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ORCID36th VTS 2018: San Francisco, CA, USA
- 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, CA, USA, April 22-25, 2018. IEEE Computer Society 2018, ISBN 978-1-5386-3774-6
- Peter Sarson, Tomonori Yanagida, Kosuke Machida:
Group delay measurement of frequency down-converter devices using chirped RF modulated signal. 1-6 - Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida:
A coherent subsampling test system arrangement suitable for phase domain measurements. 1-6 - Marc Margalef-Rovira, Manuel J. Barragán, Ekta Sharma, Philippe Ferrari, Emmanuel Pistono, Sylvain Bourdel:
An oscillation-based test technique for on-chip testing of mm-wave phase shifters. 1-6 - Ro Cammarota, Naghmeh Karimi, Siddharth Garg, Jeyavijayan Rajendran:
Special session: Recent developments in hardware security. 1 - M. Casarsa, Gurgen Harutyunyan, Kaitlyn Chen, Ramesh Sharma, Giri Podichetty, Martin Keim, Sreejit Chakravarty, Ramesh C. Tekumalla:
Innovative practices on memory test practice. 1 - Abhrajit Sengupta, Mohammed Thari Nabeel, Muhammad Yasin
, Ozgur Sinanoglu:
ATPG-based cost-effective, secure logic locking. 1-6 - Ziqi Zhou, Ujjwal Guin, Vishwani D. Agrawal:
Modeling and test generation for combinational hardware Trojans. 1-6 - Jing Ye, Qingli Guo, Yu Hu, Huawei Li, Xiaowei Li:
Modeling attacks on strong physical unclonable functions strengthened by random number and weak PUF. 1-6 - Lukás Sekanina, Zdenek Vasícek, Alberto Bosio, Marcello Traiola, Paolo Rech, Daniel Oliveira, Fernando Fernandes, Stefano Di Carlo:
Special session: How approximate computing impacts verification, test and reliability. 1 - Wim Dobbelaere, On Semi, Massimo Violante, Turin Polytechnic, Jeff Rearick:
Innovative practices on quality levels of A/MS devices. 1 - Tamzidul Hoque, Xinmu Wang, Abhishek Basak, Robert Karam, Swarup Bhunia:
Hardware Trojan attacks in embedded memory. 1-6 - Gregor Schatzberger, Friedrich Peter Leisenberger, Peter Sarson, Andreas Wiesner:
High efficient low cost EEPROM screening method in combination with an area optimized byte replacement strategy which enables high reliability EEPROMs. 1-6 - Mohammad Nasim Imtiaz Khan, Swaroop Ghosh:
Test challenges and solutions for emerging non-volatile memories. 1-6 - Shimeng Yu, Chenchen Liu, Wujie Wen, Yiran Chen:
Special session on reliability and vulnerability of neuromorphic computing systems. 1 - Art Schaldenbrand, Yervant Zorian, Stephen Sunter, Peter Sarson:
IP session on ISO26262 EDA. 1 - Abhishek Koneru, Krishnendu Chakrabarty:
An inter-layer interconnect BIST solution for monolithic 3D ICs. 1-6 - Maryam Shafiee, Jennifer N. Kitchen, Sule Ozev:
A built-in self-test technique for transmitter-only systems. 1-6 - Omar Al-Terkawi Hasib, Daniel Crepeau, Thomas Awad, Andrei Dulipovici, Yvon Savaria, Claude Thibeault:
Exploiting built-in delay lines for applying launch-on-capture at-speed testing on self-timed circuits. 1-6 - Terrence S. T. Mak, Hiroki Matsutani, Partha Pratim Pande:
Special session on bringing cores closer together: The wireless revolution in on-chip communication. 1 - Anandh Krishnan, John van Gelder, Mayukh Bhattacharya, Sreejit Chakravarty, Prashant Goteti:
Innovative practices on functional testing and fault simulation for FuSa. 1 - Zhanwei Zhong, Guoliang Li, Qinfu Yang, Jun Qian, Krishnendu Chakrabarty:
Broadcast-based minimization of the overall access time for the IEEE 1687 network. 1-6 - Saurabh Gupta, Jae Wu, Jennifer Dworak:
Efficient parallel testing: A configurable and scalable broadcast network design using IJTAG. 1-6 - Rana Elnaggar, Ramesh Karri, Krishnendu Chakrabarty:
Securing IJTAG against data-integrity attacks. 1-6 - Sudeep Pasricha, Davide Bertozzi, Hui Li:
Special session on overcoming reliability and energy-efficiency challenges with silicon photonics for future manycore computing. 1 - Koji Asami, Yoshiro Tamura, Haruo Kobayashi, Jun Matsushima, Yoichi Maeda, Kazumi Hatayama:
Innovative practices on test in Japan. 1 - Felix Neubauer, Jan Burchard, Pascal Raiola, Jochen Rivoir, Bernd Becker, Matthias Sauer:
Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. 1-6 - Gaurav Rajavendra Reddy, Constantinos Xanthopoulos, Yiorgos Makris:
Enhanced hotspot detection through synthetic pattern generation and design of experiments. 1-6 - Yingdi Liu, Janusz Rajski, Sudhakar M. Reddy, Jedrzej Solecki, Jerzy Tyszer:
Staggered ATPG with capture-per-cycle observation test points. 1-6 - Kanad Basu, Shreyas Sen:
Special session on intelligent sensor nodes. 1 - Roy Meade, Woosung Kim, Richard Otte, Eugene R. Atwood:
Innovative practices on silicon photonics. 1 - Abhishek Das, Nur A. Touba:
Systematic b-adjacent symbol error correcting reed-solomon codes with parallel decoding. 1-6 - Kexin Yang, Taizhi Liu, Rui Zhang, Linda Milor:
Circuit-level reliability simulator for front-end-of-line and middle-of-line time-dependent dielectric breakdown in FinFET technology. 1-6 - Sascha Heinssen, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
On-line monitoring and error correction in sensor interface circuits using digital calibration techniques. 1-6 - Hans-Mart von Staudt, James Izon, Sule Ozev, Peter Sarson:
Special session on BIST/calibration of A/MS devices. 1 - Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang:
Innovative practices on machine learning for emerging applications. 1 - Fang Lin, Ali Ahmadi, Kannan Sekar, Yan Pan, Ke Huang:
IC layout weak point effectiveness evaluation based on statistical methods. 1-6 - Jeff Jun Zhang, Tianyu Gu, Kanad Basu, Siddharth Garg:
Analyzing and mitigating the impact of permanent faults on a systolic array based neural network accelerator. 1-6 - Shih-Yao Lin, Yen-Chun Fang, Yu-Ching Li, Yu-Cheng Liu, Tsung-Shan Yang, Shang-Chien Lin, Chien-Mo James Li, Eric Jia-Wei Fang:
IR drop prediction of ECO-revised circuits using machine learning. 1-6 - Krishnendu Chakrabarty, Li-C. Wang, Gaurav Veda, Yu Huang:
Special session on machine learning for test and diagnosis. 1 - Sohrab Aftabjahani, Jason Oberg, Michael Chen, Huawei Li:
Innovative practices on challenges, opportunities, and solutions to hardware security. 1 - Michael S. Hsiao, Sarmad Tanwir:
Fast fault coverage estimation of sequential tests using entropy measurements. 1-6 - Qutaiba Khasawneh, Jennifer Dworak, Ping Gui, Benjamin Williams, Alan C. Elliott, Anand Muthaiah:
Real-time monitoring of test fallout data to quickly identify tester and yield issues in a multi-site environment. 1-6 - Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev:
Online information utility assessment for per-device adaptive test flow. 1-6 - Carlo Reita, Jonathan Baugh, Gabriel Poulin-Lamarre, Bozena Kaminska, Bernard Courtois:
Special session on quantum systems: Next challenges in design, test, integration. 1 - Soumya Mittal, R. D. (Shawn) Blanton:
NOIDA: Noise-resistant Intra-cell Diagnosis. 1-6 - Alessandro Vallero, Sotiris Tselonis, Dimitris Gizopoulos, Stefano Di Carlo:
Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUs. 1-6 - Fatih Karabacak, Richard Welker, Matthew J. Casto, Jennifer N. Kitchen, Sule Ozev:
RF circuit authentication for detection of process Trojans. 1-6 - Yiorgos Makris, Amit Nahar, Haralampos-G. D. Stratigopoulos, Marc Hutner:
Special session on machine learning: How will machine learning transform test? 1 - Tsung-Ching Jim Huang, Jason Marsh, Scott H. Goodwin, Dorota S. Temple:
Innovative practices on design & test for flexible hybrid electronics. 1
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