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ORCIDNagarajan Raghavan
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2020 – today
- 2024
[j46]Jerry Joseph James
, Nagarajan Raghavan:
Successive Multi-Stage Compliance-Ramp Voltage Sweep Methodology (MSC-RVS) for Understanding the Evolution of Gate Breakdown Mechanisms in p-GaN HEMTs. IEEE Access 12: 133499-133508 (2024)- 2023
- [j45]Sejun Yoon, Nagarajan Raghavan, Nguyen-Truong Le, Hyunseok Park:
Investigating Knowledge Structure and Future Directions in IT-Based Business Methods Using Hierarchical Main Path Approach. IEEE Access 11: 135334-135350 (2023) - [j44]Umesh Kizhakkinan, Pham Luu Trung Duong, Robert Laskowski, Guglielmo Vastola, David W. Rosen, Nagarajan Raghavan:
Development of a surrogate model for high-fidelity laser powder-bed fusion using tensor train and gaussian process regression. J. Intell. Manuf. 34(1): 369-385 (2023) - [c16]J. Tan, J. H. Lim, Jae Hyun Kwon, Vinayak Bharat Naik, Nagarajan Raghavan, Kin Leong Pey:
Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation. IRPS 2023: 1-6 - [c15]Tiang Teck Tan, Yu-Yun Wang, Joel Tan, Tian-Li Wu, Nagarajan Raghavan, Kin Leong Pey:
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices. IRPS 2023: 1-7 - 2022
- [j43]Cheryl Selvanayagam, Pham Luu Trung Duong, Brett Wilkerson, Nagarajan Raghavan:
Global Optimization of Surface Warpage for Inverse Design of Ultra-Thin Electronic Packages Using Tensor Train Decomposition. IEEE Access 10: 48589-48602 (2022) - [j42]Nagaraj Lakshmana Prabhu, Nagarajan Raghavan:
Neuromorphic In-Memory RRAM NAND/NOR Circuit Performance Analysis in a CNN Training Framework on the Edge for Low Power IoT. IEEE Access 10: 125112-125135 (2022) - [j41]Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan:
Remaining Useful Life Prediction of Lithium-Ion Batteries Using Neural Networks with Adaptive Bayesian Learning. Sensors 22(10): 3803 (2022) - 2021
- [j40]Dan Jiang, Weihua Lin, Nagarajan Raghavan:
A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction. IEEE Access 9: 22253-22263 (2021) - [j39]Sohee Kim, Sejun Yoon, Nagarajan Raghavan, Nguyen-Truong Le, Hyunseok Park:
Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis. IEEE Access 9: 44704-44717 (2021) - [j38]Cheryl Selvanayagam, Pham Luu Trung Duong, Brett Wilkerson, Nagarajan Raghavan:
Inverse Design for Low Warpage Ultra-Thin Packages Using Constrained Particle Swarm Optimization. IEEE Access 9: 64043-64053 (2021) - [j37]Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan:
Hybrid Particle Filter Trained Neural Network for Prognosis of Lithium-Ion Batteries. IEEE Access 9: 135132-135143 (2021) - [j36]Dan Jiang, Weihua Lin, Nagarajan Raghavan:
Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms. IEEE Access 9: 137655-137666 (2021) - [j35]Lim Sze Li Harry, Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan:
Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis. IEEE Access 9: 166639-166657 (2021) - [j34]Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan:
Predicting Lumen Degradation of Light Emitting Diodes Using Hybrid Particle Filter Trained Neural Networks. IEEE Access 9: 167292-167304 (2021) - [j33]Nagaraj Lakshmana Prabhu, Nagarajan Raghavan:
Computational Failure Analysis of In-Memory RRAM Architecture for Pattern Classification CNN Circuits. IEEE Access 9: 168093-168106 (2021) - [j32]Sejun Yoon, Changbae Mun, Nagarajan Raghavan, Dongwook Hwang, Sohee Kim, Hyunseok Park:
Hierarchical main path analysis to identify decompositional multi-knowledge trajectories. J. Knowl. Manag. 25(2): 454-476 (2021) - [c14]Monika Tanwar, Nagarajan Raghavan, Sidra Khanam:
Condition Based Maintenance Policy for Crankcase Lubricating Oil in Diesel Locomotives. IEEM 2021: 1593-1598 - 2020
- [j31]Cheryl Selvanayagam, Pham Luu Trung Duong, Nagarajan Raghavan:
Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis. IEEE Access 8: 50163-50170 (2020) - [j30]Monika Tanwar, Nagarajan Raghavan:
Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression. IEEE Access 8: 128897-128907 (2020) - [j29]Karkulali Pugalenthi, Hyunseok Park, Nagarajan Raghavan:
Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters. IEEE Access 8: 153508-153516 (2020) - [j28]Dan Jiang, Weihua Lin, Nagarajan Raghavan:
A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques. IEEE Access 8: 197885-197895 (2020) - [j27]Pham Luu Trung Duong, Shaista Hussain, Mark Hyunpong Jhon, Nagarajan Raghavan:
Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression. IEEE Access 8: 222256-222266 (2020) - [c13]Alok Ranjan, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey:
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. IRPS 2020: 1-7 - [c12]Jia Hao Lim, Nagarajan Raghavan, Jae Hyun Kwon, Tae Young Lee, Robin Chao, Nyuk Leong Chung, Kazutaka Yamane, Naganivetha Thiyagarajah, Vinayak Bharat Naik, Kin Leong Pey:
Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. IRPS 2020: 1-5 - [c11]Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey:
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. IRPS 2020: 1-6
2010 – 2019
- 2019
- [c10]Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo:
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. IRPS 2019: 1-8 - [c9]Jia Hao Lim, Nagarajan Raghavan, Vinayak Bharat Naik, Jae Hyun Kwon, Kazutaka Yamane, H. Yang, K. H. Lee, Kin Leong Pey:
Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. IRPS 2019: 1-7 - [c8]Kin Leong Pey, Alok Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea:
