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ORCIDWilliam R. Eisenstadt
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2020 – today
- 2022
[c26]William R. Eisenstadt
, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière:
Special Session on RF/5G Test. ETS 2022: 1-9- 2021
- [j17]Lee J. Johnson, William R. Eisenstadt, Frank Alexander, Kyle T. Packer:
MicroSTARLING: A Millimeter Scale Self-Organizing Optical Communication Processor for Embedded Multihop Sensor and Computational Networks. IEEE Access 9: 108702-108717 (2021) - [c25]Shadi M. Harb, William R. Eisenstadt:
Signal Integrity in High Speed 3D IC Design- A Case Study. NorCAS 2021: 1-5 - [c24]Anurag Tulsiram, William R. Eisenstadt:
Design for Testability of Low Dropout Regulators. VTS 2021: 1-7
2010 – 2019
- 2017
- [j16]Manuel J. Barragán, William R. Eisenstadt:
Guest Editorial: Analog, Mixed-Signal and RF Testing. J. Electron. Test. 33(3): 281-282 (2017) - [c23]Shadi M. Harb, William R. Eisenstadt:
A study of characterizing crosstalk effects in 3-D vias. LASCAS 2017: 1-4 - 2016
- [c22]Shadi M. Harb, William R. Eisenstadt:
Oscillation ring testing methodology of TSVs in 3D stacked ICs. NORCAS 2016: 1-4 - 2015
- [c21]Hyunho Baek, William R. Eisenstadt:
Design and techniques for on-die power integrity noise measurement system with digital output. ISCAS 2015: 1390-1393 - [c20]Shadi M. Harb, William R. Eisenstadt:
A CMOS High Resolution Multi-Edge Delay Generator. NORCAS 2015: 1-4 - 2013
- [j15]William R. Eisenstadt, Byul Hur:
Embedded RF Test Circuits: RF Power Detectors, RF Power Control Circuits, Directional Couplers, and 77-GHz Six-Port Reflectometer. J. Inform. and Commun. Convergence Engineering 11(1): 56-61 (2013) - 2011
- [c19]Shadi M. Harb, William R. Eisenstadt, Robert M. Fox:
A sub-1V CMOS voltage reference generator. ISCAS 2011: 901-904 - 2010
- [c18]Devin Morris, William R. Eisenstadt, Andrea Paganini, Mustapha Slamani, Timothy Platt, John Ferrario:
Synthetic DSP approach for novel FPGA-based measurement of error vector magnitude. ITC 2010: 237-244
2000 – 2009
- 2009
- [c17]Moishe Groger, Shadi M. Harb, Devin Morris, William R. Eisenstadt, Sudeep Puligundla:
High speed I/O and thermal effect characterization of 3D stacked ICs. 3DIC 2009: 1-5 - 2008
- [j14]Qizhang Yin, William R. Eisenstadt, Tian Xia:
Wireless System for Microwave Test Signal Generation. IEEE Des. Test Comput. 25(2): 160-166 (2008) - [c16]Saleh Abdel-Hafeez, Shadi M. Harb, William R. Eisenstadt:
High speed digital CMOS divide-by-N fequency divider. ISCAS 2008: 592-595 - 2007
- [c15]Xueqing Wang, William R. Eisenstadt, Robert M. Fox:
Embedded Jitter Measurement of High-speed I/O Signals. ISCAS 2007: 153-156 - [c14]Saleh Abdel-Hafeez, Shadi M. Harb, William R. Eisenstadt:
Low-Power Content Addressable Memory With Read/Write and Matched Mask Ports. PATMOS 2007: 75-85 - [c13]Saleh Abdel-Hafeez, Shadi M. Harb, William R. Eisenstadt:
A low-power CAM using a 12-transistor design cell. VLSI-SoC 2007: 264-269 - 2006
- [j13]Tao Zhang, William R. Eisenstadt, Robert M. Fox, Qizhang Yin:
Bipolar Microwave RMS Power Detectors. IEEE J. Solid State Circuits 41(9): 2188-2192 (2006) - [j12]Kooho Jung, William R. Eisenstadt, Robert M. Fox:
SPICE-based mixed-mode S-parameter calculations for four-port and three-port circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25(5): 909-913 (2006) - 2005
- [j11]Qizhang Yin, William R. Eisenstadt, Robert M. Fox, Tao Zhang:
A translinear RMS detector for embedded test of RF ICs. IEEE Trans. Instrum. Meas. 54(5): 1708-1714 (2005) - [j10]Jangsup Yoon, William R. Eisenstadt:
Embedded loopback test for RF ICs. IEEE Trans. Instrum. Meas. 54(5): 1715-1720 (2005) - [c12]Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt:
On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111 - 2004
- [j9]Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim:
A decoupling technique for efficient timing analysis of VLSI interconnects with dynamic circuit switching. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23(9): 1321-1337 (2004) - [j8]Robert M. Fox, H. J. Ko, William R. Eisenstadt:
Differential log-domain filters with high-gain common-mode feedback. IEEE Trans. Circuits Syst. I Regul. Pap. 51-I(2): 254-263 (2004) - [j7]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects. IEEE Trans. Very Large Scale Integr. Syst. 12(4): 395-407 (2004) - [c11]Jangsup Yoon, William R. Eisenstadt:
Lumped passive circuits for 5GHz embedded test of RF SoCs. ISCAS (1) 2004: 241-244 - [c10]Qizhang Yin, Robert M. Fox, William R. Eisenstadt:
A translinear-based RF RMS detector for embedded test. ISCAS (1) 2004: 245-248 - [c9]Tao Zhang, William R. Eisenstadt, Robert M. Fox:
A novel 5GHz RF power detector. ISCAS (1) 2004: 897-900 - [c8]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switching. ISQED 2004: 337-342 - 2003
- [c7]Sanghoon Choi, William R. Eisenstadt, Robert M. Fox:
Design of programmable embedded IF source for design self-test. ISCAS (5) 2003: 241-244 - [c6]William R. Eisenstadt:
Improving Wireless Product Testing via University and Industry Collaboration. ITC 2003: 1288 - 2002
- [j6]Robert M. Fox, R. Chawla, William R. Eisenstadt, D. Hemmenway, J. Johnston:
Circuit for monitoring BJT RF performance using DC measurements. IEEE J. Solid State Circuits 37(9): 1207-1210 (2002) - [j5]Yungseon Eo, Jongin Shim, William R. Eisenstadt:
A traveling-wave-based waveform approximation technique for thetiming verification of single transmission lines. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(6): 723-730 (2002) - [j4]Yungseon Eo, Seongkyun Shin, William R. Eisenstadt, Jongin Shim:
Generalized traveling-wave-based waveform approximation technique for the efficient signal integrity verification of multicoupled transmission line system. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(12): 1489-1497 (2002) - [c5]Seongkyun Shin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects. SLIP 2002: 61-68 - [c4]Robert C. Aitken, Mustapha Slamani, H. Ding, William R. Eisenstadt, Sanghoon Choi, John McLaughlin:
Wireless Test. VTS 2002: 173-174 - 2001
- [j3]Woojin Jin, Yungseon Eo, William R. Eisenstadt, Jongin Shim:
Fast and accurate quasi-three-dimensional capacitance determination of multilayer VLSI interconnects. IEEE Trans. Very Large Scale Integr. Syst. 9(3): 450-460 (2001) - [c3]Robert M. Fox, Hyung-Jong Ko, William R. Eisenstadt:
High-gain common-mode feedback circuits for differential log-domain filters. ISCAS (1) 2001: 560-563 - 2000
- [j2]Bob Stengel, William R. Eisenstadt:
LINC power amplifier combiner method efficiency optimization. IEEE Trans. Veh. Technol. 49(1): 229-234 (2000)
1990 – 1999
- 1999
- [c2]Y. Ro, William R. Eisenstadt, Robert M. Fox:
New 1.4 volt transconductor with superior power supply rejection. ISCAS (2) 1999: 644-647
1980 – 1989
- 1987
- [c1]Herman Lam, Stanley Y. W. Su, F. L. C. Seeger, William R. Eisenstadt:
A Special Function Unit for Database Operations Within a Data-Control Flow System. ICPP 1987: 330-339 - 1986
- [j1]Surya Veeraraghavan, Jerry G. Fossum, William R. Eisenstadt:
SPICE Simulation of SOI MOSFET Integrated Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 5(4): 653-658 (1986)
Coauthor Index
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