"Integrated Test Solutions for a System Design Environment."

Kevin T. Kornegay, Robert W. Brodersen (1994)

> Home

Details and statistics

DOI: 10.1155/1994/39791

access: open

type: Journal Article

metadata version: 2022-12-06

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/KornegayB94
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/KornegayB94
Kevin T. Kornegay, Robert W. Brodersen:
Integrated Test Solutions for a System Design Environment. VLSI Design 1(4): 345-357 (1994)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.