0 AND PINMMR43[17] = 1
eCAP4 PINMMR43[24] = 1 PINMMR43[24] = 0 AND PINMMR43[25] = 1
eCAP5 PINMMR44[0] = 1 PINMMR44[0] = 0 AND PINMMR44[1] = 1
eCAP6 PINMMR44[8] = 1 PINMMR44[8] = 0 AND PINMMR44[9] = 1

7.2.4 Enhanced Capture Module (eCAP) Timings

Table 7-9. eCAPx Timing Requirements

PARAMETER TEST CONDITIONS MIN MAX UNIT
tw(CAP) Capture input pulse width Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter

Table 7-10. eCAPx Switching Characteristics

PARAMETER TEST CONDITIONS MIN MAX UNIT
tw(APWM) Pulse duration, APWMx output high or low 20 ns

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7.3 Enhanced Quadrature Encoder (eQEP)

Figure 7-4 shows the eQEP module interconnections on the device.

VBus32
EQEP1A
EQEP1ENCLK EQEP1B
VCLK4
SYS_nRST
EQEP1 EQEP1I
EPWM1/../7 VIM EQEP1INTn EQEP1IO
Module EQEP1IOE

EQEP1ERR EQEP1S
EQEP1SO
TZ4n

EQEP1SOE

IO
Mux
VBus32
EQEP2A
EQEP2ENCLK EQEP2B
VCLK4
SYS_nRST
EQEP2 EQEP2I
VIM EQEP2INTn EQEP2IO
Module EQEP2IOE
Connection
Selection EQEP2ERR EQEP2S
Mux EQEP2SO
EQEP2SOE

Figure 7-4. eQEP Module Interconnections

7.3.1 Clock Enable Control for eQEPx Modules

Device-level control registers are implemented to generate the EQEPxENCLK signals. When SYS_nRST
is active low, the clock enables are ignored and the eQEPx logic is clocked so that it can reset to a proper
state. When SYS_nRST goes in-active high, the state of clock enable is respected.

Table 7-11. eQEPx Clock Enable Control

ePWM Module Instance Control Register to Enable Clock Default Value
eQEP1 PINMMR40[16] 1
eQEP2 PINMMR40[24] 1

The default value of the control registers to enable the clocks to the eQEPx modules is 1. This means that
the VCLK4 clock connections to the eQEPx modules are enabled by default. The application can choose
to gate off the VCLK4 clock to any eQEPx module individually by clearing the respective control register
bit.

7.3.2 Using eQEPx Phase Error to Trip ePWMx Outputs

The eQEP module sets the EQEPERR signal output whenever a phase error is detected in its inputs
EQEPxA and EQEPxB. This error signal from both the eQEP modules is input to the connection selection
multiplexor. This multiplexor is defined in Table 7-3. As shown in Figure 7-1, the output of this selection
multiplexor is inverted and connected to the TZ4n trip-zone input of all EPWMx modules. This connection
allows the application to define the response of each ePWMx module on a phase error indicated by the
eQEP modules.

7.3.3 Input Connections to eQEPx Modules

The input connections to each of the eQEP modules can be selected between a double-VCLK4-
synchronized input or a double-VCLK4-synchronized and filtered input, as shown in Table 7-12.
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Table 7-12. Device-Level Input Connection to eCAPx Modules

Input Signal Control for Double-Synchronized Connection to Control for Double-Synchronized and Filtered
eQEPx Connection to eQEPx
eQEP1A PINMMR44[16] = 1 PINMMR44[16] = 0 and PINMMR44[17] = 1
eQEP1B PINMMR44[24] = 1 PINMMR44[24] = 0 and PINMMR44[25] = 1
eQEP1I PINMMR45[0] = 1 PINMMR45[0] = 0 and PINMMR45[1] = 1
eQEP1S PINMMR45[8] = 1 PINMMR45[8] = 0 and PINMMR45[9] = 1
eQEP2A PINMMR45[16] = 1 PINMMR45[16] = 0 and PINMMR45[17] = 1
eQEP2B PINMMR45[24] = 1 PINMMR45[24] = 0 and PINMMR45[25] = 1
eQEP2I PINMMR46[0] = 1 PINMMR46[0] = 0 and PINMMR46[1] = 1
eQEP2S PINMMR46[8] = 1 PINMMR46[8] = 0 and PINMMR46[9] = 1

7.3.4 Enhanced Quadrature Encoder Pulse (eQEPx) Timing

Table 7-13. eQEPx Timing Requirements

PARAMETER TEST CONDITIONS MIN MAX UNIT
tw(QEPP) QEP input period Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter
tw(INDEXH) QEP Index Input High Time Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter
tw(INDEXL) QEP Index Input Low Time Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter
tw(STROBH) QEP Strobe Input High Time Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter
tw(STROBL) QEP Strobe Input Low Time Synchronous 2 tc(VCLK4) cycles
Synchronous, with input 2 tc(VCLK4) + filter width cycles
filter

Table 7-14. eQEPx Switching Characteristics

PARAMETER MIN MAX UNIT
td(CNTR)xin Delay time, external clock to counter increment 4 tc(VCLK4) cycles
td(PCS-OUT)QEP Delay time, QEP input edge to position compare sync output 6 tc(VCLK4) cycles

7.4 Multibuffered 12bit Analog-to-Digital Converter

The multibuffered A-to-D converter (MibADC) has a separate power bus for its analog circuitry that
enhances the A-to-D performance by preventing digital switching noise on the logic circuitry which could
be present on VSS and VCC from coupling into the A-to-D analog stage. All A-to-D specifications are given
with respect to ADREFLO unless otherwise noted.

Table 7-15. MibADC Overview

Description Value
Resolution 12 bits
Monotonic Assured
Output conversion code 00h to 3FFh [00 for VAI ≤ ADREFLO; 3FFh for VAI ≥ ADREFHI]

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7.4.1 Features
• 12-bit resolution
• ADREFHI and ADREFLO pins (high and low reference voltages)
• Total Sample/Hold/Convert time: 600ns Minimum at 30MHz ADCLK
• One memory region per conversion group is available (event, group 1, group 2)
• Allocation of channels to conversion groups is completely programmable
• Supports flexible channel conversion order
• Memory regions are serviced either by interrupt or by DMA
• Programmable interrupt threshold counter is available for each group
• Programmable magnitude threshold interrupt for each group for any one channel
• Option to read either 8-bit, 10-bit or 12-bit values from memory regions
• Single or continuous conversion modes
• Embedded self-test
• Embedded calibration logic
• Enhanced power-down mode
– Optional feature to automatically power down ADC core when no conversion is in progress
• External event pin (ADxEVT) programmable as general-purpose I/O

7.4.2 Event Trigger Options

The ADC module supports 3 conversion groups: Event Group, Group1 and Group2. Each of these 3
groups can be configured to be hardware event-triggered. In that case, the application can select from
among 8 event sources to be the trigger for a group's conversions.

7.4.2.1 MIBADC1 Event Trigger Hookup

Table 7-16. MIBADC1 Event Trigger Hookup

Trigger Event Signal
Group Source
Select, G1SRC, PINMMR30[0] = 0 and PINMMR30[1] = 1
Event # PINMMR30[0] = 1
G2SRC or
(default) Control for Control for
EVSRC Option A Option B
Option A Option B
000 1 AD1EVT AD1EVT — AD1EVT —
PINMMR30[8] = 0
001 2 N2HET1[8] N2HET2[5] PINMMR30[8] = 1 ePWM_B and
PINMMR30[9] = 1
010 3 N2HET1[10] N2HET1[27] — N2HET1[27] —
PINMMR30[16] =
RTI Compare 0 RTI Compare 0 PINMMR30[16] = 0 and
011 4 ePWM_A1
Interrupt Interrupt 1 PINMMR30[17] =
1
100 5 N2HET1[12] N2HET1[17] — N2HET1[17] —
PINMMR30[24] =
PINMMR30[24] = 0 and
101 6 N2HET1[14] N2HET1[19] N2HET2[1]
1 PINMMR30[25] =
1
PINMMR31[0] = 0
110 7 GIOB[0] N2HET1[11] PINMMR31[0] = 1 ePWM_A2 and
PINMMR31[1] = 1
PINMMR31[8] = 0
PINMMR32[16] =
111 8 GIOB[1] N2HET2[13] ePWM_AB and
1
PINMMR31[9] = 1

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NOTE
If ADEVT, N2HET1 or GIOB is used as a trigger source, the connection to the MibADC1
module trigger input is made from the output side of the input buffer. This way, a trigger
condition can be generated either by configuring the function as output onto the pad (through
the mux control), or by driving the function from an external trigger source as input. If the
mux control module is used to select different functionality instead of the ADEVT, N2HET1[x]
or GIOB[x] signals, then care must be taken to disable these signals from triggering
conversions; there is no multiplexing on the input connections.

If ePWM_B, ePWM_S2, ePWM_AB, N2HET2[1], N2HET2[5], N2HET2[13],

N2HET1[11], N2HET1[17] or N2HET1[19] is used to trigger the ADC the connection
to the ADC is made directly from the N2HET or ePWM module outputs. As a result,
the ADC can be triggered without having to enable the signal from being output on
a device terminal.

NOTE
For the RTI compare 0 interrupt source, the connection is made directly from the output of
the RTI module. That is, the interrupt condition can be used as a trigger source even if the
actual interrupt is not signaled to the CPU.

