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ORCIDEgor S. Sogomonyan
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2020 – today
- 2020
[j9]Mehmed Dug
, Stefan Weidling, Egor S. Sogomonyan, Dejan Jokic, Milos Krstic:
Full Error Detection and Correction Method Applied on Pipelined Structure Using Two Approaches. J. Circuits Syst. Comput. 29(13): 2050218:1-2050218:15 (2020)
2010 – 2019
- 2016
- [j8]Milos Krstic, Stefan Weidling, Vladimir Petrovic, Egor S. Sogomonyan:
Enhanced architectures for soft error detection and correction in combinational and sequential circuits. Microelectron. Reliab. 56: 212-220 (2016) - 2013
- [c28]Egor S. Sogomonyan, Stefan Weidling, Michael Gössel:
A new method for correcting time and soft errors in combinational circuits. DDECS 2013: 283-286 - [c27]Stefan Weidling, Egor S. Sogomonyan, Michael Gössel:
Error Correction of Transient Errors in a Sum-Bit Duplicated Adder by Error Detection. DSD 2013: 855-862
2000 – 2009
- 2008
- [j7]Michael Gössel, Egor S. Sogomonyan:
A Non-linear Split Error Detection Code. Fundam. Informaticae 83(1-2): 109-115 (2008) - 2006
- [j6]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld:
Modulo p=3 Checking for a Carry Select Adder. J. Electron. Test. 22(1): 101-107 (2006) - [c26]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking and Code-Disjoint Non-Restoring Array Divider. IOLTS 2006: 23-30 - [c25]Cristian Grecu, André Ivanov, Res Saleh, Egor S. Sogomonyan, Partha Pratim Pande:
On-line Fault Detection and Location for NoC Interconnects. IOLTS 2006: 145-150 - 2005
- [c24]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
New Self-checking Output-Duplicated Booth Multiplier with High Fault Coverage for Soft Errors. Asian Test Symposium 2005: 76-81 - 2004
- [c23]Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel:
Self-checking Carry-selectAdder with Sum-bit Duplication. ARCS Workshops 2004: 84-91 - [c22]Egor S. Sogomonyan, Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Sum-Bit Duplicated Carry-Select Adder. DATE 2004: 1360-1361 - [c21]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A new self-checking multiplier by use of a code-disjoint sum-bit duplicated adder. ETS 2004: 30-35 - [c20]Vitalij Ocheretnij, Daniel Marienfeld, Egor S. Sogomonyan, Michael Gössel:
Self-Checking Code-Disjoint Carry-Select Adder with Low Area Overhead by Use of Add1-Circuits. IOLTS 2004: 31-36 - 2003
- [j5]Adit D. Singh, Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
Multimode scan: Test per clock BIST for IP cores. ACM Trans. Design Autom. Electr. Syst. 8(4): 491-505 (2003) - [c19]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld:
A Modulo p Checked Self-Checking Carry Select Adder. IOLTS 2003: 25-29 - [c18]Kartik Mohanram, Egor S. Sogomonyan, Michael Gössel, Nur A. Touba:
Synthesis of Low-Cost Parity-Based Partially Self-Checking Circuits. IOLTS 2003: 35- - 2002
- [c17]Daniel Marienfeld, Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan:
Partially Duplicated Code-Disjoint Carry-Skip Adder. DFT 2002: 78-86 - [c16]Daniel Marienfeld, Egor S. Sogomonyan, Vitalij Ocheretnij, Michael Gössel:
A New Self-Checking Code-Disjoint Carry-Skip Adder. IOLTW 2002: 39-43 - [c15]Michael Gössel, Egor S. Sogomonyan, Adit D. Singh:
Scan-Path with Directly Duplicated and Inverted Duplicated Registers. VTS 2002: 47-52 - 2001
- [c14]Vitalij Ocheretnij, Egor S. Sogomonyan, Michael Gössel:
A New Code-Disjoint Sum-Bit Duplicated Carry Look-Ahead Adder for Parity Codes. Asian Test Symposium 2001: 365- - [c13]Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan:
Code-Disjoint Carry-Dependent Sum Adder with Partial Look-Ahead. IOLTW 2001: 147-152 - [c12]Egor S. Sogomonyan, Andrej A. Morosov, Jan Rzeha, Michael Gössel, Adit D. Singh:
Early Error Detection in Systems-on-Chip for Fault-Tolerance and At-Speed Debugging. VTS 2001: 184-189
1990 – 1999
- 1999
- [j4]Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. J. Electron. Test. 15(1-2): 87-96 (1999) - [c11]Adit D. Singh, Egor S. Sogomonyan, Michael Gössel, Markus Seuring:
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element. ITC 1999: 286-293 - [c10]Michael Gössel, Andrej A. Morosov, Egor S. Sogomonyan:
A New Totally Error Propagating Compactor for Arbitrary Cores with Digital Interfaces. VTS 1999: 49-57 - 1998
- [c9]Egor S. Sogomonyan, Adit D. Singh, Michael Gössel:
A Multi-Mode Scannable Memory Element for High Test Application Efficiency and Delay Testing. VTS 1998: 324-331 - [c8]Markus Seuring, Michael Gössel, Egor S. Sogomonyan:
A Structural Approach for Space Compaction for Concurrent Checking and BIST. VTS 1998: 354-361 - 1997
- [c7]Hendrik Hartje, Michael Gössel, Egor S. Sogomonyan:
Code-Disjoint Circuits for Parity Circuits. Asian Test Symposium 1997: 100- - [c6]Andrzej Hlawiczka, Michael Gössel, Egor S. Sogomonyan:
A linear code-preserving signature analyzer COPMISR. VTS 1997: 350-355 - 1996
- [j3]Michael Gössel, Egor S. Sogomonyan:
A parity-preserving multi-input signature analyzer and its application for concurrent checking and BIST. J. Electron. Test. 8(2): 165-177 (1996) - [j2]Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick:
Self-Checking Comparator with One Periodic Output. IEEE Trans. Computers 45(3): 379-380 (1996) - [c5]Egor S. Sogomonyan, Michael Gössel:
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems. VTS 1996: 138-144 - 1994
- [c4]Michael Gössel, Egor S. Sogomonyan:
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design. VTS 1994: 151-157 - 1993
- [j1]Egor S. Sogomonyan, Michael Gössel:
Design of self-testing and on-line fault detection combinational circuits with weakly independent outputs. J. Electron. Test. 4(3): 267-281 (1993) - [c3]Egor S. Sogomonyan, Michael Gössel:
Design of Self-Parity Combinational Circuits for Self-testing and On-line Detection. DFT 1993: 239-246 - [c2]Michael Gössel, Egor S. Sogomonyan:
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111 - 1992
- [c1]Egor S. Sogomonyan, Michael Gössel:
Self-testing and self-checking combinational circuits with weakly independent outputs. VTS 1992: 298-303
Coauthor Index
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