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2020 – today
- 2024
[c12]Yiming Qu, Chu Yan, Yaru Ding, Yi Zhao:
Impact of Hot Carrier Degradation and Bias Temperature Instability on GHz Cycle-to-Cycle Variation in Ultra-Scaled FinFETs. IRPS 2024: 1-6- [c11]Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao:
Physical Study of Low-frequency TDDB Lifetime Deterioration in Advanced FinFETs. IRPS 2024: 1-6 - [c10]Zeping Weng
, Zhangsheng Lan, Yaru Ding, Yiming Qu, Yi Zhao:
Orthorhombic-I Phase and Related Phase Transitions: Mechanism of Superior Endurance $(> 10^{14})$ of HfZrO Anti-ferroelectrics for DRAM Applications. IRPS 2024: 11 - 2023
- [j3]Yiming Qu, I-Hua Chen, Shangjie Meng:
Multimedia teaching resource allocation method for distance online education based on packet cluster mapping. Int. J. Inf. Commun. Technol. 23(4): 314-326 (2023) - [c9]Yaru Ding, Xinwei Yu, Chu Yan, Zeping Weng, Yiming Qu, Yi Zhao:
Interval time dependent wake-up effect of HfZrO ferroelectric capacitor. IRPS 2023: 1-4 - [c8]Yiming Qu, Chu Yan, Xinwei Yu, Yaru Ding, Yi Zhao:
GHz Cycle-to-Cycle Variation in Ultra-scaled FinFETs: From the Time-Zero to the Aging States. IRPS 2023: 1-6 - [c7]Xinwei Yu, Chu Yan, Yaru Ding, Yiming Qu, Yi Zhao:
GHz AC to DC TDDB Modeling with Defect Accumulation Efficiency Model. IRPS 2023: 1-6 - 2022
- [c6]Yiming Qu, Yang Shen, Mingji Su, Jiwu Lu, Yi Zhao:
GHz C-V Characterization Methodology and Its Application for Understanding Polarization Behaviors in High-k Dielectric Films. IRPS 2022: 3 - [c5]Chu Yan, Yaru Ding, Yiming Qu, Liang Zhao, Yi Zhao:
Universal Hot Carrier Degradation Model under DC and AC Stresses. IRPS 2022: 7 - [c4]Yaru Ding, Wei Liu, Yiming Qu, Liang Zhao, Yi Zhao:
Degradation Behaviors of 22 nm FDSOI CMOS Inverter Under Gigahertz AC Stress. IRPS 2022: 50-1 - 2021
- [j2]Ran Cheng, Ying Sun, Yiming Qu, Wei Liu, Fanyu Liu, Jianfeng Gao, Nuo Xu, Bing Chen:
Nano-scaled transistor reliability characterization at nano-second regime. Sci. China Inf. Sci. 64(10) (2021) - 2020
- [c3]Yiming Qu, Jiwu Lu, Junkang Li, Zhuo Chen, Jie Zhang, Chunlong Li, Shiuh-Wuu Lee, Yi Zhao:
In-Situ Monitoring of Self-Heating Effect in Aggressively Scaled FinFETs and Its Quantitative Impact on Hot Carrier Degradation Under Dynamic Circuit Operation. IRPS 2020: 1-6
2010 – 2019
- 2019
- [c2]Shifan Gao, Bing Chen, Nuo Xu, Yiming Qu, Yi Zhao:
Probing Write Error Rate and Random Telegraph Noise of MgO Based Magnetic Tunnel Juction Using a High Throughput Characterization System. IRPS 2019: 1-4 - 2018
- [j1]Yiming Qu, Bing Chen, Wei Liu, Jinghui Han, Jiwu Lu, Yi Zhao:
Sub-1 ns characterization methodology for transistor electrical parameter extraction. Microelectron. Reliab. 85: 93-98 (2018) - [c1]Yiming Qu, Ran Cheng, Wei Liu, Junkang Li, Bich-Yen Nguyen, Olivier Faynot, Nuo Xu, Bing Chen, Yi Zhao:
Effect of measurement speed (μs-800 ps) on the characterization of reliability behaviors for FDSOI nMOSFETs. IRPS 2018: 6
Coauthor Index
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