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Slawomir Pilarski
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2020 – today
- 2022
- [j15]Sebastian Pilarski, Slawomir Pilarski, Dániel Varró:
Delayed Reward Bernoulli Bandits: Optimal Policy and Predictive Meta-Algorithm PARDI. IEEE Trans. Artif. Intell. 3(2): 152-163 (2022) - 2021
- [j14]Sebastian Pilarski, Slawomir Pilarski, Dániel Varró:
Optimal Policy for Bernoulli Bandits: Computation and Algorithm Gauge. IEEE Trans. Artif. Intell. 2(1): 2-17 (2021)
2000 – 2009
- 2004
- [c11]Demos Anastasakis, Lisa McIlwain, Slawomir Pilarski:
Efficient equivalence checking with partitions and hierarchical cut-points. DAC 2004: 539-542 - 2002
- [c10]Slawomir Pilarski, Gracia Hu:
SAT with partial clauses and back-leaps. DAC 2002: 743-746 - [c9]Slawomir Pilarski, Gracia Hu:
Speeding up SAT for EDA. DATE 2002: 1081
1990 – 1999
- 1997
- [j13]Alicja Pierzynska, Slawomir Pilarski:
Pitfalls in delay fault testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 16(3): 321-329 (1997) - 1996
- [c8]Sandeep K. Gupta, Slawomir Pilarski, Sudhakar M. Reddy, Jacob Savir, Prab Varma:
Delay Fault Testing: How Robust are Our Models? VTS 1996: 502-503 - 1995
- [j12]Slawomir Pilarski:
Comments on "Aliasing Properties of Circular MISRs". J. Electron. Test. 6(1): 139-140 (1995) - [j11]Slawomir Pilarski, Kevin James Wiebe:
Counter-Based Compaction: Delay and Stuck-Open Faults. IEEE Trans. Computers 44(6): 780-791 (1995) - [j10]Slawomir Pilarski:
Comments on "Test efficiency analysis of random self-test of sequential circuits". IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 14(8): 1044-1045 (1995) - [c7]Alicja Pierzynska, Slawomir Pilarski:
Quality considerations in delay fault testing. EURO-DAC 1995: 196-201 - [c6]Alicja Pierzynska, Slawomir Pilarski:
Non-Robust versus Robust. ITC 1995: 123-131 - 1994
- [j9]Slawomir Pilarski, André Ivanov, Tiko Kameda:
On minimizing aliasing in scan-based compaction. J. Electron. Test. 5(1): 83-90 (1994) - 1993
- [j8]Slawomir Pilarski, Tiko Kameda:
Simple Bounds on the Convergence Rate of an Ergodic Markov Chain. Inf. Process. Lett. 45(2): 81-87 (1993) - [j7]Tiko Kameda, Slawomir Pilarski, André Ivanov:
Notes on Multiple Input Signature Analysis. IEEE Trans. Computers 42(2): 228-234 (1993) - [j6]Slawomir Pilarski, Tiko Kameda, André Ivanov:
Sequential faults and aliasing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 12(7): 1068-1074 (1993) - [c5]Slawomir Pilarski, Alicja Pierzynska:
BIST and Delay Fault Detection. ITC 1993: 236-242 - 1992
- [j5]Slawomir Pilarski, Kevin James Wiebe:
Counter-based compaction: An analysis for BIST. J. Electron. Test. 3(1): 33-43 (1992) - [j4]André Ivanov, Slawomir Pilarski:
Performance of signature analysis: a survey of bounds, exact, and heuristic algorithms. Integr. 13(1): 17-38 (1992) - [j3]Slawomir Pilarski, Andrzej Krasniewski, Tiko Kameda:
Estimating testing effectiveness of the circular self-test path technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(10): 1301-1316 (1992) - [j2]Slawomir Pilarski, Tiko Kameda:
Checkpointing for Distributed Databases: Starting from the Basics. IEEE Trans. Parallel Distributed Syst. 3(5): 602-610 (1992) - [c4]Andrzej Krasniewski, Slawomir Pilarski:
High Quality Testing of Embedded RAMs Using Circular Self-Test Path. ITC 1992: 652-661 - [c3]Alicja Pierzynska, Slawomir Pilarski:
Built-in self-test design for large embedded PLAs. VTS 1992: 73-78 - 1990
- [c2]Slawomir Pilarski, Tiko Kameda:
A Novel Checkpointing Scheme for Distributed Database Systems. PODS 1990: 368-378
1980 – 1989
- 1989
- [j1]Andrzej Krasniewski, Slawomir Pilarski:
Circular self-test path: a low-cost BIST technique for VLSI circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8(1): 46-55 (1989) - 1987
- [c1]Andrzej Krasniewski, Slawomir Pilarski:
Circular Self-Test Path: A Low-Cost BIST Technique. DAC 1987: 407-415
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