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Test point

Known as: Testpoint 
A test point is a location within an electronic circuit that is used to either monitor the state of the circuitry or to inject test signals. Test… 
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Related topics

Related topics

5 relations
Functional testing (manufacturing)Main distribution frameReference designatorSurface-mount technology

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
The Role of Social Learning Networks in Mobile Assisted Language Learning: Edmodo as a Case Study
  • Huseyin Bicen
  • Journal of universal computer science (Online)
  • 2015
  • Corpus ID: 40273196
In this study the effect of the Edmodo social learning environment on mobile assisted language learning (MALL) was examined by… 
2013
2013
Real time monitoring of aging process in power converters using the SSTDR generated impedance matrix
A non-interfering measurement technique has been proposed in this paper to identify aging in various components in a power… 
Highly Cited
2012
Highly Cited
2012
An affinity-based new local distance function and similarity measure for kNN algorithm
2011
2011
Developing Quality Learning Materials for Effective Teaching and Learning in an ODL environment: Making the jump from print modules to online modules
This paper highlights the need to develop quality learning materials for effective teaching and learning in an online and… 
2007
2007
SPARTAN: a spectral and information theoretic approach to partial-scan
We propose a new partial-scan algorithm, the first to use toggling rates of the flip-flops (analyzed using DSP methods) and… 
2004
2004
A new probing technique for high-speed/high-density printed circuit boards
  • K. Parker
  • International Conferce on Test
  • 2004
  • Corpus ID: 15681853
Bullock in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of… 
Review
2003
Review
2003
Determining the Causes of Top-Down Cracks in Bituminous Pavements
Top down cracks (TDC) are longitudinal or transverse cracks that initiate at the pavement surface and propagate downward and… 
Highly Cited
2000
Highly Cited
2000
Test point insertion for compact test sets
Efficient production testing is frequently hampered because (cores in) current complex digital circuit designs require too large… 
1999
1999
A systematic DFT procedure for library cells
We present an automated procedure for improving the testability of a product by improving the testability of cells in the cell… 
1977
1977
The acquisition of word meaning: An investigation of some current concepts
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