default search action
"Self-parity cominational circuits for self-testing, concurrent fault ..."
Michael Gössel, Egor S. Sogomonyan (1993)
- Michael Gössel, Egor S. Sogomonyan:
Self-parity cominational circuits for self-testing, concurrent fault detection and parity scan design. VLSI 1993: 103-111
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.