7.4.2.2 MIBADC2 Event Trigger Hookup

Table 7-17. MIBADC2 Event Trigger Hookup

Trigger Event Signal
Group Source
Select, G1SRC, PINMMR30[0] = 0 and PINMMR30[1] = 1
Event # PINMMR30[0] = 1
G2SRC or
(default) Control for Control for
EVSRC Option A Option B
Option A Option B
000 1 AD2EVT AD2EVT — AD2EVT —
PINMMR31[16] =
PINMMR31[16] = 0 and
001 2 N2HET1[8] N2HET2[5] ePWM_B
1 PINMMR31[17] =
1
010 3 N2HET1[10] N2HET1[27] — N2HET1[27] —
PINMMR31[24] =
RTI Compare 0 RTI Compare 0 PINMMR31[24] = 0 and
011 4 ePWM_A1
Interrupt Interrupt 1 PINMMR31[25] =
1
100 5 N2HET1[12] N2HET1[17] — N2HET1[17] —
PINMMR32[0] = 0
101 6 N2HET1[14] N2HET1[19] PINMMR32[0] = 1 N2HET2[1] and
PINMMR32[1] = 1
PINMMR32[8] = 0
110 7 GIOB[0] N2HET1[11] PINMMR32[8] = 1 ePWM_A2 and
PINMMR32[9] = 1
PINMMR32[16] =
PINMMR32[16] = 0 and
111 8 GIOB[1] N2HET2[13] ePWM_AB
1 PINMMR32[17] =
1

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NOTE
If AD2EVT, N2HET1 or GIOB is used as a trigger source, the connection to the MibADC2
module trigger input is made from the output side of the input buffer. This way, a trigger
condition can be generated either by configuring the function as output onto the pad (through
the mux control), or by driving the function from an external trigger source as input. If the
mux control module is used to select different functionality instead of the AD2EVT,
N2HET1[x] or GIOB[x] signals, then care must be taken to disable these signals from
triggering conversions; there is no multiplexing on the input connections.

If ePWM_B, ePWM_S2, ePWM_AB, N2HET2[5], N2HET2[1], N2HET2[13],

7.4.2.3 Controlling ADC1 and ADC2 Event Trigger Options Using SOC Output from ePWM Modules
As shown in Figure 7-5, the ePWMxSOCA and ePWMxSOCB outputs from each ePWM module are used
to generate 4 signals – ePWM_B, ePWM_A1, ePWM_A2 and ePWM_AB, that are available to trigger the
ADC based on the application requirement.

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SOCAEN, SOCBEN bits Controlled by PINMMR

inside ePWMx modules

EPWM1SOCA
EPWM1
module EPWM1SOCB

EPWM2SOCA
EPWM2
module EPWM2SOCB

EPWM3SOCA
EPWM3
module EPWM3SOCB

EPWM4SOCA
EPWM4
module EPWM4SOCB

EPWM5SOCA
EPWM5
module EPWM5SOCB

EPWM6SOCA
EPWM6
module EPWM6SOCB

EPWM7SOCA
EPWM7
module EPWM7SOCB

ePWM_B ePWM_A1 ePWM_A2 ePWM_AB

Figure 7-5. ADC Trigger Source Generation from ePWMx

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Table 7-18. Control Bit to SOC Output

Control Bit SOC Output
PINMMR35[0] SOC1A_SEL
PINMMR35[8] SOC2A_SEL
PINMMR35[16] SOC3A_SEL
PINMMR35[24] SOC4A_SEL
PINMMR36[0] SOC5A_SEL
PINMMR36[8] SOC6A_SEL
PINMMR36[16] SOC7A_SEL

The SOCA output from each ePWM module is connected to a "switch" shown in Figure 7-5.
The logic equations for the 4 outputs from the combinational logic shown in Figure 7-5 are:
ePWM_
SOC1B or SOC2B or SOC3B or SOC4B or SOC5B or SOC6B or SOC7B
B=
ePWM_
[ SOC1A and not(SOC1A_SEL) ] or [ SOC2A and not(SOC2A_SEL) ] or [ SOC3A and not(SOC3A_SEL) ] or
A1 =
[ SOC4A and not(SOC4A_SEL) ] or [ SOC5A and not(SOC5A_SEL) ] or [ SOC6A and not(SOC6A_SEL) ] or
[ SOC7A and not(SOC7A_SEL) ]
ePWM_
[ SOC1A and SOC1A_SEL ] or [ SOC2A and SOC2A_SEL ] or [ SOC3A and SOC3A_SEL ] or
A2 =
[ SOC4A and SOC4A_SEL ] or [ SOC5A and SOC5A_SEL ] or [ SOC6A and SOC6A_SEL ] or
[ SOC7A and SOC7A_SEL ]
ePWM_
ePWM_B or ePWM_A2
AB =

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7.4.3 ADC Electrical and Timing Specifications

Table 7-19. MibADC Recommended Operating Conditions

Parameter MIN MAX Unit
(1)
ADREFHI A-to-D high-voltage reference source ADREFLO VCCAD V
ADREFLO A-to-D low-voltage reference source VSSAD (1) ADREFHI V
VAI Analog input voltage ADREFLO ADREFHI V
IAIK Analog input clamp current (2) -2 2 mA
(VAI < VSSAD – 0.3 or VAI > VCCAD + 0.3)
(1) For VCCAD and VSSAD recommended operating conditions, see Section 5.4.
(2) Input currents into any ADC input channel outside the specified limits could affect conversion results of other channels.

Table 7-20. MibADC Electrical Characteristics Over Full Ranges of Recommended Operating Conditions
Parameter Description/Conditions MIN Nom MAX Unit
Rmux Analog input mux on- See Figure 7-6 250 Ω
resistance
Rsamp ADC sample switch on- See Figure 7-6 250 Ω
resistance
Cmux Input mux capacitance See Figure 7-6 16 pF
Csamp ADC sample capacitance See Figure 7-6 13 pF
IAIL Analog off-state input VCCAD = 3.6V VSSAD ≤ VIN < VSSAD + 100mV -300 200 nA
leakage current maximum
VSSAD + 100mV ≤ VIN ≤ VCCAD - 200mV -200 200 nA
VCCAD - 200mV < VIN ≤ VCCAD -200 500 nA
IAIL Analog off-state input VCCAD = 5.5V VSSAD ≤ VIN < VSSAD + 300mV -1000 250 nA
leakage current maximum
VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV -250 250 nA
VCCAD - 300mV < VIN ≤ VCCAD -250 1000 nA
IAOSB1 (1) ADC1 Analog on-state input VCCAD = 3.6V VSSAD ≤ VIN < VSSAD + 100mV -8 2 µA
bias current maximum
VSSAD + 100mV < VIN < VCCAD - 200mV -4 2 µA
VCCAD - 200mV < VIN < VCCAD -4 12 µA
IAOSB2 (1) ADC2 Analog on-state input VCCAD = 3.6V VSSAD ≤ VIN < VSSAD + 100mV -7 2 µA
bias current maximum
VSSAD + 100mV ≤ VIN ≤ VCCAD - 200mV -4 2 µA
VCCAD - 200mV < VIN ≤ VCCAD -4 10 µA
IAOSB1 (1) ADC1 Analog on-state input VCCAD = 5.5V VSSAD ≤ VIN < VSSAD + 300mV -10 3 µA
bias current maximum
VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV -5 3 µA
VCCAD - 300mV < VIN ≤ VCCAD -5 14 µA
IAOSB2 (1) ADC2 Analog on-state input VCCAD = 5.5V VSSAD ≤ VIN < VSSAD + 300mV -8 3 µA
bias current maximum
VSSAD + 300mV ≤ VIN ≤ VCCAD - 300mV -5 3 µA
VCCAD - 300mV < VIN ≤ VCCAD -5 12 µA
IADREFHI ADREFHI input current ADREFHI = VCCAD, ADREFLO = VSSAD 3 mA
ICCAD Static supply current Normal operating mode 15 mA
ADC core in power down mode 5 µA
(1) If a shared channel is being converted by both ADC converters at the same time, the on-state leakage is equal to IAOSB1 + IAOSB2

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Rext Pin Smux Rmux

VS1
IAOSB

On-State Cext
Bias Current

Rext Pin Smux Rmux

VS2
IAIL
Cext IAIL IAIL
Off-State
Leakages

Rext Pin Smux Rmux Ssamp Rsamp

VS24
IAIL Csamp
Cmux
Cext IAIL IAIL

Figure 7-6. MibADC Input Equivalent Circuit

Table 7-21. MibADC Timing Specifications

Parameter MIN NOM MAX Unit
tc(ADCLK) (1) Cycle time, MibADC clock 0.033 µs
(2)
td(SH) Delay time, sample and hold 0.2 µs
time
td(PU-ADV) Delay time from ADC power on 1 µs
until first input can be sampled
12-bit mode
td©) Delay time, conversion time 0.4 µs
td(SHC) (3) Delay time, total sample/hold 0.6 µs
and conversion time
10-bit mode
td©) Delay time, conversion time 0.33 µs
td(SHC) (3) Delay time, total sample/hold 0.53 µs
and conversion time
(1) The MibADC clock is the ADCLK, generated by dividing down the VCLK by a prescale factor defined by the ADCLOCKCR register bits
4:0.
(2) The sample and hold time for the ADC conversions is defined by the ADCLK frequency and the AD<GP>SAMP register for each
conversion group. The sample time needs to be determined by accounting for the external impedance connected to the input channel as
well as the ADC’s internal impedance.
(3) This is the minimum sample/hold and conversion time that can be achieved. These parameters are dependent on many factors, for
example, the prescale settings.

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Table 7-22. MibADC Operating Characteristics Over Full Ranges of Recommended Operating
Conditions (1) (2)
Parameter Description/Conditions MIN Type MAX Unit
CR Conversion range over ADREFHI - ADREFLO 3 5.5 V
which specified
accuracy is
maintained
ZSET Zero Scale Offset Difference between the first ideal transition 10-bit 1 LSB
(from code 000h to 001h) and the actual mode
transition
12-bit 2 LSB
mode
FSET Full Scale Offset Difference between the range of the 10-bit 2 LSB
measured code transitions (from first to last) mode
and the range of the ideal code transitions
12-bit 3 LSB
mode
EDNL Differential Difference between the actual step width and 10-bit ± 1.5 LSB
nonlinearity error the ideal value. (See Figure 7-7) mode
12-bit ±2 LSB
mode
EINL Integral nonlinearity Maximum deviation from the best straight line 10-bit ±2 LSB
error through the MibADC. MibADC transfer mode
characteristics, excluding the quantization
12-bit ±2 LSB
error.
mode
ETOT Total unadjusted error Maximum value of the difference between an 10-bit ±2 LSB
analog value and the ideal midstep value. mode
12-bit ±4 LSB
mode
(1) 1 LSB = (ADREFHI – ADREFLO)/ 212 for 12-bit mode
(2) 1 LSB = (ADREFHI – ADREFLO)/ 210 for 10-bit mode

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7.4.4 Performance (Accuracy) Specifications

7.4.4.1 MibADC Nonlinearity Errors

The differential nonlinearity error shown in Figure 7-7 (sometimes referred to as differential linearity) is the
difference between an actual step width and the ideal value of 1 LSB.

