Module2 - Capacitor and Resistor Model
Module2 - Capacitor and Resistor Model
Reference:
Rabaey
Outline
MOS Capacitance Models
Shiv
Nadar
University
The Big Picture
So far, we have treated transistors as ideal switches
An ON transistor passes a finite amount of current
Depends on terminal voltages
Current-voltage (I-V) relationships
Transistor gate, source, drain all have capacitance
I = C (DV/Dt) Dt = (C/I) DV
Capacitance and current determine speed
MOS CAPACITANCE
• The current-voltage characteristics investigated here can be
applied for investigating the DC response of MOS circuits
under various operating conditions.
junction capacitances
Overlap Capacitance
• It was shown earlier that the gate electrode overlaps both the
source and drain region at the edges. The two overlap
capacitances that arise as a result of this structural
arrangement are called CGS0 (overlap) and CGD0 (overlap),
respectively.
• Assuming that both the source and the drain diffusion regions
have the same width W, the overlap capacitances can be
found as
In Cut-off mode:
surface is not inverted. Consequently, there is no conducting
channel that links the surface to the source and to the drain.
Therefore, the gate-to-source and the gate-to-drain capacitances
are both equal to zero:
Linear Mode
Saturation Mode
When the MOSFET is operating in
saturation mode, the inversion layer on the
surface does not extend to the drain,
Cgd = 0
Total Capacitance
Diffusion Capacitance
Csb, Cdb
Undesired capacitance (parasitic)
Due to the reverse biased p-n
junctions between source diffusion
and body and drain diffusion and body
Capacitance depends on area and
perimeter
Diffusion Capacitance
• Bottom-plate junction,
• Side-wall junction
𝑪
𝒔𝒘 =𝑪 𝒋𝒔𝒘 (𝐖 +𝟐 𝑳 𝒔 )
Reference
1. Baker
Review: MOSFET CAPACITANCE
• Effective switching resistance of MOSFET
Point A in Fig. shows the operating point of the MOSFET prior to switching for
VDD = 5 V. After switching takes place, the operating point moves to point B
and follows the curve Vgs = VDD down to ID = 0 and VDS = 0, point C.
• For an NMOS device with a specific width, W, or length,
L, we can estimate the effective switching resistance of
the device in the long-channel CMOS process (scale
factor of 1 µm) as
where W is the drawn width of the devices. Practically, to model the effects of
increasing switching resistance when L is greater than 1 (minimum), we can re-write Eq
SHORT-CHANNEL PROCESS
LONG-CHANNEL PROCESS
LONG-CHANNEL PROCESS