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. IRPS 2019: 1-12 - 2018
- [j26]Pham Luu Trung Duong, Nagarajan Raghavan:
Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery. Microelectron. Reliab. 81: 232-243 (2018) - [j25]Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan:
Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes. Microelectron. Reliab. 87: 206-212 (2018) - [j24]Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan:
Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes. Microelectron. Reliab. 88-90: 80-84 (2018) - [j23]Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan:
Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. Microelectron. Reliab. 88-90: 85-90 (2018) - [j22]Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong:
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. Microelectron. Reliab. 88-90: 164-168 (2018) - [j21]Cheryl Selvanayagam, Rathin Mandal, Nagarajan Raghavan:
Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis. Microelectron. Reliab. 88-90: 817-823 (2018) - [j20]Karkulali Pugalenthi, Nagarajan Raghavan:
A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study. Microelectron. Reliab. 91: 160-169 (2018) - [c7]Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey:
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS 2018: 4 - [c6]Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey:
Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction. IRPS 2018: 6 - 2017
- [j19]Chinedu I. Ossai, Xuechu Xu, Qing Yang, Nagarajan Raghavan:
Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing. Microelectron. Reliab. 76-77: 106-111 (2017) - [j18]Pham Luu Trung Duong, Trong Toan Tran, Nagarajan Raghavan:
Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators. Microelectron. Reliab. 76-77: 619-625 (2017) - [c5]Pham Luu Trung Duong, Nagarajan Raghavan:
Uncertainty quantification in prognostics: A data driven polynomial chaos approach. ICPHM 2017: 135-142 - [c4]Pham Luu Trung Duong, Nagarajan Raghavan:
A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms. ICPHM 2017: 227-233 - 2016
- [j17]Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey:
Compliance current dominates evolution of NiSi2 defect size in Ni/dielectric/Si RRAM devices. Microelectron. Reliab. 61: 71-77 (2016) - [j16]Nagarajan Raghavan:
Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices. Microelectron. Reliab. 64: 54-58 (2016) - [j15]Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey:
Analysis of quantum conductance, read disturb and switching statistics in HfO2 RRAM using conductive AFM. Microelectron. Reliab. 64: 172-178 (2016) - [j14]Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey:
Conductive filament formation at grain boundary locations in polycrystalline HfO2 -based MIM stacks: Computational and physical insight. Microelectron. Reliab. 64: 204-209 (2016) - 2015
- [j13]Nagarajan Raghavan, Daniel D. Frey:
Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms. Microelectron. Reliab. 55(9-10): 1297-1301 (2015) - [j12]Nagarajan Raghavan, Michel Bosman, Kin Leong Pey:
Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. Microelectron. Reliab. 55(9-10): 1412-1416 (2015) - [j11]Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey:
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. Microelectron. Reliab. 55(9-10): 1422-1426 (2015) - [j10]Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey:
An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO2/SiOx dielectric stacks for failure analysis. Microelectron. Reliab. 55(9-10): 1450-1455 (2015) - [c3]Nagarajan Raghavan, Daniel D. Frey:
Remaining useful life estimation for systems subject to multiple degradation mechanisms. ICPHM 2015: 1-8 - [c2]Nagarajan Raghavan, Michel Bosman, Kin Leong Pey:
Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer. IRPS 2015: 5 - [c1]Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey:
Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. IRPS 2015: 5 - 2014
- [j9]Nagarajan Raghavan, Kin Leong Pey, Kalya Shubhakar:
High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact. Microelectron. Reliab. 54(5): 847-860 (2014) - [j8]Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey:
Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO2 on reliability of SiOx interfacial layer. Microelectron. Reliab. 54(9-10): 1712-1717 (2014) - [j7]Nagarajan Raghavan, Daniel D. Frey, Kin Leong Pey:
Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory. Microelectron. Reliab. 54(9-10): 1729-1734 (2014) - [j6]Nagarajan Raghavan:
Performance and reliability trade-offs for high-κ RRAM. Microelectron. Reliab. 54(9-10): 2253-2257 (2014) - [j5]Nagarajan Raghavan, Michel Bosman, Daniel D. Frey, Kin Leong Pey:
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. Microelectron. Reliab. 54(9-10): 2266-2271 (2014) - [j4]Nagarajan Raghavan, Michel Bosman, Kin Leong Pey:
Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. Microelectron. Reliab. 54(9-10): 2295-2299 (2014)
2000 – 2009
- 2009
- [j3]Cher Ming Tan, Nagarajan Raghavan:
Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems". Reliab. Eng. Syst. Saf. 94(3): 781-782 (2009) - 2008
- [j2]Cher Ming Tan, Nagarajan Raghavan:
A framework to practical predictive maintenance modeling for multi-state systems. Reliab. Eng. Syst. Saf. 93(8): 1138-1150 (2008) - 2007
- [j1]Cher Ming Tan, Nagarajan Raghavan:
An approach to statistical analysis of gate oxide breakdown mechanisms. Microelectron. Reliab. 47(9-11): 1336-1342 (2007)
Coauthor Index
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