0 ... 110

0 ... 101

0 ... 100
Digital Output Code

0 ... 011
Differential Linearity
1 LSB Error (–½ LSB)

0 ... 010

Differential Linearity
0 ... 001 Error (–½ LSB)
1 LSB

0 ... 000
0 1 2 3 4 5
Analog Input Value (LSB)
12
NOTE A: 1 LSB = (ADREFHI – ADREFLO)/2

Figure 7-7. Differential Nonlinearity (DNL) Error

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The integral nonlinearity error shown in Figure 7-8 (sometimes referred to as linearity error) is the
deviation of the values on the actual transfer function from a straight line.

0 ... 111

0 ... 110

Ideal
0 ... 101 Transition

Actual
Digital Output Code

Transition
0 ... 100

At Transition
0 ... 011 011/100
(–½ LSB)

0 ... 010
End-Point Lin. Error

0 ... 001
At Transition
001/010 (–1/4 LSB)

0 ... 000
0 1 2 3 4 5 6 7
Analog Input Value (LSB)
12
NOTE A: 1 LSB = (ADREFHI – ADREFLO)/2

Figure 7-8. Integral Nonlinearity (INL) Error

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7.4.4.2 MibADC Total Error

The absolute accuracy or total error of an MibADC as shown in Figure 7-9 is the maximum value of the
difference between an analog value and the ideal midstep value.

0 ... 111

0 ... 110

0 ... 101
Digital Output Code

0 ... 100
Total Error
At Step 0 ... 101
(–1 1/4 LSB)
0 ... 011

0 ... 010

Total Error
0 ... 001 At Step
0 ... 001 (1/2 LSB)

0 ... 000
0 1 2 3 4 5 6 7
Analog Input Value (LSB)
12
NOTE A: 1 LSB = (ADREFHI – ADREFLO)/2

Figure 7-9. Absolute Accuracy (Total) Error

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7.5 General-Purpose Input/Output

The GPIO module on this device supports two ports, GIOA and GIOB. The I/O pins are bidirectional and
bit-programmable. Both GIOA and GIOB support external interrupt capability.

7.5.1 Features
The GPIO module has the following features:
• Each IO pin can be configured as:
– Input
– Output
– Open Drain
• The interrupts have the following characteristics:
– Programmable interrupt detection either on both edges or on a single edge (set in GIOINTDET)
– Programmable edge-detection polarity, either rising or falling edge (set in GIOPOL register)
– Individual interrupt flags (set in GIOFLG register)
– Individual interrupt enables, set and cleared through GIOENASET and GIOENACLR registers
respectively
– Programmable interrupt priority, set through GIOLVLSET and GIOLVLCLR registers
• Internal pullup/pulldown allows unused I/O pins to be left unconnected
For information on input and output timings see Section 5.11 and Section 5.12

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7.6 Enhanced High-End Timer (N2HET)

The N2HET is an advanced intelligent timer that provides sophisticated timing functions for real-time
applications. The timer is software-controlled, using a reduced instruction set, with a specialized timer
micromachine and an attached I/O port. The N2HET can be used for pulse width modulated outputs,
capture or compare inputs, or general-purpose I/O. It is especially well suited for applications requiring
multiple sensor information and drive actuators with complex and accurate time pulses.

7.6.1 Features
The N2HET module has the following features:
• Programmable timer for input and output timing functions
• Reduced instruction set (30 instructions) for dedicated time and angle functions
• 160 words of instruction RAM protected by parity
• User defined number of 25-bit virtual counters for timer, event counters and angle counters
• 7-bit hardware counters for each pin allow up to 32-bit resolution in conjunction with the 25-bit virtual
counters
• Up to 32 pins usable for input signal measurements or output signal generation
• Programmable suppression filter for each input pin with adjustable limiting frequency
• Low CPU overhead and interrupt load
• Efficient data transfer to or from the CPU memory with dedicated High-End-Timer Transfer Unit (HTU)
or DMA
• Diagnostic capabilities with different loopback mechanisms and pin status read back functionality

7.6.2 N2HET RAM Organization

The timer RAM uses 4 RAM banks, where each bank has two port access capability. This means that one
RAM address may be written while another address is read. The RAM words are 96-bits wide, which are
split into three 32-bit fields (program, control, and data).

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7.6.3 Input Timing Specifications

All of the N2HET channels have an enhanced pulse capture circuit. The N2HET instructions PCNT and
WCAP use this circuit to achieve the input timing requirements shown in Figure 7-10 and Table 7-23
below.

N2HETx
3
4

Figure 7-10. N2HET Input Capture Timings

Table 7-23. Input Timing Requirements for N2HET Channels with Enhanced Pulse Capture
PARAMETER MIN MAX UNIT
25
1, 2 Input signal period, PCNT or WCAP (HRP) (LRP) tc(VCLK2) + 2 2 (HRP) (LRP) tc(VCLK2) - 2 ns
3 Input signal high phase, PCNT or WCAP 2 (HRP) tc(VCLK2) + 2 225 (HRP) (LRP) tc(VCLK2) - 2 ns
4 Input signal low phase, PCNT or WCAP 2 (HRP) tc(VCLK2) + 2 225 (HRP) (LRP) tc(VCLK2) - 2 ns

7.6.4 N2HET1-N2HET2 Synchronization

In some applications the N2HET resolutions must be synchronized. Some other applications require a
single time base to be used for all PWM outputs and input timing captures.
The N2HET provides such a synchronization mechanism. The Clk_master/slave (HETGCR.16) configures
the N2HET in master or slave mode (default is slave mode). A N2HET in master mode provides a signal
to synchronize the prescalers of the slave N2HET. The slave N2HET synchronizes its loop resolution to
the loop resolution signal sent by the master. The slave does not require this signal after it receives the
first synchronization signal. However, anytime the slave receives the re-synchronization signal from the
master, the slave must synchronize itself again..

N2HET1 N2HET2
EXT_LOOP_SYNC NHET_LOOP_SYNC

NHET_LOOP_SYNC EXT_LOOP_SYNC

Figure 7-11. N2HET1 – N2HET2 Synchronization Hookup

7.6.5 N2HET Checking

7.6.5.1 Internal Monitoring

To assure correctness of the high-end timer operation and output signals, the two N2HET modules can be
used to monitor each other’s signals as shown in Figure 7-12. The direction of the monitoring is controlled
by the I/O multiplexing control module.

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N2HET1[1,3,5,7,9,11] IOMM mux control signal x

N2HET1[1,3,5,7,9,11] / N2HET2[8,10,12,14,16,18]
N2HET1

N2HET2[8,10,12,14,16,18]

N2HET2

Figure 7-12. N2HET Monitoring

7.6.5.2 Output Monitoring using Dual Clock Comparator (DCC)

N2HET1[31] is connected as a clock source for counter 1 in DCC1. This allows the application to measure
the frequency of the pulse-width modulated (PWM) signal on N2HET1[31].
Similarly, N2HET2[0] is connected as a clock source for counter 1 in DCC2. This allows the application to
measure the frequency of the pulse-width modulated (PWM) signal on N2HET2[0].
Both N2HET1[31] and N2HET2[0] can be configured to be internal-only channels. That is, the connection
to the DCC module is made directly from the output of the N2HETx module (from the input of the output
buffer).
For more information on DCC see Section 6.7.3.

7.6.6 Disabling N2HET Outputs

Some applications require the N2HET outputs to be disabled under some fault condition. The N2HET
module provides this capability through the "Pin Disable" input signal. This signal, when driven low,
causes the N2HET outputs identified by a programmable register (HETPINDIS) to be tri-stated. For more
details on the "N2HET Pin Disable" feature, see the device-specific Terminal Reference Manual.
GIOA[5] is connected to the "Pin Disable" input for N2HET1, and GIOB[2] is connected to the "Pin
Disable" input for N2HET2.

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7.6.7 High-End Timer Transfer Unit (HTU)

A High End Timer Transfer Unit (HTU) can perform DMA type transactions to transfer N2HET data to or
from main memory. A Memory Protection Unit (MPU) is built into the HTU.

7.6.7.1 Features
• CPU and DMA independent
• Master Port to access system memory
• 8 control packets supporting dual buffer configuration
• Control packet information is stored in RAM protected by parity
• Event synchronization (HET transfer requests)
• Supports 32 or 64 bit transactions
• Addressing modes for HET address (8 byte or 16 byte) and system memory address (fixed, 32 bit or 64bit)
• One shot, circular and auto switch buffer transfer modes
• Request lost detection

7.6.7.2 Trigger Connections

Table 7-24. HTU1 Request Line Connection

Modules Request Source HTU1 Request
N2HET1 HTUREQ[0] HTU1 DCP[0]
N2HET1 HTUREQ[1] HTU1 DCP[1]
N2HET1 HTUREQ[2] HTU1 DCP[2]
N2HET1 HTUREQ[3] HTU1 DCP[3]
N2HET1 HTUREQ[4] HTU1 DCP[4]
N2HET1 HTUREQ[5] HTU1 DCP[5]
N2HET1 HTUREQ[6] HTU1 DCP[6]
N2HET1 HTUREQ[7] HTU1 DCP[7]

Table 7-25. HET TU2 Request Line Connection

Modules Request Source HET TU2 Request
N2HET2 HTUREQ[0] HTU2 DCP[0]
N2HET2 HTUREQ[1] HTU2 DCP[1]
N2HET2 HTUREQ[2] HTU2 DCP[2]
N2HET2 HTUREQ[3] HTU2 DCP[3]
N2HET2 HTUREQ[4] HTU2 DCP[4]
N2HET2 HTUREQ[5] HTU2 DCP[5]
N2HET2 HTUREQ[6] HTU2 DCP[6]
N2HET2 HTUREQ[7] HTU2 DCP[7]

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7.7 Controller Area Network (DCAN)

The DCAN supports the CAN 2.0B protocol standard and uses a serial, multimaster communication
protocol that efficiently supports distributed real-time control with robust communication rates of up to 1
megabit per second (Mbps). The DCAN is ideal for applications operating in noisy and harsh
environments (for example, automotive and industrial fields) that require reliable serial communication or
multiplexed wiring.

