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ORCIDIEEE Transactions on Instrumentation and Measurement, Volume 52
Volume 52, Number 1, February 2003
- Péter Várady, Szabolcs Bongár, Zoltán Benyó:
Detection of airway obstructions and sleep apnea by analyzing the phase relation of respiration movement signals. 2-6 - Zhiyao Huang, Baoliang Wang, Haiqing Li:
Application of electrical capacitance tomography to the void fraction measurement of two-phase flow. 7-12 - Ants Ronk:
Analysis and reproduction of a signal's periodic components by means of an extended block-adaptive Fourier analyzer. 13-19 - Leopoldo Angrisani, Aldo Baccigalupi, Giovanni D'Angiolo:
A frame-level measurement apparatus for performance testing of ATM equipment. 20-26 - Maurice G. Cox, Mark P. Dainton, Nick M. Ridler, Martin J. Salter, P. R. Young:
An interpolation scheme for precision intermediate frequency reflection coefficient measurement. 27-37 - Salvatore Acunto, Pasquale Arpaia
, Donald M. Hummels, Fred H. Irons:
A new bidimensional histogram for the dynamic characterization of ADCs. 38-45 - Thierry Sentenac, Yannick Le Maoult, Guy Rolland, Michel Devy:
Temperature correction of radiometric and geometric models for an uncooled CCD camera in the near infrared. 46-60 - Rik Pintelon, Yves Rolain, Wendy Van Moer:
Probability density function for frequency response function measurements using periodic signals. 61-68 - Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Variance of the cumulative histogram of ADCs due to frequency errors. 69-74 - Giovanni Bucci, Edoardo Fiorucci, Carmine Landi:
Digital measurement station for power quality analysis in distributed environments. 75-84 - Alina Caddemi, Nicola Donato:
Characterization techniques for temperature-dependent experimental analysis of microwave transistors. 85-91 - Balázs Vödrös, István Kollár:
Identification of a furnace from quasi-periodic measurements. 92-96 - Zbigniew Czaja, Romuald Zielonko:
Fault diagnosis in electronic circuits based on bilinear transformation in 3-D and 4-D spaces. 97-102 - Shoji Kawahito, Ales Cerman, K. Aramaki, Yoshiaki Tadokoro:
A weak magnetic field measurement system using micro-fluxgate sensors and delta-sigma interface. 103-110 - Shanup Peer, Joseph T. Case, E. Gallaher, Kimberly E. Kurtis, Reza Zoughi:
Microwave reflection and dielectric properties of mortar subjected to compression force and cyclically exposed to water and sodium chloride solution. 111-118 - Dejun Liu, Rensheng Che, Zifang Li, Xiaochuan Luo:
Research on the theory and the virtual prototype of 3-DOF parallel-link coordinate-measuring machine. 119-125 - Michael Bazzarelli, Nelson G. Durdle, Edmond Lou, V. James Raso:
A wearable computer for physiotherapeutic scoliosis treatment. 126-129 - Richard A. Dudley, Nick M. Ridler:
Traceability via the Internet for microwave measurements using vector network analyzers. 130-134 - Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. 135-142 - Dalgerti Lelis Milanez, Alexander Eigeles Emanuel:
The instantaneous-space-phasor: a powerful diagnosis tool. 143-148 - Valentino Liberali, Fabio Cherchi, Luca Disingrini, Massimo Gottardi, Stefano Gregori, Guido Torelli:
A digital self-calibration circuit for absolute optical rotary encoder microsystems. 149-157 - Voicu Z. Groza:
Experimental determination of synchronous machine reactances from DC decay at standstill. 158-164 - Giovanni Bucci, Carmine Landi:
A distributed measurement architecture for industrial applications. 165-174 - Emil M. Petriu, Lichen Zhao, Sunil R. Das, Voicu Z. Groza, Aurel Cornell:
Instrumentation applications of multibit random-data representation. 175-181 - Enrico Rubiola, Vincent Giordano, Hermann Stoll:
The ±45° correlation interferometer as a means to measure phase noise of parametric origin. 182-188 - Gabriele D'Antona:
The full least-squares method. 189-196 - Alain Geens, Yves Rolain, Wendy Van Moer, Kenneth Vanhoenacker, Johan Schoukens:
Discussion on fundamental issues of NPR measurements. 197-202 - Carlos Roberto Negrão Teani, Alberto Martins Jorge:
Nonlinear parametric test. 203-208 - Rommanee Jirawimut, Piotr Ptasinski, Vanja Garaj, Franjo Cecelja, Wamadeva Balachandran:
A method for dead reckoning parameter correction in pedestrian navigation system. 209-215
Volume 52, Number 2, April 2003
- U. Feller:
Editorial. 225-226 - John L. Hall, Jun Ye:
Optical frequency standards and measurement. 227-231 - Long Sheng Ma, Lennart Robertsson, Susanne Picard, Jean-Marie Chartier, H. Karlsson, E. Prieto, Robert Windeler:
The BIPM laser standards at 633 nm and 532 nm simultaneously linked to the SI second using a femtosecond laser in an optical clock configuration. 232-235 - Susanne Picard, Lennart Robertsson, Long Sheng Ma, Y. Millerioux, Patrick Juncar, Jean-Pierre Wallerand, Petr Balling, Petr Krin, Kaj Nyholm, Mikko Merimaa, Tero E. Ahola, Feng-Lei Hong:
Results from international comparisons at the BIPM providing a world-wide reference network of 127I2 stabilized frequency-doubled Nd: YAG lasers. 236-239 - Feng-Lei Hong, Jun Ishikawa, Kazuhiko Sugiyama, Kazuhik Onae, Hirokazu Matsumoto, Jun Ye, John L. Hall:
Comparison of independent optical frequency measurements using a portable iodine-stabilized Nd: YAG laser. 240-244 - U. Tanaka, James C. Bergquist, Sebastien Bize, Scott A. Diddams, R. E. Drullinger, Leo Hollberg, Wayne M. Itano, Carol E. Tanner, David J. Wineland:
Optical frequency standards based on the 199Hg+ ion. 245-249 - Jürgen Helmcke, Guido Wilpers, Tomas Binnewies, Carsten Degenhardt, Uwe Sterr, Harald Schnatz, Fritz Riehle:
Optical frequency standard based on cold Ca atoms. 250-254 - Irène Courtillot, Audrey Quessada, Richard P. Kovacich, Jean-Jacques Zondy, Arnaud Landragin, Giorgio Santarelli, André Clairon, Pierre Lemonde:
Cold strontium atoms for an optical frequency standard. 255-257 - Jacques Vanier, Martin W. Levine, Daniel Janssen, Michael J. Delaney:
The coherent population trapping passive frequency standard [Rb example]. 258-262 - Taeg Yong Kwon, Ho Seong Lee, Sung Hoon Yang, Sang Eon Park:
Development of a cesium atomic fountain frequency standard. 263-266 - Filippo Levi, Luca Lorini, Davide Calonico, Aldo Godone:
Systematic shift uncertainty evaluation of IEN CSF1 primary frequency standard. 267-271 - A. A. Madej, M. Ball:
Iodine stabilized dye laser system for frequency measurements in the visible and near IR region of the spectrum. 272-276 - Sang Eon Park, Taeg Yong Kwon, Ho Seong Lee:
Production of Raman laser beams using injection-locking technique. 277-279 - Sang Eon Park, Taeg Yong Kwon, Eun-joo Shin, Ho Seong Lee:
A compact extended-cavity diode laser with a Littman configuration. 280-283 - Kaj Nyholm, Mikko Merimaa, Tero E. Ahola, Antti Lassila:
Frequency stabilization of a diode-pumped Nd: Yag laser at 532 nm to iodine by using third-harmonic technique. 284-287 - Frédéric du Burck, Olivier Lopez, A. El Basri:
Narrow-band correction of the residual amplitude modulation in frequency-modulation spectroscopy. 288-291 - Simon Rainville, James K. Thompson, David E. Pritchard:
Two ions in one trap: ultra-high precision mass spectrometry? 292-296 - Fengchao Xiao, Fadhel M. Ghannouchi, Toshiyuki Yakabe:
Application of a six-port wave-correlator for a very low velocity measurement using the Doppler effect. 297-301 - Anton Widarta, Tomoteru Kawakami:
Attenuation measurement system in the frequency range of 10 to 100 MHz. 302-305 - Hiroshi Nakano, Hiroshi Murakami, Takeumi Inoue, Yoshihiko Kato:
An experiment for verification of the auxiliary transmission-line method to evaluate a microwave thermal noise source. 306-310 - Ulrich Stumper:
Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements. 311-315 - Ilona Rolfes, Burkhard Schiek:
LRR-a self-calibration technique for the calibration of vector network analyzers. 316-319 - Luciano Brunetti, Emil T. Vremera:
A new microcalorimeter for measurements in 3.5-mm coaxial line. 320-323 - Thomas Musch:
A high precision 24-GHz FMCW radar based on a fractional-N ramp-PLL. 324-327 - Ling Hao, John C. Gallop, John C. Macfarlane:
Coupled microwave resonators as the basis for sensitive bolometric detection. 328-332 - Nicolas Gagnon, Jafar Shaker, Pierre Berini, Langis Roy, Aldo Petosa:
Material characterization using a quasi-optical measurement system. 333-336 - Umberto Pogliano:
Frequency band requirement for a precision RMS measurement system based on successive extraction of the means of absolute values. 337-340 - Milos Stojanovic, Manfred Klonz, Borislav Stojanovic:
High performance millivolt-amplifier for the planar multijunction thermal converter. 341-344 - Luciana Scarioni, Manfred Klonz, David Janik, Héctor Laiz, Marian Kampik:
High-frequency thin-film multijunction thermal converter on a quartz crystal chip. 345-349 - Héctor Laiz, Manfred Klonz, Ernst Kessler, Marian Kampik, Rado Lapuh:
Low-frequency AC-DC voltage transfer standards with new high-sensitivity and low-power-coefficient thin-film multijunction thermal converters. 350-354 - Borislav Stojanovic, Manfred Klonz, Héctor Laiz, S. Kraicanic:
AC-DC voltage transfer module with thin-film multijunction thermal converter. 355-358 - Hitoshi Sasaki, Hirotake Yamamori, Hiroyuki Fujiki, Kunihiko Takahashi, Akira Shoji:
Measurement of thermoelectric effects in a thermal converter using a NbN/TiN/NbN Josephson junction array. 359-362 - Ling Xiang Liu, Sze Wey Chua, Chee Kiang Ang:
Behavior and frequency dependence of AC-DC high voltage transfer standard under humidity step changes. 363-366 - Gregory A. Kyriazis:
Extension of Swerlein's algorithm for AC voltage measurement in the frequency domain. 367-370 - Waldemar G. Kürten Ihlenfeld, Enrico Mohns, Hans Bachmair, Günther Ramm, Harald Moser:
Evaluation of the synchronous generation and sampling technique. 371-374 - Umberto Pogliano, Gian Carlo Bosco, Vincenzo D'Elia:
Extension of the IEN traceability for AC voltages below 200 mV. 375-379 - Luca Callegaro, Gian Carlo Bosco, Vincenzo D'Elia, Danilo Serazio:
Direct-reading absolute calibration of AC voltage ratio standards. 380-383 - Rae Duk Lee, Han Jun Kim, Yu. P. Semyonov:
Precise ratio transformer: a new concept of the magnetic system. 384-387 - Andrew C. Corney:
Digital generator assisted impedance bridge. 388-391 - S. S. Moodley, W. van den Berg, C. S. Veldman:
Improving the mechanical stability of a standard capacitor. 392-395 - Günther Ramm, Harald Moser:
Calibration of electronic capacitance and dissipation factor bridges. 396-399 - Jari K. Hällström, Yury Chekurov, Martti M. Aro:
A calculable impulse voltage calibrator for calibration of impulse digitizers. 400-403 - Yi Li, Juris Rungis, Terry R. McComb:
Comparative impulse voltage measurements at the National Measurement Laboratory (NML), CSIRO, Australia, and the Institute for National Measurement Standards (INMS), NRC, Canada. 404-407 - Daniel Slomovitz:
Electronic system for increasing the accuracy of in-service instrument-current transformers. 408-410 - Réjean Arseneau, Michelle E. Sutherland, John J. Zelle:
A new transfer device for the NRC Travelling Standard Program. 411-414 - Ruslan Papazyan, Roland Eriksson:
Calibration for time domain propagation constant measurements on power cables. 415-418 - Giancarlo Marullo-Reedtz, Roberto Cerri, Isabelle Blanc, Ove Gunnarsson, Jonathan M. Williams, Felix Raso, Kyu-Tae Kim, Robert B. Frenkel, Zhang Xiuzeng, Alexander S. Katkov, Ronald Dziuba, Mark Parker, Barry M. Wood, Laurie A. Christian, Eddie Tarnow, Surender K. Mahajan, Ajeet Singh, Yasuhiko Sakamoto:
Comparison CCEM-K8 of DC voltage ratio: results. 419-423 - Eddy So, Réjean Arseneau, David Bennett, Thomas L. Nelson, Bryan C. Waltrip:
NRC-NIST intercomparison of calibration systems for current transducers with a voltage output at power frequencies. 424-428 - Eddy So, Réjean Arseneau, Ernst Hanique:
No-load loss measurements of power transformers under distorted supply voltage waveform conditions. 429-432 - Vladlen Ya. Shifrin, Vyacheslav N. Khorev, A. Ye. Shilov, Po Gyu Park:
The long-term stability of an atomic magnetic resonance standard system for the reproduction of direct current and magnetic flux density. 433-435 - Gerd-Dietmar Willenberg, H. N. Tauscher, Peter Warnecke:
A traceable precision current source for currents between 100 aA and 10 pA. 436-439 - Gunnar Fernqvist, Gregory Hudson, John R. P. Pickering, Francis Power:
Design and evaluation of a 10-mA DC current reference standard. 440-444 - Gunnar Fernqvist, Björn Halvarsson, John G. Pett, John R. P. Pickering:
A novel current calibration system up to 20 kA. 445-448 - Gert Rietveld, Chris V. Koijmans, Lesley C. A. Henderson, Michael J. Hall, Stuart Harmon, Peter Warnecke, Bernd Schumacher:
DC conductivity measurements in the Van der Pauw geometry. 449-453 - Clark A. Hamilton, Larry W. Tarr:
Projecting Zener DC reference performance between calibrations. 454-456 - Luís Alexandre Rocha, Edmond Cretu, Reinoud F. Wolffenbuttel:
Stability of a micromechanical pull-in voltage reference. 457-460 - Harald Slinde, Kåre Lind:
A precision setup and method for calibrating a DC voltage divider's ratios from 10 V to 1000 V. 461-464 - Yasuhiko Sakamoto, Hiroyuki Fujiki:
DC voltage divider calibration system at NMIJ. 465-468 - Kyu-Tae Kim, Sang-Hwa Lee, Jae Kap Jung, Yang Sup Song:
Method to determine the voltage coefficient of a DC high-voltage divider. 469-473 - Dean G. Jarrett, Ronald F. Dziuba:
CCEM-K2 key comparison of 10-MΩ and 1-GΩ resistance standards. 474-477 - Davey D. L. Wijngaards, Reinoud F. Wolffenbuttel:
Study on temperature stability improvement of on-chip reference elements using integrated Peltier coolers. 478-482 - Laurent-Guy Bernier:
Use of the Allan deviation and linear prediction for the determination of the uncertainty on time calibrations against predicted timescales. 483-486 - T. J. Witt:
Experimental sampling distributions and confidence intervals of the Allan variance in some DC electrical measurements. 487-490 - Nien Fan Zhang, Nell Sedransk, Dean G. Jarrett:
Statistical uncertainty analysis of key comparison CCEM-K2. 491-494 - Panu Helistö, Heikki Seppä:
Analysis of international comparisons with the minimum variance method. 495-499 - Giovanni Durando, Giovanni Mana, Fabrizio Mazzoleni:
Accuracy assessment of data analysis in absolute gravimetry. 500-503 - Alain Picard, Hao Fang:
Methods to determine the density of moist air. 504-507 - David B. Newell, John A. Kramar, Jon R. Pratt, Douglas T. Smith, Edwin R. Williams:
The NIST microforce realization and measurement project. 508-511 - Se Il Park, Hyun Kwon Hong:
Development of 10-V Josephson series arrays. 512-515 - Jean-Pierre Lo-Hive, Sophie Djordjevic, Phillippe Cancela, François P. M. Piquemal, Ralf Behr, Charles J. Burroughs Jr., Heikki Seppä:
Characterization of binary Josephson series arrays of different types at BNM-LNE and comparisons with conventional SIS arrays. 516-520 - Ralf Behr, Torsten Funck, Bernd Schumacher, Peter Warnecke:
Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays. 521-523 - Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö:
Analysis of different measurement setups for a programmable Josephson voltage standard. 524-528 - Alexander M. Klushin, Alexander V. Komkov, Valentina D. Gelikonova, Solomon I. Borovitskii, M. Siegel:
DC voltage calibrator based on an array of high-temperature superconductor Josephson junctions. 529-532 - Panu Helistö, Jaani Nissilä, Kari Ojasalo, Jari S. Penttilä, Heikki Seppä:
AC voltage standard based on a programmable SIS array. 533-537 - Ilya F. Budovsky, Hitoshi Sasaki, Peter Coogan:
AC-DC transfer comparator for the calibration of thermal voltage converters against Josephson alternating voltage standards. 538-541 - Charles J. Burroughs Jr., Samuel P. Benz, Paul D. Dresselhaus:
AC Josephson voltage standard error measurements and analysis. 542-544 - Samuel P. Benz, John M. Martinis, Paul D. Dresselhaus, Sae Woo Nam:
An AC Josephson source for Johnson noise thermometry. 545-549 - Sae Woo Nam, Samuel P. Benz, Paul D. Dresselhaus, Weston L. Tew, Rod White, John M. Martinis:
Johnson noise thermometry measurements using a quantized voltage noise source for calibration. 550-554 - A. Bounouh, Wilfrid Poirier, François P. M. Piquemal, Gérard Genevès, J. P. André:
Quantum resistance standards with double 2DEG. 555-558 - A. Dave Inglis, Barry M. Wood, Marcel Cote, R. Brent Young, Murray D. Early:
Direct determination of capacitance standards using a quadrature bridge and a pair of quantized Hall resistors. 559-562 - Jürgen Melcher, Jürgen Schurr, Klaus Pierz, Jonathan M. Williams, Stephen P. Giblin, Franco Cabiati, Luca Callegaro, Giancarlo Marullo-Reedtz, Cristina Cassiago, Beat Jeckelmann, Blaise Jeanneret, Frédéric Overney, Jaroslav Bohacek, Jirí Riha, Oliver Power, John Murray, Mário Nunes, Mário Lobo, Isabel Godinho:
The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect. 563-568 - A. Dave Inglis, Barry M. Wood, Marcel Cote, R. Brent Young, Murray D. Early:
Plateau flatness in the ACQHR: do gates really help? 569-573 - Frédéric Overney, Blaise Jeanneret, Beat Jeckelmann:
Effects of metallic gates on AC measurements of the quantum Hall resistance. 574-578 - Brian W. Ricketts, John R. Fiander, H. Leigh Johnson, Greig W. Small:
Four-port AC quantized Hall resistance measurements. 579-583 - Helko E. van den Brom, Oswin Kerkhof, Sergey V. Lotkhov, Sergey A. Bogoslovsky, Gerd-Dietmar Willenberg, Hansjörg Scherer, Alexander B. Zorin, S. Pedersen, C. Kristoffersson, A. Aassime, Per Delsing, Marian A. Taslakov, Z. Ivanov, Håkan Nilsson, Stephen P. Giblin, Peter Kleinschmidt, Christian Hof, Ali L. Eichenberger, Frédéric Overney, Blaise Jeanneret, Gérard Genevès, Nicolas Feltin, Laurent Devoille, Frederic Gay, François P. M. Piquemal:
Counting electrons one by one-overview of a joint European research project. 584-589 - Randolph E. Elmquist, Neil M. Zimmerman, William H. Huber:
Using a high-value resistor in triangle comparisons of electrical standards. 590-593 - Jens Ebbecke, Nicholas E. Fletcher, Franz-Josef Ahlers, A. Hartland, Jan-Theodor B. M. Janssen:
Study of the limitations of the quantized acoustic current technique at PTB and NPL. 594-598 - Nicolas Feltin, Laurent Devoille, François P. M. Piquemal, Sergey V. Lotkhov, Alexander B. Zorin:
Progress in measurements of a single-electron pump by means of a CCC. 599-603 - Christian Hof, Blaise Jeanneret, Ali L. Eichenberger, Frédéric Overney, Sergey V. Lotkhov:
First steps toward a quantum capacitance standard at METAS. 604-607 - Neil M. Zimmerman, Mahmoud A. El Sabbagh, Yicheng Wang:
Larger value and SI measurement of the improved cryogenic capacitor for the electron-counting capacitance standard. 608-611 - Javier Sesé, Elena Bartolomé, Agustín Camón, Jaap Flokstra, Gert Rietveld, Conrado Rillo:
Simplified calculus for the design of a cryogenic current comparator. 612-616 - Ling Hao, John C. Gallop, John C. Macfarlane, Chris Carr:
HTS cryogenic current comparator for non-invasive sensing of charged particle beams. 617-620 - Gert Rietveld, Elena Bartolomé, Javier Sesé, Pieter de la Court, Jaap Flokstra, Conrado Rillo, Agustín Camón:
1: 30000 cryogenic current comparator with optimum SQUID readout. 621-625 - Walter Beer, Ali L. Eichenberger, Blaise Jeanneret, Beat Jeckelmann, Ali R. Pourzand, Philippe Richard, Joshua P. Schwarz:
Status of the METAS watt balance experiment. 626-630 - Naoki Kuramoto, Kenichi Fujii:
Interferometric determination of the diameter of a silicon sphere using a direct optical frequency tuning system. 631-635 - Horst Bettin, Hans Toth:
Flotation measurements to reveal the reason for the discrepancy in the molar volume of silicon. 636-640 - Michael J. Kenny, Paul De Bievre, Alain Picard:
A Web-based database for the international programme to improve the Avogadro constant along the silicon route. 641-645 - Kenichi Fujii, Atsushi Waseda, Naoki Kuramoto, Shigeki Mizushima, Mitsuru Tanaka, Staf Valkiers, Philip Taylor, Rüdiger Kessel, Paul De Bievre:
Evaluation of the molar volume of silicon crystals for a determination of the Avogadro constant. 646-651
Volume 52, Number 3, June 2003
- Fernando López-Peña, Richard J. Duro:
A virtual instrument for automatic anemometer calibration with ANN based supervision. 654-661 - Yu Su, Charles R. Allen, David Geng, David J. Burn, Una Brechany, Geoffrey Duncan Bell, R. Rowland:
3-D motion system ("data-gloves"): application for Parkinson's disease. 662-674 - Lionel Valet, Gilles Mauris, Philippe Bolon, Naamen Keskes:
A fuzzy linguistic-based software tool for seismic image interpretation. 675-680 - Matteo Bertocco, Sandro Cappellazzo, Alessio Carullo, Marco Parvis, Alberto Vallan:
Virtual environment for fast development of distributed measurement applications. 681-685 - Fernando Pianegiani, David Macii, Paolo Carbone:
An open distributed measurement system based on an abstract client-server architecture. 686-692 - Giovanni Moschioni:
A virtual instrumentation system for measurements on the tallest medieval bell tower in Europe. 693-702 - Daniel Fischer, Barna Szabados, W. F. Skip Poehlman:
Using a Bayes classifier to optimize alarm generation to electric power generator stator overheating. 703-709 - Alessandro Ferrero, Simona Salicone, Claudio Bonora, Marco Parmigiani:
ReMLab: a Java-based remote, didactic measurement laboratory. 710-715 - Francesco Amigoni, Arnaldo Brandolini, Gabriele D'Antona, Roberto Ottoboni, Marco Somalvico:
Artificial intelligence in science of measurements: from measurement instruments to perceptive agencies. 716-723 - Juan Luis Crespo, Richard J. Duro, Fernando López-Peña:
Gaussian synapse ANNs in multi- and hyperspectral image data analysis. 724-732 - Alessio Carullo, Marco Parvis, Alberto Vallan:
An audio card-based kit for educational purposes. 733-737 - David W. Braudaway:
The costs of calibration. 738-741 - Shen-Shu Xiong, Zhao-Ying Zhou:
Neural filtering of colored noise based on Kalman filter structure. 742-747 - Kenneth Vanhoenacker, Johan Schoukens:
Detection of nonlinear distortions with multisine excitations in the case of nonideal behavior of the input signal. 748-753 - Hui Shao, Wei Jin, Shie Qian:
Order tracking by discrete Gabor expansion. 754-761 - Salvatore Baglio, Enrico Foti:
Non-invasive measurements to analyze sandy bed evolution under sea waves action. 762-770 - Theodore Antonakopoulos, Eustathia Ziouva, Vassilios Makios:
On mapping stochastic processes into hardware and its application on ATM traffic emulation. 771-779 - Chung-Bin Wu, Bin-Da Liu, Jar-Ferr Yang:
A fuzzy-based impulse noise detection and cancellation for real-time processing in video receivers. 780-784 - Kay Soon Low, Meng-Teck Keck:
Advanced precision linear stage for industrial automation applications. 785-789 - Guillaume Gelle, Maxime Colas, Christine Servière:
Blind source separation: a new pre-processing tool for rotating machines monitoring? 790-795 - Bruno Andò, Annalisa Baeri, Ignazio Fragalà, Salvatore Graziani:
A field point based approach for sensor conditioning in MO-CVD reactors. 796-803 - Paiboon Nakmahachalasint, Khai D. T. Ngo:
High-temperature, high-frequency characterization system for power ferrites. 804-808 - Alireza K. Ziarani, Adalbert Konrad, Anthony N. Sinclair:
A novel time-domain method of analysis of pulsed sine wave signals. 809-814 - Bruno Andò, Salvatore Graziani:
An instrument for the detection of optimal working conditions in stochastic systems. 815-821 - Jacques Vanier, Martin W. Levine, Daniel Janssen, Michael J. Delaney:
On the use of intensity optical pumping and coherent population trapping techniques in the implementation of atomic frequency standards. 822-831 - Xin Hu, Kevin W. Houser:
A versatile spectral lamp measurement system. 832-838 - Franco Fiori, Francesco Musolino:
Comparison of IC conducted emission measurement methods. 839-845 - Loredana Cristaldi, Alessandro Ferrero, Massimo Lazzaroni, Adriano Paolo Morando:
Sensorless evaluation of asymmetric hysteresis loops of ferromagnetic materials. 846-851 - Andrea Murari, A. Hoffmann:
Signal processing and calibration electronics for the SXR tomographic diagnostic of the RFX fusion experiment. 852-858 - Gabriel Abadal, Francesc Pérez-Murano, Núria Barniol, Xavier Aymerich:
The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips. 859-864 - Ching-Shiang Hwang, Fu Yuan Lin, Tai-ching Fan:
Integral magnetic field measurement using an automatic fast long-loop-flip coil system. 865-870 - Matteo Bertocco, Luca Garbin, Claudio Narduzzi:
Correction of systematic effects in digitizing oscilloscopes. 871-877 - Remo Lombardi, Giuseppe Coldani, Giovanni Danese, Roberto Gandolfi, Francesco Leporati:
Data acquisition system for measurements in free moving subjects and its applications. 878-884 - Colt R. Correa, Selim Saad Awad:
Embedded controller software and algorithm development tool. 885-890 - Frank De Bisschop, Jan Vandewege, Wei Li, Marc De Mets:
Low-frequency electronic gate detection for the counting and sizing of cells, bacteria, and colloidal particles in liquids. 891-897 - Yen-Wei Chen, Shusuke Narieda, Katsumi Yamashita:
Blind nonlinear system identification based on a constrained hybrid genetic algorithm. 898-902 - Lorenzo Gonzo, Andrea Simoni, Massimo Gottardi, David Stoppa, J.-Angelo Beraldin:
Sensors optimized for 3-D digitization. 903-908 - Valnyr Vasconcelos Lira, José Sérgio da Rocha Neto, P. Rezende Barros, Adrianus C. van Haandel:
Automation of an anaerobic-aerobic wastewater treatment process. 909-915 - Amei Li, Xinqun Liu, Warwick Clegg, David F. L. Jenkins, Terrence Donnelly:
Real-time method to measure head disk spacing variation under vibration conditions. 916-920 - Ada Fort, Nicola Machetti, Santina Rocchi, M. Belén Serrano-Santos, Luca Tondi, Nicola Ulivieri, Valerio Vignoli, Giorgio Sberveglieri:
Tin oxide gas sensing: comparison among different measurement techniques for gas mixture classification. 921-926 - Zoltin Szabó, Géza Kolumbán:
How to avoid false lock in SPLL frequency synthesizers. 927-931 - Paolo Ferrari, Alessandra Flammini, Daniele Marioli, Andrea Taroni:
High-resolution multichannel instrument for resonant sensor array. 932-937 - Andrea Aiello, Domenico Grimaldi:
Frequency error measurement in GMSK signals in a multipath propagation environment. 938-945 - Roland Holcer, Linus Michaeli, Ján Saliga:
DNL ADC testing by the exponential shaped voltage. 946-949 - Rainer J. Fink, Mark B. Yeary, Mark Burns, David W. Guidry:
A DSP-based technique for high-speed A/D conversion to generate coherently sampled sequences. 950-958 - Andrea Bernieri, Giovanni Betta, Luigi Ferrigno:
Improving nondestructive testing probe performance by digital processing techniques. 959-965 - Michal Wisniewski, Roman Z. Morawski, Andrzej Barwicz:
An adaptive rational filter for interpretation of spectrometric data. 966-972 - Ali Iraqi, Andrzej Barwicz, Paul Mermelstein, Roman Z. Morawski, Wojtek J. Bock:
Design of a wireless communications module for telemetry in civil infrastructure monitoring. 973-977 - Pasquale Arpaia, Felice Cennamo, Pasquale Daponte, Harald Schumny:
Modeling and characterization of sigma-delta analog-to-digital converters. 978-983 - Kostas N. Tarchanidis, John N. Lygouras:
Data glove with a force sensor. 984-989 - Ángel Custodio, Ramon Pallas-Areny, Ramon Bragós:
Correction to "Error analysis and reduction for a simple sensor-microcontroller interface". 990
Volume 52, Number 4, August 2003
- Renato Sasdelli:
Editorial [IMTC 2002]. 994-996 - Chin E. Lin, Chih-Ching Li, An Sang Hou, Chih-Chen Wu:
A real-time remote control architecture using mobile communication. 997-1003 - Mathias J. Niemann, Volker H. Hans:
Phase reconstruction of modulated ultrasonic signals and new measurement technique of flow velocity. 1004-1008 - José Ismael de la Rosa Vargas, Gilles Fleury, Marie-Eve Davoust:
Minimum-entropy, PDF approximation, and kernel selection for measurement estimation. 1009-1020 - Johan Schoukens, Yves Rolain, Gyula Simon, Rik Pintelon:
Fully automated spectral analysis of periodic signals. 1021-1024 - Sebastian C. Schneider, Y. Gautam, Bernhard G. Zagar:
Application of a locally operating laser-speckle strain sensor. 1025-1029 - Alain Geens, Wendy Van Moer, Yves Rolain:
Measuring in-band distortions of mixers. 1030-1034 - Niksa Tadic, Desa Gobovic:
A square-rooting current-to-frequency converter. 1035-1040 - Qiang Wang, Yi Shen, Ye Zhang, Jian Qiu Zhang:
A quantitative method for evaluating the performances of hyperspectral image fusion. 1041-1047 - Matteo Bertocco, Ronny Tittoto, Edoardo Rizzi, Luigino Benetazzo:
Statistical analysis of measurements for telecommunication-network troubleshooting. 1048-1053 - Piet M. T. Broersen, Stijn de Waele:
Time series analysis in a frequency subband. 1054-1060 - Piet M. T. Broersen, Stijn de Waele:
Generating data with prescribed power spectral density. 1061-1067 - Antonio J. López-Martín, Juan Ignacio Osa, Mikel Zuza, Alfonso Carlosena:
Analysis of a negative impedance converter as a temperature compensator for bridge sensors. 1068-1072 - Loredana Cristaldi, Alessandro Ferrero, Carlo Muscas, Simona Salicone, Roberto Tinarelli:
The impact of Internet transmission on the uncertainty in the electric power quality estimation by means of a distributed measurement system. 1073-1078 - Claudia Di Nucci, Ada Fort, Santina Rocchi, Luca Tondi, Valerio Vignoli, Fabio Di Francesco, M. Belén Serrano-Santos:
A measurement system for odor classification based on the dynamic response of QCM sensors. 1079-1086 - Bernhard Schweighofer, Klaus M. Raab, Georg Brasseur:
Modeling of high power automotive batteries by the use of an automated test system. 1087-1091 - Pawel Niewczas, Lukasz Dziuda, Grzegorz Fusiek, Andrew J. Willshire, James R. McDonald, G. Thursby, D. Harvey, W. Craig Michie:
Interrogation of extrinsic Fabry-Perot interferometric sensors using arrayed waveguide grating devices. 1092-1096 - Leopoldo Angrisani, Massimo D'Apuzzo, Mauro D'Arco:
A new method for power measurements in digital wireless communication systems. 1097-1106 - David I. Bergman, Bryan C. Waltrip:
A low-noise latching comparator probe for waveform sampling applications. 1107-1113 - Michael Solomou, David Rees:
Measuring the best linear approximation of systems suffering nonlinear distortions: an alternative method. 1114-1119 - Jan Obrzut, Aleksei Anopchenko:
High-frequency input impedance characterization of dielectric films for power-ground planes. 1120-1124 - Dan Shi, Hongjian Zhang, Liming Yang:
Time-delay neural network for the prediction of carbonation tower's temperature. 1125-1128 - Pier Andrea Traverso, Domenico Mirri, Gaetano Pasini, Fabio Filicori:
A nonlinear dynamic S/H-ADC device model based on a modified Volterra series: identification procedure and commercial CAD tool implementation. 1129-1135 - Woei Wan Tan, Reginald F. Y. Li:
An in-situ temperature measurement system for DUV lithography. 1136-1142 - Lorenzo Peretto, Renato Sasdelli, Roberto Tinarelli:
A statistical model for estimating the trend of electrical quantities in power systems. 1143-1147 - Fabrizio Russo:
A method for estimation and filtering of Gaussian noise in images. 1148-1154 - Seiji Oda, Mitsuyoshi Anzai, Shoichi Uematsu, Kenzo Watanabe:
A silicon micromachined flow sensor using thermopiles for heat transfer measurements. 1155-1159 - Raul Carneiro Martins, António Manuel da Cruz Serra:
Representation and measurement of nonlinearities in stimulus signals. 1160-1165 - Rommanee Jirawimut, Simant Prakoonwit, Franjo Cecelja, Wamadeva Balachandran:
Visual odometer for pedestrian navigation. 1166-1173 - Alessandro Ferrero, Simona Salicone:
An innovative approach to the determination of uncertainty in measurements based on fuzzy variables. 1174-1181 - Domenico Capriglione, Consolatina Liguori, Cesare Pianese, Antonio Pietrosanto:
On-line sensor fault detection, isolation, and accommodation in automotive engines. 1182-1189 - Gianluca Galzerano, Cesare Svelto, Elio Bava, Giorgio Carelli, M. Finotti, Augusto Moretti, Niccolò Beverini:
High-stability 72-GHz Gunn oscillator for the characterization of ultra-high-speed optical receivers based on InP and InSb Schottky diodes. 1190-1194 - Luca Callegaro, Gianluca Galzerano, Cesare Svelto:
Precision impedance measurements by the three-voltage method with a novel high-stability multiphase DDS generator. 1195-1199 - Francesco Adamo, Filippo Attivissimo, Nicola Giaquinto, Amerigo Trotta:
A/D converters nonlinearity measurement and correction by frequency analysis and dither. 1200-1205 - Theodore Laopoulos, Periklis Neofotistos, C. A. Kosmatopoulos, Spiridon Nikolaidis:
Measurement of current variations for the estimation of software-related power consumption [embedded processing circuits]. 1206-1212 - Alberto Lozano, Alfonso Carlosena:
DSP-based implementation of an ANSI S1.11 acoustic analyzer. 1213-1219 - Marco Parvis, Guido Perrone, Alberto Vallan:
A precompliance EMC test-set based on a sampling oscilloscope. 1220-1223 - Tran Hoai Linh, Stanislaw Osowski, Maciej Stodolski:
On-line heart beat recognition using Hermite polynomials and neuro-fuzzy network. 1224-1231 - Johan Driesen, Ronnie Belmans:
Wavelet-based power quantification approaches. 1232-1238 - Alessio Carullo, Marco Parvis, Alberto Vallan, Luca Callegaro:
Automatic compensation system for impedance measurement. 1239-1242 - Pasquale Daponte, Gianpaolo Mercurio, Sergio Rapuano, Gioacchino Truglia:
An image processing-based method for stress classification in digital telecommunication networks. 1243-1250 - Calogero Pace, Carmine Ciofi, Felice Crupi:
Very low-noise, high-accuracy programmable voltage reference. 1251-1254 - Federico Baronti, Luca Fanucci, Diego Lunardini, Roberto Roncella, Roberto Saletti:
A technique for nonlinearity self-calibration of DLLs. 1255-1260 - Georg Brasseur:
Design rules for robust capacitive sensors. 1261-1265 - Andrew G. Morgan, Nick M. Ridler, Martin J. Salter:
Generalized adaptive calibration schemes for precision RF vector network analyzer measurements. 1266-1272 - Giovanni Chiorboli:
Uncertainty of mean value and variance obtained from quantized data. 1273-1278 - Emilia Nunzi, Paolo Carbone, Dario Petri:
A procedure for highly reproducible measurements of ADC spectral parameters. 1279-1283 - Anne-Marie Jeffery, Andrew D. Koffman:
Improved 1-kHz capacitance calibration uncertainty. 1284-1288 - Rajesh Luharuka, Robert X. Gao, Sundar Krishnamurty:
Design and realization of a portable data logger for physiological sensing [GSR]. 1289-1295 - Changting Wang, Robert X. Gao:
Wavelet transform with spectral post-processing for enhanced feature extraction [machine condition monitoring]. 1296-1301 - Antonio Moschitta, Dario Petri:
Wideband communication system sensitivity to overloading quantization noise [ADC characterization]. 1302-1307 - Roman Z. Morawski, Andrzej Miekina, Tomasz Oleszczak, Andrzej Barwicz:
Polarization-versed calibration of spectrophotometric transducers. 1308-1313 - Piotr S. Filipski, Michael Boecker:
Experience with high-output-resistance MJTC AC-DC transfer standards at high frequencies [multijunction thermal converters]. 1314-1319 - Yoshio Tanimoto, Hirosuke Takechi, Akihiro Tokuhiro, Hideo Yamamoto:
Measurements of pressure and sinking depth for mattress selection [spinal cord injured patients]. 1320-1324 - Tet Hin Yeap, David K. Fenton, Pierre D. Lefebvre:
A novel common-mode noise cancellation technique for VDSL applications. 1325-1334 - Petru Rusu, Emil M. Petriu, Thomas E. Whalen, Aurel Cornell, Hans J. W. Spoelder:
Behavior-based neuro-fuzzy controller for mobile robot navigation. 1335-1340 - Bernard P. Gollomp:
Energy efficiency gain through partial recovery of surplus energy induced by nonlinear operating conditions and environments [automotive systems]. 1341-1346
Volume 52, Number 5, October 2003
- Sunil R. Das, Rochit Rajsuman:
Guest editorial [Special section on innovations in VLSI automatic test equipment (ATEs)]. 1350-1352 - Krishnendu Chakrabarty, Markus Seuring:
Space compaction of test responses using orthogonal transmission functions [logic testing]. 1353-1362 - Sunil R. Das, Made Sudarma, Mansour H. Assaf, Emil M. Petriu, Wen-Ben Jone, Krishnendu Chakrabarty, Mehmet Sahinoglu:
Parity bit signature in response data compaction and built-in self-testing of VLSI circuits with nonexhaustive test sets. 1363-1380 - Wen-Ben Jone, Der-Cheng Huang, Sunil R. Das:
An efficient BIST method for non-traditional faults of embedded memory arrays. 1381-1390 - Parag K. Lala, Alfred L. Burress:
Self-checking logic design for FPGA implementation. 1391-1398 - San L. Lin, Shoba Krishnan, Samiha Mourad:
A self-binning BIST structure for data communications transceivers. 1399-1407 - Rochit Rajsuman:
Architecture, design, and application of an event-based test system. 1408-1427 - Mehmet Sahinoglu:
An empirical Bayesian stopping rule in testing and verification of behavioral models. 1428-1443 - Jacob Savir, Zhen Guo:
Test limitations of parametric faults in analog circuits. 1444-1454 - Amit M. Sheth, Jacob Savir:
Single-clock, single-latch, scan design. 1455-1457 - Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai:
A cost-effective wafer-level reliability test system for integrated circuit makers. 1458-1467 - Lörinc Antoni, Régis Leveugle, Béla Fehér:
Using run-time reconfiguration for fault injection applications. 1468-1473 - Salvatore Baglio:
Bio-geochemically inspired capacitive sensors for heavy metals pollution monitoring. 1474-1481 - Sebastian Yuri Cavalcanti Catunda, Jean-François Naviner, Gurdip Singh Deep, Raimundo Carlos Silvério Freire:
Designing a programmable analog signal conditioning circuit without loss of measurement range. 1482-1487 - Soubhi Abou Chahine, Bernard Huyart, Joseph Achkar:
Reflectometer calibration without an open circuit. 1488-1493 - Song Chen, De-Yin Jeng, Hironori Hadano, Yoshiaki Ishiguro, Masakatsu Nakayama, Kenzo Watanabe:
A Nasicon CO2 gas sensor with drift-detection electrode. 1494-1500 - Tsenchieh Chiu:
Dielectric constant measurement technique for a dielectric strip using a rectangular waveguide. 1501-1508 - Minsu Choi, Nohpill Park, Fabrizio Lombardi:
Modeling and analysis of fault tolerant multistage interconnection networks. 1509-1519 - Konstantinos Christidis, G. P. Premasiri Gunarathne:
Temperature compensation for ultrasound measurements and characterization of materials. 1520-1527 - Ugur Çilingiroglu, Siew Kuok Hoon:
An optimally self-biased threshold-voltage extractor [MOSFET circuit parametric testing]. 1528-1532 - Carmine Ciofi, Felice Crupi, Calogero Pace, Graziella Scandurra:
Micro-prober for wafer-level low-noise measurements in MOS devices. 1533-1536 - Kevin J. Coakley, C. M. Wang, Paul D. Hale, Tracy S. Clement:
Adaptive characterization of jitter noise in sampled high-speed signals. 1537-1547 - Gustavo H. M. de Arruda, Péricles R. Barros:
Relay-based gain and phase margins PI controller design. 1548-1553 - Rômulo Pires Coelho Ferreira, Raimundo Carlos Silvério Freire, Gurdip Singh Deep:
Performance evaluation of a fluid temperature-compensated single sensor constant temperature anemometer. 1554-1558 - George C. Giakos, R. Guntupalli, J. Alexis De Abreu Garcia, N. Shah, Srinivasan Vedantham, Sankararaman Suryanarayanan, Samir Chowdhury, N. Patnekar, S. Sumrain, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Okechukwu C. Ugweje, A. Moholkar:
Intrinsic sensitivity of Cd1-xZnxTe semiconductors for digital radiographic imaging. 1559-1565 - George C. Giakos, Samir Chowdhury, N. Shah, S. Guntupalli, Srinivasan Vedantham, Sankararaman Suryanarayanan, Richard Nemer, Amlan Dasgupta, K. Mehta, Edward A. Evans, A. Orozco, V. Kumar, Luay Fraiwan, N. Patnekar:
Signal dispersion measurements on the gas detector volume of a dual-energy multimedia digital imaging sensor. 1566-1572 - Gaetano Iuculano, Andrea Zanobini, Annarita Lazzari, G. P. Gualtieri:
Measurement uncertainty in a multivariate model: a novel approach. 1573-1580 - Dileepan Joseph, Steve Collins:
Modeling, calibration, and rendition of color logarithmic CMOS image sensors. 1581-1587 - V. Jagadeesh Kumar, P. Sankaran, K. Sudhakara Rao:
Measurement of C and tanδ of a capacitor employing PSDs and dual-slope DVMs. 1588-1592 - Xi Li, Renbiao Wu, Srihari Rasmi, Jian Li, Louis N. Cattafesta, Mark Sheplak:
Acoustic proximity ranging in the presence of secondary echoes. 1593-1605 - Sabine Long, Laurent Escotte, Jacques Graffeuil, F. Brasseau, J. L. Cazaux:
On-wafer noise characterization of low-noise amplifiers in the Ka-band. 1606-1610 - David Macii, Paolo Carbone, Dario Petri:
Management of measurement uncertainty for effective statistical process control. 1611-1617 - Nicholas G. Paulter Jr., Donald R. Larson:
Sources of uncertainty in the nose-to-nose sampler calibration method. 1618-1626 - Pierre Payeur, Changzhong Chen:
Registration of range measurements with compact surface representation. 1627-1634 - M. Schlaf, Hani Hagras, David Sands:
Optimization strategies for parametric analysis of thin-film reflectivity spectra. 1635-1639 - Mohamed A. Suhail, Mohammad S. Obaidat:
Digital watermarking-based DCT and JPEG model. 1640-1647 - Zdzislaw Szczepanik, Zbigniew Rucki, Zbigniew Moron:
Finite-element analysis of the electric field distribution in conductance cell. 1648-1653 - Vladimir V. Terzija:
Improved recursive Newton-type algorithm for frequency and spectra estimation in power systems. 1654-1659 - Hartwig W. Thim:
Absence of the relativistic transverse Doppler shift at microwave frequencies. 1660-1664 - Gabriella Tognola, Marta Parazzini, Paolo Ravazzani, Ferdinando Grandori, Cesare Svelto:
3-D acquisition and quantitative measurements of anatomical parts by optical scanning and image reconstruction from unorganized range data. 1665-1673 - Wuqiang Yang, A. L. Stott, J. C. Gamio:
Analysis of the effect of stray capacitance on an ac-based capacitance tomography transducer. 1674-1681 - A. Zanobini, M. Ghizzani:
Measurement of some typical parameters in the realization of a signal management plant in railway diagnostics. 1682-1687 - Predrag V. Pejovic, Lazar Saranovac, Miodrag V. Popovic:
Comments on "New algorithm for measuring 50/60-Hz AC values based on the usage of slow A/D converters" and "Measuring of slowly changing AC signals without sample-and-hold circuit". 1688-1692
Volume 52, Number 6, December 2003
- Nohpill Park, Fabrizio Lombardi:
Guest Editorial. 1694-1695 - Vishal Sahni, V. Prem Pyara:
An embryonic approach to reliable digital instrumentation based on evolvable hardware. 1696-1702 - Cristiana Bolchini, Luigi Pomante, Fabio Salice, Donatella Sciuto:
The design of reliable devices for mission-critical applications. 1703-1712 - Byoungjae Jin, Nohpill Park, Kayikkalthop M. George, Minsu Choi, Mark B. Yeary:
Modeling and analysis of soft-test/repair for CCD-based digital X-ray systems. 1713-1721 - Luca Schiano, Cecilia Metra, Diego Marino:
Self-checking design, implementation, and measurement of a controller for track-side railway systems. 1722-1728 - Petros Drineas, Yiorgos Makris:
SPaRe: selective partial replication for concurrent fault-detection in FSMs. 1729-1737 - Tian Xia, Jien-Chung Lo:
Time-to-voltage converter for on-chip jitter measurement. 1738-1748 - Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max:
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment. 1749-1755 - Marco S. Dragic, Martin Margala:
A versatile built-in CMOS sensing device for digital circuit parametric test. 1756-1764 - Michele Norgia, Silvano Donati:
A displacement-measuring instrument utilizing self-mixing interferometry. 1765-1770 - Trent McConaghy, Henry Leung, Éloi Bossé, Vinay Varadan:
Classification of audio radar signals using radial basis function neural networks. 1771-1779 - Mohamed M. Hafed, Gordon W. Roberts:
Techniques for high-frequency integrated test and measurement. 1780-1786 - Seung Ho Hong, In-Ho Choi:
Experimental evaluation of a bandwidth allocation scheme for foundation fieldbus. 1787-1791 - Jordi Salazar, Antoni Turó, Juan Antonio Chávez, Juan A. Ortega, Miguel Jesus García:
High-power high-resolution pulser for air-coupled ultrasonic NDE applications. 1792-1798 - Hakim Khali, Yvon Savaria, Jean-Louis Houle, Marc Rioux, J.-Angelo Beraldin, D. Poussart:
Improvement of sensor accuracy in the case of a variable surface reflectance gradient for active laser range finders. 1799-1808 - Luigi Fortuna, Mattia Frasca, Alessandro Rizzo:
Chaotic pulse position modulation to improve the efficiency of sonar sensors. 1809-1814 - Sergey N. Kharkovsky, Ugur Cem Hasar:
Measurement of mode patterns in a high-power microwave cavity. 1815-1819 - Daniel Nordin, Kalevi Hyyppä:
Single-stage photodiode op-amp solution suited for a self-mixing FMCW system. 1820-1824 - Nicholas G. Paulter Jr., Andrew J. A. Smith, Donald R. Larson, T. Michael Souders, A. G. Roddie:
NIST-NPL interlaboratory pulse measurement comparison. 1825-1833 - Wendy Van Moer, Yves Rolain:
Proving the usefulness of a three-port nonlinear vectorial network analyzer through mixer measurements. 1834-1837 - Sheng-Jen Hsieh, Clarence E. Rash, Thomas H. Harding, Howard H. Beasley, John S. Martin:
Helmet-mounted display image quality evaluation system. 1838-1845 - M. Bahoura, André Clairon:
Diode laser phase noise influence on the ultimate performance of its frequency stabilization to a Mach-Zehnder interferometer fringe. 1846-1853 - Thilo Sauter, Herbert Nachtnebel:
A feasible noise estimation algorithm for resource-limited sensor systems. 1854-1858 - Kati Sulonen, Pertti Vainikainen:
Performance of mobile phone antennas including effect of environment using two methods. 1859-1864 - Kok Wai Wong, Chun Che Fung, Halit Eren, Tom Gedeon:
Fuzzy rule interpolation for multidimensional input spaces in determining d50c of hydrocyclones. 1865-1869 - Abdullah Al Mamun, Tong Heng Lee, Guoxiao Guo, Wai Ee Wong, W. C. Ye:
Measurement of position offset in hard disk drive using dual frequency servo bursts. 1870-1880 - Dale Umbach, Kerry N. Jones:
A few methods for fitting circles to data. 1881-1885 - Bertalan Eged, László Balogh:
Analytical calculation of the impedance of lossy power/ground planes. 1886-1891 - Bruno Casadei, Jean-Piere Le Normand, Yann Hu, Bernard Cunin:
Design and characterization of a fast CMOS multiple linear array imager for nanosecond light pulse detections. 1892-1897 - Pietro Fiorentin:
Effect of the finite memory length of a recorder in evaluating its frequency response from step response. 1898-1902
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