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Yoshikazu Morooka
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2000 – 2009
- 2009
- [j5]Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto:
A Continuous-Adaptive DDRx Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. IEICE Trans. Electron. 92-C(4): 453-459 (2009) - 2007
- [c3]Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto:
A Continuous-Adaptive DDR2 Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. ISSCC 2007: 490-491
1990 – 1999
- 1999
- [j4]Yasunobu Nakase, Yoshikazu Morooka, David J. Perlman, Daniel J. Kolor, Jae-Myoung Choi, Hyun J. Shin, Tsutomu Yoshimura, Naoya Watanabe, Yoshio Matsuda, Masaki Kumanoya, Michihiro Yamada:
Source-synchronization and timing vernier techniques for 1.2-GB/s SLDRAM interface. IEEE J. Solid State Circuits 34(4): 494-501 (1999) - 1996
- [j3]Tadaaki Yamauchi, Yoshikazu Morooka, Hideyuki Ozaki:
A low power and high speed data transfer scheme with asynchronous compressed pulse width modulation for AS-Memory. IEEE J. Solid State Circuits 31(4): 523-530 (1996) - 1994
- [j2]Kiyohiro Furutani, Hiroshi Miyamoto, Yoshikazu Morooka, M. Suwa, Hideyuki Ozaki:
An adjustable output driver with a self-recovering Vpp generator for a 4M⨉16 DRAM. IEEE J. Solid State Circuits 29(3): 308-310 (1994) - [j1]Yasuhiko Tsukikawa, Takeshi Kajimoto, Yasuhiko Okasaka, Yoshikazu Morooka, Kiyohiro Furutani, Hiroshi Miyamoto, Hideyuki Ozaki:
An efficient back-bias generator with hybrid pumping circuit for 1.5-V DRAMs. IEEE J. Solid State Circuits 29(4): 534-538 (1994) - 1991
- [c2]Yoshikazu Morooka, Shigeru Mori, Hiroshi Miyamoto, Michihiro Yamada:
An Address Maskable Parallel Testing for Ultra High Density DRAMs. ITC 1991: 556-563
1980 – 1989
- 1985
- [c1]Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, Takao Nakano:
Test Pattern Considerations for Fault Tolerant High Density DRAM. ITC 1985: 451-455
Coauthor Index
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