7.7.1 Features
Features of the DCAN module include:
• Supports CAN protocol version 2.0 part A, B
• Bit rates up to 1 MBit/s
• The CAN kernel can be clocked by the oscillator for baud-rate generation.
• 64 mailboxes on each DCAN
• Individual identifier mask for each message object
• Programmable FIFO mode for message objects
• Programmable loop-back modes for self-test operation
• Automatic bus on after Bus-Off state by a programmable 32-bit timer
• Message RAM protected by parity
• Direct access to Message RAM during test mode
• CAN Rx / Tx pins configurable as general purpose IO pins
• Message RAM Auto Initialization
• DMA support
For more information on the DCAN see the TMS570LS12x/11x Technical Reference Manual (SPNU515).

7.7.2 Electrical and Timing Specifications

Table 7-26. Dynamic Characteristics for the DCANx TX and RX pins

Parameter MIN MAX Unit
td(CANnTX) Delay time, transmit shift register to CANnTX pin (1) 15 ns
td(CANnRX) Delay time, CANnRX pin to receive shift register 5 ns
(1) These values do not include rise/fall times of the output buffer.

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7.8 Local Interconnect Network Interface (LIN)

The SCI/LIN module can be programmed to work either as an SCI or as a LIN. The core of the module is
an SCI. The SCI’s hardware features are augmented to achieve LIN compatibility.
The SCI module is a universal asynchronous receiver-transmitter that implements the standard nonreturn
to zero format. The SCI can be used to communicate, for example, through an RS-232 port or over a K-
line.
The LIN standard is based on the SCI (UART) serial data link format. The communication concept is
single-master/multiple-slave with a message identification for multi-cast transmission between any network
nodes.

7.8.1 LIN Features

The following are features of the LIN module:
• Compatible to LIN 1.3, 2.0 and 2.1 protocols
• Multibuffered receive and transmit units DMA capability for minimal CPU intervention
• Identification masks for message filtering
• Automatic Master Header Generation
– Programmable Synch Break Field
– Synch Field
– Identifier Field
• Slave Automatic Synchronization
– Synch break detection
– Optional baudrate update
– Synchronization Validation
• 231 programmable transmission rates with 7 fractional bits
• Error detection
• 2 Interrupt lines with priority encoding

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7.9 Serial Communication Interface (SCI)

7.9.1 Features
• Standard universal asynchronous receiver-transmitter (UART) communication
• Supports full- or half-duplex operation
• Standard nonreturn to zero (NRZ) format
• Double-buffered receive and transmit functions
• Configurable frame format of 3 to 13 bits per character based on the following:
– Data word length programmable from one to eight bits
– Additional address bit in address-bit mode
– Parity programmable for zero or one parity bit, odd or even parity
– Stop programmable for one or two stop bits
• Asynchronous or isosynchronous communication modes
• Two multiprocessor communication formats allow communication between more than two devices.
• Sleep mode is available to free CPU resources during multiprocessor communication.
• The 24-bit programmable baud rate supports 224 different baud rates provide high accuracy baud rate selection.
• Four error flags and Five status flags provide detailed information regarding SCI events.
• Capability to use DMA for transmit and receive data.

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7.10 Inter-Integrated Circuit (I2C)

The inter-integrated circuit (I2C) module is a multi-master communication module providing an interface
between the microcontroller and devices compliant with Philips Semiconductor I2C-bus specification
version 2.1 and connected by an I2C-bus. This module will support any slave or master I2C compatible
device.

7.10.1 Features
The I2C has the following features:
• Compliance to the Philips I2C bus specification, v2.1 (The I2C Specification, Philips document number
9398 393 40011)
– Bit/Byte format transfer
– 7-bit and 10-bit device addressing modes
– General call
– START byte
– Multi-master transmitter/ slave receiver mode
– Multi-master receiver/ slave transmitter mode
– Combined master transmit/receive and receive/transmit mode
– Transfer rates of 10 kbps up to 400 kbps (Phillips fast-mode rate)
• Free data format
• Two DMA events (transmit and receive)
• DMA event enable/disable capability
• Seven interrupts that can be used by the CPU
• Module enable/disable capability
• The SDA and SCL are optionally configurable as general purpose I/O
• Slew rate control of the outputs
• Open drain control of the outputs
• Programmable pullup/pulldown capability on the inputs
• Supports Ignore NACK mode

NOTE
This I2C module does not support:
• High-speed (HS) mode
• C-bus compatibility mode
• The combined format in 10-bit address mode (the I2C sends the slave address second
byte every time it sends the slave address first byte)

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7.10.2 I2C I/O Timing Specifications

Table 7-27. I2C Signals (SDA and SCL) Switching Characteristics (1)
Parameter Standard Mode Fast Mode Unit
MIN MAX MIN MAX
tc(I2CCLK) Cycle time, Internal Module clock for I2C, 75.2 149 75.2 149 ns
prescaled from VCLK
f(SCL) SCL Clock frequency 0 100 0 400 kHz
tc(SCL) Cycle time, SCL 10 2.5 µs
tsu(SCLH-SDAL) Setup time, SCL high before SDA low (for a 4.7 0.6 µs
repeated START condition)
th(SCLL-SDAL) Hold time, SCL low after SDA low (for a repeated 4 0.6 µs
START condition)
tw(SCLL) Pulse duration, SCL low 4.7 1.3 µs
tw(SCLH) Pulse duration, SCL high 4 0.6 µs
tsu(SDA-SCLH) Setup time, SDA valid before SCL high 250 100 ns
th(SDA-SCLL) Hold time, SDA valid after SCL low (for I2C bus 0 3.45 (2) 0 0.9 µs
devices)
tw(SDAH) Pulse duration, SDA high between STOP and 4.7 1.3 µs
START conditions
tsu(SCLH-SDAH) Setup time, SCL high before SDA high (for STOP 4.0 0.6 µs
condition)
tw(SP) Pulse duration, spike (must be suppressed) 0 50 ns
Cb (3) Capacitive load for each bus line 400 400 pF
(1) The I2C pins SDA and SCL do not feature fail-safe I/O buffers. These pins could potentially draw current when the device is powered
down.
(2) The maximum th(SDA-SCLL) for I2C bus devices has only to be met if the device does not stretch the low period (tw(SCLL)) of the SCL
signal.
(3) Cb = The total capacitance of one bus line in pF.

SDA

tw(SDAH) tsu(SDA-SCLH) tw(SP)

tw(SCLL)
tw(SCLH) tsu(SCLH-SDAH)
tr(SCL)

SCL

tc(SCL) tf(SCL) th(SCLL-SDAL)

th(SDA-SCLL)
tsu(SCLH-SDAL)
th(SCLL-SDAL)

Stop Start Repeated Start Stop

Figure 7-13. I2C Timings

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NOTE
• A device must internally provide a hold time of at least 300 ns for the SDA signal
(referred to the VIHmin of the SCL signal) to bridge the undefined region of the falling
edge of SCL.
• The maximum th(SDA-SCLL) has only to be met if the device does not stretch the LOW
period (tw(SCLL)) of the SCL signal.
• A Fast-mode I2C-bus device can be used in a Standard-mode I2C-bus system, but the
requirement tsu(SDA-SCLH) ≥ 250 ns must then be met. This will automatically be the case if
the device does not stretch the LOW period of the SCL signal. If such a device does
stretch the LOW period of the SCL signal, it must output the next data bit to the SDA line
tr max + tsu(SDA-SCLH).
• Cb = total capacitance of one bus line in pF. If mixed with fast-mode devices, faster fall-
times are allowed.

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7.11 Multibuffered / Standard Serial Peripheral Interface

The MibSPI is a high-speed synchronous serial input/output port that allows a serial bit stream of
programmed length (2 to 16 bits) to be shifted in and out of the device at a programmed bit-transfer rate.
Typical applications for the SPI include interfacing to external peripherals, such as I/Os, memories, display
drivers, and analog-to-digital converters.

7.11.1 Features
Both Standard and MibSPI modules have the following features:
• 16-bit shift register
• Receive buffer register
• 8-bit baud clock generator
• SPICLK can be internally-generated (master mode) or received from an external clock source (slave
mode)
• Each word transferred can have a unique format
• SPI I/Os not used in the communication can be used as digital input/output signals

Table 7-28. MibSPI/SPI Configurations PGE Package

MibSPIx/SPIx I/Os
MibSPI1 MIBSPI1SIMO[1:0], MIBSPI1SOMI[1:0], MIBSPI1CLK, MIBSPI1nCS[5:4,2:0], MIBSPI1nENA
MibSPI3 MIBSPI3SIMO[0], MIBSPI3SOMI[0], MIBSPI3CLK, MIBSPI3nCS[5:0], MIBSPI3nENA
MibSPI5 MIBSPI5SIMO[0], MIBSPI5SOMI[2:0], MIBSPI5CLK, MIBSPI5nCS[0], MIBSPI5nENA
SPI4 SPI4SIMO[0], SPI4SOMI[0], SPI4CLK, SPI4nCS[0], SPI4nENA

Table 7-29. MibSPI/SPI Configurations ZWT Package

MibSPIx/SPIx I/Os
MibSPI1 MIBSPI1SIMO[1:0], MIBSPI1SOMI[1:0], MIBSPI1CLK, MIBSPI1nCS[5:0], MIBSPI1nENA
MibSPI3 MIBSPI3SIMO[0], MIBSPI3SOMI[0], MIBSPI3CLK, MIBSPI3nCS[5:0], MIBSPI3nENA
MibSPI5 MIBSPI5SIMO[3:0], MIBSPI5SOMI[3:0], MIBSPI5CLK, MIBSPI5nCS[3:0], MIBSPI5nENA
SPI2 SPI2SIMO[0], SPI2SOMI[0], SPI2CLK, SPI2nCS[1:0], SPI2nENA
SPI4 SPI4SIMO[0], SPI4SOMI[0], SPI4CLK, SPI4nCS[0], SPI4nENA

7.11.2 MibSPI Transmit and Receive RAM Organization

The Multibuffer RAM is comprised of 128 buffers. Each entry in the Multibuffer RAM consists of 4 parts: a
16-bit transmit field, a 16-bit receive field, a 16-bit control field and a 16-bit status field. The Multibuffer
RAM can be partitioned into multiple transfer group with variable number of buffers each. Each MibSPIx
module supports 8 transfer groups.

