"Analysis of the leakage effect in a pipelined ADC with nanoscale CMOS ..."

Chin-Yu Lin, Yen-Chuan Huang, Tai-Cheng Lee (2013)

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DOI: 10.1109/VLDI-DAT.2013.6533874

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Chin-Yu Lin, Yen-Chuan Huang, Tai-Cheng Lee:
Analysis of the leakage effect in a pipelined ADC with nanoscale CMOS technologies. VLSI-DAT 2013: 1-4

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