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ORCIDJean-Pierre Raskin
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2020 – today
- 2024
[i5]Srinjoy Mitra, Jean-Pierre Raskin:
The Paradox of Industrial Involvement in Engineering Higher Education. CoRR abs/2402.16766 (2024)- 2023
- [c22]Nicolas Roisin, Jean-Pierre Raskin, Denis Flandre:
Near-IR response of highly-strained Si photodetector linking first principles and TCAD. ESSDERC 2023: 132-135 - [c21]Quentin Berlingard, M. Moulin, J.-P. Michel, T. Fache, Ismael Charlet, C. Plantier, Z. Chalupa, Jose Lugo-Alvarez
, Jean-Pierre Raskin, Louis Hutin, Mikaël Cassé:
RF performance of Standard, High-Resistivity and Trap-Rich Silicon substrates down to cryogenic temperature. ESSDERC 2023: 148-151 - [c20]Srinjoy Mitra, Jean-Pierre Raskin:
The Paradox of Industrial Involvement in Engineering Higher Education. FIE 2023: 1-6 - [c19]Youssef Bendou, Martin Rack, Dimitri Lederer, Andreia Cathelin, Jean-Pierre Raskin:
Substrate noise mitigation using high resistivity base silicon wafer for a 14 GHz VCO on 28 nm FD-SOI. NEWCAS 2023: 1-5 - [i4]Srinjoy Mitra, Jean-Pierre Raskin, Mario Pansera:
Role of ICT Innovation in Perpetuating the Myth of Techno-Solutionism. CoRR abs/2309.12355 (2023) - 2022
- [j12]Rameez Raja Shaik, Chandrasekar Lakshumanan, Jean-Pierre Raskin, Kumar Prasannajit Pradhan:
Back-gate bias effect on the linearity of pocket doped FDSOI MOSFET. Microelectron. J. 121: 105365 (2022) - [j11]Fares Tounsi, Mohamed Hadj Said, Margo Hauwaert, Sinda Kaziz, Laurent A. Francis, Jean-Pierre Raskin, Denis Flandre:
Variation Range of Different Inductor Topologies with Shields for RF and Inductive Sensing Applications. Sensors 22(9): 3514 (2022) - [c18]Thibault Pirson, Thibault P. Delhaye, Alex Pip, Grégoire Le Brun, Jean-Pierre Raskin, David Bol:
The Environmental Footprint of IC Production: Meta-Analysis and Historical Trends. ESSDERC 2022: 352-355 - [c17]Oriane de Leuze, Yann Danlée, Xiaohui Tang, Julien Mahy, Thomas Walewyns, Jean-Pierre Raskin, Sophie Hermans, Laurent A. Francis:
Sub-ppm detection of H2S with CuO-loaded SnO2 hollow nanospheres deposited on interdigitated electrodes. ISOEN 2022: 1-3 - 2021
- [j10]Xiaohui Tang, Marc Debliquy, Driss Lahem, Yiyi Yan, Jean-Pierre Raskin:
A Review on Functionalized Graphene Sensors for Detection of Ammonia. Sensors 21(4): 1443 (2021) - [c16]Quentin Courte, Martin Rack, M. Nabet, Pieter Cardinael, Jean-Pierre Raskin:
High-Temperature Characterization of Novel Silicon-Based Substrate Solutions for RF-IC Applications. ESSDERC 2021: 187-190 - [c15]Martin Rack, Lucas Nyssens, Quentin Courte, Dimitri Lederer, Jean-Pierre Raskin:
Impact of Device Shunt Loss on DC-80 GHz SPDT in 22 nm FD-SOI. ESSDERC 2021: 195-198 - [c14]Pieter Cardinael, Sachin Yadav, Ming Zhao, Martin Rack, Dimitri Lederer, Nadine Collaert, Bertrand Parvais, Jean-Pierre Raskin:
Impact of III-N buffer layers on RF losses and harmonic distortion of GaN-on-Si Substrates. ESSDERC 2021: 303-306 - [c13]Sachin Yadav, Pieter Cardinael, Ming Zhao, Komal Vondkar, Uthayasankaran Peralagu, AliReza Alian, Ahmad Khaled, Sergej Makovejev, Enrique Ekoga, Dimitri Lederer, Jean-Pierre Raskin, Bertrand Parvais, Nadine Collaert:
CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities. ICICDT 2021: 1-4
2010 – 2019
- 2019
- [c12]Lucas Nyssens, Arka Halder, Babak Kazemi Esfeh, Nicolas Planes, Michel Haond, Denis Flandre, Jean-Pierre Raskin, Valeriya Kilchytska:
Self-Heating in 28 FDSOI UTBB MOSFETs at Cryogenic Temperatures. ESSDERC 2019: 162-165 - 2018
- [j9]Marc Debliquy, Driss Lahem, Antonio Bueno-Martinez, Christophe Caucheteur, Marcel Bouvet, Isaline Recloux, Jean-Pierre Raskin, Marie-Georges Olivier:
Optical Fibre NO2 Sensor Based on Lutetium Bisphthalocyanine in a Mesoporous Silica Matrix. Sensors 18(3): 740 (2018) - [j8]Luis A. Velosa-Moncada, Luz Antonio Aguilera-Cortés, Max A. González-Palacios, Jean-Pierre Raskin, Agustín Leobardo Herrera-May:
Design of a Novel MEMS Microgripper with Rotatory Electrostatic Comb-Drive Actuators for Biomedical Applications. Sensors 18(5): 1664 (2018) - [j7]Néstor N. Peña-García, Luz Antonio Aguilera-Cortés, Max A. González-Palacios, Jean-Pierre Raskin, Agustín Leobardo Herrera-May:
Design and Modeling of a MEMS Dual-Backplate Capacitive Microphone with Spring-Supported Diaphragm for Mobile Device Applications. Sensors 18(10): 3545 (2018) - 2017
- [j6]Xiaohui Tang, Jean-Pierre Raskin, Driss Lahem, Arnaud Krumpmann, André Decroly, Marc Debliquy:
A Formaldehyde Sensor Based on Molecularly-Imprinted Polymer on a TiO2 Nanotube Array. Sensors 17(4): 675 (2017) - [c11]B. Kazemi Esfeh, Valeria Kilchytska, Bertrand Parvais, Nicolas Planes, M. Haond, Denis Flandre, Jean-Pierre Raskin:
Back-gate bias effect on UTBB-FDSOI non-linearity performance. ESSDERC 2017: 148-151 - 2016
- [j5]Pierre-Antoine Haddad, Geoffroy Gosset, Jean-Pierre Raskin, Denis Flandre:
Automated Design of a 13.56 MHz 19µW Passive Rectifier With 72% Efficiency Under 10µA load. IEEE J. Solid State Circuits 51(5): 1290-1301 (2016) - [c10]Pierre-Antoine Haddad, Jean-Pierre Raskin, Denis Flandre:
Efficient passive energy harvesters at 950 MHz and 2.45 GHz for 100 μW applications in 65 nm CMOS. ICECS 2016: 508-511 - [c9]Pierre-Antoine Haddad, Jean-Pierre Raskin, Denis Flandre:
Automated design of a 13.56 MHz corner-robust efficient differential drive rectifier for 10 μA load. ISCAS 2016: 1822-1825 - 2015
- [c8]Jean-Pierre Raskin:
FinFET versus UTBB SOI - A RF perspective. ESSDERC 2015: 84-88 - [c7]A. Rouhi Najaf Abadi, W. Guo, X. Sun, K. Ben Ali, Jean-Pierre Raskin, Martin Rack, C. Roda Neve, M. Choi, V. Moroz, Geert Van der Plas, Ingrid De Wolf, Eric Beyne, Philippe P. Absil:
Through silicon via to FinFET noise coupling in 3-D integrated circuits. ICICDT 2015: 1-4 - [c6]Jean-Marc Le Meil, Bernard Aspar, Eric Desbonnets, Jean-Pierre Raskin:
Engineered substrates: The foundation to meet current and future RF requirements. VLSI-DAT 2015: 1-4 - 2014
- [c5]Sergej Makovejev, Babak Kazemi Esfeh, Jean-Pierre Raskin, Valeria Kilchytska, Denis Flandre, Vincent Barral, Nicolas Planes, Michel Haond:
Variability of UTBB MOSFET analog figures of merit in wide frequency range. ESSDERC 2014: 222-225 - [c4]Yasmina Belaroussi, Abdelhalim Slimane, Mohand-Tahar Belaroussi, Mohamed Trabelsi, Gilles Scheen, Khaled Ben Ali, Jean-Pierre Raskin:
RF and non-linearity characterization of porous silicon layer for RF-ICs. IDT 2014: 79-82 - [c3]Jean-Pierre Raskin:
SOI technology: An opportunity for RF designers? VLSI-DAT 2014: 1-2 - 2013
- [c2]Sergej Makovejev, Babak Kazemi Esfeh, Jean-Pierre Raskin, Denis Flandre, Valeria Kilchytska, François Andrieu:
Threshold voltage extraction techniques and temperature effect in context of global variability in UTBB mosfets. ESSDERC 2013: 194-197 - 2011
- [j4]C. Roda Neve, Valeria Kilchytska, Joaquín Alvarado, Dimitri Lederer, O. Militaru, Denis Flandre, Jean-Pierre Raskin:
Impact of neutron irradiation on the RF properties of oxidized high-resistivity silicon substrates with and without a trap-rich passivation layer. Microelectron. Reliab. 51(2): 326-331 (2011)
2000 – 2009
- 2008
- [j3]Rodrigo Trevisoli Doria, Antonio Cerdeira, Jean-Pierre Raskin, Denis Flandre, Marcelo Antonio Pavanello:
Harmonic distortion analysis of double gate graded-channel MOSFETs operating in saturation. Microelectron. J. 39(12): 1663-1670 (2008) - [j2]Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, Alexandru Vlad, Jean-Pierre Raskin:
MIMC reliability and electrical behavior defined by a physical layer property of the dielectric. Microelectron. Reliab. 48(8-9): 1553-1556 (2008) - [i3]M. El Ghorba, Nicolas André, S. Sobieski, Jean-Pierre Raskin:
Out-of-Plane Cmos Compatible Magnetometers. CoRR abs/0802.3077 (2008) - 2007
- [i2]Carlos Méndez, Christophe Louis, S. Paquay, P. De Vincenzo, Igor Klapka, Veronique Rochus, F. Iker, Nicolas André, Jean-Pierre Raskin:
3-D Self-Assembled Soi Mems: An Example of Multiphysics Simulation. CoRR abs/0711.3277 (2007) - [i1]D. Fabrègue, Nicolas André, T. Pardoen, Jean-Pierre Raskin:
New Internal Stress Driven on-Chip Micromachines for Extracting Mechanical Properties of Thin Films. CoRR abs/0711.3332 (2007) - 2003
- [c1]G. Laurent, Luis Moreno Hagelsieb, Dimitri Lederer, P. E. Lobert, Denis Flandre, J. Remacle, Jean-Pierre Raskin:
DNA electrical detection based on inductor resonance frequency in standard CMOS technology. ESSCIRC 2003: 337-340
1990 – 1999
- 1998
- [j1]Jean-Paul Eggermont, Denis Flandre, Jean-Pierre Raskin, Jean-Pierre Colinge:
Potential and modeling of 1-μm SOI CMOS operational transconductance amplifiers for applications up to 1 GHz. IEEE J. Solid State Circuits 33(4): 640-643 (1998)
Coauthor Index
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