7.11.3 MibSPI Transmit Trigger Events

Each of the transfer groups can be configured individually. For each of the transfer groups a trigger event
and a trigger source can be chosen. A trigger event can be for example a rising edge or a permanent low
level at a selectable trigger source. For example, up to 15 trigger sources are available for use by each
transfer group.

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7.11.3.1 MIBSPI1 Event Trigger Hookup

Table 7-30. MIBSPI1 Event Trigger Hookup

Event # TGxCTRL TRIGSRC[3:0] Trigger
Disabled 0000 No trigger source
EVENT0 0001 GIOA[0]
EVENT1 0010 GIOA[1]
EVENT2 0011 GIOA[2]
EVENT3 0100 GIOA[3]
EVENT4 0101 GIOA[4]
EVENT5 0110 GIOA[5]
EVENT6 0111 GIOA[6]
EVENT7 1000 GIOA[7]
EVENT8 1001 N2HET1[8]
EVENT9 1010 N2HET1[10]
EVENT10 1011 N2HET1[12]
EVENT11 1100 N2HET1[14]
EVENT12 1101 N2HET1[16]
EVENT13 1110 N2HET1[18]
EVENT14 1111 Internal Tick counter

NOTE
For N2HET1 trigger sources, the connection to the MibSPI1 module trigger input is made
from the input side of the output buffer (at the N2HET1 module boundary). This way, a
trigger condition can be generated even if the N2HET1 signal is not selected to be output on
the pad.

NOTE
For GIOx trigger sources, the connection to the MibSPI1 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
selecting the GIOx pin as an output pin and selecting the pin to be a GIOx pin, or by driving
the GIOx pin from an external trigger source. If the mux control module is used to select
different functionality instead of the GIOx signal, then care must be taken to disable GIOx
from triggering MibSPI1 transfers; there is no multiplexing on the input connections.

7.11.3.2 MIBSPI3 Event Trigger Hookup

Table 7-31. MIBSPI3 Event Trigger Hookup

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Table 7-31. MIBSPI3 Event Trigger Hookup (continued)

Event # TGxCTRL TRIGSRC[3:0] Trigger
EVENT9 1010 N2HET1[10]
EVENT10 1011 N2HET1[12]
EVENT11 1100 N2HET1[14]
EVENT12 1101 N2HET1[16]
EVENT13 1110 N2HET1[18]
EVENT14 1111 Internal Tick counter

NOTE
For N2HET1 trigger sources, the connection to the MibSPI3 module trigger input is made
from the input side of the output buffer (at the N2HET1 module boundary). This way, a
trigger condition can be generated even if the N2HET1 signal is not selected to be output on
the pad.

NOTE
For GIOx trigger sources, the connection to the MibSPI3 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
selecting the GIOx pin as an output pin and selecting the pin to be a GIOx pin, or by driving
the GIOx pin from an external trigger source. If the mux control module is used to select
different functionality instead of the GIOx signal, then care must be taken to disable GIOx
from triggering MibSPI3 transfers; there is no multiplexing on the input connections.

7.11.3.3 MIBSPI5 Event Trigger Hookup

Table 7-32. MIBSPI5 Event Trigger Hookup

NOTE
For N2HET1 trigger sources, the connection to the MibSPI5 module trigger input is made
from the input side of the output buffer (at the N2HET1 module boundary). This way, a
trigger condition can be generated even if the N2HET1 signal is not selected to be output on
the pad.

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NOTE
For GIOx trigger sources, the connection to the MibSPI5 module trigger input is made from
the output side of the input buffer. This way, a trigger condition can be generated either by
selecting the GIOx pin as an output pin and selecting the pin to be a GIOx pin, or by driving
the GIOx pin from an external trigger source. If the mux control module is used to select
different functionality instead of the GIOx signal, then care must be taken to disable GIOx
from triggering MibSPI5 transfers; there is no multiplexing on the input connections.

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7.11.4 MibSPI/SPI Master Mode I/O Timing Specifications

Table 7-33. SPI Master Mode External Timing Parameters (CLOCK PHASE = 0, SPICLK = output, SPISIMO
= output, and SPISOMI = input) (1) (2) (3)
NO. Parameter MIN MAX Unit
1 tc(SPC)M Cycle time, SPICLK (4) 40 256tc(VCLK) ns
2 (5) tw(SPCH)M Pulse duration, SPICLK high (clock 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3 ns
polarity = 0)
tw(SPCL)M Pulse duration, SPICLK low (clock 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3
polarity = 1)
3 (5) tw(SPCL)M Pulse duration, SPICLK low (clock 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3 ns
polarity = 0)
tw(SPCH)M Pulse duration, SPICLK high (clock 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3
polarity = 1)
4 (5) td(SPCH-SIMO)M Delay time, SPISIMO valid before 0.5tc(SPC)M – 6 ns
SPICLK low (clock polarity = 0)
td(SPCL-SIMO)M Delay time, SPISIMO valid before 0.5tc(SPC)M – 6
SPICLK high (clock polarity = 1)
5 (5) tv(SPCL-SIMO)M Valid time, SPISIMO data valid after 0.5tc(SPC)M – tf(SPC) – 4 ns
SPICLK low (clock polarity = 0)
tv(SPCH-SIMO)M Valid time, SPISIMO data valid after 0.5tc(SPC)M – tr(SPC) – 4
SPICLK high (clock polarity = 1)
6 (5) tsu(SOMI-SPCL)M Setup time, SPISOMI before SPICLK tf(SPC) + 2.2 ns
low (clock polarity = 0)
tsu(SOMI-SPCH)M Setup time, SPISOMI before SPICLK tr(SPC) + 2.2
high (clock polarity = 1)
7 (5) th(SPCL-SOMI)M Hold time, SPISOMI data valid after 10 ns
SPICLK low (clock polarity = 0)
th(SPCH-SOMI)M Hold time, SPISOMI data valid after 10
SPICLK high (clock polarity = 1)
8 (6) tC2TDELAY Setup time CS active CSHOLD = 0 C2TDELAY*tc(VCLK) + 2*tc(VCLK) (C2TDELAY+2) * tc(VCLK) - ns
until SPICLK high - tf(SPICS) + tr(SPC) – 7 tf(SPICS) + tr(SPC) + 5.5
(clock polarity = 0)
CSHOLD = 1 C2TDELAY*tc(VCLK) + 3*tc(VCLK) (C2TDELAY+3) * tc(VCLK) -
- tf(SPICS) + tr(SPC) – 7 tf(SPICS) + tr(SPC) + 5.5
Setup time CS active CSHOLD = 0 C2TDELAY*tc(VCLK) + 2*tc(VCLK) (C2TDELAY+2) * tc(VCLK) - ns
until SPICLK low - tf(SPICS) + tf(SPC) – 7 tf(SPICS) + tf(SPC) + 5.5
(clock polarity = 1)
CSHOLD = 1 C2TDELAY*tc(VCLK) + 3*tc(VCLK) (C2TDELAY+3) * tc(VCLK) -
- tf(SPICS) + tf(SPC) – 7 tf(SPICS) + tf(SPC) + 5.5
9 (6) tT2CDELAY Hold time SPICLK low until CS inactive 0.5*tc(SPC)M + 0.5*tc(SPC)M + ns
(clock polarity = 0) T2CDELAY*tc(VCLK) + tc(VCLK) - T2CDELAY*tc(VCLK) + tc(VCLK) -
tf(SPC) + tr(SPICS) - 7 tf(SPC) + tr(SPICS) + 11
Hold time SPICLK high until CS 0.5*tc(SPC)M + 0.5*tc(SPC)M + ns
inactive (clock polarity = 1) T2CDELAY*tc(VCLK) + tc(VCLK) - T2CDELAY*tc(VCLK) + tc(VCLK) -
tr(SPC) + tr(SPICS) - 7 tr(SPC) + tr(SPICS) + 11
10 tSPIENA SPIENAn Sample point (C2TDELAY+1) * tc(VCLK) - (C2TDELAY+1)*tc(VCLK) ns
tf(SPICS) – 29
11 tSPIENAW SPIENAn Sample point from write to (C2TDELAY+2)*tc(VCLK) ns
buffer
(1) The MASTER bit (SPIGCR1.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is cleared.
(2) tc(VCLK) = interface clock cycle time = 1 / f(VCLK)
(3) For rise and fall timings, see Table 5-7.
(4) When the SPI is in Master mode, the following must be true:
For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)M = 2tc(VCLK) ≥ 40ns.
The external load on the SPICLK pin must be less than 60pF.
(5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
(6) C2TDELAY and T2CDELAY is programmed in the SPIDELAY register

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1
SPICLK
(clock polarity = 0)

3
SPICLK
(clock polarity = 1)

4 5

SPISIMO Master Out Data Is Valid

SPISOMI Master In Data

Must Be Valid

Figure 7-14. SPI Master Mode External Timing (CLOCK PHASE = 0)

Write to buffer

SPICLK
(clock polarity=0)

SPICLK
(clock polarity=1)

SPISIMO Master Out Data Is Valid

8 9
SPICSn

11
SPIENAn

Figure 7-15. SPI Master Mode Chip Select Timing (CLOCK PHASE = 0)

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Table 7-34. SPI Master Mode External Timing Parameters (CLOCK PHASE = 1, SPICLK = output, SPISIMO
= output, and SPISOMI = input) (1) (2) (3)
NO. Parameter MIN MAX Unit
(4)
1 tc(SPC)M Cycle time, SPICLK 40 256tc(VCLK) ns
(5)
2 tw(SPCH)M Pulse duration, SPICLK high (clock 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3 ns
polarity = 0)
tw(SPCL)M Pulse duration, SPICLK low (clock 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3
polarity = 1)
3 (5) tw(SPCL)M Pulse duration, SPICLK low (clock 0.5tc(SPC)M – tf(SPC)M – 3 0.5tc(SPC)M + 3 ns
polarity = 0)
tw(SPCH)M Pulse duration, SPICLK high (clock 0.5tc(SPC)M – tr(SPC)M – 3 0.5tc(SPC)M + 3
polarity = 1)
4 (5) tv(SIMO-SPCH)M Valid time, SPICLK high after 0.5tc(SPC)M – 6 ns
SPISIMO data valid (clock polarity =
0)
tv(SIMO-SPCL)M Valid time, SPICLK low after 0.5tc(SPC)M – 6
SPISIMO data valid (clock polarity =
1)
5 (5) tv(SPCH-SIMO)M Valid time, SPISIMO data valid after 0.5tc(SPC)M – tr(SPC) – 4 ns
SPICLK high (clock polarity = 0)
tv(SPCL-SIMO)M Valid time, SPISIMO data valid after 0.5tc(SPC)M – tf(SPC) – 4
SPICLK low (clock polarity = 1)
6 (5) tsu(SOMI-SPCH)M Setup time, SPISOMI before tr(SPC) + 2.2 ns
SPICLK high (clock polarity = 0)
tsu(SOMI-SPCL)M Setup time, SPISOMI before tf(SPC) + 2.2
SPICLK low (clock polarity = 1)
7 (5) tv(SPCH-SOMI)M Valid time, SPISOMI data valid after 10 ns
SPICLK high (clock polarity = 0)
tv(SPCL-SOMI)M Valid time, SPISOMI data valid after 10
SPICLK low (clock polarity = 1)
8 (6) tC2TDELAY Setup time CS CSHOLD = 0 0.5*tc(SPC)M + 0.5*tc(SPC)M + ns
active until SPICLK (C2TDELAY+2) * tc(VCLK) - (C2TDELAY+2) * tc(VCLK) -
high (clock polarity = tf(SPICS) + tr(SPC) – 7 tf(SPICS) + tr(SPC) + 5.5
0)
CSHOLD = 1 0.5*tc(SPC)M + 0.5*tc(SPC)M +
(C2TDELAY+3) * tc(VCLK) - (C2TDELAY+3) * tc(VCLK) -
tf(SPICS) + tr(SPC) – 7 tf(SPICS) + tr(SPC) + 5.5
Setup time CS CSHOLD = 0 0.5*tc(SPC)M + 0.5*tc(SPC)M + ns
active until SPICLK (C2TDELAY+2) * tc(VCLK) - (C2TDELAY+2) * tc(VCLK) -
low (clock polarity = tf(SPICS) + tf(SPC) – 7 tf(SPICS) + tf(SPC) + 5.5
1)
CSHOLD = 1 0.5*tc(SPC)M + 0.5*tc(SPC)M +
(C2TDELAY+3) * tc(VCLK) - (C2TDELAY+3) * tc(VCLK) -
tf(SPICS) + tf(SPC) – 7 tf(SPICS) + tf(SPC) + 5.5
9 (6) tT2CDELAY Hold time SPICLK low until CS T2CDELAY*tc(VCLK) + T2CDELAY*tc(VCLK) + ns
inactive (clock polarity = 0) tc(VCLK) - tf(SPC) + tr(SPICS) - tc(VCLK) - tf(SPC) + tr(SPICS) +
7 11
Hold time SPICLK high until CS T2CDELAY*tc(VCLK) + T2CDELAY*tc(VCLK) + ns
inactive (clock polarity = 1) tc(VCLK) - tr(SPC) + tr(SPICS) - tc(VCLK) - tr(SPC) + tr(SPICS) +
7 11
10 tSPIENA SPIENAn Sample Point (C2TDELAY+1)* tc(VCLK) - (C2TDELAY+1)*tc(VCLK) ns
tf(SPICS) – 29
11 tSPIENAW SPIENAn Sample point from write to (C2TDELAY+2)*tc(VCLK) ns
buffer
(1) The MASTER bit (SPIGCR1.0) is set and the CLOCK PHASE bit (SPIFMTx.16) is set.
(2) tc(VCLK) = interface clock cycle time = 1 / f(VCLK)
(3) For rise and fall timings, see the Table 5-7.
(4) When the SPI is in Master mode, the following must be true:
For PS values from 1 to 255: tc(SPC)M ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)M = 2tc(VCLK) ≥ 40ns.
The external load on the SPICLK pin must be less than 60pF.
(5) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).
(6) C2TDELAY and T2CDELAY is programmed in the SPIDELAY register

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SPICLK
(clock polarity = 0)
2

SPICLK
(clock polarity = 1)

4 5

SPISIMO Master Out Data Is Valid Data Valid

6 7

Master In Data
SPISOMI Must Be Valid

Figure 7-16. SPI Master Mode External Timing (CLOCK PHASE = 1)

Write to buffer

SPICLK
(clock polarity=0)

SPICLK
(clock polarity=1)

SPISIMO Master Out Data Is Valid

8 9
SPICSn

11
SPIENAn

Figure 7-17. SPI Master Mode Chip Select Timing (CLOCK PHASE = 1)

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7.11.5 SPI Slave Mode I/O Timings

Table 7-35. SPI Slave Mode External Timing Parameters (CLOCK PHASE = 0, SPICLK = input, SPISIMO =
input, and SPISOMI = output) (1) (2) (3) (4)
NO. Parameter MIN MAX Unit
1 tc(SPC)S Cycle time, SPICLK (5) 40 ns
2 (6) tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 0) 14 ns
tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 1) 14
3 (6) tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 0) 14 ns
tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 1) 14
4 (6) td(SPCH-SOMI)S Delay time, SPISOMI valid after SPICLK high (clock trf(SOMI) + 20 ns
polarity = 0)
td(SPCL-SOMI)S Delay time, SPISOMI valid after SPICLK low (clock polarity trf(SOMI) + 20
= 1)
5 (6) th(SPCH-SOMI)S Hold time, SPISOMI data valid after SPICLK high (clock 2 ns
polarity =0)
th(SPCL-SOMI)S Hold time, SPISOMI data valid after SPICLK low (clock 2
polarity =1)
6 (6) tsu(SIMO-SPCL)S Setup time, SPISIMO before SPICLK low (clock polarity = 4 ns
0)
tsu(SIMO-SPCH)S Setup time, SPISIMO before SPICLK high (clock polarity = 4
1)
7 (6) th(SPCL-SIMO)S Hold time, SPISIMO data valid after SPICLK low (clock 2 ns
polarity = 0)
th(SPCH-SIMO)S Hold time, SPISIMO data valid after S PICLK high (clock 2
polarity = 1)
8 td(SPCL-SENAH)S Delay time, SPIENAn high after last SPICLK low (clock 1.5tc(VCLK) 2.5tc(VCLK)+tr(ENAn)+ ns
polarity = 0) 22
td(SPCH-SENAH)S Delay time, SPIENAn high after last SPICLK high (clock 1.5tc(VCLK) 2.5tc(VCLK)+ tr(ENAn) +
polarity = 1) 22
9 td(SCSL-SENAL)S Delay time, SPIENAn low after SPICSn low (if new data tf(ENAn) tc(VCLK)+tf(ENAn)+27 ns
has been written to the SPI buffer)
(1) The MASTER bit (SPIGCR1.0) is cleared and the CLOCK PHASE bit (SPIFMTx.16) is cleared.
(2) If the SPI is in slave mode, the following must be true: tc(SPC)S ≥ (PS + 1) tc(VCLK), where PS = prescale value set in SPIFMTx.[15:8].
(3) For rise and fall timings, see Table 5-7.
(4) tc(VCLK) = interface clock cycle time = 1 /f(VCLK)
(5) When the SPI is in Slave mode, the following must be true:
For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)S = 2tc(VCLK) ≥ 40ns.
(6) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).

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1
SPICLK
(clock polarity = 0)

3
SPICLK
(clock polarity = 1)

5
4

SPISOMI SPISOMI Data Is Valid

SPISIMO SPISIMO Data

Must Be Valid

Figure 7-18. SPI Slave Mode External Timing (CLOCK PHASE = 0)

SPICLK
(clock polarity=0)

SPICLK
(clock polarity=1)

SPIENAn
9
SPICSn

Figure 7-19. SPI Slave Mode Enable Timing (CLOCK PHASE = 0)

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Table 7-36. SPI Slave Mode External Timing Parameters (CLOCK PHASE = 1, SPICLK = input, SPISIMO =
input, and SPISOMI = output) (1) (2) (3) (4)
NO. Parameter MIN MAX Unit
1 tc(SPC)S Cycle time, SPICLK (5) 40 ns
(6)
2 tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 0) 14 ns
tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 1) 14
3 (6) tw(SPCL)S Pulse duration, SPICLK low (clock polarity = 0) 14 ns
tw(SPCH)S Pulse duration, SPICLK high (clock polarity = 1) 14
4 (6) td(SOMI-SPCL)S Delay time, SPISOMI data valid after SPICLK low trf(SOMI) + 20 ns
(clock polarity = 0)
td(SOMI-SPCH)S Delay time, SPISOMI data valid after SPICLK high trf(SOMI) + 20
(clock polarity = 1)
5 (6) th(SPCL-SOMI)S Hold time, SPISOMI data valid after SPICLK high 2 ns
(clock polarity =0)
th(SPCH-SOMI)S Hold time, SPISOMI data valid after SPICLK low (clock 2
polarity =1)
6 (6) tsu(SIMO-SPCH)S Setup time, SPISIMO before SPICLK high (clock 4 ns
polarity = 0)
tsu(SIMO-SPCL)S Setup time, SPISIMO before SPICLK low (clock polarity 4
= 1)
7 (6) tv(SPCH-SIMO)S High time, SPISIMO data valid after SPICLK high 2 ns
(clock polarity = 0)
tv(SPCL-SIMO)S High time, SPISIMO data valid after SPICLK low (clock 2
polarity = 1)
8 td(SPCH-SENAH)S Delay time, SPIENAn high after last SPICLK high 1.5tc(VCLK) 2.5tc(VCLK)+tr(ENAn) + 22 ns
(clock polarity = 0)
td(SPCL-SENAH)S Delay time, SPIENAn high after last SPICLK low (clock 1.5tc(VCLK) 2.5tc(VCLK)+tr(ENAn) + 22
polarity = 1)
9 td(SCSL-SENAL)S Delay time, SPIENAn low after SPICSn low (if new data tf(ENAn) tc(VCLK)+tf(ENAn)+ 27 ns
has been written to the SPI buffer)
10 td(SCSL-SOMI)S Delay time, SOMI valid after SPICSn low (if new data tc(VCLK) 2tc(VCLK)+trf(SOMI)+ 28 ns
has been written to the SPI buffer)
(1) The MASTER bit (SPIGCR1.0) is cleared and the CLOCK PHASE bit (SPIFMTx.16) is set.
(2) If the SPI is in slave mode, the following must be true: tc(SPC)S ≤ (PS + 1) tc(VCLK), where PS = prescale value set in SPIFMTx.[15:8].
(3) For rise and fall timings, see Table 5-7.
(4) tc(VCLK) = interface clock cycle time = 1 /f(VCLK)
(5) When the SPI is in Slave mode, the following must be true:
For PS values from 1 to 255: tc(SPC)S ≥ (PS +1)tc(VCLK) ≥ 40ns, where PS is the prescale value set in the SPIFMTx.[15:8] register bits.
For PS values of 0: tc(SPC)S = 2tc(VCLK) ≥ 40ns.
(6) The active edge of the SPICLK signal referenced is controlled by the CLOCK POLARITY bit (SPIFMTx.17).

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SPICLK
(clock polarity = 0)
2

SPICLK
(clock polarity = 1)
5
4

SPISOMI SPISOMI Data Is Valid

SPISIMO SPISIMO Data

Must Be Valid

Figure 7-20. SPI Slave Mode External Timing (CLOCK PHASE = 1)

SPICLK
(clock polarity=0)

SPICLK
(clock polarity=1)

SPIENAn
9
SPICSn

10
SPISOMI Slave Out Data Is Valid

Figure 7-21. SPI Slave Mode Enable Timing (CLOCK PHASE = 1)

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8 Device and Documentation Support

8.1 Device and Development-Support Tool Nomenclature
To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of
all devices and support tools. Each commercial family member has one of three prefixes: TMX, TMP,
or TMS (for example,TMS570LS1224). Texas Instruments recommends two of three possible prefix
designators for its support tools: TMDX and TMDS. These prefixes represent evolutionary stages of
product development from engineering prototypes (TMX/TMDX) through fully qualified production
devices/tools (TMS/TMDS).
Device development evolutionary flow:
TMX Experimental device that is not necessarily representative of the final device's electrical
specifications.
TMP Final silicon die that conforms to the device's electrical specifications but has not completed
quality and reliability verification.
TMS Fully-qualified production device.
TMX and TMP devices are shipped against the following disclaimer:
"Developmental product is intended for internal evaluation purposes."
TMS devices have been characterized fully, and the quality and reliability of the device have been
demonstrated fully. TI's standard warranty applies.
Predictions show that prototype devices (TMX or TMP) have a greater failure rate than the standard
production devices. Texas Instruments recommends that these devices not be used in any production
system because their expected end-use failure rate still is undefined. Only qualified production devices
are to be used.
The figure below illustrates the numbering and symbol nomenclature for the TMS570LS1224 .

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Full Part # TMS 570 LS 12 2 4 B ZWT Q Q1 R

Orderable Part # TMX 570 12 2 4 B ZWT Q Q1 R

Prefix: TM
TMS = Fully Qualified
TMP = Prototype
TMX = Samples

Core Technology:
570 = Cortex R4F

Architecture:
LS = Dual CPUs in Lockstep
(not included in orderable part #)

Flash Memory Size:

12 = 1.25MB

RAM MemorySize:
2 = 192kB

Peripheral Set:
4 = no FlexRay, no Ethernet

Die Revision:
A = Die Revision A
B = Die Revision B

Package Type:
ZWT = 337-Pin Plastic BGA with pb-free solder ball
PGE = 144 Pin Plastic Quad Flatpack

Temperature Range:
Q = -40...+125oC

Quality Designator:
Q1 = Automotive

Shipping Options:
R = Tape and Reel

Figure 8-1. TMS570LS1224 Device Numbering Conventions

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8.2 Documentation Support

8.2.1 Related Documentation from Texas Instruments

The following documents describe the TMS570LS11x/12x microcontroller..
SPNU515 TMS570LS12x/11x 16/32-Bit RISC Flash Microcontroller Technical Reference Manual details the
integration, the environment, the functional description, and the programming models for each
peripheral and subsystem in the device.
SPNZ199 TMS570LS12x/11x Microcontroller, Silicon Revision B, Silicon Errata describes the usage notes
and known exceptions to the functional specifications for the device silicon revision B.
SPNZ218 TMS570LS12x/11x Microcontroller, Silicon Revision C, Silicon Errata describes the usage notes
and known exceptions to the functional specifications for the device silicon revision C.

8.2.2 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the
respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views;
see TI's Terms of Use.
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among
engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve
problems with fellow engineers.
TI Embedded Processors Wiki Texas Instruments Embedded Processors Wiki. Established to help developers
get started with Embedded Processors from Texas Instruments and to foster innovation and growth of
general knowledge about the hardware and software surrounding these devices.

8.3 Trademarks
E2E is a trademark of Texas Instruments.
CoreSight is a trademark of ARM Limited.
ARM, Cortex are registered trademarks of ARM Limited (or its subsidiaries) in the EU and/or elsewhere.
All rights reserved.
All other trademarks are the property of their respective owners.

8.4 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

8.5 Glossary
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.

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8.6 Device Identification

8.6.1 Device Identification Code Register

The device identification code register identifies several aspects of the device including the silicon version.
The details of the device identification code register are shown in Table 8-1. The device identification code
register value for this device is:
• Rev A = 0x8046AD05
• Rev B = 0x8046AD15
• Rev C = 0x8046AD1D

Figure 8-2. Device ID Bit Allocation Register

31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 16
CP-15 UNIQUE ID TECH
R-1 R-00000000100011 R-0

15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
TECH I/O PERIPH FLASH ECC RAM VERSION 1 0 1
VOLT PARITY ECC
AGE
R-101 R-0 R-1 R-10 R-1 R-00011 R-1 R-0 R-1
LEGEND: R/W = Read/Write; R = Read only; -n = value after reset

Table 8-1. Device ID Bit Allocation Register Field Descriptions

Bit Field Value Description
31 CP15 Indicates the presence of coprocessor 15
1 CP15 present
30-17 UNIQUE ID 100011 Unique device identification number
This bitfield holds a unique number for a dedicated device configuration (die).
16-13 TECH Process technology on which the device is manufactured.
0101 F021
12 I/O VOLTAGE I/O voltage of the device.
0 I/O are 3.3v
11 PERIPHERAL 1 Peripheral Parity
PARITY Parity on peripheral memories
10-9 FLASH ECC Flash ECC
10 Program memory with ECC
8 RAM ECC Indicates if RAM memory ECC is present.
1 ECC implemented
7-3 REVISION Revision of the Device.
2-0 101 The platform family ID is always 0b101

8.6.2 Die Identification Registers

The two die ID registers at addresses 0xFFFFFF7C and 0xFFFFFF80 form a 64-bit dieid with the
information as shown in Table 8-2.

Table 8-2. Die-ID Registers

Item # of Bits Bit Location
X Coordinate on Wafer 12 0xFFFFFF7C[11:0]
Y Coordinate on Wafer 12 0xFFFFFF7C[23:12]
Wafer # 8 0xFFFFFF7C[31:24]
Lot # 24 0xFFFFFF80[23:0]

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Table 8-2. Die-ID Registers (continued)

Item # of Bits Bit Location
Reserved 8 0xFFFFFF80[31:24]

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8.7 Module Certifications

The following communications modules have received certification of adherence to a standard.

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8.7.1 DCAN Certification

Figure 8-3. DCAN Certification

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8.7.2 LIN Certification

8.7.2.1 LIN Master Mode

Figure 8-4. LIN Certification - Master Mode

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8.7.2.2 LIN Slave Mode - Fixed Baud Rate

Figure 8-5. LIN Certification - Slave Mode - Fixed Baud Rate

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8.7.2.3 LIN Slave Mode - Adaptive Baud Rate

Figure 8-6. LIN Certification - Slave Mode - Adaptive Baud Rate

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9 Mechanical Packaging and Orderable Information

9.1 Packaging Information
The following pages include mechanical packaging and orderable information. This information is the most
current data available for the designated devices. This data is subject to change without notice and
without revision of this document. For browser-based versions of this data sheet, refer to the left-hand
navigation.

www.ti.com 10-Dec-2020

PACKAGING INFORMATION

Orderable Device Status Package Type Package Pins Package Eco Plan Lead finish/ MSL Peak Temp Op Temp (°C) Device Marking Samples
(1) Drawing Qty (2) Ball material (3) (4/5)
(6)

TMS5701224CPGEQQ1 ACTIVE LQFP PGE 144 60 RoHS & Green NIPDAU Level-3-260C-168 HR -40 to 125 TMS570LS
1224CPGEQQ1
TMS5701224CZWTQQ1 ACTIVE NFBGA ZWT 337 90 RoHS & Green SNAGCU Level-3-260C-168 HR -40 to 125 TMS570LS
1224CZWTQQ1

(1)
The marketing status values are defined as follows:
ACTIVE: Product device recommended for new designs.
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.
OBSOLETE: TI has discontinued the production of the device.

(2)
RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may
reference these types of products as "Pb-Free".
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based
flame retardants must also meet the <=1000ppm threshold requirement.

(3)
MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.

(4)
There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.

(5)
Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation
of the previous line and the two combined represent the entire Device Marking for that device.

(6)
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two
lines if the finish value exceeds the maximum column width.

Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.

In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.

Addendum-Page 1
PACKAGE OPTION ADDENDUM

www.ti.com 10-Dec-2020

Addendum-Page 2
PACKAGE MATERIALS INFORMATION

www.ti.com 23-Sep-2022

TRAY

L - Outer tray length without tabs KO -

Outer
tray
height

W-
Outer
tray
width
Text

P1 - Tray unit pocket pitch

CW - Measurement for tray edge (Y direction) to corner pocket center
CL - Measurement for tray edge (X direction) to corner pocket center

Chamfer on Tray corner indicates Pin 1 orientation of packed units.

*All dimensions are nominal

Device Package Package Pins SPQ Unit array Max L (mm) W K0 P1 CL CW
Name Type matrix temperature (mm) (µm) (mm) (mm) (mm)
(°C)
TMS5701224CPGEQQ1 PGE LQFP 144 60 5X12 150 315 135.9 7620 25.4 17.8 17.55
TMS5701224CZWTQQ1 ZWT NFBGA 337 90 6 X 15 150 315 135.9 7620 20 17.5 15.45

Pack Materials-Page 1
MECHANICAL DATA

MTQF017A – OCTOBER 1994 – REVISED DECEMBER 1996

PGE (S-PQFP-G144) PLASTIC QUAD FLATPACK

108 73

109 72

0,27
0,08 M
0,17

0,50

144 0,13 NOM

1 36
Gage Plane
17,50 TYP
20,20 SQ
19,80 0,25
22,20 0,05 MIN 0°– 7°
SQ
21,80

0,75
0,45
1,45
1,35

Seating Plane

1,60 MAX 0,08

4040147 / C 10/96

NOTES: A. All linear dimensions are in millimeters.

B. This drawing is subject to change without notice.
C. Falls within JEDEC MS-026

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 1

PACKAGE OUTLINE
ZWT0337A SCALE 0.950
NFBGA - 1.4 mm max height
PLASTIC BALL GRID ARRAY

16.1 A
B
15.9

BALL A1 CORNER

16.1
15.9

1.4 MAX C

SEATING PLANE
0.45 BALL TYP
TYP 0.12 C
0.35

14.4 TYP
SYMM (0.8) TYP

V
U (0.8) TYP
T
R
P
N
M
14.4 L SYMM
TYP K
J
H
G 0.55
337X
F 0.45
E 0.15 C A B
D
0.05 C
C

B
A
0.8 TYP 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19

BALL A1 CORNER 0.8 TYP

4223381/A 02/2017

NOTES:

1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing
per ASME Y14.5M.
2. This drawing is subject to change without notice.

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EXAMPLE BOARD LAYOUT
ZWT0337A NFBGA - 1.4 mm max height
PLASTIC BALL GRID ARRAY

(0.8) TYP
337X ( 0.4)
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
A
B
(0.8) TYP C

J
SYMM
K

SYMM

LAND PATTERN EXAMPLE

EXPOSED METAL SHOWN
SCALE:7X

0.05 MAX METAL UNDER

( 0.4) 0.05 MIN
SOLDER MASK
METAL

EXPOSED METAL
SOLDER MASK ( 0.4)
EXPOSED METAL SOLDER MASK
OPENING
OPENING
NON-SOLDER MASK SOLDER MASK
DEFINED DEFINED
(PREFERRED)

SOLDER MASK DETAILS

NOT TO SCALE
4223381/A 02/2017

NOTES: (continued)

3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.
For information, see Texas Instruments literature number SPRAA99 (www.ti.com/lit/spraa99).

www.ti.com
EXAMPLE STENCIL DESIGN
ZWT0337A NFBGA - 1.4 mm max height
PLASTIC BALL GRID ARRAY

( 0.4) TYP
(0.8) TYP
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19
A
B
(0.8) TYP C

J
SYMM
K

SYMM

SOLDER PASTE EXAMPLE

BASED ON 0.15 mm THICK STENCIL
SCALE:7X

4223381/A 02/2017

NOTES: (continued)

4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.

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DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS”
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These resources are subject to change without notice. TI grants you permission to use these resources only for development of an
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TI products.
TI objects to and rejects any additional or different terms you may have proposed. IMPORTANT NOTICE

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tms570ls1224

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TMS570LS1224 16- and 32-Bit RISC Flash Microcontroller

2 Device Overview Copyright © 2012–2015, Texas Instruments Incorporated

Table 1-1. Device Information (1)

Copyright © 2012–2015, Texas Instruments Incorporated Device Overview 3

1.4 Functional Block Diagram

Main Cross Bar: Arbitration and Prioritization Control

Figure 1-1. Functional Block Diagram

4 Device Overview Copyright © 2012–2015, Texas Instruments Incorporated

Copyright © 2012–2015, Texas Instruments Incorporated Table of Contents 5

• Updated/Changed section title to "Device Overview" ........................................................................... 1

6 Revision History Copyright © 2012–2015, Texas Instruments Incorporated

• Changed EMIF th(EMOEH-EMCEH) from +4 to +5 .................................................................................... 85

Copyright © 2012–2015, Texas Instruments Incorporated Revision History 7

Table 3-1. TMS570LS1224 Device Comparison (1) (2)

(1) For additional device variants, see www.ti.com/tms570

8 Device Comparison Copyright © 2012–2015, Texas Instruments Incorporated

4 Terminal Configuration and Functions

nTRST 109 72 AD1IN[10] / AD2IN[10]

Figure 4-1. PGE QFP Package Pinout (144-Pin)

Copyright © 2012–2015, Texas Instruments Incorporated Terminal Configuration and Functions 9

4.2 ZWT BGA Package Ball-Map (337 Ball Grid Array)

AD1IN[15] AD1IN[22] AD1IN[11]

AD1IN[8] AD1IN[14] AD1IN[13]

AD1IN[23] AD1IN[12] AD1IN[19]

N2HET1 N2HET1 EMIF_

EMIF_ EMIF_ MIBSPI3

N2HET1 EMIF_ EMIF_ EXTCLKI MIBSPI3 MIBSPI3

EMIF_ EMIF_ EMIF_ MIBSPI3 MIBSPI3

EMIF_ EMIF_ EMIF_ N2HET1

MIBSPI5 EMIF_ EMIF_ EMIF_ N2HET1 MIBSPI5

N2HET1 N2HET1 EMIF_ EMIF_ N2HET1 N2HET1 EMIF_

MIBSPI3 SPI2 KELVIN_ N2HET1 N2HET1 MIBSPI1 N2HET1

SPI2 N2HET1 N2HET1 N2HET1 N2HET1 N2HET1

Figure 4-2. ZWT Package Pinout. Top View

10 Terminal Configuration and Functions Copyright © 2012–2015, Texas Instruments Incorporated

4.3 Terminal Functions

4.3.1 PGE Package

4.3.1.1 Multibuffered Analog-to-Digital Converters (MibADC)

Table 4-1. PGE Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2)

Table 4-1. PGE Multibuffered Analog-to-Digital Converters (MibADC1, MibADC2) (continued)

12 Terminal Configuration and Functions Copyright © 2012–2015, Texas Instruments Incorporated

4.3.1.2 Enhanced High-End Timer Modules (N2HET)

Table 4-2. PGE Enhanced High-End Timer Modules (N2HET)

Copyright © 2012–2015, Texas Instruments Incorporated Terminal Configuration and Functions 13

Table 4-2. PGE Enhanced High-End Timer Modules (N2HET) (continued)

4.3.1.3 Enhanced Capture Modules (eCAP)

Table 4-3. PGE Enhanced Capture Modules (eCAP) (1)

14 Terminal Configuration and Functions Copyright © 2012–2015, Texas Instruments Incorporated

4.3.1.4 Enhanced Quadrature Encoder Pulse Modules (eQEP)

4.3.1.5 Enhanced Pulse-Width Modulator Modules (ePWM)

Table 4-5. PGE Enhanced Pulse-Width Modulator Modules (ePWM)

Copyright © 2012–2015, Texas Instruments Incorporated Terminal Configuration and Functions 15

Table 4-5. PGE Enhanced Pulse-Width Modulator Modules (ePWM) (continued)

4.3.1.6 General-Purpose Input / Output (GPIO)

Table 4-6. PGE General-Purpose Input / Output (GPIO)

4.3.1.7 Controller Area Network Controllers (DCAN)

Table 4-7. PGE Controller Area Network Controllers (DCAN)

16 Terminal Configuration and Functions Copyright © 2012–2015, Texas Instruments Incorporated

4.3.1.8 Local Interconnect Network Interface Module (LIN)

Table 4-8. PGE Local Interconnect Network Interface Module (LIN)

4.3.1.9 Standard Serial Communication Interface (SCI)

Table 4-9. PGE Standard Serial Communication Interface (SCI)

4.3.1.10 Inter-Integrated Circuit Interface Module (I2C)

Table 4-10. PGE Inter-Integrated Circuit Interface Module (I2C)

4.3.1.11 Standard Serial Peripheral Interface (SPI)

Table 4-11. PGE Standard Serial Peripheral Interface (SPI)

Copyright © 2012–2015, Texas Instruments Incorporated Terminal Configuration and Functions 17

4.3.1.12 Multibuffered Serial Peripheral Interface Modules (MibSPI)

Table 4-12. PGE Multibuffered Serial Peripheral Interface Modules (MibSPI)

MIBSPI3CLK/AWM1_EXT_SEL[1]/EQEP1A 53 I/O Pull Up Programmable, MibSPI3 clock, or GPIO

MIBSPI5CLK 100 I/O Pull Up Programmable, MibSPI5 clock, or GPIO

18 Terminal Configuration and Functions Copyright © 2012–2015, Texas Instruments Incorporated

4.3.1.13 System Module Interface

Table 4-13. PGE System Module Interface